JPS59175172U - 移動検査装置 - Google Patents

移動検査装置

Info

Publication number
JPS59175172U
JPS59175172U JP6851083U JP6851083U JPS59175172U JP S59175172 U JPS59175172 U JP S59175172U JP 6851083 U JP6851083 U JP 6851083U JP 6851083 U JP6851083 U JP 6851083U JP S59175172 U JPS59175172 U JP S59175172U
Authority
JP
Japan
Prior art keywords
mobile inspection
inspection equipment
subject
pair
inspection device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6851083U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0421102Y2 (enExample
Inventor
鋭 都築
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Heavy Industries Ltd
Original Assignee
Mitsubishi Heavy Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Heavy Industries Ltd filed Critical Mitsubishi Heavy Industries Ltd
Priority to JP6851083U priority Critical patent/JPS59175172U/ja
Publication of JPS59175172U publication Critical patent/JPS59175172U/ja
Application granted granted Critical
Publication of JPH0421102Y2 publication Critical patent/JPH0421102Y2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/044—Internal reflections (echoes), e.g. on walls or defects

Landscapes

  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP6851083U 1983-05-10 1983-05-10 移動検査装置 Granted JPS59175172U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6851083U JPS59175172U (ja) 1983-05-10 1983-05-10 移動検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6851083U JPS59175172U (ja) 1983-05-10 1983-05-10 移動検査装置

Publications (2)

Publication Number Publication Date
JPS59175172U true JPS59175172U (ja) 1984-11-22
JPH0421102Y2 JPH0421102Y2 (enExample) 1992-05-14

Family

ID=30198680

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6851083U Granted JPS59175172U (ja) 1983-05-10 1983-05-10 移動検査装置

Country Status (1)

Country Link
JP (1) JPS59175172U (enExample)

Also Published As

Publication number Publication date
JPH0421102Y2 (enExample) 1992-05-14

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