JPS5888147U - 磁気テ−プの光透過率測定装置 - Google Patents

磁気テ−プの光透過率測定装置

Info

Publication number
JPS5888147U
JPS5888147U JP1981183131U JP18313181U JPS5888147U JP S5888147 U JPS5888147 U JP S5888147U JP 1981183131 U JP1981183131 U JP 1981183131U JP 18313181 U JP18313181 U JP 18313181U JP S5888147 U JPS5888147 U JP S5888147U
Authority
JP
Japan
Prior art keywords
magnetic tape
measuring device
light transmittance
transmittance measuring
tape light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1981183131U
Other languages
English (en)
Japanese (ja)
Other versions
JPS6311634Y2 (enrdf_load_stackoverflow
Inventor
石坂　安雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Victor Company of Japan Ltd
Original Assignee
Victor Company of Japan Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Victor Company of Japan Ltd filed Critical Victor Company of Japan Ltd
Priority to JP1981183131U priority Critical patent/JPS5888147U/ja
Publication of JPS5888147U publication Critical patent/JPS5888147U/ja
Application granted granted Critical
Publication of JPS6311634Y2 publication Critical patent/JPS6311634Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Manufacturing Of Magnetic Record Carriers (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP1981183131U 1981-12-09 1981-12-09 磁気テ−プの光透過率測定装置 Granted JPS5888147U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1981183131U JPS5888147U (ja) 1981-12-09 1981-12-09 磁気テ−プの光透過率測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1981183131U JPS5888147U (ja) 1981-12-09 1981-12-09 磁気テ−プの光透過率測定装置

Publications (2)

Publication Number Publication Date
JPS5888147U true JPS5888147U (ja) 1983-06-15
JPS6311634Y2 JPS6311634Y2 (enrdf_load_stackoverflow) 1988-04-05

Family

ID=29982120

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1981183131U Granted JPS5888147U (ja) 1981-12-09 1981-12-09 磁気テ−プの光透過率測定装置

Country Status (1)

Country Link
JP (1) JPS5888147U (enrdf_load_stackoverflow)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54115061A (en) * 1978-02-28 1979-09-07 Fujitsu Ltd Inspection method of semiconductor wafer by infrared rays

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54115061A (en) * 1978-02-28 1979-09-07 Fujitsu Ltd Inspection method of semiconductor wafer by infrared rays

Also Published As

Publication number Publication date
JPS6311634Y2 (enrdf_load_stackoverflow) 1988-04-05

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