JPS59177938U - Electron beam exposure equipment - Google Patents

Electron beam exposure equipment

Info

Publication number
JPS59177938U
JPS59177938U JP5396184U JP5396184U JPS59177938U JP S59177938 U JPS59177938 U JP S59177938U JP 5396184 U JP5396184 U JP 5396184U JP 5396184 U JP5396184 U JP 5396184U JP S59177938 U JPS59177938 U JP S59177938U
Authority
JP
Japan
Prior art keywords
electron beam
beam exposure
exposure equipment
exposure
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5396184U
Other languages
Japanese (ja)
Inventor
護 中筋
Original Assignee
株式会社東芝
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社東芝 filed Critical 株式会社東芝
Priority to JP5396184U priority Critical patent/JPS59177938U/en
Publication of JPS59177938U publication Critical patent/JPS59177938U/en
Pending legal-status Critical Current

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  • Electron Beam Exposure (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

図は本考案の一実施例を示す概略構成図である。 1・・・電子ビーム露光装置、5・・・試料室、7・・
・試   □料台、8・・・試料、9・・・Be箔(コ
ーティング)。
The figure is a schematic configuration diagram showing an embodiment of the present invention. 1... Electron beam exposure device, 5... Sample chamber, 7...
・Sample □Sample stand, 8...Sample, 9...Be foil (coating).

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 露光室内に設置された試料に電子ビーム発生源で発生さ
れた電子ビームを照射し、上記試料を露光する電子ビー
ム露光装置において、前記露光室の少くとも前記設置さ
れた試料の露光面に対向する面を、Beでコーティング
したことを特徴とする電子ビーム露光装置。
In an electron beam exposure apparatus that exposes a sample placed in an exposure chamber by irradiating an electron beam generated by an electron beam generation source to the sample, an electron beam exposure device that faces at least the exposure surface of the installed sample in the exposure chamber An electron beam exposure device characterized in that a surface thereof is coated with Be.
JP5396184U 1984-04-12 1984-04-12 Electron beam exposure equipment Pending JPS59177938U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5396184U JPS59177938U (en) 1984-04-12 1984-04-12 Electron beam exposure equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5396184U JPS59177938U (en) 1984-04-12 1984-04-12 Electron beam exposure equipment

Publications (1)

Publication Number Publication Date
JPS59177938U true JPS59177938U (en) 1984-11-28

Family

ID=30184310

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5396184U Pending JPS59177938U (en) 1984-04-12 1984-04-12 Electron beam exposure equipment

Country Status (1)

Country Link
JP (1) JPS59177938U (en)

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