JPS5912321A - 分光計 - Google Patents

分光計

Info

Publication number
JPS5912321A
JPS5912321A JP12102082A JP12102082A JPS5912321A JP S5912321 A JPS5912321 A JP S5912321A JP 12102082 A JP12102082 A JP 12102082A JP 12102082 A JP12102082 A JP 12102082A JP S5912321 A JPS5912321 A JP S5912321A
Authority
JP
Japan
Prior art keywords
wavelength
light
measured
reflected light
intensity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12102082A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0571270B2 (enrdf_load_stackoverflow
Inventor
Yoshiro Ooyama
大山 吉郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP12102082A priority Critical patent/JPS5912321A/ja
Publication of JPS5912321A publication Critical patent/JPS5912321A/ja
Publication of JPH0571270B2 publication Critical patent/JPH0571270B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Radiation-Therapy Devices (AREA)
JP12102082A 1982-07-12 1982-07-12 分光計 Granted JPS5912321A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12102082A JPS5912321A (ja) 1982-07-12 1982-07-12 分光計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12102082A JPS5912321A (ja) 1982-07-12 1982-07-12 分光計

Publications (2)

Publication Number Publication Date
JPS5912321A true JPS5912321A (ja) 1984-01-23
JPH0571270B2 JPH0571270B2 (enrdf_load_stackoverflow) 1993-10-06

Family

ID=14800815

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12102082A Granted JPS5912321A (ja) 1982-07-12 1982-07-12 分光計

Country Status (1)

Country Link
JP (1) JPS5912321A (enrdf_load_stackoverflow)

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS503388A (enrdf_load_stackoverflow) * 1973-05-11 1975-01-14
JPS51136474A (en) * 1975-05-06 1976-11-25 Siemens Ag Drift correcting apparatus for gas analyzer
JPS52138178A (en) * 1976-05-14 1977-11-18 Toshiba Machine Co Ltd Apparatus for measuring hue of liquid
JPS5311079A (en) * 1976-07-15 1978-02-01 Sterndent Corp Method of producing colorimeter and mixed ceramic material
JPS5360683A (en) * 1976-11-12 1978-05-31 Uragami Riko Kk Light detector for photometer
JPS5455881U (enrdf_load_stackoverflow) * 1978-09-21 1979-04-18
JPS55125528U (enrdf_load_stackoverflow) * 1979-03-01 1980-09-05

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS503388A (enrdf_load_stackoverflow) * 1973-05-11 1975-01-14
JPS51136474A (en) * 1975-05-06 1976-11-25 Siemens Ag Drift correcting apparatus for gas analyzer
JPS52138178A (en) * 1976-05-14 1977-11-18 Toshiba Machine Co Ltd Apparatus for measuring hue of liquid
JPS5311079A (en) * 1976-07-15 1978-02-01 Sterndent Corp Method of producing colorimeter and mixed ceramic material
JPS5360683A (en) * 1976-11-12 1978-05-31 Uragami Riko Kk Light detector for photometer
JPS5455881U (enrdf_load_stackoverflow) * 1978-09-21 1979-04-18
JPS55125528U (enrdf_load_stackoverflow) * 1979-03-01 1980-09-05

Also Published As

Publication number Publication date
JPH0571270B2 (enrdf_load_stackoverflow) 1993-10-06

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