JPS593057B2 - Trunk test method - Google Patents

Trunk test method

Info

Publication number
JPS593057B2
JPS593057B2 JP52033873A JP3387377A JPS593057B2 JP S593057 B2 JPS593057 B2 JP S593057B2 JP 52033873 A JP52033873 A JP 52033873A JP 3387377 A JP3387377 A JP 3387377A JP S593057 B2 JPS593057 B2 JP S593057B2
Authority
JP
Japan
Prior art keywords
trunk
test
inter
office
trunks
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP52033873A
Other languages
Japanese (ja)
Other versions
JPS53118909A (en
Inventor
秀実 原田
盛義 石田
芳昭 松浦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP52033873A priority Critical patent/JPS593057B2/en
Publication of JPS53118909A publication Critical patent/JPS53118909A/en
Publication of JPS593057B2 publication Critical patent/JPS593057B2/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04MTELEPHONIC COMMUNICATION
    • H04M3/00Automatic or semi-automatic exchanges
    • H04M3/22Arrangements for supervision, monitoring or testing
    • H04M3/26Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
    • H04M3/28Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor

Description

【発明の詳細な説明】 本発明はトランク試験に関するものである。[Detailed description of the invention] The present invention relates to trunk testing.

従来のトランク試験においては、その試験のために、入
回線試験架、出回線試験架のように試験専用の架を必要
とし、装置全体の価格、設置スペース等で問題があつた
。又、折返し試、験に対しても夫々コード類を使用しな
ければならず、操作上も煩雑であつた。
Conventional trunk testing requires racks dedicated to the test, such as an incoming line test rack and an outgoing line test rack, which poses problems in terms of the overall cost of the equipment, the installation space, etc. In addition, cords had to be used for return tests and tests, making the operation complicated.

本発明は、かかる欠点を改善したものであり、1 交換
機の局間中継線巾トランクにおいて、前記局間中継線巾
トランクを試験装置へ切換るとともに、他局に対して閉
塞信号を送出する複極電鍵を前記局間中継線巾トランク
内に内蔵し、かつ、トランク試験装置を前記複数の局間
中継線巾トランク間″0 で複式接続し、前記複極電鍵
を操作することにより前記局間中継線巾トランクと前記
トランク試験装置間あるいは前記局間中継線巾トランク
相互間の接続を行わせて試験を行うようにした。以下、
図面を参照して本発明を更に詳細に説明5する。
The present invention has improved such drawbacks, and has the following features: (1) In the inter-office trunk trunk of an exchange, the inter-office trunk trunk is switched to the test equipment, and at the same time, the inter-office trunk trunk is switched to the test equipment, and at the same time, it is possible to transmit a blockage signal to other stations. A pole telephone key is built in the inter-office trunk line width trunk, and a trunk test device is duplex connected between the plurality of inter-office trunk line width trunks, and by operating the double pole telephone key, the inter-office The test was performed by connecting the trunk line width trunk and the trunk test equipment or between the trunk line width trunks between offices.
The present invention will be explained in more detail with reference to the drawings.

第1図は従来のトランク試験方式を示したものであわ、
図中、SUBA、SUBBは一般加入者、SUBTは試
験デスク、NWはネットワークであわ、図示せざる中央
処理装置により制御される。
Figure 1 shows the conventional trunk test method.
In the figure, SUBA and SUBB are general subscribers, SUBT is a test desk, and NW is a network, which is controlled by a central processing unit (not shown).

0TRKはトランクであり、これは入トランクICT出
トランクOGT等を総称したものである。
0TRK is a trunk, which is a general term for incoming trunk ICT, outgoing trunk OGT, etc.

又、TSTEはトランク試、験装置、ICLTFは入ト
ランク試験架、OGLTFは出トランク試験架であり、
この架には各回線対応に弾器SPGUが搭5載されてい
る。そして、トランクの機能試験を行う場合、第1図a
に示す様に、トランク試験架IC/OGLTF中の対応
するトランクTRKの弾器SPGUにトランク試験装置
TSTEのプラグPをさし込み、0 トランク試験装置
TSTEの操作部を操作することによシ試験する。
Also, TSTE is a trunk test, test equipment, ICLTF is an incoming trunk test rack, OGLTF is an outgoing trunk test rack,
This rack is equipped with five ammunition SPGUs corresponding to each line. When performing a trunk function test, see Figure 1a.
As shown in Figure 2, the plug P of the trunk test equipment TSTE is inserted into the ammunition SPGU of the corresponding trunk TRK in the trunk test rack IC/OGLTF, and the test is performed by operating the operation section of the trunk test equipment TSTE. do.

尚、この試験においてトランク試験装置STEに設けら
れた各種トランク、レジスタ等の擬似回路により試験す
る方法と一般加入者で使用される5 トランクを使つて
試験する方法がある。
In this test, there are two methods: one is to test using pseudo circuits such as various trunks and registers provided in the trunk test equipment STE, and the other is to test using five trunks used by general subscribers.

又、このトランク試験装置TSTEに備えられていない
特殊試験を行う場合は、図示せざる特殊試験器を上記と
同様に弾器SPGUにさし込んで試験する。
In addition, when performing a special test that is not provided in the trunk test equipment TSTE, a special test device (not shown) is inserted into the ammunition SPGU in the same manner as described above.

又、折返し試験により、交換機全体の制御を司る図示せ
ざる中央処理装置の機能試験或は障害探索を行う場合、
第1図BVC示す様に例えばコードの一端を入トランク
ICT対応の弾器SPGUに、かつ、そのコードの他端
を出トランク0GT対応の弾器SPGUに接続し、試験
デスクSUBTより発信させ、加入者SUBAへ着信さ
せる動作を行わせる。
In addition, when carrying out a return test to test the functionality of the central processing unit (not shown) that controls the entire switchboard or to search for faults,
As shown in Figure 1 BVC, for example, one end of the cord is connected to the ammunition SPGU that supports incoming trunk ICT, and the other end of the cord is connected to the ammunition SPGU that supports outgoing trunk 0GT, and a call is made from the test desk SUBT to join. The user performs an operation to receive the call to SUBA.

いずれにしろ、各トランク対応に弾器およびその搭載架
が必要となると共に接続操作の煩雑さを招く。
In any case, ammunition and its mounting rack are required for each trunk, and the connection operation becomes complicated.

第2図は、本発明の一実施例を示すものであり、第1図
と同符号のものは同一機能を示す。
FIG. 2 shows an embodiment of the present invention, and the same reference numerals as in FIG. 1 indicate the same functions.

ここで、各トランクTRKには切換用の複極電鍵Kが設
けられている。
Here, each trunk TRK is provided with a bipolar electric key K for switching.

そしてこの電鍵Kを押すと、他局に対しては地気が送出
され閉塞状態となり、一方トランクTRKはトランク試
験装置TSTEへ接続される。
When this key K is pressed, air is sent out to other stations and the station becomes blocked, while the trunk TRK is connected to the trunk testing device TSTE.

このトランク試験装置TSTSEへの接続線の途中には
、ジヤツクJが設けられており、このジヤツクJはトラ
ンクTRK搭載架に各1個設けられており、かつ、その
架内の全トランクに複式接続されている。又、架間では
各架のジヤツクJが複式接続されてトランク試験装置T
STEにつながつている。
A jack J is provided in the middle of the connection line to the trunk test equipment TSTSE, and one jack J is provided for each trunk TRK mounting rack, and is double-connected to all trunks in that rack. has been done. In addition, between the racks, the jacks J of each rack are connected in duplicate and the trunk test equipment T is connected.
Connected to STE.

そこで、トランクの機能試験を行う場合、第2図aに示
す如く、被試験トランクTRKの電鍵Kを押すだけでそ
のトランクTRKはトランク試験装置TSTEに引き込
まれる。又、特殊試験をする場合には、特殊試験器TR
KTSTEを被試験トランクTRKの搭載架に設けられ
たジヤックに接続し、後は被試験トランクTRKの電鍵
Kを押すだけで、試験器との接続が行える。そこで同じ
架内のトランクに対しては以後電鍵Kの操作のみで特殊
試験器TRKTSTEとの接続ができ、操作上の煩雑さ
、実装スペース上の問題が解消される。更に、折返し試
験をする場合も、第2図bに示す様に選択すべき入トラ
ンクICTl出トランク0GTの電鍵Kl,K2を操作
するだけで両者の接続ができ、コード類を必要とせず、
又、当然その取扱いも不要となり、極めて取扱い易いも
のとなる。
Therefore, when performing a trunk function test, as shown in FIG. 2a, simply by pressing the electric key K of the trunk TRK to be tested, the trunk TRK is drawn into the trunk testing device TSTE. In addition, when performing special tests, use the special tester TR.
Connect the KTSTE to the jack installed on the mounting rack of the trunk under test TRK, and then simply press the key K on the trunk under test TRK to connect to the test equipment. Therefore, the trunk in the same rack can be connected to the special tester TRKTSTE by simply operating the electric key K, which eliminates operational complexity and mounting space problems. Furthermore, when conducting a loopback test, the two can be connected by simply operating the keys Kl and K2 of the incoming trunk ICT and outgoing trunk 0GT to be selected, as shown in Fig. 2b, and no cords are required.
Moreover, it is naturally unnecessary to handle it, making it extremely easy to handle.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来例、第2図は本発明の一実施例を示す。 図中、SUBは加入者、NWはネツトワーク、TRKは
トランク、ICTは入トランク、0GTは出トランク、
TSTEはトランク試験装置、ICLTFは入トランク
試験架、0GLTFは出トランク試験架、SPGOは弾
器、Pはプラグ、Kは電鍵、Jはジヤツク、TRKTS
TEは特殊試験器である。
FIG. 1 shows a conventional example, and FIG. 2 shows an embodiment of the present invention. In the figure, SUB is the subscriber, NW is the network, TRK is the trunk, ICT is the incoming trunk, 0GT is the outgoing trunk,
TSTE is trunk testing equipment, ICLTF is incoming trunk testing rack, 0GLTF is outgoing trunk testing rack, SPGO is ammunition, P is plug, K is electric key, J is jack, TRKTS
TE is a special tester.

Claims (1)

【特許請求の範囲】[Claims] 1 交換機の局間中継線用トランクにおいて、前記局間
中継線用トランクをトランク試験装置へ切換るとともに
、他局に対して閉塞信号を送出する複極電鍵を前記局間
中継線用トランク内に内蔵し、かつ、トランク試験装置
を前記複数の局間中継線用トランク間で複式接続し、前
記複極電鍵を操作することにより前記局間中継線用トラ
ンクと前記トランク試験装置間あるいは前記局間中継線
用トランク相互間の接続を行わせて試験を行うことを特
徴とするトランク試験方式。
1. In the trunk for the inter-office trunk line of the exchange, switch the trunk for the inter-office trunk line to the trunk test device, and place a bipolar key for sending a blockage signal to other stations into the trunk for the inter-office trunk line. By connecting the trunk test equipment between the plurality of trunks for inter-office trunk lines, and operating the multipolar telephone key, the trunk test equipment can be connected between the trunks for inter-office trunk lines and the trunk testing equipment or between the above-mentioned offices. A trunk test method characterized by testing by connecting trunks for trunk lines.
JP52033873A 1977-03-26 1977-03-26 Trunk test method Expired JPS593057B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP52033873A JPS593057B2 (en) 1977-03-26 1977-03-26 Trunk test method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP52033873A JPS593057B2 (en) 1977-03-26 1977-03-26 Trunk test method

Publications (2)

Publication Number Publication Date
JPS53118909A JPS53118909A (en) 1978-10-17
JPS593057B2 true JPS593057B2 (en) 1984-01-21

Family

ID=12398622

Family Applications (1)

Application Number Title Priority Date Filing Date
JP52033873A Expired JPS593057B2 (en) 1977-03-26 1977-03-26 Trunk test method

Country Status (1)

Country Link
JP (1) JPS593057B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61260676A (en) * 1985-05-15 1986-11-18 Nec Corp Manufacture of insulated gate type semiconductor device
JPS6223838A (en) * 1985-07-25 1987-01-31 Aisin Warner Ltd Oil pump circuit of transfer for vehicle
JPH0577543B2 (en) * 1985-07-25 1993-10-26 Aisin Aw Co

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4850615A (en) * 1971-10-26 1973-07-17
JPS5132930A (en) * 1974-09-13 1976-03-19 Yuasa Battery Co Ltd

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4850615A (en) * 1971-10-26 1973-07-17
JPS5132930A (en) * 1974-09-13 1976-03-19 Yuasa Battery Co Ltd

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61260676A (en) * 1985-05-15 1986-11-18 Nec Corp Manufacture of insulated gate type semiconductor device
JPS6223838A (en) * 1985-07-25 1987-01-31 Aisin Warner Ltd Oil pump circuit of transfer for vehicle
JPH0577543B2 (en) * 1985-07-25 1993-10-26 Aisin Aw Co

Also Published As

Publication number Publication date
JPS53118909A (en) 1978-10-17

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