JPS59121746A - 表面分析装置 - Google Patents

表面分析装置

Info

Publication number
JPS59121746A
JPS59121746A JP57227437A JP22743782A JPS59121746A JP S59121746 A JPS59121746 A JP S59121746A JP 57227437 A JP57227437 A JP 57227437A JP 22743782 A JP22743782 A JP 22743782A JP S59121746 A JPS59121746 A JP S59121746A
Authority
JP
Japan
Prior art keywords
cathode
anode
sample
ion
hole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57227437A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0135469B2 (cs
Inventor
Katsuhiro Kageyama
影山 賀都鴻
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP57227437A priority Critical patent/JPS59121746A/ja
Publication of JPS59121746A publication Critical patent/JPS59121746A/ja
Publication of JPH0135469B2 publication Critical patent/JPH0135469B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP57227437A 1982-12-28 1982-12-28 表面分析装置 Granted JPS59121746A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57227437A JPS59121746A (ja) 1982-12-28 1982-12-28 表面分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57227437A JPS59121746A (ja) 1982-12-28 1982-12-28 表面分析装置

Publications (2)

Publication Number Publication Date
JPS59121746A true JPS59121746A (ja) 1984-07-13
JPH0135469B2 JPH0135469B2 (cs) 1989-07-25

Family

ID=16860844

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57227437A Granted JPS59121746A (ja) 1982-12-28 1982-12-28 表面分析装置

Country Status (1)

Country Link
JP (1) JPS59121746A (cs)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5150010A (en) * 1990-03-14 1992-09-22 Kabushiki Kaisha Toshiba Discharge-in-magnetic-field type ion generating apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5150010A (en) * 1990-03-14 1992-09-22 Kabushiki Kaisha Toshiba Discharge-in-magnetic-field type ion generating apparatus

Also Published As

Publication number Publication date
JPH0135469B2 (cs) 1989-07-25

Similar Documents

Publication Publication Date Title
Kruit et al. Magnetic field paralleliser for 2π electron-spectrometer and electron-image magnifier
JPH09500967A (ja) 超感度分子識別装置
Kisker et al. Electron spectrometer for spin‐polarized angle‐and energy‐resolved photoemission from ferromagnets
US6985553B2 (en) Ultra-short ion and neutron pulse production
US3644731A (en) Apparatus for producing an ion beam by removing electrons from a plasma
US4661710A (en) Negative ion source
Kelly et al. Nitrogen ion spectrum from a low energy plasma focus device
US3534385A (en) Process and apparatus for micro-machining and treatment of materials
US4455486A (en) Method and apparatus for detecting magnetism by means of electron spin polarization measurements through dielectronic transition
JPS59121746A (ja) 表面分析装置
JPH04505828A (ja) 真空装置のリーク検出のための、冷陰極イオン源を用いる分圧ゲージ
Krishnakumar et al. Dissociative attachment studies by negative‐ion time‐of‐flight mass spectrometry
US3379968A (en) Method and means for detection of gases and vapors
Bonnie et al. Resonance‐enhanced multiphoton ionization for diagnosis of a weakly ionized plasma
JPH0355934B2 (cs)
Purser A future AMS/chromatography instrument for biochemical and environmental measurements
WO2004064462A9 (en) Coded target for neutron source
JP2777614B2 (ja) 質量分析方法および質量分析計
GB829783A (en) Apparatus for producing beams of ions of a given element
Muller Application of multiply charged ions to small accelerators
Nishihashi et al. Negative ion source for the tandem accelerator
Okano Preliminary Report on an Electromagnetic Isotope Separator
JP2001343364A (ja) 固体中の特定原子の検出装置
Malinowski et al. Analysis Of The Structure Of Ion Micro‐Beams Emitted From RPI‐And PF‐Type Facilities
Das et al. Radial Characteristics of a Magnetized Plasma Column