JPS59112202A - マイクロメ−タ - Google Patents

マイクロメ−タ

Info

Publication number
JPS59112202A
JPS59112202A JP22358282A JP22358282A JPS59112202A JP S59112202 A JPS59112202 A JP S59112202A JP 22358282 A JP22358282 A JP 22358282A JP 22358282 A JP22358282 A JP 22358282A JP S59112202 A JPS59112202 A JP S59112202A
Authority
JP
Japan
Prior art keywords
spindle
rotating
contact
moves
micrometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP22358282A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6315521B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
Mineo Yamauchi
山内　岑郎
Yoshimitsu Karahashi
唐橋　義光
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsutoyo Manufacturing Co Ltd
Original Assignee
Mitsutoyo Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsutoyo Manufacturing Co Ltd filed Critical Mitsutoyo Manufacturing Co Ltd
Priority to JP22358282A priority Critical patent/JPS59112202A/ja
Priority to US06/557,767 priority patent/US4553330A/en
Publication of JPS59112202A publication Critical patent/JPS59112202A/ja
Publication of JPS6315521B2 publication Critical patent/JPS6315521B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B3/00—Measuring instruments characterised by the use of mechanical techniques
    • G01B3/002—Details
    • G01B3/004—Scales; Graduations
    • G01B3/006—Scales; Graduations having both coarse and fine graduation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B3/00—Measuring instruments characterised by the use of mechanical techniques
    • G01B3/18—Micrometers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Instruments Using Mechanical Means (AREA)
JP22358282A 1982-12-20 1982-12-20 マイクロメ−タ Granted JPS59112202A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP22358282A JPS59112202A (ja) 1982-12-20 1982-12-20 マイクロメ−タ
US06/557,767 US4553330A (en) 1982-12-20 1983-12-02 Micrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22358282A JPS59112202A (ja) 1982-12-20 1982-12-20 マイクロメ−タ

Publications (2)

Publication Number Publication Date
JPS59112202A true JPS59112202A (ja) 1984-06-28
JPS6315521B2 JPS6315521B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1988-04-05

Family

ID=16800417

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22358282A Granted JPS59112202A (ja) 1982-12-20 1982-12-20 マイクロメ−タ

Country Status (1)

Country Link
JP (1) JPS59112202A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0791801A3 (en) * 1996-02-26 1998-04-01 Mitutoyo Corporation Micrometer
JP2008514904A (ja) * 2004-09-28 2008-05-08 カール マール ホールディング ゲーエムベーハー 非回転スピンドルを備えて構成されるマイクロメータ
US8296966B2 (en) 2010-04-08 2012-10-30 Mitutoyo Corporation Micrometer
US8413348B2 (en) 2010-04-16 2013-04-09 Mitutoyo Corporation Displacement measuring instrument

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS471166U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1971-01-14 1972-08-11
JPS4886851U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1972-01-20 1973-10-20

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS471166U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1971-01-14 1972-08-11
JPS4886851U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1972-01-20 1973-10-20

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0791801A3 (en) * 1996-02-26 1998-04-01 Mitutoyo Corporation Micrometer
US5829155A (en) * 1996-02-26 1998-11-03 Mitutoyo Corporation Micrometer
JP2008514904A (ja) * 2004-09-28 2008-05-08 カール マール ホールディング ゲーエムベーハー 非回転スピンドルを備えて構成されるマイクロメータ
US8296966B2 (en) 2010-04-08 2012-10-30 Mitutoyo Corporation Micrometer
US8413348B2 (en) 2010-04-16 2013-04-09 Mitutoyo Corporation Displacement measuring instrument

Also Published As

Publication number Publication date
JPS6315521B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1988-04-05

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