JPS5888671A - Method for life test of zinc oxide element - Google Patents

Abstract

PURPOSE:To enable life of a ZnO element to be estimated in a comparatively short time, by applying a voltage having <=1Hz or >=1Hz frequency. CONSTITUTION:A sample tested contains 95.0% ZnO, 0.5% Bi2O3, 1.0% Sb2O3, 0.5% Cr2O3, 0.5% MnO2, 0.5% CO2, 0.5% O3, 0.5% SiO2, 1.0% NiO2, by the molar base, they are mixed, granulated, then, formed into a disc having 64mm. diameter and 22mm. thickness by pressing, and heat treated at 1,250 deg.C for 6hr. The element thus obtained is subjected AC application having 0.1, 1, 50, 1,000, and 10,000Hz frequencies, resulting in increase of power loss W/WO at <=1Hz and >=1Hz as compared with that at 50Hz, thus permitting life of the ZnO element to be estimated in a comparatively short time by comparing the life characteristics in a usual condition with that of the life test continued in the same conditions except 50Hz.

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention 9;j relates to a test method for determining the life expectancy of a ZnO element (an oxidized oxidation resistor).

ZnO elements are mainly composed of Zn0 (zinc oxide), VC bismuth (Btn, cobalt (Oo), -qnga7 (M
n) Adding antimony (sb) oxide,
Mixing, granulation.

The molded product was formed at a temperature of 1000'C or more, and its voltage-current characteristics were found to be non-Ii glandular over a wide range. It is widely used as bait.

Since this ZnO element is used in a poor electrical state during the k period,
The copper deterioration characteristics are important. Deterioration of ZnO cords includes instantaneous deterioration due to rain impulses and switching impulse currents, etc.
Long 1υ(i) There is a good time deterioration due to the coming VC. VC long 1st j
Since +1j is required, an accelerated life test may be performed to accelerate deterioration. in this case,
Charge rate (terminal pressure when 1 mA current is applied to the element)
The parameters are fi! 1, but even if it is placed directly in the surroundings at high temperatures (80 to 200℃ and the power supply voltage is 50H2 or 61JHz), there will be almost no deterioration. Yes, the situation is accelerating, and it will take a long time even if the trial period is short.

Therefore, we looked at the frequency of the applied voltage, flVC7, and determined that the frequency of the applied voltage was 7. Prefectural Exhibition-200
°C, the circumference of the applied 'li pressure at a galvanic rate of 85 in k 0.5
When increasing the frequency in the range of Hz to 50 KHz and calculating the rate of increase in force loss due to resistance increase, the results shown in Figures 1 and 2 are 1 digit n.

Figure 1 eJl force loss (loss W at the time of measurement and blood pressure impression 1
1 loss w (1 ratio w/w (1 = 1), 1 call increase, and if you lose, you will wake up (1) for a short time. However, when the charging time is delayed by VC1 and a half, the power is 11 times, but compared to the commercial frequency (501] z), is it true that the frequency is lower than the commercial frequency and the frequency is 10 times higher than the commercial frequency? There have been many
jl O (J UI-1r) Published one year after the second loss, which shows the loss.

The present invention utilizes the 1ν1 dead axis end of 16, and accelerates the life cycle of ZnO cords (in this case, applying a specific pressure of several degrees to the circumference θ of less than IHz or more than 1KHz). 'From the voltage eC, the lifespan is 111.xr (it is a short time of 11 times), and the life test of ZnO is the power method'. The purpose is to

S'JO3L, Umon%, 0r20B
(15mai1%, Mn02 (15mog%
, 0o2030.5moμ%, S ], Ll
;2 o, 5 mol.

%, Nio1. (After mixing and granulation with J moQ% of 1%.

111 diameter 641+1111. The material was press-molded into a disk shape of JKyosa 22 + River, and cjL was formed at 1.250° C. for 6 hours at a concentration of 6%.

Under the test conditions of an ambient temperature of 200°C and a density ratio of 8b, the applied voltage range M, EI 0. IHz, lHz
, 50Hz, I KHz-, 10KH2VC about 7M rows of ivy.

The results are shown in FIG.

According to the results, the power loss (w/No) is lower than IHz and l
It increases considerably at frequencies above KHz, and moreover, I
At frequencies above KHz, a sharp rise can be seen at a wake-up time of about 201 JOHr, and at frequencies below iHz, a sharp rise can be seen at a charging time of about 2500 Hr, whereas at 50 Hz, a steady rise is observed. Vt can be compared with the lifespan characteristic obtained by continuing to apply electricity under the same test conditions at 5υHz (or the lifespan characteristic obtained by C or other lifespan 66 estimation methods) and the ratio is blurred. The life of ZnO element +
i+-bo becomes one function.

As described above, according to the method described in this book, the accelerated lifespan of ZnO cables is 15? i IH the circumference tU number of opening force 1st opening pressure during trial softening
Relatively 1f, such as 2 or less or 1 KHz or more
6 It is possible to make the deterioration 1 [progress matter] scattered by simple means, and with short poems + nl, a suitable gradation estimation becomes town tj15.

[Brief explanation of the drawing]

11th 1st gear ZnO element force 11th speed gradient 6fitJ:
In order to determine whether the j closed wave number of the applied voltage passes as a factor that accelerates VC deterioration during the experiment, a diagram showing the relationship between power loss (W/Wo) measured using the frequency of the applied voltage as a parameter and time. , Fig. 2 is a diagram showing the relationship between the power loss (w/wo) in the JOUHr and the frequency of the applied direct pressure, and Fig. 8 is a diagram showing the relationship between the power loss (w/wo) in the JOUHr and the frequency of the applied direct pressure. /+ This is a diagram showing all the power.W... 'Power loss at the time of measurement, WO...Power loss at the time of measurement. 3i □ ・Work voice 2 figure

Claims (1)

[Claims] (1) A lifespan test method for ZnO elements, in which the applied voltage pressure at a frequency of IHz or less or IKHz or more is used as the time value for the accelerated lifespan test based on the direct pressure V of the ZnO element.