JPS59153180A - Tester for microwave circuit unit - Google Patents

Abstract

PURPOSE:To obtain a tester for a microwave circuit unit which is handy and efficient while enabling a highly reliable testing and adjustment by bridging between micro strip lines using a conductor piece. CONSTITUTION:A circuit unit 11 housed in a case 12 has a micro strip line 11b connected to a micro strip line 16a of a substrate 16 through a conductor piece 20 and further to an external measuring apparatus or the like through a high frequency connector 177. With a tester of such an arrangement, only requirement is that the circuit 11 is housed in the case 12 and then, the micro strip lines 16a and 11b are bridged between the substrate 16 and the circuit unit 11 with conductor piece 20 subjected to a specified pressing. This eliminates the removal of a solder 18 or the like completely and makes the equipment free from problems such as breakage of a core 17a of the high frequency connector 17 and peeling of a copper foil composing the micro strip lines 11b and 16a thereby elevating the working efficiency.

Description

DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to a microwave circuit unit tester that can easily test a microwave circuit unit having a microstrip line.

[Technical background of the invention and its background]

Recently, SHF band microwave circuit units have been made into microstrip lines, and improvements have been made such as making them smaller and lighter, simplifying their structures, and improving mass productivity.

Conventionally, when testing and adjusting this type of circuit unit, for example, as shown in FIG. 1, a high frequency connector 1.
Inside the housing 3 (2) containing the circuit unit 4, the input/output terminals of the circuit unit 4 are connected to the core wires 1a and 2a of the high frequency connector 1.2, and the high frequency connector 1.2 is In other words, the microstrip line of the circuit unit 4 is soldered to the core wires 1a and 2b of the high-frequency connector 1.2, as shown in the cross-sectional configuration in FIG. The test-a adjustment of the circuit unit 4 is carried out by directly connecting the circuit unit 4 with the above-mentioned circuit unit 4. In FIG. The wave circuit unit 4 is shielded.

However, when testing and adjusting a large number of microwave circuit units 4 in this way, the high frequency connector 1 is
．． 2 and the circuit unit 4, and removing assembly screws to disassemble the casing 3, which is complicated. Moreover, when the half-finished connector is removed, excessive nast stress is applied to the core wires 1a and 7b of the high-frequency connector 1.2, which causes the problem that the core wires 1a and Ib are likely to break. Furthermore, there was a problem that the copper foil constituting the microstrip line of the circuit unit 4 would peel off due to the removal of the solder. In addition, it is necessary to ensure the connection between the circuit unit 4 and the high-frequency connector 1.2, including the ground point. Purpose of the Invention The present invention has been made in consideration of the above circumstances, and its purpose is to easily (2) efficiently and reliably test and adjust a microwave circuit unit having a microstrip line. To provide a microwave circuit unit tester that can perform

[Summary of the invention]

The present invention connects a high frequency connector to one end of the microstrip line of a board on which a microstrip line of a predetermined impedance is formed, and connects the microstrip line of the microwave circuit unit arranged side by side with the microstrip line of the board The conductor piece C2 bridges the gap by applying a predetermined pressing force. This conductor piece is designed to perform input and output to and from the microwave circuit unit via the microstrip line and high frequency connector on the board.

〔Effect of the invention〕

Thus, according to the present invention C2, it is only necessary to connect the microwave circuit unit to the board between the microstrip lines using a conductor piece, so the workability is very good. Moreover,
Since the consistency of the connection part with the high frequency connector can be ensured in advance, highly reliable measurements can always be performed. Furthermore, there is no possibility of breakage of the core wire of the high frequency connector or peeling of the copper foil, resulting in very high practicality.

[Embodiments of the invention]

Hereinafter, two embodiments of the present invention will be described with reference to the drawings.

FIG. 3 is a sectional view showing a schematic configuration of a microwave circuit unit tester according to Example f1. Testing and adjustment using this tester (1) The microwave circuit unit 11 to be provided is
It has a structure in which a microstrip line zzb is formed on a substrate ZJa of a predetermined size to a predetermined size.
It is composed of a frame plate I3 made of a metal material, a bottom plate I4 thereof, and a lid body 25. A housing space for the circuit unit 11 is formed on the bottom plate Z4 in the housing 12, and a board z6 is provided along the frame plates Z and 91-, and is integrally fixed to the frame plate 13. has been done. The board 16 is housed in the casing I2 and is provided in a predetermined space on the bottom plate It (2) to form the same plane as the microstrip line JZb of the circuit unit 11 to be incorporated, and is provided on the upper surface thereof. For example, a microstrip line 16a with an impedance of 50Ω is formed.
At one end of a is the frame Z, ? The core wire Z7a of the high-frequency connector 17 attached to the second connector is connected using solder 18.

This high frequency connector 17 is installed in a through hole drilled in the frame 1.91 with electrical insulation applied to the housing 1.
2. The external connector portion (2) is used to connect measuring instruments (not shown).

On the other hand, the housing 15 is positioned and placed and fixed in the upper end opening YLAδ of the frame body I3 (into the upper end of the frame I3).
The substrate 16 of the lid 15 and the circuit unit 1 are fitted into the alignment groove 13a provided at the edge of the frame I3 (this is done by two twists and fixed by screws or other means). A through hole 15b is provided at the opposite position of the edge 12 where the two abut against each other.A rod 19 made of, for example, a reflex flight with low dielectric loss is attached to the through hole 15b so that it can move forward and backward. This rod 19 is connected to the housing 1.
A metal conductor piece 20 is attached to the inner end of the flange 198 provided near the end and the lid 15 (which is biased downward by an interposed spring 2I). .

When the lid 15 is attached to the frame 13, the rod 19 moves back and forth against the spring 2I, and the metal conductor piece 2o at its tip is connected to the substrate Z6 and the circuit unit ll (2). The metal conductor piece 20 bridges the substrate 16 and each microstrip line 16a, 16b of the circuit unit IZ, thereby electrically short-circuiting the two. become.

Claims (2)

[Claims] (1) A board formed with a microstrip line of a predetermined impedance, a high frequency connector connected to one end of the microstrip line of this board,
A conductor piece is provided that connects the microstrip lines by bridging the microstrip lines of the microwave circuit units arranged side by side on the substrate and the microstrip lines of the substrate by receiving a predetermined pressing force. A microwave circuit unit tester characterized by: (2) The board and the high frequency connector are integrally fixed to the housing in which the microwave circuit unit is positioned and housed, and the conductor piece is attached to the housing C1.
Claim 1, which is movably attached.
Microwave circuit unit tester as described in section.