JPS59155861A - Particle removing device - Google Patents
Particle removing deviceInfo
- Publication number
- JPS59155861A JPS59155861A JP3110983A JP3110983A JPS59155861A JP S59155861 A JPS59155861 A JP S59155861A JP 3110983 A JP3110983 A JP 3110983A JP 3110983 A JP3110983 A JP 3110983A JP S59155861 A JPS59155861 A JP S59155861A
- Authority
- JP
- Japan
- Prior art keywords
- particles
- particle
- particle removal
- support
- removal roller
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G15/00—Apparatus for electrographic processes using a charge pattern
- G03G15/06—Apparatus for electrographic processes using a charge pattern for developing
- G03G15/08—Apparatus for electrographic processes using a charge pattern for developing using a solid developer, e.g. powder developer
- G03G15/095—Removing excess solid developer, e.g. fog preventing
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G2217/00—Details of electrographic processes using patterns other than charge patterns
- G03G2217/0041—Process where the image-carrying member is always completely covered by a toner layer
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electrophotography Using Other Than Carlson'S Method (AREA)
- Magnetic Brush Developing In Electrophotography (AREA)
Abstract
Description
【発明の詳細な説明】
産業上の利用分野
本発明は、例えば光透過性粒子と電子写真感光体を用い
て1粒子を透過する光の多少に応じて感光体上に生じる
潜像に対応して選択的に粒子を除去して粒子像を得る画
像形成法等に適用する、粒子一層化あるいは現像のため
の粒子除去装置に関する0
従来例の構成とその問題点
微細な光透過性粒子を用いた画像形成法においみを除去
する現像工程か必要である。DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention uses, for example, light-transmitting particles and an electrophotographic photoreceptor to generate a latent image on the photoreceptor depending on the amount of light transmitted through each particle. Related to a particle removal device for layering particles or developing, which is applied to an image forming method that selectively removes particles to obtain a particle image The image forming method requires a development step to remove the odor.
従来、このような支持体上の粒子の一層化や、現像に用
いられている方法としては、電子けがき法におけるエア
ジェツトvこよる方法、特公昭56−2338号公報に
記載されているような支持体に振動を与えて、付着力の
弱い粒子を落下させる方法等がある。これらの方法は、
支持体上に残るべき必要粒子に影響を与えず、しかも不
要粒子のみ完全に除去するためには、エアーの吹きつけ
方や振動の与え方に微妙な調整を必要とし、良好な画像
を得るには技術的に非常な困難を伴う。捷だ、たとえ可
能となっても、これらを装置化した場合、装置が複雑か
つ大型になったり、振動による。騒音を生したりする等
の問題かあった。Conventionally, methods used for layering particles on a support and for development include methods using air jets in electronic marking methods, and methods such as those described in Japanese Patent Publication No. 56-2338. There are methods such as applying vibration to the support to cause particles with weak adhesion to fall. These methods are
In order to completely remove unnecessary particles without affecting the necessary particles that should remain on the support, delicate adjustments are required in the way air is blown and the way vibrations are applied, and in order to obtain a good image. is technically extremely difficult. Even if it were possible, if these were made into a device, the device would be complicated and large, and it would cause vibrations. There were problems such as noise generation.
丑だ他の方法として、第1図に示すような誘電体ローラ
とプレートによるものがある。図でコロナ帯電器1によ
って帯電さfした誘電体2は、支持体3に対向した位置
で、支持体3との静電付着力が弱い不要粒子を静電的に
吸引する。誘電体2に付着した粒子は、誘電体2に圧接
されたブレ〜l・4によりかき落とされる。この方法d
、構成が簡単であるが、誘電体をクリーニングするのに
ブlノートを用いているため、次のような欠点かある。Another method is to use a dielectric roller and plate as shown in FIG. In the figure, the dielectric body 2 charged by the corona charger 1 electrostatically attracts unnecessary particles having weak electrostatic adhesion to the support body 3 at a position opposite to the support body 3. Particles adhering to the dielectric 2 are scraped off by the brake l·4 which is pressed against the dielectric 2. This method d
Although the structure is simple, since a blank notebook is used to clean the dielectric, it has the following drawbacks.
すなわち、グレードによってかき落され、回収箱5に収
容された粒子は、損傷さ汎ている場合が多いため、特に
光透過性粒子のように、その形状や表面状態が画像に影
響する場合には再使用できない。In other words, the particles that have been scraped off by the grade and stored in the collection box 5 are often widely damaged, so especially when the shape and surface condition of the particles affect the image, such as light-transmitting particles. Cannot be reused.
丑だ、ブレードと誘電体は常時摩擦しているため、ブレ
ード端面や誘電体表面が損傷されやすく、誘電体表面の
傷は誘電体と支持体との対向部における電界分布に影響
を褐え、不均一な電界分布となって画像に影響を与えた
り、あるいにブレードや誘電体自身の寿命を知<シたり
する。さらに、ブレードによって完全に落とされず誘電
体上に残った−1−まの粒子もでてくるが、これらか誘
電体の回転に従ってコロナ帯電器を通過すると帯電さ汎
るため、誘電体と支持体の対向部寸で達すると、この部
分の電界によって支持体に向かって吸引され支持体上に
イス1着しプ一り、必要粒子に当たったりして画像を乱
す恐れがちる○
発明の目的
本発明は、前古己の従来例のような欠点を克服した、わ
ン子一層化あるいは現像のための粒子除去装置を提供す
ることを目的とする。すなわち、帯電した支持体上に多
層に散布された粒子のうち、支持体への静′屯的伺着力
の弱い二層目以上の粒子を除去し、支持体上の粒子の一
層化を行う装置であり、このプロセスは、特に光透過性
粒子を用いる画像形成法には不可欠のものである。また
、電子′す′直感光体あるいは静電記録体に形成された
静電層像に従って粒子を選択的に残し、他の不要な粒子
を除去する現像装置を提供するものである。Unfortunately, because the blade and dielectric are constantly in friction, the blade end face and the dielectric surface are easily damaged, and scratches on the dielectric surface will affect the electric field distribution in the area where the dielectric and the support face each other. This can result in non-uniform electric field distribution, which can affect the image, and can also affect the lifespan of the blade or dielectric itself. Furthermore, there are -1- particles that are not completely removed by the blade and remain on the dielectric material, but when they pass through the corona charger as the dielectric material rotates, they are charged and spread, so that the dielectric material and support are When the size of the opposing part reaches , the electric field in this part attracts the chair toward the support, and the chair falls onto the support, which may hit the necessary particles and disturb the image.Object of the Invention SUMMARY OF THE INVENTION An object of the present invention is to provide a particle removal device for single-layer layering or development, which overcomes the drawbacks of the prior art. In other words, it is a device that removes particles from the second layer and above, which have a weak static adhesion to the support, from among particles dispersed in multiple layers on a charged support, and forms the particles on the support into a single layer. This process is especially essential for image forming methods using light-transmitting particles. Another object of the present invention is to provide a developing device that selectively leaves particles in accordance with an electrostatic layer image formed on an electronic intuitive light body or an electrostatic recording body and removes other unnecessary particles.
発明の構成
本発明は、粒子の支持体と、間隙をもってその支持体に
7j向した回転可能な粒子除去ローラと、支持体とほぼ
反対側で間隙をもって粒子除去ローラレ′こ対向し/こ
ワイヤ等のクリーニング電極を備え、支持体と粒子除去
ローラ間、粒子除去ローラと電極間にそれぞれ同方向の
電位差を馬えて、支持体−1−の不安粒子を除去する粒
子除去装置である。Structure of the Invention The present invention comprises a support for particles, a rotatable particle removal roller 7j facing the support with a gap, and a particle removal roller facing the support with a gap on a side substantially opposite to the support. This is a particle removal device that removes unstable particles from the support -1- by creating a potential difference in the same direction between the support and the particle removal roller and between the particle removal roller and the electrode.
実施例の説明
以−ト、本発明による支持体上の粒子一層化の実施例を
図面に基づいて説明する。第2図はその一尖hj例を示
す0
10は支持体としての謄奔体古七ミを感光体ドラムで、
内部の金属ローラ10aとその外周面に塗布された酸化
用1鉛よりなる感光層10bとで構成されている。11
は実施例で用いる粒子である。DESCRIPTION OF EXAMPLES Hereinafter, examples of layering particles on a support according to the present invention will be described based on the drawings. Figure 2 shows an example of one point hj.
It consists of an internal metal roller 10a and a photosensitive layer 10b made of 1 lead oxide coated on its outer peripheral surface. 11
are particles used in Examples.
感光体トラム100回転に従って感光層1obの表向は
順次コロナ帯電器12によって負に帯電される。帯電さ
れた感光層10bか粒子ホ、/:13の下方開口部13
a[対向した位置に達すると、ドラム近傍の粒子は静電
引力により感光層10b上に吸引付着され、多数層の粒
子か感光層表面に集ってドラムの回転と共に移動してい
く。14はマイラあるいはシリコーンゴム等よりなる薄
板で、ホッパ13の開口端部に固着され、ホノノく13
と感光体ドラム1oの間の間隙を埋め、粒子のもれを防
いでいる。As the photosensitive tram rotates 100 times, the surface of the photosensitive layer 1ob is sequentially negatively charged by the corona charger 12. The lower opening 13 of the charged photosensitive layer 10b or particle E, /:13
a [When the particles near the drum reach the opposing position, they are attracted and adhered onto the photosensitive layer 10b by electrostatic attraction, and a large number of layers of particles gather on the surface of the photosensitive layer and move as the drum rotates. 14 is a thin plate made of mylar or silicone rubber, which is fixed to the open end of the hopper 13,
This fills the gap between the photoreceptor drum 1o and the photoreceptor drum 1o to prevent particles from leaking.
感光層10b上に乗った多数層の粒子か粒子除去ローラ
16vC対向する位置に達すると、感光層10bへの静
電付着力の弱い上層の粒子は、粒子除去ローラ15と感
光体ドラム10間にかけた電界により粒子除去ローラ1
5に向って吸引される。When the particles in the multiple layers on the photosensitive layer 10b reach the position facing the particle removal roller 16vC, the particles in the upper layer, which have weak electrostatic adhesion to the photosensitive layer 10b, are suspended between the particle removal roller 15 and the photoreceptor drum 10. Particle removal roller 1
It is attracted towards 5.
実施例では粒子除去ローラの内部の金属ローラ15at
/(は、感光体ドラムに対し正の電位をかけている。こ
のとき一層目の粒子のみを残し、二層目以上の粒子を残
すには、適切な電界強度金遣べばよいが、粒子の導電性
が増す程一層目と二層目の吸引されやすさの差か犬きく
なるので、導電性の高い粒子を使用する場合VCは一層
化がさらに容易となる。In the embodiment, the metal roller 15at inside the particle removal roller
/( applies a positive potential to the photoreceptor drum. At this time, in order to leave only the particles in the first layer and the particles in the second layer and above, it is necessary to use an appropriate electric field strength, but the particle As the conductivity of the VC increases, the difference in the ease of attraction between the first and second layers increases, so when highly conductive particles are used, it becomes easier to form a single layer of VC.
粒子除去ローラ15の外周15bは、マイラ等の訪電体
丑たげ酸化亜鉛等の半導体よりなり、ここVc吸引され
た粒子は、表面に例着した1才粒子除去ローラ15の回
転に従ってホッパ13の方に移送される。16はクリー
ニング電極で、これに−2粒子除去ローラ15に対しさ
らに正の電位がカえられており、この近傍に達した粒子
除去ローラ15上の粒子は、電界によってクリーニング
電極16の方向に吸引される。電極16の先端は、非常
に薄く構成することにより粒子除去ローラ15との間の
電界強度を高くするとともに、クリーニング電極16に
向かって飛しょうしてきた粒子でクリーニング電極16
に当たって正の電荷、を貰って逆に再ひ粒子除去ローラ
に吸引されるものの割合が非常に少なくなるようにして
いる。したがって、はとんどの粒子はホッパ13内に回
収される。The outer periphery 15b of the particle removal roller 15 is made of a semiconductor such as zinc oxide or the like, and the particles sucked here are transferred to the hopper 13 according to the rotation of the one-year-old particle removal roller 15 deposited on the surface. will be transferred to Reference numeral 16 denotes a cleaning electrode, to which a positive potential is applied with respect to the -2 particle removal roller 15, and particles on the particle removal roller 15 that reach this vicinity are attracted toward the cleaning electrode 16 by the electric field. be done. The tip of the electrode 16 is made very thin to increase the electric field strength between it and the particle removal roller 15, and the particles flying toward the cleaning electrode 16 are
The particle removal roller receives a positive charge when the particle hits the particle, and the proportion of particles that are attracted to the particle removal roller is extremely small. Therefore, most of the particles are collected in the hopper 13.
以上のようにして、支持体である感光層10b上の粒子
が一層化される。17は粒子に光透過性のものを用いた
場合の粒子を通しての感光層10bへの露光を示してい
る。In the manner described above, the particles on the photosensitive layer 10b, which is a support, are layered. Reference numeral 17 shows exposure of the photosensitive layer 10b through the particles when light-transmitting particles are used.
第3図は粒子一層化の他の実施例で、クリーニング電極
18として複数本の細いワイヤを用いた例である。複数
本の細いワイヤを出いることによって、クリーニング電
極と粒子除去ローラ15間の電界強度を落とさすに粒子
がその電界にさらされる時間を長ぐすることにより、粒
子の除去能力を十けたものである。すなわち、′電界の
強さが同しであれば、より大きい速度で粒子除去ローラ
16を回転させてわ”l子を完全除去することができ、
プロセス速度を速くすることができる。FIG. 3 shows another embodiment of single-layer particle formation, in which a plurality of thin wires are used as the cleaning electrode 18. By using a plurality of thin wires, the strength of the electric field between the cleaning electrode and the particle removal roller 15 is reduced, and the time that the particles are exposed to the electric field is increased, thereby increasing the particle removal ability. be. That is, if the electric field strength is the same, particles can be completely removed by rotating the particle removal roller 16 at a higher speed.
Process speed can be increased.
次に本発明全現像装置に応用した実施例を第4図によっ
て説明する。感光層10 b −J二に一層に静電伺着
した光透過性粒子11の上から矢印17の」二うに像の
パターンを露光すると、像パターンに応じて感光層10
bは電荷の弱くなった部分もしくは無くなった部分と強
く残っている部分とができる。こ汎が粒子除去ローラ1
5′との対向部にくると、残留電荷の強さに応して除去
される粒子と残った1寸の粒子ができ、感光層10b上
に露光パターンに応じた粒子像ができる。18′はりI
J ’ニング電極、19は粒子回収箱であり、これらの
動作は前記の実施例と同様である。Next, an embodiment in which the present invention is applied to a total developing device will be described with reference to FIG. When an image pattern is exposed from above the light-transmitting particles 11 electrostatically adhered to the photosensitive layer 10b-J2 in the direction of the arrow 17, the photosensitive layer 10 is exposed according to the image pattern.
In b, there are parts where the charge is weak or has disappeared, and parts where the charge remains strong. Particle removal roller 1
5', some particles are removed depending on the strength of the residual charge, while others of 1 inch remain, forming a particle image on the photosensitive layer 10b in accordance with the exposure pattern. 18' beam I
J'ning electrode, 19 is a particle collection box, and their operation is the same as in the previous embodiment.
第5図は粒子除去ローラ15の外周部15bに酸化即鉛
等の半導体を用いたときの粒子11の挙動の説明図であ
る。粒子11の表面にCuI等の導電性皮膜を形成し、
外周部15bに酸化亜鉛等の半導体を用いる場合は、1
5bに通常の誘電体を用いる場合に比べてクリーニング
電極に同じ電f☆をかけても粒子は吸引され易い。この
詳細な原因について附不明であるが、次のように推定さ
れる。FIG. 5 is an explanatory diagram of the behavior of the particles 11 when a semiconductor such as instant lead oxide is used for the outer peripheral portion 15b of the particle removing roller 15. Forming a conductive film such as CuI on the surface of the particles 11,
When using a semiconductor such as zinc oxide for the outer peripheral portion 15b, 1
Compared to the case where a normal dielectric material is used for 5b, particles are more easily attracted even if the same electric current f☆ is applied to the cleaning electrode. Although the detailed cause of this is unknown, it is presumed as follows.
つ捷り通常の誘電体では外周部15bに付着した粒子は
、感光層10bから吸引されたとき負の電荷を持ってく
るため、クリーニング電極18に対向したとき、ここの
電界に応じて再び吸引されるが、その吸引力はその時に
粒子に残っている電荷lによる。こ汎に対し酸化亜鉛等
の半導体の場合は次のようになっていると思われる。粒
子11が外周部15bに伺着した状態では粒子のCuI
と外周部15bの酸化亜鉛とはPN接合となっていると
考えら汎る。感光層10bから負の電荷を持って外周部
15bllIC接した粒子の方へ外周部15bから正の
電気は注入されにくいため、外周部15bと支持体10
bの間の電界の中でも粒子は負に帯電した一1寸となる
が、これが電極18と対向した部分にくると前とは逆の
電界を受けるため、矢印〃のように外周部15bの酸化
亜鉛から粒子のCuIへの負電荷の注入が起こって粒子
かクリーニング7E極18に吸引さ汎る力かより強くな
る。したかって電界強度が同じでも粒子は除去されやす
くなると考えられる。In a normal dielectric, particles attached to the outer peripheral part 15b carry a negative charge when they are attracted from the photosensitive layer 10b, so when they face the cleaning electrode 18, they are attracted again according to the electric field there. However, the attractive force depends on the charge l remaining on the particle at that time. On the other hand, in the case of semiconductors such as zinc oxide, the situation seems to be as follows. In the state where the particles 11 have arrived at the outer peripheral part 15b, the CuI of the particles
It is generally considered that the zinc oxide of the outer peripheral portion 15b forms a PN junction. Since it is difficult for positive electricity to be injected from the outer periphery 15b to the particles having negative charge from the photosensitive layer 10b and in contact with the outer periphery 15bllIC, the outer periphery 15b and the support 10
The particles become negatively charged in the electric field between b and 11, but when they come to the part facing the electrode 18, they receive an electric field opposite to the previous one, so the outer peripheral part 15b is oxidized as shown by the arrow. Injection of negative charge from the zinc to the CuI of the particles occurs and the force with which the particles are attracted to the cleaning 7E electrode 18 becomes stronger. Therefore, it is thought that particles are more easily removed even if the electric field strength is the same.
発明の効果 不発り」によrしは、次のような効果がある。Effect of the invention The prevention of non-explosion has the following effects:
(1)回転する粒子除去ローラとクリーニング電極に電
圧を与えるだけで粒子除去ができるため、小型、軽量で
安価な装置が構成できる。(1) Since particles can be removed simply by applying voltage to the rotating particle removal roller and cleaning electrode, a small, lightweight, and inexpensive device can be constructed.
(2)支持体と粒子除去ローラ間、粒子除去ローラとク
リーニング電極間の電界によって粒子吸引力を出してい
るため、エアーシェド、振動法あるいはブレード等の方
法によるものに比較して除去力が均一であり、しかも常
に安定しているため、支持体に残るべき粒子に影響を与
えずに安定した粒子除去が容易となる。(2) Since the particle suction force is generated by the electric field between the support and the particle removal roller and between the particle removal roller and the cleaning electrode, the removal force is more uniform compared to methods such as air shed, vibration method, or blade. Moreover, since it is always stable, stable particle removal is facilitated without affecting the particles that should remain on the support.
(3)振動法等に比べ騒音が少ない。(3) Less noise compared to vibration methods etc.
(4) ブレード等による方法に比べ摩擦部分がない
ので寿命が長い。(4) Compared to methods using blades, etc., there are no frictional parts, so the service life is longer.
(5)除去される粒子にはほとんど損傷を力えないため
、粒子の再使用ができる。(5) Since the removed particles are hardly damaged, they can be reused.
第1図は従来の現像装置の構成を示す図、第2図、第3
図は本発明を粒子一層化装置に応用した実施例の構成を
示す図、第4図は本発明を現像装置に応用した実施例の
構成を示す図、第5図Vi粒子除去ローラの外周部に半
導体を用いた場合の粒子の挙動を説明する図である。
10−・・感光体ドラム(支持体)、10b・感光層、
11・・ ・粒子、15 、15’・・・・粒子除去ロ
ーラ、15b 外周部、16 、18 、18’・
・・・・クリーニング電極。
代理人の氏名 弁理士 中 尾 敏 男 ほか1名第1
図
第2図
第3図
第4図
/7Figure 1 shows the configuration of a conventional developing device, Figures 2 and 3.
The figure shows the configuration of an embodiment in which the present invention is applied to a particle layering device. Figure 4 shows the configuration of an embodiment in which the present invention is applied to a developing device. Figure 5. Vi outer periphery of the particle removal roller. FIG. 3 is a diagram illustrating the behavior of particles when a semiconductor is used for the purpose of the present invention. 10-... Photosensitive drum (support), 10b, photosensitive layer,
11... Particles, 15, 15'... Particle removal roller, 15b Outer circumference, 16, 18, 18'...
...Cleaning electrode. Name of agent: Patent attorney Toshio Nakao and 1 other person 1st
Figure 2 Figure 3 Figure 4/7
Claims (3)
持体四対向させた回転可能な粒子除去ローラと、前記支
持体と前記粒子除去ローラの対向部から削れた位置で、
間隙を設けて前記粒子除去ローラVこ対向させたクリー
ニング電極とを有し、前記支持体と前記粒子除去ローラ
および前記粒子除去ローラと前記クリーニング電極との
間に、それぞれ同方向の電位差を設けたことを特徴とす
る粒子除去装置。(1) A support for particles, a rotatable particle removal roller with four supports facing each other with a gap provided between the supports, and a position scraped from the opposing portion of the support and the particle removal roller,
A cleaning electrode is provided facing the particle removal roller V with a gap therebetween, and a potential difference is provided in the same direction between the support and the particle removal roller and between the particle removal roller and the cleaning electrode, respectively. A particle removal device characterized by:
周MISを生害体にした特許請求の範囲第1項記載の粒
子除去装置。(2) The particles are conductive and the particle removal roller
The particle removal device according to claim 1, wherein the surrounding MIS is used as a biological pest.
成された特許請求の範囲第1項または第2項記載の粒子
除去装置。(3) The particle removal device according to claim 1 or 2, wherein the cleaning electrode is configured by arranging a plurality of wires in parallel.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3110983A JPS59155861A (en) | 1983-02-25 | 1983-02-25 | Particle removing device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3110983A JPS59155861A (en) | 1983-02-25 | 1983-02-25 | Particle removing device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS59155861A true JPS59155861A (en) | 1984-09-05 |
Family
ID=12322230
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3110983A Pending JPS59155861A (en) | 1983-02-25 | 1983-02-25 | Particle removing device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59155861A (en) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55127578A (en) * | 1979-03-22 | 1980-10-02 | Minnesota Mining & Mfg | Method and device for electronic graphic system |
JPS57195258A (en) * | 1981-05-27 | 1982-11-30 | Ricoh Co Ltd | Electrostatic recorder |
-
1983
- 1983-02-25 JP JP3110983A patent/JPS59155861A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55127578A (en) * | 1979-03-22 | 1980-10-02 | Minnesota Mining & Mfg | Method and device for electronic graphic system |
JPS57195258A (en) * | 1981-05-27 | 1982-11-30 | Ricoh Co Ltd | Electrostatic recorder |
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