JPS5890146A - Optical cycle tester for dew condensation - Google Patents

Optical cycle tester for dew condensation

Info

Publication number
JPS5890146A
JPS5890146A JP18847581A JP18847581A JPS5890146A JP S5890146 A JPS5890146 A JP S5890146A JP 18847581 A JP18847581 A JP 18847581A JP 18847581 A JP18847581 A JP 18847581A JP S5890146 A JPS5890146 A JP S5890146A
Authority
JP
Japan
Prior art keywords
test
cooling element
heating
electronic cooling
bottom plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18847581A
Other languages
Japanese (ja)
Inventor
Yoji Watanabe
渡邊 洋二
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suga Test Instruments Co Ltd
Original Assignee
Suga Test Instruments Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Suga Test Instruments Co Ltd filed Critical Suga Test Instruments Co Ltd
Priority to JP18847581A priority Critical patent/JPS5890146A/en
Publication of JPS5890146A publication Critical patent/JPS5890146A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00Investigating or analyzing materials by the use of thermal means
    • G01N25/56Investigating or analyzing materials by the use of thermal means by investigating moisture content
    • G01N25/66Investigating or analyzing materials by the use of thermal means by investigating moisture content by investigating dew-point
    • G01N25/68Investigating or analyzing materials by the use of thermal means by investigating moisture content by investigating dew-point by varying the temperature of a condensing surface

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)

Abstract

PURPOSE:To perform a test under a high-precise condition, by a method wherein an electronic cooling element for heating or cooling a sample through a heat- transferring bottom plate of a test bath is located under the bottom plate, another electronic cooling element is situated to the side of the bath, and an ultraviolet lamps are positioned on the ceiling surface of the test bath. CONSTITUTION:If, in case an electronic cooling element 4 under a bottom plate 2 is cooled, air humidified by an ultrasonic system is fed to a test bath 1, dew is formed on a surface of a sample 3. The electronic cooling element 4 is then switched to heating, the humidified air is shut off, and an ultraviolet fluorescent lamp 7 is lighted. A cooling and a heating of the sample 3 can be freely regulated at a range of -10-+60 deg.C, and the temperature of the test bath 1 can be adjusted to a range of +10-+60 deg.C by cooling and heating an electronic cooling element 6 at a side. Finally, under a condition under which dew is formed on the surface of the sample 3, dew formation and ultraviolet irradiation can also be performed simultaneously.

Description

【発明の詳細な説明】 本発明は、塗膜、合成樹脂、金属面及びその表面処理剤
など工業材料の光、熱、低温及び結露或はこれらの組合
わせによる複合条件に対する耐久性をみるためのサイク
ル試験機に関するものである。
Detailed Description of the Invention The present invention aims to examine the durability of industrial materials such as paint films, synthetic resins, metal surfaces, and surface treatment agents against light, heat, low temperature, dew condensation, or complex conditions caused by combinations thereof. The present invention relates to a cycle testing machine.

従来の複合試験機例えばデユーサイクル式促進耐候試験
機において、カーボンアーク灯の周囲に回転試料枠があ
り、アーク灯の消灯時にこの試料枠に対して垂直に掛け
る試験片の裏面に6〜7℃の冷却用スプレーを噴射する
と試験槽内の湿度は98チ以上となり試験片が冷却する
ために試験片表面に結露する。
In a conventional composite testing machine, such as a due-cycle accelerated weathering test machine, there is a rotating sample frame around a carbon arc lamp, and when the arc lamp is turned off, a 6 to 7 When the cooling spray at ℃ is injected, the humidity in the test chamber becomes 98 degrees or higher, and dew condenses on the surface of the test piece to cool the test piece.

次にアーク灯を点灯して冷却用スプレーを止め試験片表
面を間欠的にスプレーする時は、試験槽内湿度は40〜
50チとなり、その温度については槽内空気を排出して
外気を一部導入することによって調節する。このように
してデユーサイクル試験においては、夜間の自然条件に
相当する消灯時の試験片表面の結露と昼間の自然条件に
相当して紫外線照射と雨及び乾燥を周期的に反覆するこ
ととなる。
Next, when turning on the arc lamp, stopping the cooling spray, and spraying the surface of the test piece intermittently, the humidity in the test chamber should be 40~
The temperature is adjusted by exhausting the air inside the tank and introducing some outside air. In this way, in the due-cycle test, dew condensation on the surface of the test piece when the lights are off corresponds to natural conditions at night, and UV irradiation, rain, and dryness correspond to natural conditions during the day, which are periodically repeated. .

このデユーサイクル条件設定のためには、アーク灯及び
冷却水のための冷凍機に消費する電力が大きく且つ必然
的に装置が甚だしく大きくなり、切換えが速かでなく、
シかも条件設定の精度がよ(ない。且つ結露と紫外線照
射を同時に行うことができない。
In order to set this due-cycle condition, the electric power consumed by the arc lamp and the refrigerator for cooling water is large, and the equipment inevitably becomes extremely large, and switching is not quick.
However, the accuracy of the condition setting is poor (or not. Also, it is not possible to perform dew condensation and UV irradiation at the same time.

さらに、別の従来のサイクル試験機例を挙げると、試験
槽内の一面に試験片を配置し、試験片の裏面が接する伝
熱体壁の外側中空には熱媒と冷媒を交互に流す。しかも
、冷媒の流通期に試験槽内に高湿空気を送ると試験片表
面に結露する。次に冷媒と高湿空気とを止め熱媒を通す
と試験片表面は乾燥する。このような構成になるサイク
ル試験機においても、熱媒と冷媒を作り流すためにには
甚だしく大きな構造となり、切換えが速かでなくしかも
精度はよくない。
In another example of a conventional cycle testing machine, a test piece is placed on one side of the test tank, and a heating medium and a coolant are alternately flowed into the hollow outside of the heat transfer body wall, which is in contact with the back side of the test piece. Moreover, if high-humidity air is sent into the test chamber during the refrigerant flow period, dew condenses on the surface of the test piece. Next, the refrigerant and high-humidity air are stopped, and the heating medium is passed through to dry the surface of the test piece. Even in a cycle tester having such a configuration, the structure is extremely large in order to create and flow the heating medium and the refrigerant, and switching is not quick and accurate.

その他、複合試験法が極々開発されているが、光照射、
結露、冷却等個々の試験条件に応じて別個の装置または
一つの装置であっても試験槽を別々に設けて各単独試験
を複合的に行うことになる。したがって、試験条件ごと
忙試験装置を準備する必要があり、一つの試験槽を併用
できる試験条件は非常に限られる。
In addition, many complex test methods have been developed, including light irradiation,
Depending on the individual test conditions such as dew condensation and cooling, separate test chambers are provided for separate devices or even for one device, and each individual test is conducted in a complex manner. Therefore, it is necessary to prepare a test device for each test condition, and the test conditions for which one test tank can be used in combination are very limited.

発明者は、以上説明した従来のサイクル試験機の欠点を
解消して、一つの試験槽内で多種類の単独試験とそれら
適当組合わせによる周期的サイクル試験ができ、かつ試
験機ができるだけ小型であって切換えが速かであり、各
試験条件の精度を高(するための検討を重ねた。先づ試
験片の加熱冷却及び試験槽の温度調節には電子冷却素子
を利用することによって小型化して精度を上げることが
でき、しかも電子冷却素子の特性から切換えが速かであ
り、紫外線光源としては紫外線ランプがこの目的に適切
であり、加湿には超音波振動子によって水を微粒子とす
る方法を行うことによって、一つの試験槽を用いて、小
型で消費電力が少なく精度が高い上に切換が速かなサイ
クル試験機を完成することができた。
The inventor has solved the above-described shortcomings of the conventional cycle testing machine, and has developed a system that can perform multiple types of individual tests and periodic cycle tests by appropriately combining them in one test chamber, and that the testing machine is as small as possible. We have made repeated studies to improve the accuracy of each test condition.First, we have made it more compact by using an electronic cooling element to heat and cool the test piece and to adjust the temperature of the test chamber. As an ultraviolet light source, an ultraviolet lamp is suitable for this purpose, and for humidification, ultrasonic vibrators are used to turn water into fine particles. By doing this, we were able to complete a cycle testing machine that is small, consumes little power, has high accuracy, and has quick switching times using a single test chamber.

本発明の実施例を図面によって説明する。Embodiments of the present invention will be described with reference to the drawings.

第1図は本発明に係るサイクル試験機の平面部分断面図
、第2図はその側面断面図である。
FIG. 1 is a plan partial sectional view of a cycle testing machine according to the present invention, and FIG. 2 is a side sectional view thereof.

試験槽1の底板2は伝熱体からなりその上に試験片3を
配置する。底板の下面に接して電子冷却素子4がある。
The bottom plate 2 of the test chamber 1 is made of a heat transfer material, and the test piece 3 is placed on it. There is an electronic cooling element 4 in contact with the lower surface of the bottom plate.

試験槽の一側面には放熱器5が設けられ、この放熱器の
奥に連接して電子冷却素子6を設ける。試験槽の天井面
には10本の紫外線螢光ランプTを取付ける。
A radiator 5 is provided on one side of the test chamber, and an electronic cooling element 6 is provided connected to the back of this radiator. Ten ultraviolet fluorescent lamps T are installed on the ceiling of the test chamber.

試験槽外には加湿器8があって、これから高湿空気を試
験槽内に送る。加湿器は、超音波振動子を水に作用する
ことによって生成する水微粒子を試験槽内に送ることに
よって加湿する。槽内の温度及び湿度を均一に調整する
ためにファン9がある。第3図は電子冷却素子4.6の
説明図である。図に示すように銅板10と半導体11が
直列に連なる構造であって、板A及びBのうちAについ
ていえば電流を導線12において一定力向に流した時冷
却し、逆方向に流した時熱せられる。同時にBはAと逆
の現象がおこる。
There is a humidifier 8 outside the test chamber, which sends high-humidity air into the test chamber. A humidifier humidifies water by sending water particles generated by applying an ultrasonic vibrator to water into a test chamber. A fan 9 is provided to uniformly adjust the temperature and humidity inside the tank. FIG. 3 is an explanatory diagram of the electronic cooling element 4.6. As shown in the figure, it has a structure in which a copper plate 10 and a semiconductor 11 are connected in series, and for plate A of plates A and B, when current is passed in a constant force direction in the conductor 12, it is cooled, and when it is passed in the opposite direction. Be heated. At the same time, the opposite phenomenon occurs in B.

次に本発明の構成による作用機能を説明する。第1.2
図において、底板下部の電子冷却素子4を冷却する時、
試験槽に超音波方式による加湿空気を送ると試験片表面
に結露する。次に電子冷却素子4を加熱に切換え、加湿
空気を止め、紫外線螢光ランプを点灯することができる
。試験片の冷却加熱は一10〜十60℃の範囲で自由に
調節できる。また、各試験条件の期間において、側面に
ある電子冷却素子6を適当に加熱冷却して試験槽内の温
度を+10〜+60℃の範囲において自由に調節するこ
とができる。或は試験片表面に結露する条件において、
紫外線螢光ランプを点灯して、結露と紫外線照射とを同
時に行うことができる。
Next, the functions and functions of the configuration of the present invention will be explained. 1.2
In the figure, when cooling the electronic cooling element 4 at the bottom of the bottom plate,
When humidified air is sent into the test chamber using an ultrasonic method, dew condenses on the surface of the test piece. Next, the electronic cooling element 4 can be switched to heating, the humidified air can be stopped, and the ultraviolet fluorescent lamp can be turned on. The cooling and heating of the test piece can be freely adjusted within the range of -10 to 160°C. Further, during each test condition period, the temperature inside the test chamber can be freely adjusted within the range of +10 to +60° C. by appropriately heating and cooling the electronic cooling element 6 on the side surface. Or under conditions where dew condensation occurs on the surface of the test piece,
By lighting an ultraviolet fluorescent lamp, dew condensation and ultraviolet irradiation can be performed simultaneously.

以上、本発明の構成と作用機能について説明したが、次
に本発明の実施効果を説明する。
The configuration and functions of the present invention have been explained above, and next, the effects of implementing the present invention will be explained.

試験槽底板の加熱冷却及び試験槽の温度調節を電子冷却
素子によって行うことによって、試験機全体の容積が従
来方式に比べ非常に小さくなった。加熱冷却の切換えが
電流の方向を変えることKよって簡単かつ速かであると
共に、加熱冷却の信頼性と精度が高(、しかもその機構
の寿命が長い。また、超音波方式による加湿のための消
費電力は少なく、同じ規模において従来のヒータ一方式
の約1/10である。紫外線ランプを使用することによ
って、300〜400mμの紫外線が得られ、試験片面
に照射するエネルギーが均一であり、消費電力が少なく
設備費も安い。さらに、紫外線照射、湿度発生、加熱冷
却の方法を本発明のように行うことによって、一つの試
験槽において結露、紫外線照射、乾燥、冷却、高湿度の
各単独試験を行うことができ、またこれらの各条件の組
合わせによる複合試験をサイクル試験として行うことが
でき、従来のデユーサイクル式促進耐候試験では不可能
である結露と紫外線照射を同時に行うこともできる。本
発明に係る試験機の機能的特徴は前述の通りであるが、
装置の小型化及び一つの試験槽でサイクル試験ができる
ということが非常に経済的であることも本発明の大きな
効果である。
By using an electronic cooling element to heat and cool the bottom plate of the test chamber and to adjust the temperature of the test chamber, the volume of the entire test machine has become much smaller than in conventional systems. Switching between heating and cooling is simple and fast by changing the direction of the current, and heating and cooling are highly reliable and accurate (and the mechanism has a long lifespan. The power consumption is low, about 1/10 of the conventional one-heater type on the same scale.By using an ultraviolet lamp, ultraviolet rays of 300 to 400 mμ can be obtained, and the energy irradiated to the test piece surface is uniform, reducing the power consumption. The electricity is low and the equipment cost is low.Furthermore, by performing ultraviolet irradiation, humidity generation, and heating and cooling methods as in the present invention, each test of dew condensation, ultraviolet irradiation, drying, cooling, and high humidity can be conducted individually in one test chamber. It is also possible to perform a composite test by combining each of these conditions as a cycle test, and it is also possible to perform dew condensation and ultraviolet irradiation at the same time, which is impossible with conventional due-cycle accelerated weathering tests. The functional characteristics of the testing machine according to the present invention are as described above,
Another major effect of the present invention is that it is very economical to miniaturize the device and to be able to perform cycle tests in one test tank.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は木兄F!AK係るザイクル試験機の平面部分断
面図、第2図はその側面断面図、第3図は電子冷却素子
の説明図である。 1・・・試験槽、2・・・試験槽底板、3・・・試験片
、4.6・・・電子冷却素子、5・・・放熱器、1・・
・紫外線螢光ランプ、8・・・加湿器、9・・・ファン
、10・・・銅板、11・・・半導体、12・・・導線
、13・・・制御部、 A、B・・・加熱冷却板。 弁1図 第2 図 オ 3 図
Figure 1 is Ki-ni F! AK is a plan partial cross-sectional view of a Seikle tester, FIG. 2 is a side cross-sectional view thereof, and FIG. 3 is an explanatory diagram of a thermoelectric cooling element. DESCRIPTION OF SYMBOLS 1...Test tank, 2...Test tank bottom plate, 3...Test piece, 4.6...Electronic cooling element, 5...Radiator, 1...
・Ultraviolet fluorescent lamp, 8... Humidifier, 9... Fan, 10... Copper plate, 11... Semiconductor, 12... Conductive wire, 13... Control unit, A, B... Heating and cooling plate. Valve 1 Figure 2 Figure 3

Claims (1)

【特許請求の範囲】[Claims] 試験槽の伝熱性底板の下に該伝熱性底板を介して試験片
を加熱または冷却するための電子冷却素子があり、該試
験槽の噛側面には槽内温度を調節するための電子冷却素
子があり、かつ該試験槽の天井面に紫外線ランプがある
ことを特徴とする光無サイクル試験機。
There is an electronic cooling element under the heat conductive bottom plate of the test chamber for heating or cooling the test piece through the heat conductive bottom plate, and an electronic cooling element on the chewing side of the test chamber for adjusting the temperature inside the chamber. 1. A lightless cycle tester characterized in that the test chamber has an ultraviolet lamp on the ceiling surface of the test tank.
JP18847581A 1981-11-26 1981-11-26 Optical cycle tester for dew condensation Pending JPS5890146A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18847581A JPS5890146A (en) 1981-11-26 1981-11-26 Optical cycle tester for dew condensation

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18847581A JPS5890146A (en) 1981-11-26 1981-11-26 Optical cycle tester for dew condensation

Publications (1)

Publication Number Publication Date
JPS5890146A true JPS5890146A (en) 1983-05-28

Family

ID=16224369

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18847581A Pending JPS5890146A (en) 1981-11-26 1981-11-26 Optical cycle tester for dew condensation

Country Status (1)

Country Link
JP (1) JPS5890146A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60145472U (en) * 1984-03-07 1985-09-27 菊水化学工業株式会社 Simulated solar experimental device
JPS6219746A (en) * 1985-07-18 1987-01-28 Omron Tateisi Electronics Co Device for producing or testing moisture sensitive element or the like
JPH0191246U (en) * 1987-12-08 1989-06-15
US4995273A (en) * 1988-05-31 1991-02-26 Dainippon Plastics Co., Ltd. Method of an apparatus for weather resistance test

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60145472U (en) * 1984-03-07 1985-09-27 菊水化学工業株式会社 Simulated solar experimental device
JPH0318916Y2 (en) * 1984-03-07 1991-04-22
JPS6219746A (en) * 1985-07-18 1987-01-28 Omron Tateisi Electronics Co Device for producing or testing moisture sensitive element or the like
JPH0191246U (en) * 1987-12-08 1989-06-15
US4995273A (en) * 1988-05-31 1991-02-26 Dainippon Plastics Co., Ltd. Method of an apparatus for weather resistance test

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