JPS59114704A - High dielectric porcelain composition - Google Patents

High dielectric porcelain composition

Info

Publication number
JPS59114704A
JPS59114704A JP57224323A JP22432382A JPS59114704A JP S59114704 A JPS59114704 A JP S59114704A JP 57224323 A JP57224323 A JP 57224323A JP 22432382 A JP22432382 A JP 22432382A JP S59114704 A JPS59114704 A JP S59114704A
Authority
JP
Japan
Prior art keywords
high dielectric
dielectric constant
ceramic
composition
added
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57224323A
Other languages
Japanese (ja)
Other versions
JPS6236327B2 (en
Inventor
板倉 鉉
黒田 孝之
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP57224323A priority Critical patent/JPS59114704A/en
Publication of JPS59114704A publication Critical patent/JPS59114704A/en
Publication of JPS6236327B2 publication Critical patent/JPS6236327B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Compositions Of Oxide Ceramics (AREA)
  • Ceramic Capacitors (AREA)
  • Inorganic Insulating Materials (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 産業上の利用分野 本発明はチタン酸バリウムを主体とする高誘電率でかつ
緻密なセラミック構造を有する高誘電率磁器組成物に関
するものである。
DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention relates to a high-permittivity ceramic composition containing barium titanate as a main component and having a high dielectric constant and a dense ceramic structure.

従来例の構成とその問題点 従来より磁器コンデンサの組成物として、チタン酸バリ
ウムを主体とするものが数多く知られている。チタン酸
バリウムは周知のように、強誘電性を有する特異な物質
で高温では立方晶系のペロプスカイト形の構造を有し、
120℃以下ではC軸が僅かに伸びて正方晶となり、さ
らに0°C付近で斜方晶、−so’c伺近で菱面体晶へ
と変化する。
Conventional Structures and Their Problems Many ceramic capacitor compositions based on barium titanate have been known in the past. As is well known, barium titanate is a unique ferroelectric substance that has a cubic perovskite structure at high temperatures.
Below 120°C, the C-axis is slightly elongated to become a tetragonal crystal, and further changes to an orthorhombic crystal around 0°C and a rhombohedral crystal near -so'c.

上記120℃付近の相転移点を特にキニリ一点というが
、このキニリ一点を境にしてそれよシ高温で常誘電性を
示し、低温では強誘電性を示す。そして、とのキ、 リ
一点において、誘電率か約1o○00と極めて高い値を
示す。ここで、チタン酸バリウムだけでは常温で高誘電
率とはなり得ない。そして、チタン酸バリウムのキニリ
一点刊近の高誘電率を低温側に移動させる事により、常
温付近で適当な静電容量を有する小型のコンデンサを実
用化する事は従来より数多く行われている。
The above-mentioned phase transition point near 120° C. is particularly referred to as a single point, and beyond this point, it exhibits paraelectricity at higher temperatures and exhibits ferroelectricity at lower temperatures. And, at one point, the dielectric constant exhibits an extremely high value of about 1000. Here, barium titanate alone cannot provide a high dielectric constant at room temperature. By moving the high dielectric constant of barium titanate to the low temperature side, many attempts have been made to commercialize small capacitors with appropriate capacitance near room temperature.

この誘電率のピーク値のあられれる温度を移動させる添
加剤はシフターと呼ばれ、B a S n 03  。
The additive that shifts the temperature at which the peak value of the dielectric constant occurs is called a shifter, and is B a S n 03 .

5rSn03.C1aSn03.PbSnO3,Cu5
nO3。
5rSn03. C1aSn03. PbSnO3, Cu5
nO3.

Zn5n03.CdSnO3等のスズ酸塩、 BaZr
O3゜C1aZr03,5rZr03等のジルコノ酸塩
及び5rTiQ3 。
Zn5n03. stannates such as CdSnO3, BaZr
Zirconate salts such as O3°C1aZr03, 5rZr03 and 5rTiQ3.

P b T i O3等のチタン酸塩か一般的に知られ
、上記の順にシフターとしての効果が強い。これらのシ
フターを利用したチタン酸バリウム系磁器コンテ/ザは
単板型リ−ト付タイプのものとして利用されてきた。し
かしながら、最近積層チップ化技術が進歩し、30〜1
00μm程度の誘電体シートが容易に得られ、この薄膜
を電極を挟持する形で幾層も積層したいわゆる積層セラ
ミックチップコンデンサか種々のエレクトロニクス業界
に進出してきておシ、従来の誘電体磁器組成物をこのよ
うな積層薄膜誘電体として利用する事が多くなってきて
いる。しかしながら、従来の単板型磁器コンデンサでは
誘電体の厚みが100μm〜10000μmと厚いが、
積層セラミックチップコンデンサでは10μm〜20μ
mと薄いため5〜10倍以上の電界強度を受ける。した
がって、従来の単板型コンデンサに比較してよシミ圧依
存性の小さい組成物が要求されている。また、誘電体層
が薄くなるにしたがい、セラミックの構造的な欠陥が特
性に出やすくなるので、結晶粒子が均一でかつ微細であ
る事と、空孔が少なくかつ小さい事が望まれる。
Titanates such as P b T i O3 are generally known and have the strongest effect as a shifter in the order listed above. A barium titanate-based porcelain container/container using these shifters has been used as a single plate type with a reed. However, with recent advances in stacked chip technology, 30~1
A dielectric sheet with a diameter of approximately 0.00 μm can be easily obtained, and so-called multilayer ceramic chip capacitors, in which many layers of this thin film are laminated with electrodes sandwiched between them, have entered various electronics industries. are increasingly being used as such laminated thin film dielectrics. However, in conventional single-plate ceramic capacitors, the dielectric thickness is as thick as 100 μm to 10,000 μm.
10μm to 20μm for multilayer ceramic chip capacitors
Because it is thin (m), it receives an electric field strength of 5 to 10 times more. Therefore, there is a need for a composition that has less dependence on sag pressure than conventional single-plate capacitors. Furthermore, as the dielectric layer becomes thinner, structural defects in the ceramic become more likely to appear in the characteristics, so it is desirable that the crystal grains be uniform and fine, and that the number of pores be small and small.

このような背景において、本発明者らは特願昭57−1
6809号によりすでに高誘電率でかつセラミックの構
造欠陥か少なく、電圧依存性の小さい、しかも高耐圧な
高誘電率磁器組成物を提供している。すなわち、BaT
iO310oモル部に対1モル部からなる高誘電率磁器
組成物である。
In this background, the present inventors filed the patent application No. 57-1.
No. 6809 has already provided a high dielectric constant ceramic composition that has a high dielectric constant, has few ceramic structural defects, has low voltage dependence, and has a high withstand voltage. That is, BaT
It is a high dielectric constant ceramic composition consisting of 1 mole part to 10 mole part of iO3.

しかしながら、この組成物では絶縁抵抗がやや低い事及
び発色が鮮明な赤であり、積層セラミックチップコンデ
ンサのパラジウム電極が透けて見えるため品位上の問題
があった。
However, with this composition, the insulation resistance was somewhat low and the color was bright red, so that the palladium electrodes of the multilayer ceramic chip capacitor were visible through it, resulting in quality problems.

発明の目的 本発明は上記の欠点を除去しようとするもので、絶縁抵
抗のより高い特性を得ると同時に積層セラミックチップ
コンデンサのパラジウム電極が磁器を通して透けて見え
ない高誘電率磁器組成物を得る事を目的とする。
OBJECT OF THE INVENTION The present invention seeks to eliminate the above-mentioned drawbacks, and aims to obtain a high dielectric constant ceramic composition that has higher insulation resistance properties and at the same time does not allow palladium electrodes of a multilayer ceramic chip capacitor to be seen through the ceramic. With the goal.

発明の構成 この目的を達成するために本発明の高誘電率磁器組成物
は、BaTiO3100モル部、GeO,、−(7±1
)モル部及びTiO27±1モル部カラする磁器組成物
に酸化ニアケル(NiO)を微量添加したものである。
Structure of the Invention In order to achieve this object, the high dielectric constant ceramic composition of the present invention contains 100 mol parts of BaTiO3, GeO, -(7±1
) and 27±1 molar parts of TiO are added to a small amount of niakel oxide (NiO) to a ceramic composition.

この構成によシ絶縁抵抗が向上し、でらに磁器の発色を
明度を下げ積層セラミソクチンプコンテンサのパラジウ
ム電極が磁気を通して透けて見えなくなり品位が向上す
るものである0 実施例の説明 以下実施例に基づき詳細に本発明を説明する。
This structure improves the insulation resistance, and also reduces the brightness of the coloring of the porcelain, and the palladium electrode of the laminated ceramic molding container is no longer visible through the magnetism, improving the quality. The invention will be explained in detail on the basis of examples.

まず、チタン酸バリウム(BaTiO3)を次のように
合成した。すなわち、炭酸バリウム(BaCo3)と酸
化チタン(TiO2)をCB 2L)/(T i ) 
比が1.000±0.005の精度で混合し、11oO
〜1150’Cで仮焼後、粉砕してBaTiO3を得た
First, barium titanate (BaTiO3) was synthesized as follows. That is, barium carbonate (BaCo3) and titanium oxide (TiO2) are CB 2L)/(T i )
Mix with an accuracy of ratio 1.000±0.005, 11oO
After calcining at ~1150'C, it was pulverized to obtain BaTiO3.

このBaTiO3100モル部に対して、CeO2−(
7±1)モル部及びTiO27±1モル部を添加し、さ
らにNio f:ftm々の割合で添加して混合した。
For 100 mol parts of this BaTiO3, CeO2-(
7±1) molar parts and TiO27±1 molar parts were added, and further added at a ratio of Nio f:ftm and mixed.

この混合物にバインダーを加えて造粒し、角板状に成型
して1250〜1350°Cの範囲で焼成した。この後
、銀電極を形成した。
A binder was added to this mixture, the mixture was granulated, formed into a rectangular plate shape, and fired at a temperature in the range of 1250 to 1350°C. After this, a silver electrode was formed.

第1図A、B、0はNiOの添加量と電気特性の関係を
示す図である。この第1図から明らかなように、同図五
の誘電率eはMnO□の添加量か”0.2モル部を超え
ると次第に減少する傾向にある。
FIGS. 1A, B, and 0 are diagrams showing the relationship between the amount of NiO added and electrical characteristics. As is clear from FIG. 1, the dielectric constant e shown in FIG. 5 tends to gradually decrease when the amount of MnO□ added exceeds 0.2 mol part.

また、第1図Bで示されるi定損失角−δはNユOが0
.5モル部を超えると大きくなる傾向がある。
Also, the i constant loss angle -δ shown in Figure 1B is 0.
.. If it exceeds 5 mole parts, it tends to increase.

さらに、第1図Cで示される絶縁抵抗IRはNiOが増
加するにしたがい漸増する。
Furthermore, the insulation resistance IR shown in FIG. 1C gradually increases as the NiO content increases.

次に、上記のNiOの各種添加量の組成について、第2
図に示すような積層セラミックチップコンデンサを試作
した。尚、第2図において1は誘電体で電極間厚さは3
6μm、2はパラジウム電極、3は銀端子電極である。
Next, regarding the composition of the various amounts of NiO added above, the second
We prototyped a multilayer ceramic chip capacitor as shown in the figure. In Fig. 2, 1 is a dielectric and the thickness between the electrodes is 3.
6 μm, 2 is a palladium electrode, and 3 is a silver terminal electrode.

第3図A、B、Cはこのような積層セラミソクチ、グコ
ンデンザについて、N10添加量と電気特性の関係を示
したものである。また、斜線部はパラジウム電極が厚み
35μmの誘電体層を通して透けて見える範囲を示しだ
ものである。この第3図から明らかなように、第1図に
示される角板での電気特性値に比較してNiO添加量依
存性が比較的大きい。まず、N’i0  をO−2モル
部を超えて添加すると、第3図Aで示されるように誘電
率εは極端に低下するが、0.2モル部以内ではほとん
ど誘電率εは変化しない。また、絶縁抵抗IRは第3図
Bで示されるように0.2モル部において、N’i0 
無添加の約5倍の値を示す。さらに、第3図Gで示され
るように訪電損失角鵬δは0.3モル部以上で大きくな
る。
FIGS. 3A, B, and C show the relationship between the amount of N10 added and the electrical properties of such laminated ceramic plates and condensers. Further, the shaded area indicates the range where the palladium electrode can be seen through the dielectric layer having a thickness of 35 μm. As is clear from FIG. 3, the dependence on the amount of NiO added is relatively large compared to the electrical characteristic values of the square plate shown in FIG. First, when N'i0 is added in excess of O-2 molar parts, the dielectric constant ε decreases extremely as shown in Figure 3A, but within 0.2 molar parts, the dielectric constant ε hardly changes. . In addition, as shown in FIG. 3B, the insulation resistance IR is N'i0 at 0.2 molar parts.
The value is approximately 5 times higher than that without additives. Furthermore, as shown in FIG. 3G, the contact loss δ becomes large at 0.3 mole part or more.

以上の結果から、NiOの最適添加量の範囲はパラジウ
ム電極が透けて見えない0.06モル部と誘電率か急に
下降しはじめる直前の0.2モル部の間に制限される。
From the above results, the range of the optimum amount of NiO to be added is limited to between 0.06 mol part, at which the palladium electrode is not visible, and 0.2 mol part, at which the dielectric constant begins to drop suddenly.

尚、グレインサイズは実施例全般にわたり平均2〜3μ
mであり、ポアサイズも2〜3μml下であった。
In addition, the average grain size is 2 to 3μ throughout the examples.
m, and the pore size was also below 2 to 3 μml.

発明の効果 以上述べたことから、本発明の組成物は特願昭57−1
6809号の組成物と同様グレインが細かく、ボアが少
なく、小さい緻密なセラミックが得られるといつだ利点
を有すると共に、特願昭67−16809号の絶縁抵抗
性の大幅な改善と、積層セラミックチップコンデンサと
してパラジウム電極が透けて見える事のないセラミック
か提供しうるものである。特に、EIA規格のYsD特
性積層セラミックチップコンデンサ用銹電体組成物とし
て極めて有効であり、その産業的価値は太きいものであ
る。
Effects of the Invention From the above, the composition of the present invention is disclosed in Japanese Patent Application No. 57-1.
Similar to the composition of No. 6809, it has the advantage of being able to obtain a small, dense ceramic with fine grains and few bores, as well as the significant improvement in insulation resistance and laminated ceramic chip of patent application No. 16809/1986. It is possible to provide a ceramic capacitor in which the palladium electrode cannot be seen through. In particular, it is extremely effective as a galvanic composition for multilayer ceramic chip capacitors with YsD characteristics according to EIA standards, and its industrial value is great.

尚、実施例ではチタン酸バリウムを合成したが、市販の
チタン酸バリウムを用いてもかまわないことはもちろん
である。
Although barium titanate was synthesized in the examples, it is of course possible to use commercially available barium titanate.

【図面の簡単な説明】[Brief explanation of drawings]

第1図A、B、Cは本発明の組成物に関するN’i0 
添加量と角板誘電体の特性を示す図、第2図は本発明の
組成物を適用した積層セラミソクチ2プコンデンサの断
面図、第3図A、B、Cは本発明の組成物に関するNi
O添加量と積層セラミックチップコンデンサの特性を示
す図である。 代理人の氏名 弁理士 中 尾 敏 男 ほか1名第1
図 −”  Nt′θ俸アシシσ4(七ル部ン第2図
Figure 1 A, B, C shows N'i0 for the composition of the invention.
Figure 2 is a cross-sectional view of a multilayer ceramic dielectric capacitor to which the composition of the present invention is applied, and Figures A, B, and C are graphs showing the amount of Ni added and the characteristics of the square plate dielectric.
FIG. 3 is a diagram showing the amount of O added and the characteristics of a multilayer ceramic chip capacitor. Name of agent: Patent attorney Toshio Nakao and 1 other person No. 1
Fig. 2

Claims (1)

【特許請求の範囲】 チタン酸バリウム(BaTiO3)10oモル部。 酸化セリウム(Ceoz)−(7±1)モル部、酸化チ
タン(TiO□)7±1モル部及び酸化二・7ケル(N
iO)0.05〜0.2モル部からなる高誘電率磁器組
成物。
[Claims] 10 mol parts of barium titanate (BaTiO3). Cerium oxide (Ceoz) - (7 ± 1) mole parts, titanium oxide (TiO□) 7 ± 1 mole parts and 2.7 Kel oxide (N
iO) A high dielectric constant ceramic composition comprising 0.05 to 0.2 mole part.
JP57224323A 1982-12-20 1982-12-20 High dielectric porcelain composition Granted JPS59114704A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57224323A JPS59114704A (en) 1982-12-20 1982-12-20 High dielectric porcelain composition

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57224323A JPS59114704A (en) 1982-12-20 1982-12-20 High dielectric porcelain composition

Publications (2)

Publication Number Publication Date
JPS59114704A true JPS59114704A (en) 1984-07-02
JPS6236327B2 JPS6236327B2 (en) 1987-08-06

Family

ID=16811947

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57224323A Granted JPS59114704A (en) 1982-12-20 1982-12-20 High dielectric porcelain composition

Country Status (1)

Country Link
JP (1) JPS59114704A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0383928U (en) * 1989-12-14 1991-08-26
US20110141660A1 (en) * 2009-12-10 2011-06-16 Samsung Electro-Mechanics Co., Ltd. Multilayer ceramic capacitor

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0383928U (en) * 1989-12-14 1991-08-26
JPH0512997Y2 (en) * 1989-12-14 1993-04-06
US20110141660A1 (en) * 2009-12-10 2011-06-16 Samsung Electro-Mechanics Co., Ltd. Multilayer ceramic capacitor
US8390983B2 (en) * 2009-12-10 2013-03-05 Samsung Electronics Co., Ltd. Multilayer ceramic capacitor

Also Published As

Publication number Publication date
JPS6236327B2 (en) 1987-08-06

Similar Documents

Publication Publication Date Title
JP3146967B2 (en) Non-reducing dielectric ceramic and multilayer ceramic electronic component using the same
JPH02123614A (en) High permittivity type porcelain composition
JP4354224B2 (en) Dielectric porcelain and multilayer electronic components
JPS5954107A (en) High dielectric constant composition
JP3146966B2 (en) Non-reducing dielectric ceramic and multilayer ceramic electronic component using the same
JPS6051207B2 (en) High dielectric constant porcelain composition
JPS59114704A (en) High dielectric porcelain composition
JP2915217B2 (en) Dielectric porcelain and porcelain capacitor
JPS6051202B2 (en) High dielectric constant porcelain composition
JPS6051205B2 (en) High dielectric constant porcelain composition
JPS59128705A (en) High dielectric porcelain composition
EP0085941B1 (en) Ceramic composition of high dielectric constant
JP2779740B2 (en) Dielectric porcelain and porcelain capacitor
JPS6051208B2 (en) High dielectric constant porcelain composition
JPH041965B2 (en)
JP2872513B2 (en) Dielectric porcelain and porcelain capacitor
JPS61188810A (en) High dielectric ceramic composition
JPH02311362A (en) Porcelain composition with high dielectric constant
JPH041964B2 (en)
JPS6051206B2 (en) High dielectric constant porcelain composition
JPS61188811A (en) High dielectric ceramic composition
JPH0460943B2 (en)
JPS61188815A (en) High dielectric ceramic composition
JPS58223670A (en) High dielectric constant ceramic composition
JPS59162172A (en) High permittivity ceramic composition