JPS59216032A - Measuring device of resolving power of lens - Google Patents

Measuring device of resolving power of lens

Info

Publication number
JPS59216032A
JPS59216032A JP9041783A JP9041783A JPS59216032A JP S59216032 A JPS59216032 A JP S59216032A JP 9041783 A JP9041783 A JP 9041783A JP 9041783 A JP9041783 A JP 9041783A JP S59216032 A JPS59216032 A JP S59216032A
Authority
JP
Japan
Prior art keywords
chart
lens
resolving power
optical axis
resolution
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9041783A
Other languages
Japanese (ja)
Inventor
Mitsuki Sagane
砂金 光記
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP9041783A priority Critical patent/JPS59216032A/en
Publication of JPS59216032A publication Critical patent/JPS59216032A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0292Testing optical properties of objectives by measuring the optical modulation transfer function
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0228Testing optical properties by measuring refractive power

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

PURPOSE:To grasp sensually and extremely clearly resolving power and to evaluate objectively and accurately the resolving power by providing a chart member with a resolving power chart and a slit for MTF measurement. CONSTITUTION:When the chart member 1 is irradiated with incoherent light from an illumination lamp LS, an image Im of the chart member 1 is formed on the photodetection surface of a measuring member 2 through a rotatable lens L to be inspected. At this time, images of resolving power charts C1-C3 of the chart member 1 are projected on the screen 22 of the measuring member 2, so those images are observed visually to evaluate the resolving power of the lens L to be inspected immediately. Images of slits SL1-1-SL3-2, on the other hand, are projected on solid-state image pickup elements S1-S6. The respective solid-state image picture elements S1-S6 scan the projected slit images and their outputs are processed by a Fourier transforming means to calculate MTF, thus evaluating accurately and objectively the resolving power of the lens L to be inspected.

Description

【発明の詳細な説明】 (技術分野) この発明は、レンズの解像性能を測定するための装置に
関する。
DETAILED DESCRIPTION OF THE INVENTION (Technical Field) The present invention relates to an apparatus for measuring the resolution performance of a lens.

(従来技術) レンズの解像性能を測定する方法としては、従来、複数
の空間的周期を有する条線群を有する解像力チャートの
被検レンズによる像を直接的に目視により観察し、被検
レンズの解像性能を判断する、解像力チャート方式と、
被検レンズのMTFを測定する、MTF方式とが知られ
ている。
(Prior Art) Conventionally, the resolution performance of a lens has been measured by directly visually observing the image of the test lens on a resolving power chart having a group of striations having a plurality of spatial periods. A resolution chart method to judge the resolution performance of
An MTF method is known that measures the MTF of a lens to be tested.

解像力チャート方式は、手軽であり、迅速な解像性能測
定が可能であるが、その反面、肉眼による目視検査であ
るため、画人誤差の問題や、測定者の疲労等の問題があ
る。
The resolution chart method is simple and allows rapid measurement of resolution performance, but on the other hand, since it is a visual inspection with the naked eye, there are problems such as image error and fatigue of the measurer.

一方、MTF方式では、客観的且つ正確な解像性能の評
lll1iが可能である。
On the other hand, the MTF method allows objective and accurate evaluation of resolution performance.

しかるに、前述の如き問題の存在にもかかわらず、解像
力チャート方式は、解像性能測定方法として根強い人気
を有しており、MTF方式は、その正確さ、客観性にも
かかわらず、製品化されたレンズのFJfなどにおいて
は、なお敬遠されがちである。
However, despite the problems mentioned above, the resolution chart method remains popular as a method for measuring resolution performance, and the MTF method has not been commercialized despite its accuracy and objectivity. However, lenses such as FJf are still often avoided.

このように解像力チャート方式が根強い人気を有する反
面、MTF’方式が敬遠される理由としては、以下のよ
うな事情が考えられる。
While the resolution chart method has strong popularity, the MTF' method is avoided for the following reasons.

すなイつち、解像力チャート方式は、解像力チャートの
、被検レンズによる像を直接的に目視観察して、解1象
性能を判断するため、手軽で簡単であるばかジでなく、
測定対称である解像性能の良否を、感覚的に極めて明り
ょうに把握できるのである。
In other words, the resolving power chart method is simple and simple, as it directly visually observes the image of the lens being tested on the resolving power chart to judge the resolution performance.
The quality of resolution performance, which is the object of measurement, can be grasped very clearly intuitively.

これに対し、MTF方式では、判断の対象となるものが
、像の結像状態から一定の方式に従って算出され、数量
化されたMTFであり、解織性能そのものの感覚的な把
握が国難であるということがある。又、これまでのとこ
ろ、解像力チャート方式での解像性能の評化と、MTF
方式による評価との間の対応関係の十分な解析もなさ几
でいない。
On the other hand, in the MTF method, the target of judgment is the MTF, which is calculated and quantified according to a certain method from the imaging state of the image, and it is a national problem to intuitively understand the weaving performance itself. There is a thing. In addition, so far, evaluation of resolution performance using the resolution chart method and MTF
There is also no thorough analysis of the correspondence between evaluation methods.

そこで、本発明は、レンズの解像性能を、解像力チャー
ト方式とMTF方式の両面から測定しつる、レンズの解
像性能測定装置の提供を目的とする。
SUMMARY OF THE INVENTION Accordingly, an object of the present invention is to provide a lens resolution performance measuring device that can measure the resolution performance of a lens from both the resolution chart method and the MTF method.

(構 成) 以下、本発明を説明する。(composition) The present invention will be explained below.

本発明による、解像性能測定装置は、保持手段と、回動
手段と、チャート部材と、照明ランプと、画定部材とを
有する。
A resolution performance measuring device according to the present invention includes a holding means, a rotating means, a chart member, an illumination lamp, and a defining member.

保持手段は、解像性能を測定すべき被検レンズを、光軸
のまわシに回動可能であるように保持する。ここで、光
軸とは、測定装置自体の光軸をい1ハ、装置に固定的で
ある。被検レンズは、そのレンズ光軸を、上記光軸に合
致させるように、上記保持手段に保持される。従って、
原則的には、上記光軸と被検レンズのレンズ光軸とは一
致するのであるが、被検レンズは、一般的には、鏡筒に
保持さ几た状態で保持手段に保持されるので、レンズ光
軸が鏡筒に対してくるっている場合には、光軸とレンズ
光軸が合致しない場合もあることを付記しておく。
The holding means holds the lens to be tested whose resolution performance is to be measured so as to be rotatable about the optical axis. Here, the optical axis refers to the optical axis of the measuring device itself, and is fixed to the device. The lens to be tested is held by the holding means so that its optical axis coincides with the optical axis. Therefore,
In principle, the above-mentioned optical axis and the lens optical axis of the test lens coincide, but the test lens is generally held by a holding means in a state where it is held in a lens barrel. It should be noted that if the lens optical axis is oriented with respect to the lens barrel, the optical axis and the lens optical axis may not coincide with each other.

回動手段は、必要に応じて、被検レンズを光軸のまわり
に回動させる。回動手段は、機械力による回動を行う場
合には一般に回動の駆動源としてのモーターと、モータ
ーの駆動力を保持手段に伝える伝達系とによって構成さ
れるが、従来、種々のものが知られているから、適宜の
ものを選択して[吏用すればよい。
The rotating means rotates the lens to be tested around the optical axis as necessary. When rotation is performed by mechanical force, the rotation means is generally composed of a motor as a driving source for rotation and a transmission system that transmits the driving force of the motor to the holding means. Since it is known, all you have to do is select the appropriate one and use it.

チャート部材は、細長い平板状であって、測定装置の光
軸に、長手方向中央部を合致させて、かつ光軸に直交す
るように固定的に配備される。ただし、ここで固定的と
いうのは、測定時の状態をいい、被検レンズとの位置関
係を調整しうるようにしてよいことはいうまでもない。
The chart member has an elongated flat plate shape, and is fixedly disposed such that its longitudinal center portion coincides with the optical axis of the measuring device and is orthogonal to the optical axis. However, here, "fixed" refers to the state at the time of measurement, and it goes without saying that the positional relationship with the test lens may be adjustable.

このチャート部材の長手方向の一方の側には、1以上の
解像力チャートが配さ几、他方の側には、1以上の、M
TF測定用のスリ、トが配される。1以上の解像力チャ
ートおよびスリ、トは、光軸に関し互いに対称的である
One or more resolution charts are arranged on one side in the longitudinal direction of this chart member, and one or more resolution charts are arranged on the other side.
A slot for TF measurement is provided. The one or more resolution charts and the slots are symmetrical with respect to the optical axis.

傅明ランプは、イノコヒーレントな光で、チャート部材
を、照明する。
The Fuming lamp illuminates the chart member with inocoherent light.

測定部材は、被検レンズに関し、上記チャート部材と共
役の位置に配備される。従って、照明ランプがチャート
部材を照明すると、チャート部材の、解像力チャートお
よびスリットの像が、測定部材上に投影される。
The measurement member is arranged at a position conjugate with the chart member with respect to the lens to be tested. Thus, when the illumination lamp illuminates the chart member, an image of the chart member, the resolution chart and the slit is projected onto the measuring member.

311.1定部材の、上記解像力チャートの像を投影さ
れる部分はスクリーン部となっている。また、スリット
の像が投影される部位には、スリ、ト像を走査するため
の固体撮像素子が配備される。
The part of the 311.1 constant member on which the image of the above resolution chart is projected is a screen part. Furthermore, a solid-state image pickup device for scanning the slit image is provided at a portion where the slit image is projected.

以下、図面を参照しながら、具体的な実施例に即して説
明する。
Hereinafter, specific examples will be described with reference to the drawings.

第1図において、符号りは、被検レンズ、符号1はチャ
ート部材、符号LSは照明ランプ、符号バは光軸、符号
1口]は、被検レンズLによる、チャート部材の隊を示
している。
In FIG. 1, the reference numeral indicates the lens to be tested, the reference numeral 1 indicates the chart member, the reference numeral LS indicates the illumination lamp, the reference symbol B indicates the optical axis, and the reference numeral 1 indicates the group of chart members according to the test lens L. There is.

被検レンズLは、図示されないマウント上に固定され、
回動可能となっている。もちろん、このとき、レンズ光
軸は、光軸バと合致する。
The lens L to be tested is fixed on a mount (not shown),
It is rotatable. Of course, at this time, the lens optical axis coincides with the optical axis bar.

チャート部材1は、第2図に示すように、細長い平板状
であって、その長手方向中央部を光軸AXに合致させ、
光軸に直交するように、固定的に配備される。
As shown in FIG. 2, the chart member 1 has an elongated flat plate shape, with its longitudinal center aligned with the optical axis AX,
It is fixedly arranged perpendicular to the optical axis.

このチャート部材1の長手方向σ)一方の側には、光T
’、#lI AXから距離l+ 1 ’2 + ’3の
位置に、)1Jイ像カチャー1− C1,C2,C3が
配されており、反対側には、同じく、光軸AXから4.
a、、、x3の位置に3対のスリ、トが配されている。
In the longitudinal direction σ) of this chart member 1, a light T
', #lI At a distance l+1'2+'3 from the optical axis AX, )1J image cutters 1-C1, C2, C3 are arranged, and on the opposite side, 4.
Three pairs of slots are placed at positions a, , x3.

スリyトSLI 1 、 SLI 2の対は、光軸式に
関し、′M像カチャートC1と対称である。又、スリン
l−5L2−1 、 5L2−2の対、スリン) 5L
3−1 、 5L3−2の文旧よ、それぞれ、角了飽力
チャー)C2,C3と光軸対称である。
The pair of slits SLI 1 and SLI 2 is symmetrical to the 'M image chart C1 with respect to the optical axis system. Also, surin l-5L2-1, a pair of 5L2-2, surin) 5L
3-1 and 5L3-2 are symmetrical to the optical axis with C2 and C3, respectively.

解像力チャー)C1,C2,C3は同一のものであって
、第3図に示すように、複数の空間的周期を有する条線
群を記譜してなっている。
Resolution charts) C1, C2, and C3 are the same, and as shown in FIG. 3, they are notated as a group of striations having a plurality of spatial periods.

スリ、ト5LI−1、5L2−1 、 8L3−1はラ
ジアル方向のMTFを測定するだめのスリットであり、
スリy トSLI 2.  SL22.  SL32は
タノジェンシアル方向のMTF f:測定するためのス
リットである。この例においてチャート部材1は、光学
ガラス板の表面を良く研磨し、クロム蒸着を行って、解
像力チャート、スリ、トのパター7が形成されている。
Slits 5LI-1, 5L2-1, and 8L3-1 are slits for measuring MTF in the radial direction,
SLI 2. SL22. SL32 is a slit for measuring MTF f in the tanogenic direction. In this example, the chart member 1 is formed by polishing the surface of an optical glass plate well and depositing chromium to form a putter 7 with a resolution chart, slits, and grooves.

第1図において、照明ランプLSによるインコヒーレン
トナ光で、チャート部材を照明すると、被検レンズLに
よるチャート部□材1の像1111が、チャート部材1
と共役の位置に結像する。
In FIG. 1, when the chart member is illuminated with incoherent toner light from the illumination lamp LS, an image 1111 of the chart member
The image is formed at a position conjugate to .

さて、 1ll11定部材2は、第4図に示す如く、長
手方向の半分がスクリーン基板21と4p、他の半分が
スライド基板24となっている。
Now, as shown in FIG. 4, the 1ll11 fixed member 2 has a screen substrate 21 and 4p formed on one half in the longitudinal direction, and a slide substrate 24 on the other half.

スクリーン基板21には、透光性拡散性のスクリーン2
2が配備さnl、スライド基板24には、基板231、
 232.233. 234.235. 236が配遣
され、これら基板には、それぞれ、固体撮像素子として
のCCDが、配備されている。符号81〜S6が、これ
らCCDを示している。固体撮像素子S1〜S6の受光
面と、スクリーン21とは同一面上にある。また、第4
図で、符号25はCCD中継基板を示す。
The screen substrate 21 includes a light-transmitting and diffusive screen 2.
2 is provided, the slide substrate 24 has a substrate 231,
232.233. 234.235. 236 are arranged, and a CCD as a solid-state image sensor is arranged on each of these boards. Reference numerals 81 to S6 indicate these CCDs. The light receiving surfaces of the solid-state image sensors S1 to S6 and the screen 21 are on the same plane. Also, the fourth
In the figure, reference numeral 25 indicates a CCD relay board.

測定部材2は、第1図の、像Imが、受光面に重なるよ
うに配備される。
The measuring member 2 is arranged so that the image Im shown in FIG. 1 overlaps the light receiving surface.

すると、チャート部材1における、解像力チャ−)CI
、  C2,C3の像は、測定部材2のスクリーン22
上に投影されるので、この像を目視で観さつすることに
より、被検レンズLの月イ像性能を直ちに評価できる。
Then, the resolution chart ()CI in chart member 1
, C2 and C3 are the images of the screen 22 of the measurement member 2.
Since the image is projected upward, the lunar image performance of the lens L to be tested can be immediately evaluated by visually observing this image.

−方、  ス  リ  ソ  ト  5LI−1、8L
I−2、5L2−1.  5L2−2゜5L3−1. 
8L3−2の像は、それぞれ、固体撮像素子S2.  
SL、  S4.  S3. 86.  S5の上に、
これら素子の受光域に交るように投影される。各固体撮
像素子S1〜S6は、投影されるスリット像を走査し、
その出力にフーリエ変換演算等所定の処理が施され、+
vlTFが算出される。このようにして得られるMTF
によって、被検レンズLの解像性能を正確かつ客観的に
評価することができる。
- direction, Sri Soto 5LI-1, 8L
I-2, 5L2-1. 5L2-2゜5L3-1.
The images of 8L3-2 are respectively captured by solid-state image sensors S2.8L3-2.
SL, S4. S3. 86. On top of S5,
The light is projected so as to intersect the light receiving areas of these elements. Each solid-state image sensor S1 to S6 scans the projected slit image,
The output is subjected to predetermined processing such as Fourier transform calculation, and +
vlTF is calculated. MTF obtained in this way
Accordingly, the resolution performance of the lens L to be tested can be evaluated accurately and objectively.

この状態から、被検レンズLを180度、光軸のまわり
に回動させると、今度は、先にMTFを測定したレンズ
態位で、解像力チャートによる解像性能を測定でき、先
に解像力チャートによる解像性能を評価した状態におけ
るMTFを測定することができる。
From this state, if the lens L to be tested is rotated 180 degrees around the optical axis, the resolution performance can be measured using the resolving power chart in the lens position where the MTF was previously measured. It is possible to measure the MTF in a state where the resolution performance is evaluated by

従って、同一の被検レンズLに対し、解像性能を、解像
力チャート方式の面と、MTF方式の面とから、同時に
測定することができ、両測定方式の対応を解析する上で
、非常に高精度な測定が可能となる。
Therefore, the resolution performance of the same lens L to be tested can be measured simultaneously from the resolution chart method and the MTF method, which is very useful when analyzing the correspondence between the two measurement methods. Highly accurate measurement becomes possible.

スリット露光方式の複写機に用いるレンズや、ファクシ
ミリの読取装置に用いられるレンズでは、スリット露光
部の長手方向、あるいは読取ラインの方向の解像性能が
問題となるが、この場合は、上記方向を、チャート部材
の長手方向と対応させることによシ、所望の解像性能イ
用1定を極めて容易に行うことができる。
Lenses used in slit exposure type copying machines and lenses used in facsimile reading devices have problems with resolution performance in the longitudinal direction of the slit exposure section or in the direction of the reading line. , and the longitudinal direction of the chart member, it is possible to achieve a desired resolution performance very easily.

また、被検レンズLを、光軸のまわりに、所定の角度づ
つ、例えば0.36度づつ回動させ、回動の1ステツプ
ごとに測定を行い、被検レンズLを1回転させ肛ば、全
方位における解像性能を測定できる。このように被検レ
ンズを光軸のまわ9に、一定角づつ、ステ、ブ回動させ
るには、回動手段の駆動モーターとしてステッピングモ
ーターを用いるのがよい。
In addition, the test lens L is rotated around the optical axis by a predetermined angle, for example, by 0.36 degrees, and measurements are taken at each rotation step. , resolution performance in all directions can be measured. In order to rotate the lens to be tested around the optical axis 9 by a constant angle in this manner, it is preferable to use a stepping motor as the drive motor of the rotation means.

もちろん1、被検レンズの回転は、とnを手動で行って
もよいし、コンピー−ター等を用いて自動制御してもよ
い。
Of course, the rotation of the lens to be tested may be performed manually or may be automatically controlled using a computer or the like.

また解像力チャートや、これと光軸対称に配されるスリ
ットの数は、測定ポイント数に応じて1以」二の数に適
宜設定してよい。また、スクリーン部は、必らずしも透
光性である必要はない。
Further, the resolution chart and the number of slits disposed symmetrically with the optical axis may be appropriately set to a number of 1 to 2 depending on the number of measurement points. Further, the screen portion does not necessarily have to be translucent.

なお、本発明の測定装置におけるチャート部材には解像
力チャートと、スリット、とが配備さn、るから、チャ
ート部材は、これを小型化するといっても、おのずから
限度があり、装置全体があま9人型化しないようにしよ
うとすると、被検レンズは、高々数倍程度の、低倍率で
防用されるものに制限されてしまう。この点からすると
、本発明の測定装置は、複写装置や、ファクシミリの読
取装置に用いられる低倍率のレンズの解像性能測定に最
も適している。
In addition, since the chart member in the measuring device of the present invention is equipped with a resolution chart and a slit, even if the chart member can be miniaturized, there is a limit to the size of the chart member, and the entire device is only 9. If an attempt is made to prevent the image from becoming humanoid, the lenses to be tested will be limited to those that can be used for protection at low magnifications, several times at most. From this point of view, the measuring device of the present invention is most suitable for measuring the resolution performance of low-magnification lenses used in copying machines and facsimile reading devices.

(効  果) このように、本発明によれば、新規な、レンズの解1象
性能測定装置を提供できる。
(Effects) As described above, according to the present invention, a novel lens performance measurement device can be provided.

この測定装置によれば、被検レンズの解像性能を解像力
チャート方式とMTF方式の両面から測定でき、解像性
能を感覚的に極めて明確に把握できるとともに、解像性
能を客観的かつ正確に評価することができる。
According to this measurement device, the resolution performance of the lens to be tested can be measured from both the resolution chart method and the MTF method, and it is possible to grasp the resolution performance very clearly intuitively, as well as to measure the resolution performance objectively and accurately. can be evaluated.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、本発明の1実施例を説明するだめの図、第2
図は、上記実施例に用いるチャート部材を示す平面図、
第3図は、解像力チャートを説明するための図、第4図
は、上記実施例に用いる測定部材を示す正面図である。 L・・・被検レンズ、1・・・チャート部材、LS・・
・照明ランプ、■・・・光軸、C1,C2,C3・・・
解像力チャート、2・・・測定部材、22・・・スクリ
ーン、Sl 、 S2゜−、S6・・・固体走査素子(
C’CD)、5LI−1、8LI−2。 、、、、  5L3−1 、 8L3−2−・・スリ、
1・。
FIG. 1 is a diagram for explaining one embodiment of the present invention, and FIG.
The figure is a plan view showing a chart member used in the above embodiment;
FIG. 3 is a diagram for explaining a resolution chart, and FIG. 4 is a front view showing a measuring member used in the above embodiment. L...Test lens, 1...Chart member, LS...
・Illumination lamp, ■... Optical axis, C1, C2, C3...
Resolution chart, 2... Measuring member, 22... Screen, Sl, S2゜-, S6... Solid state scanning element (
C'CD), 5LI-1, 8LI-2. ,,,, 5L3-1, 8L3-2-... pickpocket,
1.

Claims (1)

【特許請求の範囲】[Claims] 解像性1]1?を4111定ずべき被検レンズを、光軸
のまわりに回動可能に保持する保持手段と、この保持手
段に保持された被検レンズを、光軸のまわりに、必要に
jlj>して回動させる回動手段と、細長い平板状であ
って、その長手方向中央部を上記光軸に合致させ、かつ
光軸に直交するように固定的に配備され、上記長手方向
の一方の側に1以上の解像力チャートを有し、他方の側
には、上記8”4像カチヤートに対し光軸対称に、MT
F測定用のスリットを有する、チャート部材と、コノチ
ャート前月を照明する照明ランプと、上記被検レンズに
よる解像力チャートの像を投影されるスクリーン部と、
被検レンズによるスリットの寸を走査する固体撮像素子
とを有し、上記被検レンズに関し、上記チャート部材と
共役の位置に配備される測定部材と、を有することを%
徴とする、レンズの解像性能?ltt+定装置。
Resolution 1] 1? 4111 A holding means for holding a test lens to be determined rotatably around an optical axis, and a test lens held by this holding means are rotated around the optical axis as necessary. a rotating means for moving the device; a rotating means that is in the shape of an elongated flat plate, whose central portion in the longitudinal direction coincides with the optical axis, and is fixedly disposed perpendicular to the optical axis; It has the above resolution chart, and on the other side, MT
A chart member having a slit for F measurement, an illumination lamp for illuminating the cono chart front month, and a screen portion onto which an image of the resolving power chart by the test lens is projected;
and a solid-state image sensor that scans the size of a slit formed by the lens to be tested, and a measuring member disposed at a position conjugate with the chart member with respect to the lens to be tested.
What is the resolution performance of the lens? ltt + fixed device.
JP9041783A 1983-05-23 1983-05-23 Measuring device of resolving power of lens Pending JPS59216032A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9041783A JPS59216032A (en) 1983-05-23 1983-05-23 Measuring device of resolving power of lens

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9041783A JPS59216032A (en) 1983-05-23 1983-05-23 Measuring device of resolving power of lens

Publications (1)

Publication Number Publication Date
JPS59216032A true JPS59216032A (en) 1984-12-06

Family

ID=13998015

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9041783A Pending JPS59216032A (en) 1983-05-23 1983-05-23 Measuring device of resolving power of lens

Country Status (1)

Country Link
JP (1) JPS59216032A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5574555A (en) * 1993-05-14 1996-11-12 Fuji Photo Film Co., Ltd. Lens inspection method and apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5574555A (en) * 1993-05-14 1996-11-12 Fuji Photo Film Co., Ltd. Lens inspection method and apparatus

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