JPS59149637A - Manufacture of shadow mask - Google Patents

Manufacture of shadow mask

Info

Publication number
JPS59149637A
JPS59149637A JP1820083A JP1820083A JPS59149637A JP S59149637 A JPS59149637 A JP S59149637A JP 1820083 A JP1820083 A JP 1820083A JP 1820083 A JP1820083 A JP 1820083A JP S59149637 A JPS59149637 A JP S59149637A
Authority
JP
Japan
Prior art keywords
photosensitive film
shadow mask
metal plate
exposure
dark
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1820083A
Other languages
Japanese (ja)
Inventor
Yasuhisa Otake
大竹 康久
Yutaka Tanaka
裕 田中
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP1820083A priority Critical patent/JPS59149637A/en
Publication of JPS59149637A publication Critical patent/JPS59149637A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J9/00Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
    • H01J9/02Manufacture of electrodes or electrode systems
    • H01J9/14Manufacture of electrodes or electrode systems of non-emitting electrodes
    • H01J9/142Manufacture of electrodes or electrode systems of non-emitting electrodes of shadow-masks for colour television tubes

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)

Abstract

PURPOSE:To obtain a high quality shadow mask by providing means for suppressing promotion of dark reaction at more than one positions behind photosensitive film forming process, back/for of exposure process and before developing process. CONSTITUTION:Means for suppressing aging due to dark reaction at non-exposed section of photo-sensitive film are provided on at least one position behind photo- sensitive film forming process, back/for of exposure process and before developing process. For example original negative pattern 17 positioned with black dot 16 is contacted tightly on both faces of shadow mask metal plate 14 fed through a roller 15 then exposed by light from an ultraviolet light source to harden the photo-sensitive film except black dot 16 section optically. While suction and exhaust tubes 211, 212 are provided in a dark box 18 at the winding side while an air-conditioner 26 comprising an evaporator 22, fan 23, refrigerator 24 and electric heater 25 is placed in the suction tube 211 to maintain the environment in the dark chamber 18 below 18 deg.C and relative humidity of 40- 60% under the condition for suppressing aging of the non-exposed section of photo-sensitive film.

Description

【発明の詳細な説明】 〔発明の技術分野〕 本発明はカラー受像管用シャドクマスクの製造方法に関
するものである。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to a method for manufacturing a shadow mask for a color picture tube.

〔発明の技術的背景とその問題点〕[Technical background of the invention and its problems]

一般(ニカラー受像管に使用されるシャドヮマスクは円
形状の電子ビーム通過孔を有するものと、矩形状の電子
ビーム通過孔を有するものに代表され、いずれも螢光面
に対設する面には径の大きな大孔、電子銃に対設する面
には径の小さな小孔を有し、この小孔と大孔とを貫通す
ることにより電子ビーム通過孔が完成されるようになっ
ている。
The shadow masks used in general (two-color picture tubes) are represented by those with circular electron beam passage holes and those with rectangular electron beam passage holes. It has a large hole and a small hole with a small diameter on the surface facing the electron gun, and the electron beam passage hole is completed by passing through the small hole and the large hole.

一方、近年各種のディスプレイ用やモニター用のカラー
受像管に使用されるシャドクマスクは、極めて微細、か
つ高精度の電子ビーム通過孔を有することが要求されて
おり、例えばキャラクタ−ディスプレイgr二使用され
る円形状の電子ビーム通過孔を有するシャドクマスクで
は、ピッチが0.2鶴〜0.3器、且つ電子銃側孔径が
0.090〜0、14 Q II*という微細なものが
使用されている。
On the other hand, in recent years, shadow masks used in color picture tubes for various displays and monitors are required to have extremely fine and highly accurate electron beam passage holes. A shadow mask with a circular electron beam passage hole uses a fine one with a pitch of 0.2 to 0.3 mm and a hole diameter on the electron gun side of 0.090 to 0.14 Q II*. There is.

このような微細かつ高精度の電子ビーム通過孔を有する
シャFワマスクを製造する場合には、例えば4〜5μm
程度の厚さの感光性被膜が被着形成された長尺のシャド
ソマスク用金属板の両面にそれぞれ大孔側原版イ・ガパ
ターンと小孔側原版ネガパターンを密着したのち、露光
、現像を行う。
When manufacturing a shower mask having such a fine and highly accurate electron beam passage hole, for example, a diameter of 4 to 5 μm is required.
After the large-hole side original I/GA pattern and the small-hole side original negative pattern are closely attached to both sides of a long metal plate for a shadow mask on which a photosensitive film of a certain thickness has been deposited, exposure and development are performed.

即ぢ、例えは重クロム酸塩感光拐料による画像形成は感
光剤である重クロム酸アンモニフム又は重クロム酸ナト
リクム等の重クロム酸塩と、成膜剤である例えば牛乳カ
ゼイン酸アルカリ又はポリビニールアルコールなどの水
溶性高分子物質からなる感光性膜M(ニマスクパターン
を介して紫外線を照射すると露光部が硬化し、未露光部
が現像液としての冷水や温水j二不溶性になる性質を利
用している。この光硬化反応の機構は重クロム酸塩の光
化学反応により3価のクロム(Cr”)化合物が生成す
る化学変化、つまり6価のクロム(Cr+s)が紫外線
のエネルギーを吸収し3価のクロム(Cr”)に還元さ
れ、この3価のクロムが成膜剤である牛乳カゼイン酸ア
ルカリなどの水溶性高分子物質と結合すること(二よっ
て架橋し硬化する反応を利用している。一方、光の当ら
ない未露光部においては感光性被膜の硬化が起らず、現
像処理により洗い流される。
For example, when forming an image using a dichromate photosensitive dye, a dichromate such as ammonium dichromate or sodium dichromate is used as a photosensitive agent, and a film forming agent such as alkali milk caseinate or polyvinyl chloride is used. A photosensitive film M made of a water-soluble polymer substance such as alcohol (uses the property that when UV rays are irradiated through a mask pattern, the exposed areas harden and the unexposed areas become insoluble in cold water or hot water used as a developer) The mechanism of this photocuring reaction is a chemical change in which a trivalent chromium (Cr) compound is produced by a photochemical reaction of dichromate, that is, hexavalent chromium (Cr+s) absorbs ultraviolet energy and This trivalent chromium is reduced to trivalent chromium (Cr), and this trivalent chromium is combined with a water-soluble polymer substance such as milk caseinate alkali, which is a film-forming agent. On the other hand, in unexposed areas that are not exposed to light, the photosensitive coating does not harden and is washed away by the development process.

従って開孔を形成する部分には光が照射されず、開孔部
以外の部分に光が照射されるマスクパターンン形成した
ネガ原版を用いて露光し、その後温水等の現像工程を通
すことにより開孔を穿設すべき部分の感光性膜が溶解除
去され、次のエツチング工程で目的とする開孔が穿設さ
れる。
Therefore, by exposing using a negative original plate with a mask pattern that does not irradiate the part where the openings are to be formed, but irradiates the parts other than the openings, and then passing it through a developing process such as hot water. The photosensitive film in the area where the hole is to be formed is dissolved and removed, and the desired hole is formed in the next etching step.

しかし乍ら以上のようシニ感光性膜は紫外線照射により
非水溶性となるが、それ以外5二も感光性膜形成後の温
度、湿度及び滞留時1uJ等の環境条件l二よっても紫
外線を照射されたと同じく非水溶性となる現象が存在し
、一般に暗反応と呼ばれている。
However, as mentioned above, the photosensitive film becomes water-insoluble when irradiated with ultraviolet rays, but other than that, irradiation with ultraviolet rays also depends on environmental conditions such as temperature, humidity, and 1 uJ during residence after the photosensitive film is formed. There is a phenomenon in which a substance becomes water-insoluble, which is generally called a dark reaction.

通常の作業環境下、例えは室温22℃、相対湿度55%
の下で感光性膜を塗布乾燥後48時間放置し、コダック
フォトグラフィックステップタブレツ1−NO2にて感
度チェックしたところ0.5〜1.0段感興が変化した
。この串は感光性膜全体が弱く露光されたと同じことで
、唐いかえれは孔を形成すべき部分の感光性膜も露光さ
れ完全な水溶性であるべきものが幾分非水溶性になるこ
とである。その結実現像時に開孔な形成すべき部分の感
光性膜が完全に溶解除去されず一部残存するため、個々
の開孔のエツチング進行にばらつきが生じマスクムラ品
位が低下する。父上記環境下において約210mJ/d
の露光をかけた後10時間放置し、その後現像した結果
コダックフォトグラフィックステップタブレツ)’NO
2にて感度が4段から5〜6段に、つまり1〜2段感度
が変化した。この事は前述した如く暗反応の進行によっ
て現像性が悪くなることと、更に露光、未露光の境界線
での暗反応が進行するため、第1図(a)及び(b)に
示す如く未露光部(1)(開孔形成部)と露光部(2)
の寸法が暗反応進行部(3)により目的とするものより
小さくなり且つ寸法がばらつく。その結果特l二開孔寸
法の小さな高精細マスク製造時においては開孔の寸法精
度が低下し、最終的lニムッとなって使用できないマス
クになる。
Under normal working environment, for example, room temperature is 22℃ and relative humidity is 55%.
The photosensitive film was applied and dried for 48 hours under the following conditions, and the sensitivity was checked using a Kodak Photographic Step Tablet 1-NO2, and the sensitivity changed by 0.5 to 1.0 steps. This skewer means that the entire photosensitive film has been weakly exposed to light, and this is because the parts of the photosensitive film where holes should be formed are also exposed, and what should be completely water-soluble becomes somewhat water-insoluble. It is. At the time of image formation, the photosensitive film in the portion where the opening is to be formed is not completely dissolved and removed and a portion remains, resulting in variations in the progress of etching of individual openings and deterioration of the quality of the mask unevenness. Approximately 210 mJ/d under the above environment
After exposure, I left it for 10 hours, and then developed it.The result was Kodak Photographic Step Tablets)'NO.
2, the sensitivity changed from 4 steps to 5 to 6 steps, that is, the sensitivity changed from 1 to 2 steps. This is because, as mentioned above, the development performance worsens due to the progress of the dark reaction, and furthermore, the dark reaction progresses at the boundary line between exposed and unexposed areas. Exposed part (1) (opening forming part) and exposed part (2)
The dimensions of the dark reaction progressing portion (3) become smaller than the intended size, and the dimensions vary. As a result, especially when manufacturing a high-definition mask with small aperture dimensions, the dimensional accuracy of the apertures decreases, resulting in a final mask that is unusable.

〔発明の目的〕[Purpose of the invention]

本発明は以上の点に鑑みてなされたもので暗反応の進行
を抑制し高品位のシャドクマスクを製造することを目的
とする。
The present invention has been made in view of the above points, and an object of the present invention is to suppress the progress of dark reactions and produce a high-quality shadow mask.

〔発明の概要〕[Summary of the invention]

本発明は感光性膜形成工程の後と露光工程の[1後と現
像工程の前とのいわゆる滞留部の少くとも1ケ所以上の
部分で暗反応の進行を抑制し得る手段を設けるようC:
なしたもので、その実施態様としては滞留部’l: i
’mf度18℃以下、相対湿度40%乃至60%の特定
条件の部分空調g二よって暗反紀、の進行を実用上間顎
ない範囲に抑制するようにしたものである。
The present invention provides means for suppressing the progress of the dark reaction in at least one or more so-called retention areas after the photosensitive film forming step, after the exposure step [1], and before the development step.
The embodiment of this is the retention part'l: i
Partial air conditioning under specific conditions of a mf degree of 18 degrees Celsius or less and a relative humidity of 40% to 60% is used to suppress the progression of cyclone to a practically acceptable range.

〔発明の実施例〕[Embodiments of the invention]

暗反応の進行により牛乳カゼイン酸アルカリと重クロム
酸アンモニクムとからなる感光性膜中の6価クロムイオ
ンが3価クロムイオンに還元されることに看目し、赤外
線スペクトル分析j二て10時間放置後の6価クロムイ
オン及び3価クロムイオン量の変化を温度及び相対湿間
ヲ変えて検討した結果を第2図及び第3図j二示す。第
2図は1nif度と残存6価クロムイオン量を、第3図
は相対湿度と残存6価クロムイオン量を夫々示すもので
、特性(a)及び特性(b)は夫々相対湿度40%及び
80%一定であり、特性(C1及び特性(d)は夫々温
度10’C及び40℃一定の条件である。暗反応の進行
がなければ感光性膜中l二は100%の6価クロムイオ
ンが存在する筈であるが、温度1.0℃で相対湿度40
%で約98%、温度40℃で相対湿度80%では約25
%しか6価クロムイオンが残存していない。
Observing that the hexavalent chromium ions in the photosensitive film made of milk caseate alkali and ammonium dichromate were reduced to trivalent chromium ions as the dark reaction progressed, infrared spectral analysis was performed and left for 10 hours. The results of examining subsequent changes in the amounts of hexavalent chromium ions and trivalent chromium ions by varying the temperature and relative humidity are shown in Figures 2 and 3. Figure 2 shows the 1nif degree and the amount of residual hexavalent chromium ions, and Figure 3 shows the relative humidity and the amount of residual hexavalent chromium ions.Characteristics (a) and (b) show the relative humidity of 40% and the amount of residual hexavalent chromium ions, respectively. 80% constant, and characteristic (C1) and characteristic (d) are under the condition that the temperature is constant at 10'C and 40℃, respectively.If the dark reaction does not proceed, l2 in the photosensitive film is 100% hexavalent chromium ion. should exist, but at a temperature of 1.0°C and a relative humidity of 40
Approximately 98% in %, approximately 25 at a temperature of 40°C and a relative humidity of 80%
Only % of hexavalent chromium ions remain.

この結果から暗反応の進行l二は温度の影響が非常l二
人きく、相対湿度は温度が高い場合には影響を及ぼすが
、低温の場合その影響はわずかである。
These results show that the progress of dark reactions is greatly influenced by temperature, and that relative humidity has an effect when the temperature is high, but the effect is slight at low temperatures.

次に実際にシャドクマスクとの相関を取るために相対湿
度を50%一定とし温度を変化させた時のコダックフォ
トグラフィックステップタブレットN02の感度の変化
を第4図及び第5図に示す。
Next, FIGS. 4 and 5 show changes in the sensitivity of the Kodak Photographic Step Tablet N02 when the relative humidity is kept constant at 50% and the temperature is varied in order to actually correlate with the Shadow Mask.

第4図は横軸に滞留時間、縦軸Cニコダックステップタ
ブレット値をとり、特性(e)、げ)及び(g)は夫々
温度15℃、20℃及び25℃の場合である。第5図は
第4図からのコダックステップタブレットの段数変化量
を示すもので特性(h)、(i+及び(j)は夫々温度
15℃、20℃及び25℃の場合である。
In FIG. 4, the horizontal axis represents the residence time, and the vertical axis represents the C Nicoduck step tablet value. Characteristics (e), (g), and (g) are for temperatures of 15°C, 20°C, and 25°C, respectively. FIG. 5 shows the change in the number of stages of the Kodak Step Tablet from FIG. 4, and the characteristics (h), (i+ and (j) are for temperatures of 15°C, 20°C and 25°C, respectively.

第4図及び第5図から残存6価クロムイオン量の変化特
性と相関性のあることがわかる。
It can be seen from FIGS. 4 and 5 that there is a correlation with the change characteristics of the amount of residual hexavalent chromium ions.

以上の結果から暗反応の経時変化を抑制するためには感
光性膜を塗布形成後から現像的前までシヤドワマスク材
を出来るだけ低温低湿に保守することが望ましい。しか
し乍ら実際には第1図[b)で示すような暗反応進11
部を完全l二除去することは極めて困難なことであり、
またそのために要する設備及びエネルギーも大きなもの
となる。また相対湿度よりも温度の影響の方が大きい。
From the above results, in order to suppress the change in dark reaction over time, it is desirable to maintain the shadow mask material at as low temperature and low humidity as possible from after the photosensitive film is applied and before development. However, in reality, the dark reaction progression 11 is as shown in Figure 1 [b].
It is extremely difficult to completely remove the
Moreover, the equipment and energy required for this purpose are large. Also, the influence of temperature is greater than that of relative humidity.

以上の観点からさらに検討した結果、残存6価クロムイ
オン量が80%以上でコダックフォトグラフィックステ
ップタブレットN02の段数変化が1段以内であれは、
実用上暗反応の進行があっても支障のないことが確認さ
れた。この場合塵埃条件は設備及び経済性の点から相対
湿度40%乃至60%、温度18・℃以下に制御するこ
とが好ましく充分目的を達することができる。
As a result of further investigation from the above points of view, if the residual hexavalent chromium ion content is 80% or more and the change in the number of stages of Kodak Photographic Step Tablet N02 is within one stage,
It was confirmed that there is no problem in practical use even if the dark reaction progresses. In this case, the dust conditions are preferably controlled to a relative humidity of 40% to 60% and a temperature of 18.degree.

次l二実際の各工程での状況に対応して検問する。Next, inspections will be conducted according to the actual situation at each process.

ン出常シャドクマスク用金属板は長尺帯状の金属敬をロ
ール状にワインディングされた状態から製造工程が開始
される。一旦アンワインデイングされた金属板をその尽
定速で移動させ乍ら各工程を順次経てエツチング工程終
了後(ニエツプーングされた外枠でピックオフしフラッ
トマスクを得るのが暗反応の抑制の点からは最も好まし
い。何故なら各工程間の滞留時間が最も少なくてすむか
らである。
The manufacturing process for a metal plate for a shadow mask is started by winding a long strip of metal into a roll. From the point of view of suppressing dark reactions, it is best to move the unwound metal plate at a constant speed and pass through each process in sequence, and after the etching process is complete (pick off the etching process at the unwound outer frame to obtain a flat mask). Most preferred because it requires the least residence time between each step.

この場合、各工程の全ての環境を調整する、即ち室内全
体を空腹することは非常に非経済的であるから感光性膜
塗布後から露光工程前及び露光工程後から現像工程の前
までの間に部分的に空調な施丁のが経済的である。また
各工程間の滞留時間が最小であり暗反応の進行も少いの
で各工程間の少くとも1ケ所例えば露光工程の前後の少
くとも1ケ所に部分空調を施すことが効果的であった。
In this case, it is very uneconomical to adjust all the environments in each process, that is, to starve the entire room, so from after the photosensitive film is applied to before the exposure process, and from after the exposure process to before the development process. It is economical to install partial air conditioning. Furthermore, since the residence time between each step is minimized and the dark reaction progresses less, it is effective to provide partial air conditioning at least one location between each step, for example, at least one location before and after the exposure step.

これに対して多種のシャドクマスクを製造する場合は各
工程を独立して設けることが多く、各工程間の滞留に一
定時間を要するので環境条件の調整は特に重要である。
On the other hand, when manufacturing various types of shadow masks, each process is often performed independently, and a certain amount of time is required for residence between each process, so adjustment of environmental conditions is particularly important.

即ち、金属板をアンワインディングし感光性膜を塗布形
成後一旦ワインディングする。次(二露光工程前にアン
ワインディングし露光終了後一旦ワインディングする。
That is, the metal plate is unwinded, a photosensitive film is applied, and then the metal plate is once wound. Next (unwinding before the second exposure step and winding once after the exposure is completed).

さらt二現像工程前にアンワインディングし現像終了後
直ちにエツチングを開始するか又は一旦ワインゲイング
1−る。これは多種多様のシャドクマスクを製造する場
合、金属板の幅や露光用マスクパターンが異なるので、
各工程を独立した方が製造ラインとしては効率的なため
である。この場合、露光終了後は暗反応の進行が早いの
で少くともこの部分での部分空調が必要である。またワ
インディングされた金属板は比較的暗反応の進行は遅い
が、次工程までの滞留時間が長い場合は金属板の保管場
所【二も空調を施こすことは勿論必要である。
Furthermore, unwinding is performed before the second development step, and etching is started immediately after the development is completed, or wine-gaining is performed once. This is because when manufacturing a wide variety of shadow masks, the width of the metal plate and the mask pattern for exposure are different.
This is because it is more efficient as a manufacturing line if each process is independent. In this case, since the dark reaction progresses quickly after the exposure, at least partial air conditioning is required in this area. In addition, although the dark reaction progresses relatively slowly in a wound metal plate, if the residence time until the next process is long, it is of course necessary to provide air conditioning to the storage area of the metal plate.

次シー露光工程に部分空調を施こした実施例について第
6図を用いて説明する。但し露光装置としての基本的機
構は従来のものとほぼ同様であるので図面及び説明も簡
略化している。
An embodiment in which partial air conditioning is applied to the next exposure step will be described with reference to FIG. 6. However, since the basic mechanism of the exposure apparatus is almost the same as that of the conventional one, the drawings and explanations are also simplified.

即ち、露光装置αDは巻き送り側の暗箱(121内に軸
(13)の回転を二より両面に感光性被膜の被看形成さ
れた長尺のシャドウマスク用金属板(14+)を巻いた
(ワインディング)ローラαωが、収納されており、こ
のローラα5)から送り出された(アンワインディング
)シャドウマスク用金属板の両面から黒色ドツトt、i
6)がそれぞれ位置ぎめされた大孔側及び小孔側原版ネ
ガパターンa′0(図では一方の原版ネガパターンを示
す)を密着したのち、図示しない紫外線光源からの均一
な光で露光し、黒色ドツト00部を除いて感光性被膜を
光硬化させる。また巻き取り側の暗箱(18)内で軸σ
匂の矢印方向の回転により露光部の長尺のシャドウマス
ク用金属板(14g)を巻き取る(ワインディング)ロ
ーラ(20)が設けられているのは従来の露光装置とほ
ぼ同様であるが、本実施例においてはこのワインディン
グ側の暗箱0印に吸気管(21+)及び排気管(212
)を設け、この吸気管(211)内1ニエパポレータ@
ファン+23)冷凍機@及び電気ヒータ(ハ)からなる
空調装置(261を内装させ暗箱αa内の雰囲気ン感光
性被膜の未露光部の経時変化を抑制し得る条件である温
度18℃以下、相対湿度40%乃至60%に保持してい
る。
That is, the exposure device αD has a dark box (121) on the winding side, in which a long shadow mask metal plate (14+) with a photosensitive coating formed on both sides is wound around the rotation of the shaft (13). A (winding) roller αω is housed, and black dots t, i are formed on both sides of the (unwinding) shadow mask metal plate sent out from this roller α5).
6) are placed in close contact with the large hole side and small hole side original negative patterns a′0 (the figure shows one original negative pattern), and then exposed to uniform light from an ultraviolet light source (not shown), The photosensitive coating is photocured except for 00 parts of the black dots. Also, in the dark box (18) on the winding side, the axis σ
It is almost the same as a conventional exposure device in that it is equipped with a winding roller (20) that winds up a long shadow mask metal plate (14g) in the exposure area by rotating in the direction of the arrow. In the embodiment, the intake pipe (21+) and exhaust pipe (212) are marked in the dark box 0 on the winding side.
), and one pumporator inside this intake pipe (211) @
Fan + 23) An air conditioner (261) consisting of a refrigerator @ and an electric heater (c) is installed in the atmosphere inside the dark box αa, at a temperature of 18°C or less, which is a condition that can suppress the aging of the unexposed part of the photosensitive coating. The humidity is maintained at 40% to 60%.

〔発明の効果〕〔Effect of the invention〕

以上のようC二本発明によれば、感光性膜の暗反応を実
用的に支障のない範囲ζ二効果的i二抑制することがで
き、極めて品位の良好な電子ビーム通過孔を有するシャ
ドクマスクを製造することができる。
As described above, according to the present invention, it is possible to effectively suppress the dark reaction of the photosensitive film within a practically acceptable range, and the shadow mask has extremely high quality electron beam passing holes. can be manufactured.

【図面の簡単な説明】[Brief explanation of drawings]

第1図(a)及び第1図(b)は感光性膜の露光状態を
説明するための模式図、第2図は感光性膜の未露光部の
残存6価りロムイオン量とfM度との関係を示す特性図
、郷3図は感光性膜の未露光部の残存6価クロムイオン
量と相対湿度との関係を示す特性図、第4図は滞留時間
による感光性膜の感度(コダックステップタプレッ)N
O2)の変化を示す特性図、第5図は滞留時間(二よる
感光性膜の感度(コダックステップタブレッ)NO2)
の変化量を示す特性図、第6図は本発明を適用した露光
装置の一実施例を示す概略構成図である。 (1)・・・未露光部     (2)・・・露光部(
3)・・・暗反応進行部 (141)、(142)、(148)・・・金属板代理
人 弁理士 則 近 憲 佑 (ほか1名)
Figures 1(a) and 1(b) are schematic diagrams for explaining the exposure state of the photosensitive film, and Figure 2 shows the amount of residual hexavalent ROM ions in the unexposed area of the photosensitive film and the fM degree. Figure 3 is a characteristic diagram showing the relationship between the amount of residual hexavalent chromium ions in the unexposed area of the photosensitive film and relative humidity, and Figure 4 is the sensitivity of the photosensitive film depending on residence time (Kodak Step Taplet)N
Figure 5 shows the residence time (sensitivity of photosensitive film due to two factors (Kodak Step Tablet) NO2).
FIG. 6 is a schematic configuration diagram showing an embodiment of an exposure apparatus to which the present invention is applied. (1)...Unexposed area (2)...Exposed area (
3)...Dark reaction progress department (141), (142), (148)...Metal plate agent Patent attorney Noriyuki Chika (and 1 other person)

Claims (1)

【特許請求の範囲】 1)長尺金属板に感光性膜を塗布形成する工程と前記感
光性膜を塗布された金属板をマスクパターンを介して露
光する工程と前記露光された感光性膜を現像する工程と
前記現像された感光性膜のマスクパターンに沿ってエツ
チングする工程とからなるシャドクマスクの製造方法に
おいて、前記感光性膜塗布形成後程の後と前記露光工程
の前後と前記現像工程の前との少くとも1ケ所以上で前
記感光性膜の未露光部の暗反応による経時変化を抑制を
得る手段を有することを特徴とするシャドワマスクの製
造方法。 2)前記感光性膜の未露光部の暗反応による経時変化を
抑制し得る手段が温度18℃以下、相対湿度40%乃至
60%の部分空調であることを特徴とする特許請求の範
囲第1項記載のシャドワマスクの製造方法。 3)前記感光性膜塗布形成後の長尺金属板のワイング一
部と前記露光工程での露光装置への装着前のアンワイン
ダ一部及び露光後のワイング一部と前記現像工程での現
像装置への装着前のアンワイング一部との前記長尺金属
板のワイング一部及びアンワインダ一部のうちの少くと
も1ヶ所l二部分空調を施したことを特徴とする特許請
求の範囲第1項記載のシャドワマスクの製造方法。 4)前記露光工程前後の長尺金属板のアンワイング一部
とワイング一部に部分空調を施こしたことを特徴とする
特許請求の範囲第1項記載のシャドワマスクの製造方法
[Scope of Claims] 1) A step of coating and forming a photosensitive film on a long metal plate, a step of exposing the metal plate coated with the photosensitive film to light through a mask pattern, and a step of exposing the exposed photosensitive film to light through a mask pattern. In the method for manufacturing a shadow mask, which comprises a step of developing and a step of etching the developed photosensitive film along the mask pattern, the following steps are performed: after the photosensitive film is applied, before and after the exposure step, and before and after the development step. A method for manufacturing a shadow mask, comprising means for suppressing changes over time due to dark reactions in unexposed areas of the photosensitive film at at least one or more locations. 2) The first aspect of the present invention is characterized in that the means for suppressing changes over time due to dark reactions in unexposed areas of the photosensitive film is partial air conditioning at a temperature of 18° C. or less and a relative humidity of 40% to 60%. A method for manufacturing a shadow mask as described in Section 1. 3) A part of the winding of the long metal plate after the photosensitive film has been applied and formed, a part of the unwinder before being attached to the exposure device in the exposure step, and a part of the winding after exposure and the developing device in the developing step. Claim 1, characterized in that at least one of the unwinding part of the long metal plate and the unwinding part of the long metal plate is subjected to two-part air conditioning before installation. How to make a shadow mask. 4) The method of manufacturing a shadow mask according to claim 1, characterized in that the unwinding part and the winding part of the long metal plate before and after the exposure step are partially air-conditioned.
JP1820083A 1983-02-08 1983-02-08 Manufacture of shadow mask Pending JPS59149637A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1820083A JPS59149637A (en) 1983-02-08 1983-02-08 Manufacture of shadow mask

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1820083A JPS59149637A (en) 1983-02-08 1983-02-08 Manufacture of shadow mask

Publications (1)

Publication Number Publication Date
JPS59149637A true JPS59149637A (en) 1984-08-27

Family

ID=11964989

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1820083A Pending JPS59149637A (en) 1983-02-08 1983-02-08 Manufacture of shadow mask

Country Status (1)

Country Link
JP (1) JPS59149637A (en)

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