JPS5899768A - Detecting device for short-circuiting place in substrate pattern - Google Patents

Detecting device for short-circuiting place in substrate pattern

Info

Publication number
JPS5899768A
JPS5899768A JP56199288A JP19928881A JPS5899768A JP S5899768 A JPS5899768 A JP S5899768A JP 56199288 A JP56199288 A JP 56199288A JP 19928881 A JP19928881 A JP 19928881A JP S5899768 A JPS5899768 A JP S5899768A
Authority
JP
Japan
Prior art keywords
short
pattern
circuiting
coil
inspected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56199288A
Other languages
Japanese (ja)
Inventor
Kazuyuki Tanaka
一幸 田中
Naoto Okubo
直人 大久保
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP56199288A priority Critical patent/JPS5899768A/en
Publication of JPS5899768A publication Critical patent/JPS5899768A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52Testing for short-circuits, leakage current or ground faults

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

PURPOSE:To detect a short-circuiting place in a pattern by applying a signal current to a circuit pattern from a low-frequency oscillator, and by detecting a magnetic flux by a detecting coil. CONSTITUTION:Output terminals 9 and 10 from a low-frequency oscillator 8 are connected to the component terminal insertion holes 6 and 7 of a pattern to be inspected on a printed wiring substrate, respectively, and then a detecting coil 15 connected to a level detector 11 is approached to patterns 12 and 13 on the printed wiring substrate. While a pointer of the level detector 11 being watched, the coil 15 is moved along the short-circuiting patterns on the substrate 14 to be inspected. Then, a signal current flows through places a b c f g of the short-circuiting patterns 12 and 13 and a magnetic field is generated around the sections. Thus, a short-circuiting place (c) can be found simply in a short time without damaging the substrate to be inspected at all by the detecting coil 15.

Description

【発明の詳細な説明】 本発明は、プリント基板のパターン短絡箇所検出装置に
関するもので、配線基板に発生したプリ゛  ツジある
いは誤配線等により生した基板上の配線用パターンの短
絡箇所が、発振器出力を被検査基板に接続した上で検出
コイルお゛よびレベル検出部によって探がすことにより
容易に検出できるようにしたものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a pattern short-circuit detection device on a printed circuit board. The output can be easily detected by connecting the output to the board to be inspected and searching with a detection coil and a level detection section.

従来、プリント基板上に生じているブリッジあるいは誤
配線等による不要な短絡箇所を検出する方法としては、
目視による方法、あるいは第1図のように被検査印刷配
二基板上のパターンのレジストの一部分を剥がし、まず
その部分1.2に抵抗値測定器3のグローブ4,5を当
てて抵抗値を測定し、次に再度配線パターン上の別の1
−所のレジストの一部分(第1図の2′)を剥がして前
記と同様の測定方法にてパターン間の抵抗値を測定し、
このときの値が前回測定値よりも小さくなっていれば不
要短絡箇所ムに近づいていることに鑑みて、以下同様に
何度もこのプロセスを繰り返して短絡箇所を突き詰めて
いく方法等が行なわれている。−然しなから、これらの
方法ではパターンが複雑  。
Conventionally, methods for detecting unnecessary short circuits caused by bridges or incorrect wiring on printed circuit boards include:
Measure the resistance by visual inspection, or by peeling off a part of the pattern resist on the printed circuit board to be inspected as shown in Figure 1, and first applying the gloves 4 and 5 of the resistance value measuring device 3 to that part 1.2. Measure and then measure another one on the wiring pattern again.
- Peel off a part of the resist (2' in Figure 1) and measure the resistance value between the patterns using the same measuring method as above,
If the value at this time is smaller than the previous measured value, it means that you are approaching an unnecessary short circuit, so a method such as repeating this process many times to pinpoint the short circuit is performed. ing. -However, these methods produce complex patterns.

になっ°てくると必要時間も労力も多大なものが要求さ
れる。また、抵抗値を測定する方法では抵抗 −値その
ものの絶対値が小さいために、その測定に際してはプ巳
−プの接続の仕方による誤差等の考慮が必要であり、正
確さを求めるためには犬がかりな装置と多くの費用を必
要とすることから実用上問題がある。さらに、この方法
を用いる場合にはパターンのレジストを剥がすことが必
要であるため、被検査印刷配線基板を傷つけることは避
けられない。場合によってはパターンをカットするとい
う大きな損傷を伴なわなければならないことも起こり困
難を究めている。
When the time comes, a great deal of time and effort is required. In addition, in the method of measuring the resistance value, since the absolute value of the resistance value itself is small, it is necessary to take into account errors caused by the way the pulleys are connected, and in order to obtain accuracy. This method is problematic in practice because it requires a dog and a large amount of money. Furthermore, when using this method, it is necessary to peel off the patterned resist, so it is inevitable that the printed wiring board to be inspected will be damaged. In some cases, it may be necessary to cut the pattern, which may result in major damage, making it extremely difficult.

本発明はかかる点5鑑み、容易に短時間れがも基板を傷
つけることな−く配線基板上に生じている歪要なる短絡
箇竺−を一検出する装置を提供す−るもので、以下本発
明の一実施例につき第2−図〜第4図を用いて説明する
In view of the above point 5, the present invention provides a device that can easily detect short circuits that cause distortion occurring on a wiring board for a short period of time without damaging the board. An embodiment of the present invention will be explained using FIGS. 2-4.

本発明はその一例を第2図に示す様に、印刷配線基板上
の被検査パターンの部品端子挿入孔6゜−7に低周波発
振器8からの出力端子9p 10を各々接続した後にレ
ベル検出器11に接続されている検出コイル15を印刷
配線基板のパターン12゜13に近づける。そしてレベ
ル検出器11の針をみながら被検査基板14上の前記短
絡パターンに沿ってコイル16をなぞっていく。以上の
ような構成において、被検査基板14は発振器8の出力
によシ短絡しく゛ターン12,13のa−b−c−f−
gに信号電流が流れ、そのまわりに磁界が生じる。ここ
でa7b−d、、  e−f−gは本来必要な銅箔であ
り、C耀短絡をなす不要な泪である。そこで検出コイル
16を近づけるとこのコイル15を貫抜く磁束が変化し
、電磁誘導現象により起電力が生じる。短絡パターン上
を流れる電流により生ずる磁界、と検出コイル16に発
生する起電力の関係について説明する。第3図のごとく
導体Jに電流工が流れる場合、導体Jから距離rだけ離
れた点の磁界Hは、 H−I/2πr (’/m )      ・・・・・
・・・・・・(1)となる。この磁界中に検出コイル1
5をおくと第4図のごとく、検出コイル16に発生する
起電力Eは、 となる。一方(1)式の電流工を 、にlm5inωt      ・・・・・・・・・・
・・(3)とすると、(1)式は H= lm5inωt//2.。
As an example of the present invention is shown in FIG. 2, after connecting the output terminals 9p and 10 from the low frequency oscillator 8 to the component terminal insertion holes 6°-7 of the pattern to be inspected on the printed wiring board, the level detector Detection coil 15 connected to pattern 11 is brought close to patterns 12 and 13 of the printed wiring board. Then, while watching the needle of the level detector 11, the coil 16 is traced along the short circuit pattern on the board 14 to be inspected. In the above configuration, the board to be inspected 14 is short-circuited by the output of the oscillator 8, and the a-b-c-f-
A signal current flows through g, and a magnetic field is generated around it. Here, a7b-d, e-f-g are copper foils that are originally necessary, and are unnecessary layers that create a short circuit. Therefore, when the detection coil 16 is brought close, the magnetic flux passing through the coil 15 changes, and an electromotive force is generated due to electromagnetic induction phenomenon. The relationship between the magnetic field generated by the current flowing on the short circuit pattern and the electromotive force generated in the detection coil 16 will be explained. When a current flows through the conductor J as shown in Figure 3, the magnetic field H at a point a distance r from the conductor J is H-I/2πr ('/m)...
......(1). In this magnetic field, the detection coil 1
5, the electromotive force E generated in the detection coil 16 becomes as shown in FIG. On the other hand, the electric current of equation (1) is lm5inωt ・・・・・・・・・・・・
...(3), equation (1) becomes H=lm5inωt//2. .

となり、これをtで微分すると、 となり、これより(6)式を(2)式へ代入すると、E
ニーに・Inω・cosωt/2zr −・・・・・・
・・・・・・(6)となる。
Then, when we differentiate this with respect to t, we get: From this, when we substitute equation (6) into equation (2), we get E
Knee・Inω・cosωt/2zr −・・・・・・
......(6).

−この(6)式より、発振器8の発振周波数が一定であ
るので(ω−一定)、−検出コイル16に発生する起電
力は、検出コ4ル16と導体(銅箔)との距離rに反比
例する。すなわち、第2図で検出コイル1゛5が短絡パ
ターy a −b −c −f −gに近づくほど、起
電力が増すことになる。すると、検出コイル15に接続
されたレベル検出器11のメータが大きくふれる。そし
て、たとえば第2図に示すように被検査基板14上のパ
ターンにそって、aからb方向に検出器11をみながら
検出コイル16を移動させてゆくと、0点を過ぎてdに
向、かう所では、検出器110レベルが減少する。これ
により0点でg−f−eのパターンにつながっているこ
とがわかる。
- From this equation (6), since the oscillation frequency of the oscillator 8 is constant (ω - constant), - the electromotive force generated in the detection coil 16 is the distance r between the detection coil 16 and the conductor (copper foil). is inversely proportional to. That is, the closer the detection coil 1-5 is to the short-circuit pattern ya-b-c-f-g in FIG. 2, the more the electromotive force increases. Then, the meter of the level detector 11 connected to the detection coil 15 fluctuates greatly. For example, as shown in FIG. 2, when the detection coil 16 is moved from point a to direction b while looking at the detector 11 along the pattern on the board to be inspected 14, it passes the zero point and moves toward point d. , where the detector 110 level decreases. This shows that the 0 point is connected to the gfe pattern.

以上により、パターン間の不要なるブリッジ。This eliminates unnecessary bridges between patterns.

誤配線等による短絡箇所Cを求めることができるもので
ある。またこの方法によれば肉眼ではみつケニくいパタ
゛−ン上の細いヒゲによる短絡箇所も検出することがで
きる。
It is possible to determine the short-circuit location C due to incorrect wiring or the like. Furthermore, according to this method, it is also possible to detect short circuits caused by thin whiskers on a pattern that are difficult to see with the naked eye.

このように本発明によれば、不要な短絡部を求めたい配
線基板に対して、その箇所を簡単に短時間でしかも被検
査基板を何ら損傷させることなく求めることができ、実
用上極めて価値の高いもので、ある。
As described above, according to the present invention, it is possible to easily find unnecessary short circuit parts on a wiring board in a short time and without damaging the board to be inspected, which is extremely valuable in practice. It's expensive, yes.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来例における配線基板上の短絡箇所検出方法
を説明するーための図、第2図は本発明の一実施例に即
ける基−板パターン短絡箇所検出装置のブロック図、第
3図は導体に流れる電流による磁界と距離の品係を説明
するだめの図、第4図は磁界と起電力の関係を説明する
ための図である。 6,7・・・・・導電パターン部品端子挿入孔、8・・
・・・発振器、9*10・・・・・・発振器出力端子、
11・・・・・レヘルFJ出器、 12.’ 13・・
・・・・パターン、14・・・・・・被検査基板、16
゛・・・・・・検出用弓イル。 代理人の氏名 弁理士 中 尾 敏 男 ほか1名第1
FIG. 1 is a diagram for explaining a conventional method for detecting a short circuit on a wiring board, FIG. 2 is a block diagram of a circuit board pattern short circuit detection device according to an embodiment of the present invention, and FIG. The figure is a diagram for explaining the relationship between the magnetic field and distance caused by a current flowing through a conductor, and FIG. 4 is a diagram for explaining the relationship between the magnetic field and electromotive force. 6, 7... Conductive pattern component terminal insertion hole, 8...
...oscillator, 9*10...oscillator output terminal,
11...Lehel FJ Outer, 12. '13...
... Pattern, 14 ... Board to be inspected, 16
゛...Detection bow il. Name of agent: Patent attorney Toshio Nakao and 1 other person No. 1
figure

Claims (1)

【特許請求の範囲】[Claims] プリント基板−Fの互いに独立した第1.第2のパター
ンのそれぞれ任意の箇所に接続する接続端子を有する発
振器と、前記発振器からの発振信号を検出するコイルを
有し前記コイルに発生する起電力を表示するレベル検出
器より成シ、前記発振器の接続端子を前記プリント基板
の第1.第2のパターン上の任意の2ケ所に接続し、前
記コイルによって前記発振信号の有無苓前記プリント基
板のパターンに活グて検出することを特徴とする基板パ
ターン短絡箇所検出装置。
The mutually independent first . The second pattern is composed of an oscillator having connection terminals connected to respective arbitrary points of the second pattern, and a level detector having a coil for detecting the oscillation signal from the oscillator and displaying the electromotive force generated in the coil; Connect the connection terminal of the oscillator to the first. A circuit board pattern short-circuit detection device, which is connected to two arbitrary locations on a second pattern, and detects the presence or absence of the oscillation signal by applying the oscillation signal to the pattern of the printed circuit board using the coil.
JP56199288A 1981-12-09 1981-12-09 Detecting device for short-circuiting place in substrate pattern Pending JPS5899768A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56199288A JPS5899768A (en) 1981-12-09 1981-12-09 Detecting device for short-circuiting place in substrate pattern

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56199288A JPS5899768A (en) 1981-12-09 1981-12-09 Detecting device for short-circuiting place in substrate pattern

Publications (1)

Publication Number Publication Date
JPS5899768A true JPS5899768A (en) 1983-06-14

Family

ID=16405300

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56199288A Pending JPS5899768A (en) 1981-12-09 1981-12-09 Detecting device for short-circuiting place in substrate pattern

Country Status (1)

Country Link
JP (1) JPS5899768A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6281068U (en) * 1985-11-08 1987-05-23
JPS6463878A (en) * 1987-09-03 1989-03-09 Kyushu Nippon Electric Shortcircuit position detecting apparatus
JPH0262975A (en) * 1988-08-30 1990-03-02 Seikosha Co Ltd Method and device for inspecting printed board
US5073754A (en) * 1990-07-24 1991-12-17 Photon Dynamics, Inc. Method and apparatus for testing LCD panel array using a magnetic field sensor
US5175504A (en) * 1991-06-17 1992-12-29 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing a simple matrix circuit panel
US5235272A (en) * 1991-06-17 1993-08-10 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing an active matrix LCD panel

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6281068U (en) * 1985-11-08 1987-05-23
JPS6463878A (en) * 1987-09-03 1989-03-09 Kyushu Nippon Electric Shortcircuit position detecting apparatus
JPH0262975A (en) * 1988-08-30 1990-03-02 Seikosha Co Ltd Method and device for inspecting printed board
US5073754A (en) * 1990-07-24 1991-12-17 Photon Dynamics, Inc. Method and apparatus for testing LCD panel array using a magnetic field sensor
US5175504A (en) * 1991-06-17 1992-12-29 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing a simple matrix circuit panel
US5235272A (en) * 1991-06-17 1993-08-10 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing an active matrix LCD panel
US5459410A (en) * 1991-06-17 1995-10-17 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing an active matrix LCD panel

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