JPS5888156U - Flaw detection equipment - Google Patents
Flaw detection equipmentInfo
- Publication number
- JPS5888156U JPS5888156U JP18387981U JP18387981U JPS5888156U JP S5888156 U JPS5888156 U JP S5888156U JP 18387981 U JP18387981 U JP 18387981U JP 18387981 U JP18387981 U JP 18387981U JP S5888156 U JPS5888156 U JP S5888156U
- Authority
- JP
- Japan
- Prior art keywords
- flaw detection
- inspected
- probe
- upward
- detection equipment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は本考案者が先に案出した懸垂式探傷装置の概略
的な正面全体図、第２図は本考案による探傷装置の一実
施例の概略的な正面全体図、第３図は第２図！こ示す上
向き探傷機構の全体斜視図、第４図は同上の上向き探傷
機構の上面斜視図、第５図は同上の上向き探傷機構上部
の詳細正面図、第６図は第５図に示す部分の側面図であ
る。
なお図面に用いられている符号において、１・・・・・
・被榛査材、１２・・・・・・下向き探傷機構、１３・
・・・・・上向き探傷機構、１５，２９・・・・・・プ
ローブユニット、２２・・・・・・側面ならいローラー
（側面ならい機構）、２７・・・・・・側面ならいシリ
ンダ（側面ならい機構）、１７・・・・・・主シリンダ
（下面ならい機構）、１８・・・・・・補助シリンテ（
下面ならい機構）、４９・・・・・・下面ならいローラ
ー（下面ならい機構）である。Fig. 1 is a schematic front view of a suspended flaw detection device devised earlier by the present inventor, Fig. 2 is a schematic front view of an embodiment of the flaw detection device according to the present invention, and Fig. 3 is a schematic front view of an embodiment of the flaw detection device according to the present invention. Figure 2! Fig. 4 is a top perspective view of the upward flaw detection mechanism shown above, Fig. 5 is a detailed front view of the upper part of the upward flaw detection mechanism shown above, and Fig. 6 shows the portion shown in Fig. 5. FIG. In addition, in the symbols used in the drawings, 1...
・Inspected material, 12... Downward flaw detection mechanism, 13.
...Upward flaw detection mechanism, 15, 29...Probe unit, 22...Side profiling roller (side profiling mechanism), 27...Side profiling cylinder (side profiling mechanism) mechanism), 17...Main cylinder (lower surface tracing mechanism), 18...Auxiliary cylinder (
(lower surface tracing mechanism), 49...lower surface tracing roller (lower surface tracing mechanism).
Claims (1)
向きのプローブ（探触子）と、このプローブを被検査材
に対して案内する下面ならい機構並びに側面ならい機構
とを有し、上詭被検査材の下面を探傷する上向き探傷機
構を備えると共１こ、搬送ロール上の被検査材の上面を
探傷する下向きのプローブと、このプローブを被検査材
に対して案内する上面ならい機構並びに側面ならい機構
とを有し、上記被検査材の上面を探傷する下向き探傷機
構を備え、上記上向き探傷機構を上記下向き探傷機構と
は別個独立に、被検査材の通過位置の下方に設けたこと
を特徴とする探傷装置。(1) It has an upward probe (probe) that detects flaws on the lower surface of the material to be inspected on the conveyor roll, and a lower surface tracing mechanism and a side tracing mechanism that guide this probe to the material to be inspected, and It is equipped with an upward flaw detection mechanism that detects flaws on the lower surface of the material, and also includes a downward probe that detects flaws on the upper surface of the material to be inspected on a conveyor roll, and an upper surface tracing mechanism and side tracing mechanism that guides this probe to the material to be inspected. and a downward flaw detection mechanism for detecting flaws on the upper surface of the material to be inspected, and the upward flaw detection mechanism is provided separately and independently of the downward flaw detection mechanism below the passing position of the material to be inspected. flaw detection equipment.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18387981U JPS5888156U (en) | 1981-12-10 | 1981-12-10 | Flaw detection equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18387981U JPS5888156U (en) | 1981-12-10 | 1981-12-10 | Flaw detection equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5888156U true JPS5888156U (en) | 1983-06-15 |
Family
ID=29983534
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18387981U Pending JPS5888156U (en) | 1981-12-10 | 1981-12-10 | Flaw detection equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5888156U (en) |
-
1981
- 1981-12-10 JP JP18387981U patent/JPS5888156U/en active Pending
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