JPS59195740U - Leadless chip carrier test handler - Google Patents
Leadless chip carrier test handlerInfo
- Publication number
- JPS59195740U JPS59195740U JP9042783U JP9042783U JPS59195740U JP S59195740 U JPS59195740 U JP S59195740U JP 9042783 U JP9042783 U JP 9042783U JP 9042783 U JP9042783 U JP 9042783U JP S59195740 U JPS59195740 U JP S59195740U
- Authority
- JP
- Japan
- Prior art keywords
- chip carrier
- test handler
- carrier test
- leadless chip
- leadless
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は本考案のリードレスチップキャリヤテストハン
ドラーの斜視図、第２図はコンタクト位置の斜視図であ
る。
１・・・コンタクトブロック、２・・・不良品選別機、
３・・・ローダ、４・・・アンローダ−１５・・・リー
ドレスチップキャリヤ、６・・・搬送トレー、７・・・
低温風機、８・・・低高温槽、９・・・制御装置、１０
・・・チップキャリヤ位置検出フォトセンター、１１・
・・トレー送す機。FIG. 1 is a perspective view of the leadless chip carrier test handler of the present invention, and FIG. 2 is a perspective view of the contact position. 1... Contact block, 2... Defective product sorter,
3...Loader, 4...Unloader-15...Leadless chip carrier, 6...Transport tray, 7...
Low temperature air fan, 8...Low temperature tank, 9...Control device, 10
...Chip carrier position detection photo center, 11.
... Tray feeding machine.
Claims (1)
ク、不良品選別装置、低高温温度槽、デバイスを移動さ
せる搬送トレー、ならびに、それらを供給、収納するロ
ーダ−、アンローダ−よりなるチップキャリヤテストハ
ンドラーにおいて、前記デバイスを前記搬送トレーによ
り移動させる手段を設けたことを特徴とするリードレス
チップキャリヤテストハンドラー′。In the chip carrier test handler, which consists of a contact block that electrically connects to the device under test, a defective product sorter, a low/high temperature chamber, a transfer tray that moves the device, and a loader and unloader that supply and store them, A leadless chip carrier test handler' characterized in that it is provided with means for moving said device by said transport tray.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9042783U JPS59195740U (en) | 1983-06-15 | 1983-06-15 | Leadless chip carrier test handler |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9042783U JPS59195740U (en) | 1983-06-15 | 1983-06-15 | Leadless chip carrier test handler |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS59195740U true JPS59195740U (en) | 1984-12-26 |
Family
ID=30220349
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9042783U Pending JPS59195740U (en) | 1983-06-15 | 1983-06-15 | Leadless chip carrier test handler |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59195740U (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6254176A (en) * | 1985-09-02 | 1987-03-09 | Tabai Esupetsuku Kk | Continuous automatic environmental test equipment |
| JPS6282365A (en) * | 1985-10-07 | 1987-04-15 | Rohm Co Ltd | Measuring instrument for electronic component |
| JPH0232268A (en) * | 1988-07-22 | 1990-02-02 | Mitsubishi Electric Corp | Testing device for semiconductor device |
| JPH02138884A (en) * | 1988-11-18 | 1990-05-28 | Fujitsu Ltd | Handling system of component to be tested |
| JPH03158773A (en) * | 1989-09-22 | 1991-07-08 | Internatl Business Mach Corp <Ibm> | Device and method for testing electronic part |
| JP2022018113A (en) * | 2020-07-14 | 2022-01-26 | チーリン ユニバーシティー | Contact atmosphere mixing temperature change chamber, and temperature control method |
-
1983
- 1983-06-15 JP JP9042783U patent/JPS59195740U/en active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6254176A (en) * | 1985-09-02 | 1987-03-09 | Tabai Esupetsuku Kk | Continuous automatic environmental test equipment |
| JPS6282365A (en) * | 1985-10-07 | 1987-04-15 | Rohm Co Ltd | Measuring instrument for electronic component |
| JPH0232268A (en) * | 1988-07-22 | 1990-02-02 | Mitsubishi Electric Corp | Testing device for semiconductor device |
| JPH02138884A (en) * | 1988-11-18 | 1990-05-28 | Fujitsu Ltd | Handling system of component to be tested |
| JPH03158773A (en) * | 1989-09-22 | 1991-07-08 | Internatl Business Mach Corp <Ibm> | Device and method for testing electronic part |
| JP2022018113A (en) * | 2020-07-14 | 2022-01-26 | チーリン ユニバーシティー | Contact atmosphere mixing temperature change chamber, and temperature control method |
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