JPS59195838A - Processing tube device - Google Patents

Processing tube device

Info

Publication number
JPS59195838A
JPS59195838A JP7044083A JP7044083A JPS59195838A JP S59195838 A JPS59195838 A JP S59195838A JP 7044083 A JP7044083 A JP 7044083A JP 7044083 A JP7044083 A JP 7044083A JP S59195838 A JPS59195838 A JP S59195838A
Authority
JP
Japan
Prior art keywords
carrier
process tube
wafer
tube
semiconductor wafer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7044083A
Other languages
Japanese (ja)
Inventor
Yoshio Izawa
井沢 芳夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP7044083A priority Critical patent/JPS59195838A/en
Publication of JPS59195838A publication Critical patent/JPS59195838A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67784Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations using air tracks

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)

Abstract

PURPOSE:To enable the automation of all processes carried out in the device as well as the interlocking operation with other manufacturing processes by providing a transporting device for carrying in semiconductor wafers, a flat wafer path surface, a carrier gas injection path, a reactive gas introducing pipe, a heater and a transporting device for transporting and containing the semiconductor wafers after the treatment. CONSTITUTION:A semiconductor wafer 1 to be treated is transferred on a belt conveyor 18 from a carrier 2 by use of an usual feeder and is introduced in an entrance of a processing tube 11. The semiconductor wafer 1 introduced in the processing tube 11 is transported toward an exit gradually by the carrier gas such as nitrogen gas or argon gas which is injected from carrier gas injection pathes 14... whereas the wafer is subjected to the predetermined treatment such as impurity diffusion by the reactive gas introduced from a reactive gas introducing pipe 15. Thus, the semiconductor wafer 1 transported to the exit of the processing tube 11 after the predetermined treatment is carried to a carrier 2' by a belt conveyor and is contained in the carrier 2' by an usual means.

Description

【発明の詳細な説明】 〔発明の技術分野〕 本発明は半導体装置を製造する際、半導体ウェハーに不
純物拡散や熱酸化を施すためのプロセスチューブ装置に
関する。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to a process tube apparatus for performing impurity diffusion and thermal oxidation on semiconductor wafers when manufacturing semiconductor devices.

〔発明の技術的背景〕[Technical background of the invention]

半導体装置の製造には、半導体ウェハー中に不純物を熱
拡散する工程および半導体ウェハー表面金熱酸化する工
程が含まれる。これらの工程は、従来第1図に示すよう
にプロセスチューブ装置を用いて行なわれている。
The manufacture of semiconductor devices includes the steps of thermally diffusing impurities into the semiconductor wafer and thermally oxidizing the surface of the semiconductor wafer with gold. These steps have conventionally been carried out using a process tube apparatus as shown in FIG.

まず、処理されるべき半導体ウェハー1は、キャリア2
内に収納された状態で準備される。
First, a semiconductor wafer 1 to be processed is placed on a carrier 2
It is prepared while being stored inside.

そして、半導体ウェハー1は石英ボート3上に数十〜数
百枚を立設した状態で移し替えられる。
Then, the semiconductor wafers 1 are transferred onto the quartz boat 3 in a state where tens to hundreds of wafers are stood upright.

こnら石英デート3上に立設された半導体ウニハート・
・は、この状態で同時にプロセスチューブ装置j内に導
入され、所定の処理を施される。
Semiconductor sea urchin heart built on quartz date 3
.are simultaneously introduced into the process tube device j in this state and subjected to a predetermined treatment.

従来のプロセスチー−ブ装置4は、図示のよウVCVf
tft形の石英管からなるグロセスチューには反応ガス
導入管8が連結されている。そして、例えば不純物ガス
等全反応ガス導入管8がら導入しながら、半導体ウェハ
ー1・・・を石英ボート3上に立設した状態でプロセス
チューブ5内に一定速度で挿入し、チューブ5の中心部
で数十分放置した後、再び一定速度で挿入口まで引き出
すことによって不純物拡散等の所定の処理が行なわ肛て
いた。
The conventional process team device 4 has a VCVf as shown in the figure.
A reaction gas introduction pipe 8 is connected to a gross tube made of a TFT-shaped quartz tube. Then, while introducing all reaction gases such as impurity gases through the inlet tube 8, the semiconductor wafers 1 are inserted into the process tube 5 at a constant speed while standing upright on the quartz boat 3, and the center of the tube 5 is After leaving it for several minutes, it was pulled out again at a constant speed to the insertion port to perform predetermined processes such as diffusion of impurities.

上記従来のプロセスチューブ装j44 Kよル処理方法
は、所謂バッチ処理と呼ばれている。
The above-mentioned conventional processing tube processing method is called batch processing.

〔背景技術の問題点〕[Problems with background technology]

上述のように、従来のプロセスチューブ装置ではバッチ
処理を行なわなければならないため、プロセスチューブ
装置での処理を全自動化するのが困蕗で、またコスト高
であるという問題があった。
As mentioned above, since the conventional process tube apparatus requires batch processing, it is difficult to fully automate the processing in the process tube apparatus, and there are problems in that the cost is high.

他方、半導体装置を製造する隙の他の製造工程は、その
殆どが半導体ウェハー1をキャリア2から直接ラインに
乗せて流し、他の収ぶ匈キャリアに収Akされる間に所
定の処Fl施す方式、月IJち、所謂キャリア・ツー・
キャリア方式で行なわれている。従って、バッチ処理方
式を行なわなければならない従来のプロセスチューブ装
置を用いて不純物拡散等の処理を行なうと、他の製造工
程との結合乃至連動が困難で、プロセスチューブでの処
理工程を独立して行なわざるf:得々いといった問題が
あった。
On the other hand, in most of the other manufacturing processes for manufacturing semiconductor devices, the semiconductor wafer 1 is directly placed on the line from the carrier 2, and the predetermined treatment is performed while it is being collected in another carrier. Method, monthly IJ, so-called career-to-career
This is done in a carrier format. Therefore, if processes such as impurity diffusion are performed using conventional process tube equipment that requires batch processing, it is difficult to combine or link with other manufacturing processes, and the process tube process must be performed independently. There was a problem with not doing it.

〔発明の目的〕[Purpose of the invention]

本発明は上記事情に鑑みてなさtたもので、不純物拡散
や熱酸化等、半導体装置全製造する際ニプロセスチーー
ブ装置内で行なわれる工程の全自動化を可能とし、更に
他の製造工程との連動化全も可能とするプロセスチー−
ブ装置を提供するものである。
The present invention has been made in view of the above circumstances, and enables full automation of processes such as impurity diffusion and thermal oxidation, which are performed in a two-process team when manufacturing semiconductor devices, as well as other manufacturing processes. A process team that enables full coordination with
The purpose of this project is to provide a

〔発明の概要〕[Summary of the invention]

本発明によるプロセスチー−ブ装置は、処理されるべき
半導体ウェハーを収納しているキャリアから半導体ウェ
ハーを略水平に配設されたプロセスチューブ入口内に搬
入する搬送機と、前記略水平に配設されたプロセスナー
ーブの下方内壁に形成された平らなウェハー通路面と、
該ウェハー通路面に開口して形成され、プロセスチュー
ブ出口方向に斜めにキャリアガスを噴、出することによ
りプロセスチー−ブ入口からプロセスチー−ブ出口まで
半導体ウェハーを搬送するためのキャリアガス噴出路と
、半導体ウェハーに所定の処理を施すために前記プロセ
スチューブ内に反応ガスを導入する反応ガス導入管と、
前記プロセスナーーブを所定の温度に加熱するためのヒ
ータと、前記プロセスチューブの出口から処理済みの半
導体ウェハーをキャリア内に搬送収納する搬送機とを具
備したことを特徴とするものである。
A process tube apparatus according to the present invention includes a carrier for carrying semiconductor wafers from a carrier containing semiconductor wafers to be processed into an inlet of a process tube disposed substantially horizontally, and a flat wafer passage surface formed on the lower inner wall of the process nave;
A carrier gas jetting path is formed to be open on the wafer passage surface and transports the semiconductor wafer from the process tube inlet to the process tube exit by jetting and ejecting carrier gas obliquely toward the process tube exit. and a reaction gas introduction tube for introducing a reaction gas into the process tube in order to perform a predetermined process on the semiconductor wafer;
The present invention is characterized by comprising a heater for heating the process nave to a predetermined temperature, and a conveyor for conveying and storing the processed semiconductor wafer from the outlet of the process tube into a carrier.

ゾロセスチューブ装置内では1ooo℃前後の高温で所
定の処理が行なわれるため、プロセスチーーブ内で半導
体ウェハーを搬送するために、例えばベルトコンベアー
等の通常の搬送手段を用いることはできない。これが、
従来のプロセスチーブ装置をバッチ処理方式として構成
しなければならなかった主な理由の−っである。
Because predetermined processing is carried out at a high temperature of around 100° C. within the Zorocess tube apparatus, ordinary conveyance means such as a belt conveyor cannot be used to convey the semiconductor wafer within the process chamber. This is,
This is the main reason why conventional process processing equipment had to be configured as a batch processing system.

本発明ではプロセスチューブ内面に平らなウェハー通路
を設けると共に、該通路面からキャリアガスを噴出させ
ることにより半導体ウェハーのプロセスチューブ内での
搬送を可能としたもので、これによってキャリア・ツー
・キャリア方式のプロセスチューブラ構成したものであ
る。
In the present invention, a flat wafer passage is provided on the inner surface of the process tube, and carrier gas is ejected from the passage surface, thereby making it possible to transport semiconductor wafers within the process tube. This is a process tubular structure.

彦お、当然ながら本発明におけるキャリアガースとして
は、窒素ガス、アルゴン等の不活性ガスのように化学的
に不活性なガスを用いなければならない。
Hiko, of course, as the carrier gas in the present invention, a chemically inert gas such as nitrogen gas or inert gas such as argon must be used.

〔発明の実施例〕[Embodiments of the invention]

以下、第2図を参照して本発明の一実施例を酸1明する
Hereinafter, one embodiment of the present invention will be explained with reference to FIG.

第1図は本発明の一実施例になるプロセスチューブ装置
の説明図である。同図において、11は略水平に配設さ
れた石英製のプロセスチー−ブである。該グロセスチー
ーブ11は断面正方形に形成されており、下方の平らな
内面はウェハー通路12を形成している。プロセスチュ
ーブLユにはキャリアガス導入管13が連結され、該キ
ャリアガス導入管13はプロセスチューブ11の底壁に
多数設けられたキャリアガス噴出路14・・・に連通さ
れている。このキャリアガス噴出路はウェハー通路12
に開口し、プo セ、X チューブ11の出口方向に向
けて斜めに形成されている。また、プロセスチューブ1
ノには反応ガス導入管15が連結され、該導入管15に
連通した反応ガス導入路16がプロセスチーブLユの土
壁内面K 1ji1口して形成さ扛ている。更に、プロ
セスチューブ11の出口にはガス排出管17が設けられ
ている。そして、プOセスfユーブ7ユの外01llV
Cは、従来のプロセスチー−プ装置同様、図示しないラ
イニング管およびヒータが設けられている。他方、プロ
セスチー−プ11の入口1!lにはベルトコンベア18
が配設され、出口側にはベルトコンベア19が配設され
ている。
FIG. 1 is an explanatory diagram of a process tube device according to an embodiment of the present invention. In the figure, reference numeral 11 indicates a process cube made of quartz and arranged substantially horizontally. The gloss tube 11 has a square cross section, and its lower, flat inner surface forms a wafer passageway 12. A carrier gas introduction pipe 13 is connected to the process tube L, and the carrier gas introduction pipe 13 communicates with a large number of carrier gas ejection passages 14 provided on the bottom wall of the process tube 11. This carrier gas ejection path is the wafer path 12.
The tube 11 is opened at an angle and is formed obliquely toward the exit direction of the tube 11. Also, process tube 1
A reaction gas introduction pipe 15 is connected to the reaction gas introduction pipe 15, and a reaction gas introduction passage 16 communicating with the introduction pipe 15 is formed on the inner surface K1ji of the clay wall of the process chamber L. Furthermore, a gas exhaust pipe 17 is provided at the outlet of the process tube 11. And outside of the puss f u b 7 u
C is provided with a lining pipe and a heater (not shown), as in the conventional process cheap apparatus. On the other hand, entrance 1 of process team 11! Belt conveyor 18 on l
is provided, and a belt conveyor 19 is provided on the exit side.

上記構成からなるプロセスチー−ブ装置により所定の処
理を行なうに際しては、処理さるべき半導体ウェハー1
をキャリア2から通常のフィーダを用いてベルトコンベ
ア18上に移し、該ベルトコンベア18によってプロセ
スチューブ±Jの入口に導入する。グロセスチューブL
ユ内に導入された半導体ウエノ・−1はキャリアガス噴
出路14・・・から噴出された窒素ガス。
When performing a predetermined process using the process team apparatus having the above configuration, the semiconductor wafer to be processed 1
is transferred from the carrier 2 onto the belt conveyor 18 using a conventional feeder, and introduced by the belt conveyor 18 into the inlet of the process tube ±J. gross tube L
The semiconductor Ueno-1 introduced into the chamber is nitrogen gas ejected from the carrier gas ejection passage 14.

アルゴンガス等のキャリアガスによって順次出口方向に
搬送され、その間に反応ガス導入管15から導入された
反応ガスによって不純物拡散等の所定の処理を施こされ
る。こうして所定の処理を受けてプロセスチューブLユ
の出口に搬送された半導体ウェハー1′は、ベルトコン
ベア19によってキャリア2′まで運ばれ、通常の手段
によりキャリア2′内に収納される。
It is sequentially transported toward the exit by a carrier gas such as argon gas, and during that time, a predetermined process such as impurity diffusion is performed by the reaction gas introduced from the reaction gas introduction pipe 15. Semiconductor wafer 1', which has thus been subjected to predetermined processing and transported to the exit of process tube L, is carried by belt conveyor 19 to carrier 2', and is housed in carrier 2' by conventional means.

上述のように、この実施例のプロセスチーブ装置によれ
ば、従来のようなパッチ処理方式ではなく、所謂キャリ
ア・ツー・キャリア方式で半導体ウェハーIK不純物拡
散や熱酸化等の所定の処理を行なうことができる。従っ
て、プロセスチー−ブ装置LLでの処理を全自動化する
ことが可能となり、キャリア・ツー・キャリア方式で行
なわれている他のJ!!造工程との結合も容易となる。
As described above, according to the process chip apparatus of this embodiment, predetermined processes such as semiconductor wafer IK impurity diffusion and thermal oxidation can be performed using a so-called carrier-to-carrier method rather than a conventional patch processing method. I can do it. Therefore, it is possible to fully automate the processing in the Process Cheeve equipment LL, unlike other J! ! It also facilitates integration with the manufacturing process.

この結果、半導体装置の全製造工8を通した自動化の実
現にも大きく寄与することができる。
As a result, it is possible to greatly contribute to the realization of automation throughout the entire manufacturing process 8 of semiconductor devices.

〔発明の一ケ果〕[A fruit of invention]

以上詳述したように、本発明によればキャリア・ツー・
キャリア方式による全自動化および他の製造工程との連
続化も可能なプロセスチー−プ装置を提供できるもので
ある。
As detailed above, according to the present invention, carrier-to-carrier
It is possible to provide a process-cheap device that can be fully automated using a carrier method and can be connected continuously with other manufacturing processes.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来のプロセスチューブ装置へおよびこれを用
いた処理形Mを示す説明図、第2図は本発明の一実施例
になるプロセスチューブ装置とこれを用いた半導体ウェ
ハーの処理形態を示す説明図である。 L」・・・プロセスチューブ、12・・・ウェハー通路
、13・・・キャリアガス導入管、14・・・キャリア
ガス噴出管、15・・・反応ガス導入管、16・・・反
応ガス導入路、17・・・ガス排出管、18゜19・・
・ベルトコンベア。
FIG. 1 is an explanatory diagram showing a conventional process tube apparatus and a processing type M using the same, and FIG. 2 shows a process tube apparatus according to an embodiment of the present invention and a processing form of semiconductor wafers using the same. It is an explanatory diagram. L"...Process tube, 12...Wafer passage, 13...Carrier gas introduction tube, 14...Carrier gas ejection tube, 15...Reaction gas introduction tube, 16...Reaction gas introduction path , 17... Gas exhaust pipe, 18° 19...
·belt conveyor.

Claims (1)

【特許請求の範囲】[Claims] 処理されるべき半導体ウェハーを収納しているキャリア
から半導体ウェハーを略水平に配設されたプロセスチュ
ーブ入口内に搬入する搬送機と、前記略水平に配設され
たプロセスチューブの下方内壁に形成された平ら々ウェ
ハー通路面と、該ウェハー通路面に開口して形成され、
プロセスチューブ出口方向に斜めにキャリアガス’1 
噴出することによりプロセスチューブ入口からプロセス
チューブ出口まで半導体ウェハーを搬送するためのキャ
リアガス唄出路と、半導体ウェハーに所定の処理を施す
ために前記7°ロセスチユーブ内に反応ガスを導入する
反応ガス導入管と、前記プロセスチューブを所定の温度
に加熱するためのヒータと、前記プロセスチューブの出
口から処理済みの半導体ウェハーをキャリア内に搬送収
納する搬送機とを具備したことを3特、徴と・する、プ
ロセスチー−ブ装置。
a carrier for transporting semiconductor wafers from a carrier containing semiconductor wafers to be processed into an inlet of a process tube disposed approximately horizontally; a flat wafer passage surface; and an opening formed in the wafer passage surface;
Carrier gas '1 diagonally towards the process tube exit direction.
A carrier gas outlet path for transporting the semiconductor wafer from the process tube inlet to the process tube outlet by jetting it out, and a reaction gas introduction pipe for introducing the reaction gas into the 7° process tube to perform a predetermined process on the semiconductor wafer. and a heater for heating the process tube to a predetermined temperature, and a conveyor for conveying and storing the processed semiconductor wafer from the outlet of the process tube into a carrier. , process team equipment.
JP7044083A 1983-04-21 1983-04-21 Processing tube device Pending JPS59195838A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7044083A JPS59195838A (en) 1983-04-21 1983-04-21 Processing tube device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7044083A JPS59195838A (en) 1983-04-21 1983-04-21 Processing tube device

Publications (1)

Publication Number Publication Date
JPS59195838A true JPS59195838A (en) 1984-11-07

Family

ID=13431548

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7044083A Pending JPS59195838A (en) 1983-04-21 1983-04-21 Processing tube device

Country Status (1)

Country Link
JP (1) JPS59195838A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1994014191A1 (en) * 1992-12-14 1994-06-23 Ebara Corporation System for transferring wafer

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1994014191A1 (en) * 1992-12-14 1994-06-23 Ebara Corporation System for transferring wafer
US5515618A (en) * 1992-12-14 1996-05-14 Ebara Corporation Substrate transportation system

Similar Documents

Publication Publication Date Title
DE10296988T5 (en) Processing device and method
JP4308975B2 (en) Substrate processing apparatus, substrate processing method, and semiconductor element forming method
JPS59195838A (en) Processing tube device
JPS62279642A (en) Method for heat treatment of wafer
JPS63244734A (en) Oxidation and diffusion device
JPH0110927Y2 (en)
JPH05226455A (en) Processing apparatus
KR200185285Y1 (en) Diffusion system use in manufacturing process semiconductor
JPS60211913A (en) Processing device
JPS58161317A (en) Semiconductor processor
JP3340147B2 (en) Processing equipment
JPH0237742A (en) Semiconductor device manufacturing equipment
JPS6379313A (en) Thermal processing apparatus
US3811826A (en) Diffusion furnace process tube
JPH02278719A (en) Processor of semiconductor
JP2000100733A (en) Method and equipment for manufacturing semi-conductor
JPH04245421A (en) Heat-treatment apparatus
JPS61198717A (en) Chemical vapor phase growth device
JPS61182218A (en) Treating method and device of wafer
JP2630318B2 (en) Heat treatment method and apparatus
JPH05234922A (en) Wafer heat treatment equipment and its method
JPH0438515Y2 (en)
JPS61239639A (en) Mounting/conveying boat for semiconductor substrate
JPS63241935A (en) Oxidation and cvd apparatus
JPH04163913A (en) Vertical type heat treat furnace