JPS5886557U - 物体端面傷検出装置 - Google Patents
物体端面傷検出装置Info
- Publication number
- JPS5886557U JPS5886557U JP18332081U JP18332081U JPS5886557U JP S5886557 U JPS5886557 U JP S5886557U JP 18332081 U JP18332081 U JP 18332081U JP 18332081 U JP18332081 U JP 18332081U JP S5886557 U JPS5886557 U JP S5886557U
- Authority
- JP
- Japan
- Prior art keywords
- flaw detection
- camera
- detection device
- stand
- detected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18332081U JPS5886557U (ja) | 1981-12-08 | 1981-12-08 | 物体端面傷検出装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18332081U JPS5886557U (ja) | 1981-12-08 | 1981-12-08 | 物体端面傷検出装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5886557U true JPS5886557U (ja) | 1983-06-11 |
| JPS6344764Y2 JPS6344764Y2 (enExample) | 1988-11-21 |
Family
ID=29982474
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18332081U Granted JPS5886557U (ja) | 1981-12-08 | 1981-12-08 | 物体端面傷検出装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5886557U (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1990001142A1 (fr) * | 1988-07-21 | 1990-02-08 | Kabushiki Kaisha Ksp | Procede et dispositif de mesure de l'etat d'une surface |
| JP2013088254A (ja) * | 2011-10-17 | 2013-05-13 | Ihi Corp | 管端検査装置 |
-
1981
- 1981-12-08 JP JP18332081U patent/JPS5886557U/ja active Granted
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1990001142A1 (fr) * | 1988-07-21 | 1990-02-08 | Kabushiki Kaisha Ksp | Procede et dispositif de mesure de l'etat d'une surface |
| JP2013088254A (ja) * | 2011-10-17 | 2013-05-13 | Ihi Corp | 管端検査装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6344764Y2 (enExample) | 1988-11-21 |
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