JPS5885995A - Storage device - Google Patents

Storage device

Info

Publication number
JPS5885995A
JPS5885995A JP56184765A JP18476581A JPS5885995A JP S5885995 A JPS5885995 A JP S5885995A JP 56184765 A JP56184765 A JP 56184765A JP 18476581 A JP18476581 A JP 18476581A JP S5885995 A JPS5885995 A JP S5885995A
Authority
JP
Japan
Prior art keywords
writing
data
high voltage
gate
write
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56184765A
Other languages
Japanese (ja)
Other versions
JPS6117078B2 (en
Inventor
Makoto Mitsubuchi
三淵 誠
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP56184765A priority Critical patent/JPS5885995A/en
Publication of JPS5885995A publication Critical patent/JPS5885995A/en
Publication of JPS6117078B2 publication Critical patent/JPS6117078B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/10Programming or data input circuits
    • G11C16/12Programming voltage switching circuits

Abstract

PURPOSE:To protect a storage device from a high voltage terminal, by having a series connection among the 1st protecting resistance, a voltage supply terminal connected to a writing circuit via the 1st protecting resistance, a gate which conducts in case no writing is required to all writing circuits, and the 2nd protecting resistance respectively. CONSTITUTION:A series matter of the 2nd protecting resistance 61 and N type MOSTR62 and an NOR gate 63 are added to a 2-bit PROM circuit containing a high voltage supply terminal 10, the 1st protecting resistance 20, writing data input terminals 31 and 32, and storage unit elements 41, 42, 51 and 52. When the terminals 31 and 32 are set at a low level with the TR41 and 42 turned off and a mode in which no data is written, the TR62 is turned on since the input of the gate 63 is at a low level. Thus the voltage divided by the resistances 20 and 61 is applied to the TR41 and 42. As a result, a storage device can be protected from a high voltage terminal even in case the writing is not required for all writing data.

Description

【発明の詳細な説明】 本発明は記憶装置に係シ、特に高電圧によシデータの書
込みを行なうプログラマブル読み出し専用メモリー集積
回路における高電圧端子の保護回路に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a memory device, and more particularly to a protection circuit for a high voltage terminal in a programmable read-only memory integrated circuit that writes data using a high voltage.

従来、プログラマブル読み出し専用メモリー(以下FR
OMと略す)においては、高電圧端子と内部回路との間
に保護抵抗を入れて、高電圧端子の入力保護を行なって
いた。
Traditionally, programmable read-only memory (hereinafter referred to as FR)
(abbreviated as OM), a protective resistor is inserted between the high voltage terminal and the internal circuit to protect the input of the high voltage terminal.

第1図は従来のFROMの一例の回路図である。FIG. 1 is a circuit diagram of an example of a conventional FROM.

との回路は、N型MO8(メタライズド・オキサイド脅
セミコンダクタ)トランジスタにより構成される記憶容
量2ビツトのFROMの部分で、高電圧によシデータを
書込むに必要な部分のみを記して、他の読み出しに必要
な部分等は省略しである。ことで、書込み用NIIMO
8)ランジスタ41と記憶をさせるためのプログラマブ
ルNl!MOSトランジスタ51との対が、1つの記憶
単位素子となる。高電圧入力端子1oけ、保護抵抗2o
を介してデータ書込み時に内部へ高電圧を印加するため
のものである。書込み用Nl!MOS )ランジスタ4
1.42は、そのソースが共通となシ保護抵抗20と接
続され、そのゲートが書込みデータの入力端子31.3
2とそれぞれ接続される。フローティングゲートを有す
るプログラマブルNIIMOS)ランジスタ51.52
は、そのゲートが共に保護抵抗20と接続され、そのド
レインがそれぞれN型MOS)ランジスタ41.42の
ソースと接続され、そのソースが共に接地(GND)と
接続されている。このトランジスタ51.52は、フロ
ーティングゲートを有しておシ、一度高電圧でトランジ
スタをオン(ON)状態にするとゲートに電荷が蓄積さ
れたままとなシ、以後紫外線によシ゛この電荷を放出さ
せない限りON状態が継続するので、データを記憶する
事ができる。今入力端子10に高電圧を印加すると、保
護抵抗20を介して書込み用N型M0.8)ランジスタ
41゜42のドレインとプログラマブルN型MO8)ラ
ンジスタ51.52のゲートにこの高電圧が印加される
。この時書込み用N型MO8)?ンジスタ41がONし
ていればプログラマブルNllMOSトランジスタ51
のソース・ドレイン間に高電圧が印加され、データが書
込まれる。もし、書込み用N型MO8)ランジスタ41
がオフ(OFF)ならば、これにデータは書込まれない
。また、書込み用NIIMO8)ランジスタ42がON
であればプログラマブル型MO8)ランジスタ52に、
データが書込まれる。以上の様に入力端子10よシ高電
圧を印加し入力端子31.32より入力される書込みデ
ータによシ、書込み用N型MO8)ランジスタ41.4
2をON、OFFする事でデータをプログラムする。仁
の時書込み用N型MOSトランジスタ41,42の片方
もしくけ両方がONとなるモード、即ち一方もしくは両
方にデータを書込むモードならば、入力端子10よシ数
ボルト以上のノイズが短時間印加されても、保護抵抗2
゜と、書込み用N型MO8)ランジスタ、プログラマブ
ルN型MOSトランジスタ41.51もしくは42.5
2、またはその両方のONした時の等価抵抗とで、分圧
されたものが内部にかかるので内部回路は破壊をまぬが
れることができる。しかし、書込み用N型MO8)ラン
ジスタ41.42が共にOFFの時即ち書込みデータが
すべてデータを書込まないモードの時は保護抵抗20と
接地(GND)間は切シけなされているので、数ボルト
以上のノイズが印加されると、分圧されずにそのまま直
接内部にかかるので、保護抵抗2oが役にたたないで内
部回路が破壊される事がある。
The circuit is a FROM part with a storage capacity of 2 bits made up of N-type MO8 (metalized oxide semiconductor) transistors, and only the parts necessary for writing high-voltage data are written, and other reading Necessary parts are omitted. By this, NIIMO for writing
8) Programmable Nl for transistor 41 and memory! A pair with MOS transistor 51 becomes one memory unit element. High voltage input terminal 1 ohm, protection resistor 2 ohm
This is for applying a high voltage internally during data writing. Nl for writing! MOS) transistor 4
1.42 has its source connected to the common protection resistor 20, and its gate is connected to the write data input terminal 31.3.
2, respectively. Programmable NIIMOS) transistor with floating gate 51.52
Both have their gates connected to the protection resistor 20, their drains connected to the sources of N-type MOS transistors 41 and 42, and their sources both connected to ground (GND). These transistors 51 and 52 have floating gates, and once the transistors are turned on with a high voltage, charges are accumulated in the gates and are subsequently released by ultraviolet rays. Since the ON state continues unless the switch is turned on, data can be stored. When a high voltage is now applied to the input terminal 10, this high voltage is applied to the drains of write N-type M0.8) transistors 41 and 42 and the gates of programmable N-type MO8) transistors 51 and 52 through the protection resistor 20. Ru. At this time, N type MO8 for writing? If the transistor 41 is ON, the programmable NllMOS transistor 51
A high voltage is applied between the source and drain of the device to write data. If writing N type MO8) transistor 41
If it is OFF, no data will be written to it. Also, write NIIMO8) transistor 42 is ON.
If so, programmable MO8) transistor 52,
Data is written. As described above, a high voltage is applied to the input terminal 10, and the write data input from the input terminals 31.32 is applied to the write N-type MO8) transistor 41.4.
Program data by turning 2 ON and OFF. In a mode in which either one or both of the write N-type MOS transistors 41 and 42 are turned on, that is, in a mode in which data is written to one or both, noise of several volts or more is applied to the input terminal 10 for a short time. Even if the protection resistance 2
゜, writing N-type MO8) transistor, programmable N-type MOS transistor 41.51 or 42.5
2 or the equivalent resistance when both are turned on, a divided voltage is applied internally, so the internal circuit can be prevented from being destroyed. However, when both write N-type MO8) transistors 41 and 42 are OFF, that is, when all write data is in a mode in which no data is written, the protective resistor 20 and the ground (GND) are disconnected, so the number of When noise of volts or more is applied, it is applied directly to the inside without being divided, so the protective resistor 2o becomes useless and the internal circuit may be destroyed.

以上の様に、従来のFROMにおいては、高電圧を印加
してデータ書込みを行なう際の高電圧端子の過電圧保護
が書込みデータによシ保護抵抗が役に立たない場合があ
るという欠点があった。
As described above, the conventional FROM has a drawback in that when data is written by applying a high voltage, the overvoltage protection of the high voltage terminal may depend on the written data and the protection resistor may not be useful.

本発明の目的は、上記欠点を除き、例えば書込み回路と
GND間に電気的に接続される保護抵抗を従来の回路に
付加する事によって、書込み入力データにかかわりなく
、入力保護が有効に行なわれる特にプログラマブル読み
出し専用メモリー集積回路の記憶装置を提供することに
ある。
An object of the present invention is to eliminate the above-mentioned drawbacks, and to effectively perform input protection regardless of write input data, for example, by adding a protective resistor electrically connected between the write circuit and GND to the conventional circuit. More specifically, the present invention provides a storage device for a programmable read-only memory integrated circuit.

本発明は、複数の記憶単位素子と、とれら記憶単位素子
にデータを書込むための書込み電圧を入力する端子と、
これら端子と前記各記憶単位素子との間に介在せる第1
の保護抵抗とを備えた記憶装置において、前記記憶単位
素子のすべてにデータを書込ませる必要のない場合に導
通するゲートと第2の保護抵抗との直列体が、前記記憶
単位素子と並列に接続されていることを特徴とする記憶
装置にある。
The present invention includes a plurality of memory unit elements, a terminal for inputting a write voltage for writing data to the memory unit elements,
A first interposed between these terminals and each memory unit element.
In the storage device, a series body of a gate and a second protection resistor is connected in parallel with the storage unit element and is conductive when there is no need to write data to all of the storage unit elements. A storage device characterized in that it is connected.

即ち本発明は、第1の保護抵抗と、それを介して書込み
回路と接続される書込み電圧供給端子と全ての書込みデ
ータ入力が書込み動作を伴なわない場合にのみ前記書込
み回路と例えばGND間とに第2の保護抵抗を電気的に
接続するようになす制御回路とを含んで構成される。
That is, the present invention provides a connection between a first protection resistor, a write voltage supply terminal connected to the write circuit via the first protection resistor, and the write circuit and, for example, GND only when all write data inputs do not involve a write operation. and a control circuit for electrically connecting the second protection resistor to the first protection resistor.

本発明を図面を参照して詳細に説明する。The present invention will be explained in detail with reference to the drawings.

第2図は本発明の一実施例の回路図である。この回路は
、N1MOS)ランジスタにより構成される2ビツトの
FROMの部分で、高電圧供給端子10、第1の保護抵
抗20、書込みデータ入力画端子31,32、NaNO
2)ランジスタ41゜42と70−ティングゲートを有
するN型MOSトランジスタ51.52とからなる二つ
の記憶単位素子は、第1図と同じ様に接続されているが
、第2の保護抵抗61とN型MOS)ランジスタロ2と
の直列体、ノア(NOR)ゲート63が付加されている
。N型MOS)ランジスタロ2がONすると、書込み用
NIIMO8)ランジスタ41と42のソースには第1
の保護抵抗20と第2の保護抵抗61等で分圧された電
圧が印加される。ノアゲート63の出力はN型MO8)
ランジスタロ2のゲートと接続され、その入力は入力端
子31.32と接続されている。
FIG. 2 is a circuit diagram of one embodiment of the present invention. This circuit is a 2-bit FROM part composed of N1MOS) transistors, and includes a high voltage supply terminal 10, a first protection resistor 20, write data input terminals 31 and 32, and NaNO
2) Two memory unit elements consisting of transistors 41 and 42 and N-type MOS transistors 51 and 52 having a 70-ring gate are connected in the same manner as in FIG. A NOR gate 63 connected in series with the N-type MOS transistor 2 is added. When N-type MOS) transistor 2 is turned on, the sources of write NIIMO 8) transistors 41 and 42 are connected to the first transistor.
A voltage divided by the protective resistor 20, the second protective resistor 61, etc. is applied. The output of NOR gate 63 is N type MO8)
It is connected to the gate of transistor 2, and its input is connected to input terminals 31 and 32.

今、入力端子10゛よシ高電圧が供給され、入力端子3
1もしくは32よシ、ハイレ、ベルが印加されると、ノ
アゲート63の出力はローレベルとなり62はオフし、
第2の保護抵抗61には電流が流れず、書込み用N!M
O8)ランジスタ41もしくは42がONL、てプログ
ラマブルN型MO8トランジスタ51もしくは52にデ
ータが書込まれる。しかし、入力端子31.32ともロ
ーレベルであると、書込み用NIIMO8)ランジスタ
41と42はともにオフとなシ、データが書込まれない
モードとなるが、ノアゲート63の入力がともにローレ
ベルなので、その出力はハイレベルとな9N型MO8)
ランジスタロ2がオンする。このすべての書込みデータ
がデータを書込まないモード0時もし入力端子10よシ
数ボルト以上のノイズが印加されても、内部には第1の
保護抵抗20と第2の保護抵抗61で分圧されて降圧し
た電圧がかかるので保護がなされた状態となり、破壊を
免れる事ができる。
Now, high voltage is supplied to input terminal 10, and input terminal 3
When 1 or 32 is applied, the output of NOR gate 63 becomes low level and 62 is turned off.
No current flows through the second protection resistor 61, and the write N! M
O8) When the transistor 41 or 42 is ONL, data is written to the programmable N-type MO8 transistor 51 or 52. However, if the input terminals 31 and 32 are both at low level, the writing NIIMO8) transistors 41 and 42 are both turned off, and the mode is such that no data is written. However, since both input terminals of the NOR gate 63 are at low level, Its output is high level (9N type MO8)
Ranjistaro 2 turns on. When all the write data is in mode 0 where no data is written, even if noise of several volts or more is applied to the input terminal 10, the internal voltage is divided by the first protection resistor 20 and the second protection resistor 61. Since the reduced voltage is applied to the device, it is protected and can avoid destruction.

以上の様に、従来では書込みデータのすべてを書込む必
要のない時に保護装置がその役をはたしていなかったが
、本発明を用いると、書込みデータのすべてを書込む必
要のない時に特に有効に働く保護回路を付加する事によ
って、書込みデータがどんなものであっても高圧端子か
らの保護がなされるという効果が得られる。
As described above, in the past, the protection device did not play its role when it was not necessary to write all of the write data, but with the present invention, it is particularly effective when it is not necessary to write all of the write data. By adding a working protection circuit, it is possible to obtain the effect that no matter what the written data is, it is protected from the high voltage terminal.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来のFROMの一例の回路図、第2図は本発
明の一実施例の回路図である。
FIG. 1 is a circuit diagram of an example of a conventional FROM, and FIG. 2 is a circuit diagram of an embodiment of the present invention.

Claims (1)

【特許請求の範囲】[Claims] 複数の記憶単位素子と、これら記憶単位素子にデータを
書込む丸めの書込み電圧を入力する端子と、これら端子
と前記各記憶単位素子との間に介在せる第1の保S抵抗
とを備えた記憶装置において、前記記憶単位素子のすべ
てにデータを書込ませる必要のない場合に導通するゲー
トと第2の保護抵抗との直列体が、前記記憶単位素子と
並列に接続されていることを特徴とする記憶装置。
The memory unit comprises a plurality of memory unit elements, a terminal for inputting a rounded write voltage for writing data to these memory unit elements, and a first S resistor interposed between these terminals and each of the memory unit elements. In the memory device, a series body of a gate and a second protection resistor, which is conductive when there is no need to write data to all of the memory unit elements, is connected in parallel with the memory unit elements. storage device.
JP56184765A 1981-11-18 1981-11-18 Storage device Granted JPS5885995A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56184765A JPS5885995A (en) 1981-11-18 1981-11-18 Storage device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56184765A JPS5885995A (en) 1981-11-18 1981-11-18 Storage device

Publications (2)

Publication Number Publication Date
JPS5885995A true JPS5885995A (en) 1983-05-23
JPS6117078B2 JPS6117078B2 (en) 1986-05-06

Family

ID=16158932

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56184765A Granted JPS5885995A (en) 1981-11-18 1981-11-18 Storage device

Country Status (1)

Country Link
JP (1) JPS5885995A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0272848A2 (en) * 1986-12-20 1988-06-29 Fujitsu Limited Semiconductor device having programmable read only memory cells for specific mode

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0272848A2 (en) * 1986-12-20 1988-06-29 Fujitsu Limited Semiconductor device having programmable read only memory cells for specific mode

Also Published As

Publication number Publication date
JPS6117078B2 (en) 1986-05-06

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