JPS5912633B2 - Diameter deviation detection method in Yusho pulling device - Google Patents

Diameter deviation detection method in Yusho pulling device

Info

Publication number
JPS5912633B2
JPS5912633B2 JP50050739A JP5073975A JPS5912633B2 JP S5912633 B2 JPS5912633 B2 JP S5912633B2 JP 50050739 A JP50050739 A JP 50050739A JP 5073975 A JP5073975 A JP 5073975A JP S5912633 B2 JPS5912633 B2 JP S5912633B2
Authority
JP
Japan
Prior art keywords
weight
bridge circuit
crystal
pulled
pulling
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP50050739A
Other languages
Japanese (ja)
Other versions
JPS51126853A (en
Inventor
鷹之介 青柳
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BEE KK
Original Assignee
BEE KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BEE KK filed Critical BEE KK
Priority to JP50050739A priority Critical patent/JPS5912633B2/en
Publication of JPS51126853A publication Critical patent/JPS51126853A/en
Publication of JPS5912633B2 publication Critical patent/JPS5912633B2/en
Expired legal-status Critical Current

Links

Description

【発明の詳細な説明】 この発明は結晶引上装置における直径偏差検出方法に関
するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for detecting diameter deviation in a crystal pulling apparatus.

金属あるいは半導体の単結晶は現代工業の必需品となつ
ている。
Single crystals of metals or semiconductors have become essential to modern industry.

この単結晶を得るには高温で熔解せしめたその材料より
、徐々に弓、1上げて長い単結晶とする所謂熔解引上げ
装置によるのが一般的である。この装置においては、そ
の得られる単結晶の寸法(直径または断面積)は材料の
引上速度と熔解部の温度で決定されるが、これらの決定
条件が可成り微妙である上、結晶が引上げられるに従い
熔5 解炉申に残る容積質量は減少するので熱容量が変
化して引上寸法の均一性確保を困難にしている。
To obtain this single crystal, it is common to use a so-called melt-pulling device that gradually increases the length of the material by melting it at a high temperature to produce a longer single crystal. In this device, the dimensions (diameter or cross-sectional area) of the single crystal obtained are determined by the pulling speed of the material and the temperature of the melting part, but these determining conditions are quite delicate, and the crystal is As the volume of the melt increases, the volumetric mass remaining in the melt decreases, resulting in a change in heat capacity, making it difficult to ensure uniformity in drawing dimensions.

そのために、これら装置に対して加熱電力(電流)或い
は熔解物の温度を検出し、これをフィードバックし、プ
ログラムにより制御することが行10なわれている。さ
らにより精度を高めるために近時引上げられつつある結
晶と重量と、引上寸法とを検出してフィードバックし、
単位当りの重量即ち断面積を一定化する制御方式が採用
されるようになつた。
For this purpose, the heating power (current) or the temperature of the melt is detected for these devices, this is fed back, and the device is controlled by a program (10). Furthermore, in order to further improve accuracy, we detect and feed back the crystals that are being pulled recently, their weight, and the pulling dimensions.
A control method that makes the weight per unit, that is, the cross-sectional area constant, has come to be adopted.

15そこで本発明は、結晶の引上装置に対し、その引上
げ部分の寸法(長さ)を偏位測定器により、引上げられ
た重量を重量計によつて検出し、それら両者から算出さ
れる単位長さ当り重量の瞬時値実際値と、予じめ設定せ
るその目標値との偏差と20をフィードバックし加熱電
流(又はその他のパラメータ)を制御することによりー
定断面結晶を得るものである。
15 Therefore, the present invention uses a crystal pulling device to detect the dimensions (length) of the pulled portion using a deflection measuring device and the pulled weight using a weighing scale, and to calculate a unit based on both of them. A crystal with a constant cross section is obtained by controlling the heating current (or other parameters) by feeding back the deviation between the instantaneous actual value of weight per length and its target value set in advance. .

しかしてこのばあいに、引上げられた重量は重量計の電
気的出力、また引上げ寸法は偏位計の電25気的出力を
もつてそれぞれ電圧(或は電流)として取り出し、それ
を入力とする電子的計算回路によつて目標値よりの偏差
を電気量として取り出すようにしたものである。
However, in the case of a lever, the lifted weight is the electrical output of the weight scale, and the lifted dimension is the electrical output of the displacement meter, which are respectively extracted as voltage (or current) and used as input. An electronic calculation circuit extracts the deviation from the target value as an electrical quantity.

こうして重量および引上げ寸法が共に単独に微少電圧と
して取り出される30ため、その扱いに注意しないと、
ドリフト或いは感度等の誤差を生じ易くなる欠点がある
。本発明は上述の欠点を解決し、検出された電気量がす
でに計算された結果として得られるようにするために、
ストレンゲージブリツジ回路による35重量検出器のブ
リッジ回路に対し、その抵抗分平衡調整回路と同一の構
成配置をもつて引上寸法に比例して摺動片移動するポテ
ンショメーターと、、C、−比例常数設定用抵抗値を接
続し、引上重量増加によるブリツジ回路出力と、引上寸
法増加によりポテンシオメータ一により与えられるブリ
ツジ回路出力とが互いに逆極性となるようにすることに
より、引上重量増加を引上寸法から換算される等価重量
との偏差を見い出すことにより、一定の断面積をもつて
引上げられるか否かを検出する結晶引上装置における直
径偏位検出方法を提案することをその目的とするもので
ある。
In this way, both the weight and the pull-up dimension are taken out individually as a minute voltage30, so if you are not careful when handling it,
There is a drawback that errors such as drift or sensitivity are likely to occur. The present invention solves the above-mentioned drawbacks and in order to allow the detected electrical quantity to be obtained as an already calculated result,
For the bridge circuit of the 35 weight detector based on the strain gauge bridge circuit, a potentiometer having the same configuration as the resistance balance adjustment circuit and whose sliding piece moves in proportion to the pulling dimension; By connecting a constant setting resistor value and making the bridge circuit output due to an increase in lifting weight and the bridge circuit output given by the potentiometer due to an increase in lifting size have opposite polarities, the lifting weight can be increased. The purpose is to propose a method for detecting diameter deviation in a crystal pulling device that detects whether or not a crystal can be pulled with a constant cross-sectional area by finding the deviation from the equivalent weight converted from the pulling dimension. That is.

図面につき本発明結晶引上装置における直径偏差検出方
法の好適な実施の一例態様を説明する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS A preferred embodiment of the diameter deviation detection method in the crystal pulling apparatus of the present invention will be described with reference to the drawings.

図に示すように抵抗1,2,3,4で構成したストレイ
ンゲージのブリツジ回路による荷重検出器の入出力端5
,6,7,8のうち、その端子5,7に対して端子9,
10よりブリツジ回路用の電源を印加すれば前記ブリツ
ジ回路の端子6,8間の出力は端子11,12より取り
出すことができるため、その出力電圧は、荷重検出器の
検出荷重に比例する。このストレインゲージによる荷重
検出が結晶の引上げられつつある重量を検出する如く装
着されていれば、前記端子11,12間の電圧は、すな
わち、引上げ重量に比例する。
As shown in the figure, the input/output terminal 5 of the load detector is a strain gauge bridge circuit composed of resistors 1, 2, 3, and 4.
, 6, 7, and 8, the terminal 9,
If a power source for the bridge circuit is applied from 10, the output between terminals 6 and 8 of the bridge circuit can be taken out from terminals 11 and 12, so the output voltage is proportional to the load detected by the load detector. If this strain gauge is installed to detect the weight of the crystal being pulled, the voltage between the terminals 11 and 12 will be proportional to the weight of the crystal being pulled.

また可変抵抗13と、固定抵抗14,15による調整回
路は、ストレインゲージブリツジ回路の公知の平衡回路
であり、引上重量の測定開始の時点にて前記端子11,
12の出力電圧をゼロに調整する。
Further, the adjustment circuit including the variable resistor 13 and the fixed resistors 14 and 15 is a well-known balance circuit of a strain gauge bridge circuit, and at the time of starting the measurement of the lifted weight, the terminal 11,
Adjust the output voltage of 12 to zero.

16は結晶引上装置の引上げ部に取り付けられた引上寸
法検出器である。
16 is a pulling dimension detector attached to the pulling section of the crystal pulling device.

即ち、この引上寸法検出器16は、引上げられる結晶の
引上げ寸法に比例して摺動片が移動する如く機械的に設
置する。したがつて結晶が引上げられるにつれて、その
長さに比例した不平衡を前記ブリツジ回路に与える。1
7はその比例常数の設定器である。
That is, this pulling dimension detector 16 is mechanically installed so that the sliding piece moves in proportion to the pulling dimension of the crystal to be pulled. As the crystal is pulled up, it therefore imparts an unbalance to the bridge circuit that is proportional to its length. 1
7 is a setting device for the proportionality constant.

また15は可変抵抗13(調整回路)の回転角と、同じ
く可変抵抗16の回転(又は摺動片の移動寸法)により
付与されるブリツジ回路への影響(感度)を設定してお
く固定抵抗である。
Further, 15 is a fixed resistor that sets the rotation angle of the variable resistor 13 (adjustment circuit) and the influence (sensitivity) on the bridge circuit given by the rotation of the variable resistor 16 (or the movement dimension of the sliding piece). be.

前記固定抵抗14が可変抵抗より遥かに小とし、固定抵
抗15が存在する時、前記可変抵抗17を径由して可変
抵抗16にて変化させる値(即ちそのブリツジに与える
不平衡の範囲)は、固定抵抗15のないときを1とすれ
ば固定抵抗15と14で分割した比率に低下する。
When the fixed resistor 14 is much smaller than the variable resistor and the fixed resistor 15 is present, the value changed by the variable resistor 16 via the variable resistor 17 (that is, the range of unbalance given to the bridge) is If the case where the fixed resistor 15 is not present is set to 1, then the ratio decreases to the ratio divided by the fixed resistors 15 and 14.

すなわち、固定抵抗16によつて発生せしめうるブリツ
ジ回路不平衡の最大巾を固定抵抗15によつて減少せし
めるように構成する。また上記設定器17を減少するこ
とにより、可変抵抗16による可変巾(不平衡の最大巾
)を増加せしめうる。
That is, the fixed resistor 15 is configured to reduce the maximum width of bridge circuit unbalance that can be caused by the fixed resistor 16. Furthermore, by reducing the number of setting devices 17, the variable width (maximum width of unbalance) by the variable resistor 16 can be increased.

さらに固定抵抗15を或る値に固定しておけば、可変抵
抗16の摺動片移動によりブリツジ回路に与える不平衡
量は可変抵抗17で調整設定する。上記のブリツジ回路
はストレインゲージによる荷重検出器である故、予め引
上重量によるブリツジの発生不平衡(又は出力電圧)が
定つている。
Furthermore, if the fixed resistor 15 is fixed at a certain value, the amount of unbalance given to the bridge circuit by the movement of the sliding piece of the variable resistor 16 can be adjusted and set by the variable resistor 17. Since the bridge circuit described above is a load detector using a strain gauge, the unbalance (or output voltage) at which a bridge occurs due to the lifting weight is determined in advance.

しかして、前記可変抵抗(検出器)16の摺動片が引上
寸法により移動すると、設定器17により(及び固定抵
抗により)決定される等価重量としての不平衡をブリツ
ジに与え、出力電圧として取り出すことができる。すな
わち、前記可変抵抗13は、測定開始初期の出力をゼロ
に合わせる調整回路を示すものである。いま、可変抵抗
(検出器)16の摺動片移動の極性が、引上寸法増加に
よつて等価重量の電気出力を減少せしめるようにし、そ
して引上重量が増加するに従い、ブリツジ回路の出力電
圧が増加する極性としてあつた時、および設定器17の
設定値、すなわち、引上寸法対等価重量の比例常数と同
一の重量増加と引上寸法増加があつた場合、結晶を引上
げつつ前記ブリツジ回路で検出される重量と、引上寸法
(検出器16)により、ブリツジに与えられる不平衡分
の等価重量とは極性が逆で等しくなる。
When the sliding piece of the variable resistor (detector) 16 moves according to the pull-up dimension, an unbalance as an equivalent weight determined by the setting device 17 (and the fixed resistor) is given to the bridge, and the output voltage is It can be taken out. That is, the variable resistor 13 represents an adjustment circuit that adjusts the output to zero at the initial stage of measurement. Now, the polarity of the movement of the sliding piece of the variable resistor (detector) 16 is such that the electric output of the equivalent weight decreases as the lifted size increases, and as the pulled weight increases, the output voltage of the bridge circuit decreases. When the polarity increases, and when the weight increase and the pulling dimension increase are equal to the set value of the setting device 17, that is, the proportional constant of the pulling dimension to the equivalent weight, the bridge circuit while pulling the crystal The weight detected by the bridge is equal to and opposite in polarity to the equivalent weight of the unbalanced portion given to the bridge by the lifted dimension (detector 16).

即ち、ブリツジ出力はゼ゛口である。このように、前記
ブリツジ回路の出力電圧が常にゼロである時は、引上げ
つつある結晶の重量増加、すなわち、予じめ定めた引上
寸法増加より換算される重量増加と等しいこととなる。
したがつて結晶の比重が一定であればその結晶の断面が
一定として引上げられる。しかして、例えば上記ブリツ
ジ回路の出力電圧がゼロでなくなつた時は、結晶重量増
加が予め設定器17で決定される値より異なることを示
し、したがつて、出力が正であれば重量増加過大、すな
わち断面積が大になりつつあることを示し、また出力が
負であれば断面積が小であることを示すものである。
That is, the bridge output is zero. Thus, when the output voltage of the bridge circuit is always zero, it is equal to the weight increase of the crystal being pulled, that is, the weight increase calculated from the predetermined increase in the pulling dimension.
Therefore, if the specific gravity of the crystal is constant, the cross section of the crystal will be pulled as constant. Therefore, for example, when the output voltage of the bridge circuit is no longer zero, it indicates that the crystal weight increase is different from the value predetermined by the setting device 17, and therefore, if the output is positive, the weight increase Excessive output indicates that the cross-sectional area is becoming large, and negative output indicates that the cross-sectional area is small.

このように、このブリツジ回路の出力電圧を結晶熔解用
の電流に帰還することにより、常にブリツジ回路出力を
ゼロ、すなわち、設定器17で設定せる引上寸法対重量
の比率(断面積)を一定に引上げることができる。
In this way, by feeding back the output voltage of this bridge circuit to the crystal melting current, the bridge circuit output is always zero, that is, the ratio of the pulling dimension to the weight (cross-sectional area) set by the setting device 17 is kept constant. can be raised to

上述の説明から明らかなように本発明検出方法は、その
引上重量と、引上寸法の双方に対し、それぞれを電圧と
して取り出して減算する如きことを全くせずに、1個の
回路にその差分そのものを出力として取り出し、そして
すべて受動的素子(可変抵抗、ストレインゲージ等)の
みより成る故に極めて安定で、且つ取り扱いも容易であ
る上、従来の検出方法より、遥かに簡単にしかもその検
出精度を向上させる等多くの効果がある。
As is clear from the above explanation, the detection method of the present invention allows one circuit to perform both the lifted weight and lifted dimension without extracting and subtracting each as a voltage. The difference itself is extracted as an output, and since it consists of only passive elements (variable resistors, strain gauges, etc.), it is extremely stable and easy to handle.It is also much easier to detect and has higher detection accuracy than conventional detection methods. It has many effects such as improving

【図面の簡単な説明】[Brief explanation of drawings]

図面は本発明直径偏差検出方法に適用する略図的電気配
線図である。 1,2,3,4・・・・・・抵抗、5,6,7,8・・
・・・・入出力端子、9,10,11,12・・・・・
・端子、13,14・・・・・・ゼロ点調整回路、15
・・・・・・固定抵抗、16・・・・・・検出器、17
・・・・・・設定器。
The drawing is a schematic electrical wiring diagram applied to the diameter deviation detection method of the present invention. 1, 2, 3, 4... Resistance, 5, 6, 7, 8...
...Input/output terminals, 9, 10, 11, 12...
・Terminals, 13, 14...Zero point adjustment circuit, 15
...Fixed resistor, 16...Detector, 17
・・・・・・Setting device.

Claims (1)

【特許請求の範囲】[Claims] 1 ストレインゲージブリッジ回路による重量検出器の
ブリッジ回路に対し、ての抵抗分平衡調整回路と同一の
構成配置をもつて引上寸法に比例して摺動片移動するポ
テンショメータと、比例常数設定用抵抗とを接続し、引
上重量増加によるブリッジ回路出力と、前記引上寸法増
加によりポテンシオメータにより付与されるブリッジ回
路出力とが互いに逆極性となるようにすることにより、
引上重量増加と引上寸法から換算される等価重量との偏
差を見い出すことによつて、一定の断面積をもつて引上
げられているか否かを検出するようにしたことを特徴と
する結晶引上装置における直径偏差検出方法。
1 For the bridge circuit of the weight detector using the strain gauge bridge circuit, a potentiometer whose sliding piece moves in proportion to the pulling dimension and a resistor for setting a proportionality constant have the same configuration as the resistance balance adjustment circuit. By connecting the bridge circuit output due to the increased lifting weight and the bridge circuit output given by the potentiometer due to the increased lifting size, the polarity is opposite to each other.
A crystal pulling device characterized in that whether or not the crystal is being pulled with a constant cross-sectional area is detected by finding the deviation between the increase in the pulled weight and the equivalent weight converted from the pulled dimensions. Diameter deviation detection method in the above device.
JP50050739A 1975-04-28 1975-04-28 Diameter deviation detection method in Yusho pulling device Expired JPS5912633B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50050739A JPS5912633B2 (en) 1975-04-28 1975-04-28 Diameter deviation detection method in Yusho pulling device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50050739A JPS5912633B2 (en) 1975-04-28 1975-04-28 Diameter deviation detection method in Yusho pulling device

Publications (2)

Publication Number Publication Date
JPS51126853A JPS51126853A (en) 1976-11-05
JPS5912633B2 true JPS5912633B2 (en) 1984-03-24

Family

ID=12867197

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50050739A Expired JPS5912633B2 (en) 1975-04-28 1975-04-28 Diameter deviation detection method in Yusho pulling device

Country Status (1)

Country Link
JP (1) JPS5912633B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH034518Y2 (en) * 1984-11-09 1991-02-06
JPH0434004Y2 (en) * 1985-12-10 1992-08-13

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5659692A (en) * 1979-10-13 1981-05-23 Toshiba Corp Diameter controlling method for single crystal

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3259467A (en) * 1962-12-07 1966-07-05 Siemens Ag Apparatus for pulling rod-shaped crystals of semiconductor material from a melt in acrucible
JPS4939704A (en) * 1972-08-28 1974-04-13
JPS49111879A (en) * 1973-02-27 1974-10-24

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3259467A (en) * 1962-12-07 1966-07-05 Siemens Ag Apparatus for pulling rod-shaped crystals of semiconductor material from a melt in acrucible
JPS4939704A (en) * 1972-08-28 1974-04-13
JPS49111879A (en) * 1973-02-27 1974-10-24

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH034518Y2 (en) * 1984-11-09 1991-02-06
JPH0434004Y2 (en) * 1985-12-10 1992-08-13

Also Published As

Publication number Publication date
JPS51126853A (en) 1976-11-05

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