JPS59159665A - Inspecting device of output circuit unit - Google Patents

Abstract

PURPOSE:To shorten the inspecting time of an output circuit unit by generating a malfunction detecting pulse when the voltage across the terminal of the output circuit unit using a semiconductor switch element is the preset voltage or higher, and displaying through discriminating means. CONSTITUTION:Bias means 5 for applying a power source 7 is connected through signal inputting means 4 for applying an ON signal at the suitable timing and a suitable load 6 to an output circuit unit 1 having switch means 2 using a semiconductor switch element and its control circuit 3. The voltage across the terminal of the means 2 is applied to malfunction detecting means 9, which outputs a malfunction detection pulse when the input is the preset voltage or higher to set malfunction data set means 10. It is then read out by malfunction discriminating means 11 including a CPU, and displayed on a display unit. Accordingly, the malfunction of the operation of the switching means 2 can be automatically inspected, thereby remarkably shortening the inspecting time.

Description

DETAILED DESCRIPTION OF THE INVENTION [Technical Field] The present invention relates to an inspection device for an output circuit unit in which a switch means is formed using a semiconductor switch element.

[Background technology]

Conventionally, a semiconductor switch element such as a bidirectional convex terminal thyristor is used to form a switch means, and there has been an operational abnormality in which the switch means is turned off for only half a cycle within 20 to 30 cycles after the switch means is turned on. However, FIG. 1 shows the waveform of the voltage (2) across the switch means, and FIG. 1(b) shows the waveform at normal times. By the way, in the past, in order to inspect for such anomalies in power output, the waveform of the pressure (2) at both ends of the switch means was observed using an oscilloscope. The drawbacks were that inspections took a long time and errors were likely to occur.

[Purpose of the invention]

The present invention has been made in view of the above-mentioned problems, and an object of the present invention is to provide an apparatus for inspecting an output circuit unit that simplifies inspection work, reduces inspection time, and prevents inspection errors from occurring.

[Disclosure of the invention]

(Example) Figures 2 and 5 show an example of the present invention.
Reference numeral 1) is an output circuit unit, which includes a switching means (2) consisting of a power-on switch circuit using a semiconductor switching element such as a bidirectional 5-terminal thyristor, and a switching means (2) which is configured by an input control signal. 2) and a switch control circuit (3) for controlling the switch control circuit (3). Note that the switch means (2) may be of a hybrid type using a semiconductor switch element and a relay contact. (4) is an on control signal (Von
), (5) is a bias means for applying a power supply (7) to the switch means (2) of the output circuit unit (1) via a suitable load (6), and (8) is a signal input means for inputting This is a relay contact for controlling the J"l ear. When the on control signal (Von) is input to the output circuit unit (1) and the switch means (2) is turned on, the relay contact (8) is turned on. For example, the power source (7) is applied to the load (6) via the switch means (2).(9
) is an abnormality detection means that outputs an abnormality detection pulse when the voltage (v2) across the switch means (2) is higher than a preset voltage.
It consists of a zener diode (ZD), a photocoupler (PC), and a capacitor (C), and the diode bridge (DB) output is ) In the above case, the light emitting diode of the phototransistor (PC) lights up, the phototransistor turns on, and an abnormal noise detection pulse consisting of a negative pulse is output. nd is JK flip flop Otsubu (FF
) and a 5-state buffer (Ba), and the clear terminal is high for a preset period T (for example, 0.5 seconds) from the start of the oscillation control signal (Von), and the bell is opened. The abnormality detection means (
Abnormal data is set (Q is "H", Q is "L") at the falling edge of the abnormality detection pulse output from 9). Ql)
is an abnormality determining means that determines whether or not abnormal data is set in the abnormal data setting means Of), and is formed using the CPUU, and is The output circuit unit (1) is connected to an inspection unit (5) consisting of an abnormality detection means (9) and an abnormality data setting means α0, and the inspection results of the output circuit unit (1) are displayed on a display using an LED (
141. In the figure, u9 is a relay control unit that controls a bias control relay, etc., and Qd is an input changeover switch such as a power switch and an inspection start switch. In addition, in the embodiment, the ON control section of the signal input means (4) @(-
'JOn)'s output tie is controlled by the CPU α.

Now, when the output circuit unit (1) to be tested is attached to the socket of the test unit (3) and the test start switch is pressed, the relay contact (8) for bias control is turned on by a command from the CPU (2) and the output is output. Power (7) is applied to the switch means (2) of the circuit unit (1) via the load (6), and the abnormal data setting means aO is reset. Next, the ON control signal (Y
on) is output, the switch means (2) is turned on in the switch control circuit (3) of the output circuit unit (1), and the voltage (V2) across the switch means (2) becomes as shown in FIG. It becomes a waveform. Here, when the switch operation of the switch means (2) is performed normally as shown in FIG. (ZD) Zener voltage or less, no abnormality detection pulse is output, and the JK fritz flop (FF) of the abnormality data setting means 00
The output 6 remains at "H" level. On the other hand, if the switch operation of the switch means (2) becomes abnormal as shown in FIG. 〈When the diode bridge (DB) output becomes larger than the Zener voltage of the Zener diode (ZD), an abnormality detection pulse is output, and abnormal data is set in the JK Fritz Flora (FF). , output (Q)
becomes “L” level. After a predetermined time (T), the abnormal eta continuous output signal (
VR) is output, the abnormality data set in the JK flip float j (FF) of the abnormal data setting means 00 is read out, and if abnormal data is set, the number is displayed on the display (14). An LED indicating an operational abnormality is lit and displayed, and if no abnormal data has been set, an LED indicating a pass is lit and displayed. By the way, with the above inspection device, it is not possible to distinguish between a case where the switch means (2) does not operate at all and a case where an abnormal operation occurs only for the first half cycle as shown in FIG. 1(b). It is known that the above-mentioned malfunction at the initial stage of operation occurs within 0.4 seconds immediately after the operation in most cases, so it is necessary to determine whether the malfunction occurs again after 2 to 3 seconds, for example. A clear distinction will be made. In other words, if an abnormal operation is found in the initial inspection, and if an abnormal operation is also found in the re-inspection 2 to 3 seconds later, it is determined that the switch means (2) is not operating at all. be.

Figure 4 shows how to change the display on the display.
) is provided with a fitting tool @ that fits into the display window (14a) of the panel (A), and a mounting tool (C) that is fitted or screwed into the display window hole (C) of the panel (A) is provided at the other end; One end surface (20a) of the fiber cable network is shown in the LE in the display window (4a).
D 1. Opposite the other end surface (20b) to the panel (a)
It is exposed through the display window hole @ of the fiber cable ('→), and determines which display window (14a) of the display a< the fitting tool (21) at one end of the fiber cable ('→ By selecting this, the display content displayed on the end face (20b) of the fiber cable (A) exposed through the display window hole (C) can be arbitrarily selected. This makes it possible to easily change the display on the display (C14) without requiring a switching circuit and without being affected by the screen. It goes without saying that this method of changing the display of display α(4) can also be applied to other display devices.

〔Effect of the invention〕

As described above, the present invention provides signal input means for appropriately inputting an on control signal to a switch control circuit of an output circuit unit in which a switch means is formed using a semiconductor switch element, and an output circuit. bias means for applying power to the switch means of the circuit unit via an appropriate load; abnormality detection means for outputting an abnormality detection pulse when the voltage across the switch means is equal to or higher than a preset voltage; and a starting end of the on control signal. Abnormal data setting means is activated for a preset period and sets abnormal data when an abnormality detection pulse is input; and an abnormality determination means for determining whether an abnormality has occurred in the switching means within a preset period by checking the voltage across the switching means, and detecting an abnormality detected when an abnormality occurs in the operation. Abnormal data is stored in the abnormal data setting means based on the detection pulse, and abnormal operation is determined based on the abnormal data, so that abnormal operation of the switch means is automatically inspected. Compared to conventional inspection equipment using a single oscilloscope, this has the advantage of being easier to operate during inspection work, greatly reducing inspection time, and being less prone to inspection errors.

[Brief explanation of drawings]

FIG. 1 is a diagram showing an abnormal operation of the output circuit unit according to the present invention, FIGS. 2 and 5 are circuit diagrams showing the configuration of an embodiment of the present invention, and FIG. 4 is a diagram showing a display change method of the display. FIG. (1) is an output circuit unit, (2) is a switch means, (
3) is a switch control circuit; (4) is a signal input means; (5) is a signal input means;
) is the bias means, (6) is the load, (7) is the power supply, (9
) is an abnormality detection means, (10 is an abnormality data holding means, (1
1) is an abnormality determination means. Agent Patent Attorney Ishi 1) Choshichi

Claims (1)

[Claims] (1) A signal input means for inputting an on control signal with an appropriate tie-in to the switch control circuit of the output circuit unit in which the switch means is formed using a semiconductor switch element, and an appropriate load to the switch means of the output circuit unit. bias means for applying power through the switch means; abnormality detection means for outputting an abnormality detection pulse when the constant voltage across the switch means is equal to or higher than a preset voltage; Abnormality data setting means in which abnormality data is set when activated and an abnormality detection pulse is input; and abnormality determination for determining abnormal operation of the output circuit unit based on whether or not abnormality data is set in the abnormality data setting means. Output circuit unit consisting of means, test equipment f+
5t.