JPS59207544A - Image tube - Google Patents
Image tubeInfo
- Publication number
- JPS59207544A JPS59207544A JP8013183A JP8013183A JPS59207544A JP S59207544 A JPS59207544 A JP S59207544A JP 8013183 A JP8013183 A JP 8013183A JP 8013183 A JP8013183 A JP 8013183A JP S59207544 A JPS59207544 A JP S59207544A
- Authority
- JP
- Japan
- Prior art keywords
- electron beam
- electrode
- focusing lens
- spherical aberration
- diameter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
- H01J29/46—Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
- H01J29/48—Electron guns
- H01J29/488—Schematic arrangements of the electrodes for beam forming; Place and form of the elecrodes
Abstract
Description
【発明の詳細な説明】
〔発明の技術分野〕
本発明は電子ビームを用いる映像管に係シ、特にその電
子銃の集束レンズを形成する電極構造に関するものであ
る。DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to a picture tube using an electron beam, and more particularly to an electrode structure forming a focusing lens of the electron gun.
電子ビームによって映1象を螢光スクリーンに現出せし
める映像管に用いられる電子銃は特に電子ビームの集束
性能が重要である。電子銃の集束性能に係わる重要な要
素は主として球面収差、集束レンズの倍率及び電子の相
互反発の3つが挙げられる。このうち集束性能を決定す
る最大の要素は球面収差であシ、球面収差の大小によっ
て集束性能も大きく左右される。Focusing performance of the electron beam is particularly important for an electron gun used in a picture tube that uses an electron beam to display an image on a fluorescent screen. There are three important factors related to the focusing performance of an electron gun: spherical aberration, focusing lens magnification, and mutual repulsion of electrons. Among these, the biggest factor that determines focusing performance is spherical aberration, and focusing performance is greatly influenced by the magnitude of spherical aberration.
例えば陰極線管用電子銃に用いられる集束レンズは第1
図に示すように、6KV乃至9KVが印加される集束電
極(1)と20KV乃至30f(Vが印加される加速電
極(2)がそれぞれの円形の゛峨子ビーム通過孔(3)
に相対して所定の間隔dmで配設されている。For example, the focusing lens used in cathode ray tube electron guns is
As shown in the figure, a focusing electrode (1) to which 6KV to 9KV is applied and an accelerating electrode (2) to which 20KV to 30F (V is applied) are connected to the respective circular "Ako beam passing holes (3)".
They are arranged at a predetermined interval dm opposite to each other.
一般的【上記集束レンズを構成する4極間隔dmはあま
り小さいと集束電極(1)と加速磁極(2)との間の電
界傾度が犬となり放電を生じ易くなる。また間隔dmを
あまシ大きくすると外部電界の影響tl−受は易くなシ
集束レンズ形状の歪を生ずる。シャドウマスク方式カラ
ー受像管のように複数の電子ビーム、例えば水平軸線上
に3本の電子ビームを並べ、この3本の電子ビームを集
束し且つシャドウマスク近傍で集中させる電子銃では、
特に集束レンズ形状の歪は大きな影響を及ぼす。即ち3
本の電子ビームが各々異なる力を受けるため、スクリー
ン上で3本の電子ビームが各々異なる方向に移動し色純
度の劣化を生ずる。従って電極間隔dmを拡げた方が球
面収差は減少するが、集束レンズの形状歪を生じ易くな
り一定の限界がある。そこで例えば特開昭57−103
246号公報ではこの電極間隔を実質的に拡げ球面収差
を減少させる提案が為されている。即ち第2図に示すよ
うに3つの′電子ビーム通過孔(1aL(lb)、(1
c)及び(2a)、(2b)、(2c)をそれぞれ内包
しリム(4)を外枠とする集束電極(1)と加速電極(
2)が対向して配置烙れる。そしてリム(4)は電子ビ
ーム通過孔の端面(5a)及び(5L+)よシも突出し
た形状を有している。従って電子ビーム通過孔の対向す
る端面間間隔は充分波くとって球面収差を低減し、対向
するリムの間隔を狭めて外部電界の影響を防止しようと
するものである。General [If the interval dm between the four poles constituting the above-mentioned focusing lens is too small, the electric field gradient between the focusing electrode (1) and the accelerating magnetic pole (2) becomes a dog, making it easy to cause discharge. Furthermore, if the distance dm is made too large, the shape of the focusing lens will be distorted, making it less susceptible to the influence of an external electric field. In an electron gun such as a shadow mask type color picture tube, multiple electron beams, for example, three electron beams are lined up on a horizontal axis, and these three electron beams are focused near the shadow mask.
In particular, distortion in the shape of the focusing lens has a large effect. That is 3
Since the electron beams of the book are each subjected to different forces, the three electron beams move in different directions on the screen, resulting in deterioration of color purity. Therefore, increasing the electrode spacing dm reduces spherical aberration, but this tends to cause distortion in the shape of the focusing lens, and there is a certain limit. For example, JP-A-57-103
In Japanese Patent No. 246, a proposal is made to substantially widen this electrode interval to reduce spherical aberration. That is, as shown in FIG.
c) and (2a), (2b), and (2c), respectively, and a focusing electrode (1) and an accelerating electrode (
2) are arranged facing each other. The rim (4) also has a protruding shape beyond the end faces (5a) and (5L+) of the electron beam passage hole. Therefore, the distance between the opposing end surfaces of the electron beam passage hole is sufficiently wavered to reduce spherical aberration, and the distance between the opposing rims is narrowed to prevent the influence of external electric fields.
しかし乍らこの様な形状の電極では以下の問題を生ずる
。第1に之等の電極は単一ビーム形電子銃電極ではなく
インライン配列3電子ビーム形電子銃電極であるために
リム(4)の枠形状は全体として実質的な矩形状をなし
ている。このためK IJム(4)で形成される集束レ
ンズは中央ビームとサイドビームでは非対称の歪を生ず
ることが避けられず、サイドビームで収差が出易い問題
がある。第2にリム(4)の存在の故に集束レンズ径即
ち電子ビーム通過孔を充分大きくとることが出来ず大口
径のレンズが形成されないために球面収差もまたその分
だけ大きくなる問題を有している。また第3に製造面か
らは形状が複雑であυ成形工程も複雑化し高価格となシ
、寸法精度も出しにくい等の問題を有している。However, an electrode having such a shape causes the following problems. First, since these electrodes are in-line three-beam electron gun electrodes rather than single-beam electron gun electrodes, the overall frame shape of the rim (4) is substantially rectangular. For this reason, the focusing lens formed by the K IJ beam (4) inevitably produces asymmetrical distortion between the center beam and the side beams, and there is a problem that aberrations are likely to occur in the side beams. Second, due to the presence of the rim (4), the focusing lens diameter, that is, the electron beam passing hole, cannot be made sufficiently large, and since a large diameter lens cannot be formed, the spherical aberration also increases accordingly. There is. Thirdly, from a manufacturing perspective, the shape is complicated, the υ forming process is complicated, the price is high, and dimensional accuracy is difficult to achieve.
本発明は以上の点に鑑みてなされたもので、球面収差を
低減すると共に外部電界の影響を最小とした電子銃を有
する映像管を得ることを目的とする。The present invention has been made in view of the above points, and an object of the present invention is to obtain a picture tube having an electron gun that reduces spherical aberration and minimizes the influence of external electric fields.
本発明は集束レンズを形成する低電圧印加電極及び高電
圧印加電極の対向間隔をdm、電子ビーム通過孔径をそ
れぞれDl及びD2とする時、dm〉1/′D1+0.
07D、、且つD+ ) D2とすることによって球面
収差を減少させると共に外部電界による集束レンズの影
響を補償するものである。In the present invention, when the spacing between the low voltage applying electrode and the high voltage applying electrode forming the focusing lens is dm, and the diameter of the electron beam passing hole is Dl and D2, respectively, dm>1/'D1+0.
07D, , and D+ ) By setting D2, spherical aberration is reduced and the influence of the focusing lens due to an external electric field is compensated for.
以下に本発明の実施例について詳細に説明する。 Examples of the present invention will be described in detail below.
第3図は本発明に適用される電子銃の集束レンズを構成
する電極を示すもので、集束電極(1)と集束電極より
相対的に高い電圧が印加される加速電橋(2)が間隔d
mを置いて対向配置されている。両電極の対向面はそれ
ぞれの電子ビーム通過孔(la)。Figure 3 shows the electrodes constituting the focusing lens of the electron gun applied to the present invention, in which the focusing electrode (1) and the accelerating bridge (2) to which a relatively higher voltage is applied than the focusing electrode are spaced apart. d
They are placed facing each other with a distance of m. Opposing surfaces of both electrodes have respective electron beam passage holes (la).
(Ib)、(Ic)及び(2a) 、 (2b) 、
(2c)の対向端面と一致しており、第2図のような電
子ビーム通過孔周縁部の折シ返し部は有しておらず、全
ての通過孔は独立して設けられている。このよりな′形
状では外部電界の影響及び隣り合う通過孔からの相互干
渉に対して有利である。このような集束レンズを形成す
る電極構成において、電極間隔dmによる球面収差につ
いて検討する。電子ビーム通過孔径D1を変化させた時
の限界球面収差を与える電極間隔dmとして第4図に示
すような特性が得られた。この特性曲線は外挿法により
dm =1/Dr + 0.07 D+ で示すことが
できる。即ち、dm−?l/D1+0.07D、 と
すればより球面収差を低減することができる。ここで1
/DI が犬であればdmを犬として外部電界の影響
を少なくすることができる。またDlが犬である程dm
を犬とすれば球面収差は小となる。し力)し乍ら電極間
隔dmを拡げる手段のみでは外部電界の影響を受は易く
なるので、他の手段により球面収差をさらに小とし外部
電界の影響を補償することが必要である。このためには
集束電極(1)及び加速電極(2)の電子ビーム通過孔
径D1及びD2をり、>D2とすることによって集束レ
ンズを強化しさらに球面収差を小とすることが可能であ
る。第5図は集束電極(1)の電子ビーム通過孔径り、
を4.9 rnm一定とし、加速電極(2)の電子ビー
ム通過孔径D2を変えて(D。(Ib), (Ic) and (2a), (2b),
(2c), and does not have a folded-back portion at the peripheral edge of the electron beam passage hole as shown in FIG. 2, and all the passage holes are provided independently. This slanted shape is advantageous against the influence of external electric fields and mutual interference from adjacent passage holes. In the electrode configuration forming such a focusing lens, spherical aberration due to the electrode spacing dm will be discussed. As the electrode spacing dm giving the critical spherical aberration when the electron beam passage aperture diameter D1 was changed, the characteristics shown in FIG. 4 were obtained. This characteristic curve can be expressed by extrapolation as dm = 1/Dr + 0.07 D+. That is, dm-? If l/D1+0.07D, the spherical aberration can be further reduced. Here 1
If /DI is a dog, dm can be made a dog to reduce the influence of the external electric field. Also, the more Dl is a dog, the more dm
If it is a dog, the spherical aberration will be small. However, if the electrode spacing dm is increased only by increasing the electrode spacing dm, the effect of the external electric field becomes more susceptible, so it is necessary to further reduce the spherical aberration and compensate for the influence of the external electric field by using other means. To this end, it is possible to strengthen the focusing lens and further reduce spherical aberration by setting the diameters D1 and D2 of the electron beam passage holes of the focusing electrode (1) and the accelerating electrode (2) to >D2. Figure 5 shows the diameter of the electron beam passage hole of the focusing electrode (1).
is kept constant at 4.9 nm, and the electron beam passing hole diameter D2 of the accelerating electrode (2) is changed (D).
−D2)に対する球面収差係数を求めた特性図である。-D2) is a characteristic diagram for determining the spherical aberration coefficient.
電極間隔dmは21m一定とした。第5図から明らかな
ようにDl ”t>0.6順の時球面収差は約1/2に
低減し、外部電界による影響を補償し得ることがわかる
。第3図に示す電極構成はその形状が非常に単純であり
大口径の集束レンズが形成でき、例えば特開昭57−1
23635号公報に示されるような構成によシ極めて容
易に高精度に組み立てることができる。The electrode spacing dm was constant at 21 m. As is clear from Fig. 5, when Dl ''t > 0.6, the spherical aberration is reduced to about 1/2, and the influence of the external electric field can be compensated for.The electrode configuration shown in Fig. 3 The shape is very simple and a large diameter focusing lens can be formed.
The structure shown in Japanese Patent No. 23635 can be assembled very easily and with high precision.
以上の実施例では電子ビーム通過孔周縁に折り返し部を
有さない電極構成について説明したが、第6図に示すよ
うな電極構成であっても同様の効果を有する。この場合
集束レンズの口径は集束電極(1)でほぼ決まり、外枠
のリムが突出していないので電子ビーム通過孔径は第2
図のものよりは大きくとることができ、また電極精度も
出し易い。In the above embodiments, an electrode configuration without a folded portion at the periphery of the electron beam passage hole has been described, but even an electrode configuration as shown in FIG. 6 has the same effect. In this case, the diameter of the focusing lens is almost determined by the focusing electrode (1), and since the rim of the outer frame does not protrude, the diameter of the electron beam passing hole is determined by the second diameter.
It can be made larger than the one shown in the figure, and it is easier to achieve electrode accuracy.
またインライン配列の電子銃のみではなくデルタ配列の
電子銃や或は単峨子銃にも本発明を適用し得ることは言
うまでもない。Furthermore, it goes without saying that the present invention can be applied not only to an in-line array electron gun but also to a delta array electron gun or a single-gauge gun.
以上のように本発明によれば、球面収差が小さく外部電
界の影響を補償し得る大口径の集束レンズを有し、且つ
電極精度の高い電子銃を有する映像管を提供することが
できる。As described above, according to the present invention, it is possible to provide a picture tube having a large-diameter focusing lens with small spherical aberration and capable of compensating for the influence of an external electric field, and having an electron gun with high electrode precision.
第1図及び第2図は集束レンズを構成する電極を示す要
部の概略図、第3図は本発明に適用される集束レンズを
構成する電極を示す要部の概略図、第4図は球面収差に
関する電子ビーム通過孔と電極間隔との関係を示す特性
図、第5図は集束電極と加速電極の電子ビーム通過孔差
と球面収差の関係を示す特性図、第6図は本発明の他の
実施例を示す要部の電極構成図である。
(1)・集束電極 (2)・・加速電極(Ia
)、(lb)、(lc)、(2a)、(2b)、(2c
)、(3)−電子ビーム通過孔代理人 弁理士 則 近
憲 佑 (ほか1名)第 1 図
第2図
−dd
第 4 図
第 5 図
(D、−02)侯飢
第 6 図FIGS. 1 and 2 are schematic diagrams of main parts showing electrodes constituting a focusing lens, FIG. 3 is a schematic diagram of main parts showing electrodes constituting a focusing lens applied to the present invention, and FIG. A characteristic diagram showing the relationship between the electron beam passing aperture and the electrode spacing regarding spherical aberration, FIG. 5 is a characteristic diagram showing the relationship between the electron beam passing aperture difference between the focusing electrode and the accelerating electrode, and spherical aberration, and FIG. FIG. 7 is an electrode configuration diagram of a main part showing another example. (1)・Focusing electrode (2)・Accelerating electrode (Ia
), (lb), (lc), (2a), (2b), (2c
), (3) - Electron beam passage hole representative Patent attorney Kensuke Chika (and 1 other person) Figure 1 Figure 2-dd Figure 4 Figure 5 (D, -02) Houki Figure 6
Claims (1)
し、前記電子ビームを加速および集束する複数の電極か
らなる電子銃を備えた映像管において、前記電子銃は少
くとも低電圧と高電圧を供給されて集束レンズを形成す
るための対向する電極を有し、前記低電圧側電極及び前
記高電圧側電極の電子ビーム通過孔径をり、及びり7、
対向間隔をdmとする時、drz+ > n、 十o、
07 DJ、且つり、 > D、なることを特徴とする
映像管。 2)前記DI及びり、がり、−D、>0.6mなること
を特徴とする特許請求の範囲第1項記載の映像管。[Scope of Claims] 1) A picture tube comprising an electron gun comprising a plurality of electrodes that generates an electron beam toward a fluorescent screen of the picture tube and accelerates and focuses the electron beam, the electron gun having a both have opposing electrodes for forming a focusing lens by being supplied with a low voltage and a high voltage, and the electron beam passing hole diameter of the low voltage side electrode and the high voltage side electrode is determined;
When the facing distance is dm, drz+ > n, 10o,
07 A video tube characterized by being a DJ, and a fishing > D. 2) The picture tube according to claim 1, characterized in that the DI and the length -D are >0.6 m.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8013183A JPS59207544A (en) | 1983-05-10 | 1983-05-10 | Image tube |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8013183A JPS59207544A (en) | 1983-05-10 | 1983-05-10 | Image tube |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59207544A true JPS59207544A (en) | 1984-11-24 |
JPH0472344B2 JPH0472344B2 (en) | 1992-11-18 |
Family
ID=13709672
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8013183A Granted JPS59207544A (en) | 1983-05-10 | 1983-05-10 | Image tube |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59207544A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6012647A (en) * | 1983-07-01 | 1985-01-23 | Mitsubishi Electric Corp | Cathode-ray tube |
US6509680B2 (en) * | 1998-12-21 | 2003-01-21 | Koninklijke Philips Electronics N.V. | Electron gun display device provided with an electron gun |
-
1983
- 1983-05-10 JP JP8013183A patent/JPS59207544A/en active Granted
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6012647A (en) * | 1983-07-01 | 1985-01-23 | Mitsubishi Electric Corp | Cathode-ray tube |
JPH0312423B2 (en) * | 1983-07-01 | 1991-02-20 | Mitsubishi Electric Corp | |
US6509680B2 (en) * | 1998-12-21 | 2003-01-21 | Koninklijke Philips Electronics N.V. | Electron gun display device provided with an electron gun |
Also Published As
Publication number | Publication date |
---|---|
JPH0472344B2 (en) | 1992-11-18 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS61250933A (en) | Cathode-ray tube | |
JP2000188068A (en) | Color cathode ray tube | |
JPH05151911A (en) | Display device and cathode-ray tube | |
JPS5868848A (en) | Structure of electron gun | |
JPS59207544A (en) | Image tube | |
JPS58192252A (en) | Cathode-ray tube device | |
JPS6117095B2 (en) | ||
JP2539790B2 (en) | Display tube | |
US6819038B2 (en) | Double dynamic focus electron gun | |
WO1993024951A1 (en) | Hollow chain link main lens design for color crt | |
US5256933A (en) | Electron gun for a cathode ray tube | |
JPH0160894B2 (en) | ||
JP2684996B2 (en) | In-line color cathode ray tube | |
JP2644809B2 (en) | Electron gun structure for color picture tube | |
JP2765577B2 (en) | In-line type color picture tube | |
JPS6227498B2 (en) | ||
JPH0410693B2 (en) | ||
JPH01115037A (en) | Electron gun for color picture tube | |
JPH01169853A (en) | Convergence device | |
JPS6161218B2 (en) | ||
JPH02216737A (en) | Electron gun for color picture tube | |
JPH04181637A (en) | In-line type electron gun body structure | |
JPS6271151A (en) | Electron gun for color picture tube | |
JPH0384835A (en) | Electron gun for color cathode-ray tube | |
JPH02189842A (en) | Electron gun for color image receiving tube |