JPS59202031A - Measuring apparatus - Google Patents

Measuring apparatus

Info

Publication number
JPS59202031A
JPS59202031A JP7729383A JP7729383A JPS59202031A JP S59202031 A JPS59202031 A JP S59202031A JP 7729383 A JP7729383 A JP 7729383A JP 7729383 A JP7729383 A JP 7729383A JP S59202031 A JPS59202031 A JP S59202031A
Authority
JP
Japan
Prior art keywords
correction
hold circuit
weight
value
sensitivity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7729383A
Other languages
Japanese (ja)
Other versions
JPH0224450B2 (en
Inventor
Fumihiro Tsukasa
政 文裕
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Priority to JP7729383A priority Critical patent/JPS59202031A/en
Publication of JPS59202031A publication Critical patent/JPS59202031A/en
Publication of JPH0224450B2 publication Critical patent/JPH0224450B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01GWEIGHING
    • G01G23/00Auxiliary devices for weighing apparatus
    • G01G23/01Testing or calibrating of weighing apparatus

Abstract

PURPOSE:To reduce errors in the measurement with a correction in a quick response to changes in the temperature made possible by outputting a timing signal each time such a change is sensed in the measuring such items as the weight, length and flow rate of an object to update the correction value. CONSTITUTION:When an object to be measured is placed on a measuring tray 11, a weighing signal from a weighing device 12 undergoes a subtraction by a hold value of a zero-point hold circuit 14 with a subtractor 15 via an A/D converter 13 to perform a zero-point correction and the results are multiplied by a multiplication factor held in a sensitivity hold circuit 19 with a multiplier 20 to correct the sensitivity. When a temperature sensor 22 detects a specified temperature change during the weighing operation, a timing signal TM1 is outputted to the zero-point hold circuit 14 from a timing generation circuit 23. Then, when a reference weight 17 is placed on the measuring tray 11, a timing signal TM2 is outputted to a reference weight driver 21 and a divider 18 from the timing generation circuit 23 to perform a correction.

Description

【発明の詳細な説明】 この発明は物品の重量、長さ、流量等の諸量を測定する
測定装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a measuring device for measuring various quantities such as weight, length, flow rate, etc. of an article.

測定装置、例えば重量測定装置は一般に、被計量物の重
量を計量した計量値から零点あるいは感度を補正装置に
よって補正して誤差の少ない測定値を得るようにしてい
る。
BACKGROUND OF THE INVENTION Measuring devices, such as weight measuring devices, generally use a correction device to correct the zero point or sensitivity of a measured value of the weight of an object to obtain a measured value with few errors.

そして、この補正点は変動するので、従来の測定装置で
は所定時間ごとに、あるいは所定の計測回数ごとに、零
点、感度などの補正点を更新記憶させていた。
Since this correction point changes, conventional measuring devices update and store correction points such as the zero point and sensitivity every predetermined time period or every predetermined number of measurements.

しかしながら零点、感度などの変動の最大の少因となる
のは電気的諸要素の温度変化によるドリフトであるため
、このように一定時間あるいは測定回数ごとに補正点の
更新を行なっても、温度変化が短時間に生じた場合には
測定誤差が大きくなるという欠点があつ−た。
However, the biggest cause of fluctuations in zero point, sensitivity, etc. is drift due to temperature changes in electrical elements, so even if the correction points are updated at fixed intervals or every number of measurements, temperature changes This method has the disadvantage that the measurement error becomes large when it occurs in a short period of time.

このような温度変化に対応するため、従来では第1図に
示すように、温度試験によって予め温度変化に対応した
零点および感度の補正点をそれぞれ記憶回路1a11b
に記憶させておき、温度センサ2を設けて温度センサ2
によって検知した温度変化に対応したアドレス信号を記
憶回路IJL%1bに送シ、このアドレス信号によって
記憶回路1as1b内の零点、感度の補正値を読み出し
、このようにして読み出した補正値に基いて補正回路3
.4において計量器5の計量信号を補正する方法が行な
われていた。
In order to cope with such temperature changes, conventionally, as shown in FIG.
Temperature sensor 2 is stored in memory and temperature sensor 2 is provided.
An address signal corresponding to the temperature change detected by is sent to the memory circuit IJL%1b, and with this address signal, the zero point and sensitivity correction values in the memory circuit 1as1b are read out, and corrections are made based on the correction values read out in this way. circuit 3
.. In No. 4, a method of correcting the weighing signal of the measuring instrument 5 was carried out.

しかしながら、この方法では、記憶回路1as1bに記
憶させた補正ii¥iJ定装置の同装置子の変更などを
行なった場合には、再び温度試験を行なって温度変化に
対応した補正値を検出して記憶回路1a11bに記憶さ
せなおさなければならないため、非常に煩雑であった。
However, in this method, if the correction device stored in the storage circuit 1as1b is changed, the temperature test is performed again to detect the correction value corresponding to the temperature change. It was very complicated because it had to be stored again in the memory circuit 1a11b.

本発明は上記の欠点を改めた測定装置を提供することを
目的としている。
The object of the invention is to provide a measuring device which overcomes the above-mentioned drawbacks.

以下、図面に基いて本発明の詳細な説明する。Hereinafter, the present invention will be explained in detail based on the drawings.

第2図は本発明を重量測定装置に適用した一実施例を示
すブロック図である。
FIG. 2 is a block diagram showing an embodiment in which the present invention is applied to a weight measuring device.

同図において11は秤量皿、12は秤量皿11に供給さ
れた被計量物の重量に対応した計量信号を出力する計量
器、13は計量信号をディジタル値に変換するA/D変
換器、14は秤量皿11を空の状態にしたときのA/D
変換器13の出力をホールドする零点ホールド回路、1
5は秤量皿11に被計量物をのせたときのA/D変換器
13の出力から零点ホールド回路14にホールドされた
値を減算する減算器、16は基準分銅17の真の重量が
設定される基準量設定器、18は基準置設6あ16゜オ
さゎ、l準重誓紳、111準分銅17をのせた時の前記
減算器15の出力値で除算する除算器、19は除算器1
8の出力値(乗算率)をホールドする感度ホールド回路
、20は秤量皿11に被計量物をのせた時の減算器15
の出力値に前記感度ホールド回路19にホールドされた
乗算率を乗算して出力する乗算器、21は基準分銅17
を駆動して秤量皿11にのせる基準分銅駆動装置、22
は環境温度を検出して温度に対応した信号を出力する温
度センサ、23は温度センサ22からの温度信号を受け
、予め設定された温度変化(例えば1℃)ごとにタイミ
ング信号TMl  (秤量皿11を空にしたとき)、T
M2  (秤量皿11に基準分銅17を乗せたとき)を
、TM、を零点ホールド回路14に、’f’M、を基準
分銅駆動装置21及び除算器18へ出力するタイミング
発生回路である。この二つのタイミング信号TMl、T
M、が遅わて出力さ力Z、。
In the figure, 11 is a weighing pan, 12 is a weighing device that outputs a weighing signal corresponding to the weight of the object to be weighed supplied to the weighing pan 11, 13 is an A/D converter that converts the weighing signal into a digital value, and 14 is the A/D when the weighing pan 11 is empty.
Zero point hold circuit for holding the output of the converter 13, 1
5 is a subtractor for subtracting the value held in the zero point hold circuit 14 from the output of the A/D converter 13 when the object to be weighed is placed on the weighing pan 11; and 16 is a subtracter in which the true weight of the reference weight 17 is set. 18 is a reference setting device 6, 16 degrees, l semi-heavy weight, 111 is a divider that divides by the output value of the subtractor 15 when the semi-weight 17 is placed on it, 19 is a division Vessel 1
8 is a sensitivity hold circuit that holds the output value (multiplication rate); 20 is a subtractor 15 when the object to be weighed is placed on the weighing pan 11;
A multiplier that multiplies the output value by the multiplication factor held in the sensitivity hold circuit 19 and outputs the result; 21 is a reference weight 17;
a reference weight driving device 22 for driving and placing the reference weight on the weighing pan 11;
23 is a temperature sensor that detects the environmental temperature and outputs a signal corresponding to the temperature; 23 receives a temperature signal from the temperature sensor 22, and sends a timing signal TMl (weighing pan 11 ), T
This is a timing generation circuit that outputs M2 (when the reference weight 17 is placed on the weighing pan 11), TM to the zero point hold circuit 14, and 'f'M to the reference weight drive device 21 and the divider 18. These two timing signals TMl, T
M, outputs force Z, with a delay.

次に上記実施例の動作を説明する。Next, the operation of the above embodiment will be explained.

まず秤量皿11を空にした状態でのA/Di換器13の
出力値を零点ホールド回路14にホールドさせる。次に
基準分銅駆動装置21によって基準分銅17を空の秤量
皿11にのせて、このときのA/D変換器13の出力値
から零点ホールド回路14にホールドされた値で減算し
た減算器15の出力値(即ち基準分銅17の計量実測値
)を除算器18に入力して、基準量設定器16から出力
される基準重量をこの減算器15の出力値で除算し、除
算結果を感度ホールド回路19にホールドさせる。この
ようにして初めに零点およびg度をセットした後、被計
量物の通常の計量動作を行なう。
First, the output value of the A/Di converter 13 with the weighing pan 11 empty is held in the zero point hold circuit 14. Next, the reference weight drive device 21 places the reference weight 17 on the empty weighing pan 11, and the subtracter 15 subtracts the value held in the zero point hold circuit 14 from the output value of the A/D converter 13 at this time. The output value (that is, the measured value of the reference weight 17) is input to the divider 18, the reference weight output from the reference amount setter 16 is divided by the output value of the subtracter 15, and the division result is sent to the sensitivity hold circuit. Let 19 hold. After first setting the zero point and g degrees in this way, the normal weighing operation of the object to be weighed is performed.

即ち、秤量皿11に被計量物を・のせると計量器12か
らの計量信号はA / D変換器13を経て減算器15
で零点ホールド回路14のホールド値で減算されて零点
補正され、さらに乗算器20で感度ホールド回路19に
ホールドされた乗算率が乗算されて感度補圧されて出力
される。この計量動作を継続中に温度センサ22は温度
に化を監視しており、温度が所定温度(例えは1℃)変
化しない間はタイミング発生回路23からタイミング信
号は出力されないので、零点ホールド回路14及び感度
ホールド回路19にホールドさt]た値は変化ゼす、同
一の補正値でtll正が繰!ll近される。そして、温
度センサ22が用足の温度変化を栓用するとタイミング
発生回路23からまずジイミングイ5−号TM、が零点
ホールド回路14に出力され、前記と同様に秤量皿11
が空になったときにA/D変換器13の8“3カ佃が以
前のホールド佃の代りにホールドされる。次に基べt分
銅17が秤し′皿11に乗せられるとタイミング発生回
路23からタイミング信号TM2か基準分銅駆動装置2
1及び除算器18へ出力される。この/こめ、11.準
分銅駆動装謳−21が作動して基準分銅17力秤t゛1
皿11にのぜられ、前記と同様に減邊器15のは′、力
値が除p器18に入力して除L・器18て新たな乗)L
率が得らtll この新しい乗算率が以m:Jのボール
ドfa2の代シに厄、度ホールド回鯖19にオールドさ
れる。
That is, when an object to be weighed is placed on the weighing pan 11, the weighing signal from the weighing device 12 is sent to the subtracter 15 via the A/D converter 13.
The value is subtracted by the hold value of the zero point hold circuit 14 for zero point correction, and further multiplied by the multiplication factor held in the sensitivity hold circuit 19 by the multiplier 20 to compensate for the sensitivity and output. While this metering operation continues, the temperature sensor 22 monitors the temperature change, and the timing signal is not output from the timing generation circuit 23 while the temperature does not change by a predetermined temperature (for example, 1°C), so the zero point hold circuit 14 And the value held in the sensitivity hold circuit 19 will change, and the same correction value will be positive again! ll be approached. Then, when the temperature sensor 22 detects a change in the temperature of the foot, the timing generation circuit 23 first outputs the timing signal No. 5-TM to the zero point hold circuit 14, and the weighing pan 11
When the weight is empty, the 8"3 weight of the A/D converter 13 is held in place of the previous hold weight. Next, when the base weight 17 is placed on the weighing pan 11, timing is generated. Timing signal TM2 or reference weight driver 2 from circuit 23
1 and output to the divider 18. This/kome, 11. The semi-weight drive device-21 operates and the reference weight 17 force scale t゛1
The force value is input to the divider 18 and divided by L.
This new multiplication factor is then changed to the bold fa2 of m:J, and is old to the degree hold turn 19.

そして、その後の計量動作にコ。・いで、この新たにホ
ールドさtた零点及び感度の袖正佃で補正が継続される
。そして、同様に所定の温度変化が生じるごとに零点ホ
ールド値ならびに感度ホールド値の更新が自動的に行な
われ、それに基いて補正が行なわれる。
And then there's the weighing operation.・The correction is then continued using this newly held zero point and sensitivity. Similarly, each time a predetermined temperature change occurs, the zero point hold value and the sensitivity hold value are automatically updated, and correction is performed based thereon.

第3図は本発明の他の実施例を示したブロック図である
。本実施例は第2図の回路と異なって、感度ホールドを
秤量皿11に被計量物をのせたままさらに基準分銅をの
せてもできるようにしたもので、秤量皿11に被計量物
がのっている場合のMB器15の出力値をホールドする
測定値ホールド回路24と、秤量皿11に前記被計量物
とともに基準分銅17をさらにのせた場合の減算器15
の出力値から前記画定値ホールド回路24のホールド値
を減算して除算器18に出力する減算器25とか付加さ
れた点だけが異なる。
FIG. 3 is a block diagram showing another embodiment of the present invention. This embodiment differs from the circuit shown in FIG. 2 in that the sensitivity can be held by placing the reference weight on the weighing pan 11 with the object to be weighed. A measured value hold circuit 24 holds the output value of the MB unit 15 when the object is weighed, and a subtracter 15 when the reference weight 17 is further placed on the weighing pan 11 together with the object to be measured.
The only difference is that a subtracter 25 is added which subtracts the hold value of the defined value hold circuit 24 from the output value of and outputs the result to the divider 18.

即ち、測定値ホールド回路24には秤量皿11に被計量
物がのっているときの減’X器15の出力値がホールド
され、次にさらに基準分銅17を追加したときの減算器
15の出力から、この測定値ホールド回路240ホール
ド値を@算した(+11を除算器18に入力して乗算率
を感度ホールド回路19にホールドするものであって、
その後温度変化に応じて零点及び感度を更新することは
第2図の実施例と同様である。
That is, the measured value hold circuit 24 holds the output value of the subtractor 15 when the object to be weighed is placed on the weighing pan 11, and then holds the output value of the subtracter 15 when the reference weight 17 is further added. From the output, the hold value of this measured value hold circuit 240 is calculated (+11 is input to the divider 18 and the multiplication rate is held in the sensitivity hold circuit 19,
Thereafter, updating the zero point and sensitivity according to temperature changes is similar to the embodiment shown in FIG. 2.

なお、上記実施例では本発明を重量測定装置に適用した
例についで述べたが、不発明は単に重量測定装置に限定
さするものではなく、例えは長さ、あるいは流量などの
測定装置についても、こjを適用し得るものである。
In addition, although the above embodiment describes an example in which the present invention is applied to a weight measuring device, the invention is not limited to just a weight measuring device, and may also be applied to a device for measuring length or flow rate. , this j can be applied.

以上の説明から明らかな如く、本発明の測定装置では、
温度変化を感知してこの温度変化時にタイミング信号を
出力して補正値を更新するようにしグこので、測定値の
変動の最も大きな原因である温度変化に速応して補正が
でき、測定誤差の少ない測定が可能となる。
As is clear from the above explanation, in the measuring device of the present invention,
The system detects temperature changes and outputs a timing signal when the temperature changes to update the correction value.This allows correction to be made quickly in response to temperature changes, which are the largest cause of fluctuations in measured values, and reduces measurement errors. This makes it possible to perform measurements with fewer errors.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の1蓋測定装置の一例を示すブロック図、
第2図は本発明の一実施例を示すブロック図、第3図は
不発明の他の実施例を示すブロック図でおる。 ia、lb・・・・・・記憶回路、11・・・・・・秤
量皿、12・・・・・・計量器、14・・・・・・零点
ホールド回路、15・・・・1・減算器、16・・・・
・・基準量設定器、17・・・・・・基準分銅、18・
・・・・・除算器、19・・・・・感度ホールド回路、
20・・・・・・乗算器、21・・・・・・基準分銅駆
動装置、22・・・・・・温度センサ、23・・・・・
・タイミング発生回路。 特許 出 願人  安立電気株式会社 代理人 弁理士  早 川 誠 志
FIG. 1 is a block diagram showing an example of a conventional one-lid measuring device.
FIG. 2 is a block diagram showing one embodiment of the present invention, and FIG. 3 is a block diagram showing another embodiment of the invention. ia, lb... Memory circuit, 11... Weighing pan, 12... Measuring instrument, 14... Zero point hold circuit, 15... 1. Subtractor, 16...
...Reference amount setting device, 17...Reference weight, 18.
...divider, 19...sensitivity hold circuit,
20... Multiplier, 21... Reference weight drive device, 22... Temperature sensor, 23...
・Timing generation circuit. Patent Applicant Anritsu Electric Co., Ltd. Agent Patent Attorney Makoto Hayakawa

Claims (1)

【特許請求の範囲】[Claims] 計測器よ多出力される計測信号を補正装置に記憶された
補正値に基いて補正して出力する測定装置において;前
記補正装置の前記補正値が、温度センサからめ温度信号
に基くタイミング発生回路のタイミング信号出力時に更
新されるようにしたことを特徴とする測定装置。
In a measuring device that corrects and outputs a measurement signal that is frequently output from a measuring device based on a correction value stored in a correction device; A measuring device characterized in that it is updated when a timing signal is output.
JP7729383A 1983-04-30 1983-04-30 Measuring apparatus Granted JPS59202031A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7729383A JPS59202031A (en) 1983-04-30 1983-04-30 Measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7729383A JPS59202031A (en) 1983-04-30 1983-04-30 Measuring apparatus

Publications (2)

Publication Number Publication Date
JPS59202031A true JPS59202031A (en) 1984-11-15
JPH0224450B2 JPH0224450B2 (en) 1990-05-29

Family

ID=13629828

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7729383A Granted JPS59202031A (en) 1983-04-30 1983-04-30 Measuring apparatus

Country Status (1)

Country Link
JP (1) JPS59202031A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6013223A (en) * 1983-07-01 1985-01-23 Shimadzu Corp Electronic balance
JPS62280623A (en) * 1986-05-23 1987-12-05 メトラー トレド アーゲー Automatic calibrating method of high-sensitivity electronic balance
CN103017877A (en) * 2011-09-21 2013-04-03 株式会社百利达 Weight measuring device
JP2013079935A (en) * 2011-09-21 2013-05-02 Tanita Corp Weight measurement device
JP2014178263A (en) * 2013-03-15 2014-09-25 Ishida Co Ltd Combination weighing apparatus
JP2017181097A (en) * 2016-03-28 2017-10-05 アンリツインフィビス株式会社 Weighing apparatus
JP2020094929A (en) * 2018-12-13 2020-06-18 アンリツインフィビス株式会社 Article inspection device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5369669A (en) * 1976-12-02 1978-06-21 Kamacho Seiko Kk Calibration means for span in load cell weighing machine

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5369669A (en) * 1976-12-02 1978-06-21 Kamacho Seiko Kk Calibration means for span in load cell weighing machine

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6013223A (en) * 1983-07-01 1985-01-23 Shimadzu Corp Electronic balance
JPH0349052B2 (en) * 1983-07-01 1991-07-26 Shimadzu Corp
JPS62280623A (en) * 1986-05-23 1987-12-05 メトラー トレド アーゲー Automatic calibrating method of high-sensitivity electronic balance
CN103017877A (en) * 2011-09-21 2013-04-03 株式会社百利达 Weight measuring device
JP2013079935A (en) * 2011-09-21 2013-05-02 Tanita Corp Weight measurement device
JP2014178263A (en) * 2013-03-15 2014-09-25 Ishida Co Ltd Combination weighing apparatus
JP2017181097A (en) * 2016-03-28 2017-10-05 アンリツインフィビス株式会社 Weighing apparatus
JP2020094929A (en) * 2018-12-13 2020-06-18 アンリツインフィビス株式会社 Article inspection device

Also Published As

Publication number Publication date
JPH0224450B2 (en) 1990-05-29

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