JPS59180668U - Magnetic particle flaw detection equipment - Google Patents
Magnetic particle flaw detection equipmentInfo
- Publication number
- JPS59180668U JPS59180668U JP7677883U JP7677883U JPS59180668U JP S59180668 U JPS59180668 U JP S59180668U JP 7677883 U JP7677883 U JP 7677883U JP 7677883 U JP7677883 U JP 7677883U JP S59180668 U JPS59180668 U JP S59180668U
- Authority
- JP
- Japan
- Prior art keywords
- flaw detection
- magnetic particle
- particle flaw
- detection equipment
- inspected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は従来の磁粉探傷装置の一例を示す概略正面図、
第２図は本考案の一実施例を示す概略正面図、第３図は
その側面図、第４図は要部を拡大して示す部分断面図で
ある。
−１１は被検査体、１２は磁化ヘッド、１３は圧締用シ
リンダ、１５は保持部、１６は電極、２８ ゛は
回転操作レバー取付穴。Figure 1 is a schematic front view showing an example of a conventional magnetic particle flaw detection device;
FIG. 2 is a schematic front view showing an embodiment of the present invention, FIG. 3 is a side view thereof, and FIG. 4 is a partially sectional view showing an enlarged main part. -11 is the object to be inspected, 12 is the magnetization head, 13 is the clamping cylinder, 15 is the holding part, 16 is the electrode, and 28 is the rotary operation lever mounting hole.
Claims (1)
の保持部に回転自在に保持し、この磁化ヘッドの被検査
体接触端面側に電極を設けて通電するようにするととも
に、その周部に回転操作部を設け、被検査体を回転させ
ながら探傷するように構成したことを特徴とする磁粉探
傷装置。A magnetization head to be clamped to both end surfaces of the object to be inspected is rotatably held in a holding part of a clamping device, and an electrode is provided on the end surface of the magnetization head that contacts the object to be inspected and is energized, 1. A magnetic particle flaw detection apparatus, characterized in that a rotation operation part is provided on the periphery of the magnetic particle flaw detection apparatus, and the flaw detection apparatus is configured to detect flaws while rotating an object to be inspected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7677883U JPS59180668U (en) | 1983-05-20 | 1983-05-20 | Magnetic particle flaw detection equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7677883U JPS59180668U (en) | 1983-05-20 | 1983-05-20 | Magnetic particle flaw detection equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS59180668U true JPS59180668U (en) | 1984-12-03 |
Family
ID=30206828
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7677883U Pending JPS59180668U (en) | 1983-05-20 | 1983-05-20 | Magnetic particle flaw detection equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59180668U (en) |
-
1983
- 1983-05-20 JP JP7677883U patent/JPS59180668U/en active Pending
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