JPS5880253A - イオン電流測定装置 - Google Patents

イオン電流測定装置

Info

Publication number
JPS5880253A
JPS5880253A JP57183784A JP18378482A JPS5880253A JP S5880253 A JPS5880253 A JP S5880253A JP 57183784 A JP57183784 A JP 57183784A JP 18378482 A JP18378482 A JP 18378482A JP S5880253 A JPS5880253 A JP S5880253A
Authority
JP
Japan
Prior art keywords
ion
voltage
chamber
periodically
measuring device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP57183784A
Other languages
English (en)
Japanese (ja)
Inventor
ロベ−ル・ボイエル
クロ−ド・ドユバル
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Publication of JPS5880253A publication Critical patent/JPS5880253A/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP57183784A 1981-10-21 1982-10-21 イオン電流測定装置 Pending JPS5880253A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR8119760A FR2514905A1 (fr) 1981-10-21 1981-10-21 Dispositif de mesure d'un courant ionique produit par un faisceau d'ions
FR819760 1981-10-21

Publications (1)

Publication Number Publication Date
JPS5880253A true JPS5880253A (ja) 1983-05-14

Family

ID=9263243

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57183784A Pending JPS5880253A (ja) 1981-10-21 1982-10-21 イオン電流測定装置

Country Status (5)

Country Link
US (1) US4517462A (OSRAM)
EP (1) EP0077739B1 (OSRAM)
JP (1) JPS5880253A (OSRAM)
DE (1) DE3275019D1 (OSRAM)
FR (1) FR2514905A1 (OSRAM)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4322101C2 (de) * 1993-07-02 1995-06-14 Bergmann Thorald Ionenquelle für Flugzeit-Massenspektrometer
US5689111A (en) * 1995-08-10 1997-11-18 Analytica Of Branford, Inc. Ion storage time-of-flight mass spectrometer
US5654544A (en) * 1995-08-10 1997-08-05 Analytica Of Branford Mass resolution by angular alignment of the ion detector conversion surface in time-of-flight mass spectrometers with electrostatic steering deflectors
US5847385A (en) * 1996-08-09 1998-12-08 Analytica Of Branford, Inc. Mass resolution by angular alignment of the ion detector conversion surface in time-of-flight mass spectrometers with electrostatic steering deflectors
US6806463B2 (en) * 1999-07-21 2004-10-19 The Charles Stark Draper Laboratory, Inc. Micromachined field asymmetric ion mobility filter and detection system
US7005632B2 (en) * 2002-04-12 2006-02-28 Sionex Corporation Method and apparatus for control of mobility-based ion species identification
US6815668B2 (en) * 1999-07-21 2004-11-09 The Charles Stark Draper Laboratory, Inc. Method and apparatus for chromatography-high field asymmetric waveform ion mobility spectrometry
US6690004B2 (en) * 1999-07-21 2004-02-10 The Charles Stark Draper Laboratory, Inc. Method and apparatus for electrospray-augmented high field asymmetric ion mobility spectrometry
US6815669B1 (en) * 1999-07-21 2004-11-09 The Charles Stark Draper Laboratory, Inc. Longitudinal field driven ion mobility filter and detection system
US7129482B2 (en) 1999-07-21 2006-10-31 Sionex Corporation Explosives detection using differential ion mobility spectrometry
US6495823B1 (en) 1999-07-21 2002-12-17 The Charles Stark Draper Laboratory, Inc. Micromachined field asymmetric ion mobility filter and detection system
US7098449B1 (en) 1999-07-21 2006-08-29 The Charles Stark Draper Laboratory, Inc. Spectrometer chip assembly
ATE298085T1 (de) * 2000-04-27 2005-07-15 Univ Loma Linda Nanodosimeter auf einzelionendetektierung basierend
IL159590A0 (en) * 2001-06-30 2004-06-01 Sionex Corp System for collection of data and identification of unknown ion species in an electric field
US7091481B2 (en) 2001-08-08 2006-08-15 Sionex Corporation Method and apparatus for plasma generation
US7274015B2 (en) * 2001-08-08 2007-09-25 Sionex Corporation Capacitive discharge plasma ion source
US6727496B2 (en) * 2001-08-14 2004-04-27 Sionex Corporation Pancake spectrometer
US7122794B1 (en) 2002-02-21 2006-10-17 Sionex Corporation Systems and methods for ion mobility control
US6919570B2 (en) * 2002-12-19 2005-07-19 Advanced Electron Beams, Inc. Electron beam sensor
WO2005067582A2 (en) * 2004-01-13 2005-07-28 Sionex Corporation Methods and apparatus for enhanced sample identification based on combined analytical techniques
US7399959B2 (en) * 2004-12-03 2008-07-15 Sionex Corporation Method and apparatus for enhanced ion based sample filtering and detection
EP1913379A2 (en) 2005-07-26 2008-04-23 Sionex Corporation Ultra compact ion mobility based analyzer apparatus, method, and system
KR101238040B1 (ko) * 2006-02-24 2013-02-27 텔레폰악티에볼라겟엘엠에릭슨(펍) 핸드오버를 위한 링크 계층 엔티티를 구성하는 기술
US8217344B2 (en) 2007-02-01 2012-07-10 Dh Technologies Development Pte. Ltd. Differential mobility spectrometer pre-filter assembly for a mass spectrometer
US7723706B2 (en) * 2008-06-19 2010-05-25 Varian Semiconductor Equipment Associates, Inc. Horizontal and vertical beam angle measurement technique
US8669533B2 (en) 2009-10-01 2014-03-11 Vladimir Bashkirov Ion induced impact ionization detector and uses thereof
IL202219A (en) * 2009-11-19 2013-03-24 Filt Air Ltd Method of bipolar ion generation and aerodynamic ion generator
WO2012161852A2 (en) 2011-03-07 2012-11-29 Loma Linda University Medical Center Systems, devices and methods related to calibration of a proton computed tomography scanner

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2612607A (en) * 1947-04-05 1952-09-30 William E Stephens Mass spectrometer
US2659822A (en) * 1947-04-22 1953-11-17 George H Lee Mass spectrometer
US3258591A (en) * 1961-12-22 1966-06-28 Pulse type mass spectrometer wherein ions are separated by oscillations in an electrostatic field
US3551675A (en) * 1967-08-02 1970-12-29 Gulf Energy & Environ Systems Method and apparatus for modulating the density of a beam of particles and determining the velocity distribution of the particles

Also Published As

Publication number Publication date
US4517462A (en) 1985-05-14
EP0077739B1 (fr) 1987-01-07
FR2514905B1 (OSRAM) 1983-12-02
DE3275019D1 (en) 1987-02-12
FR2514905A1 (fr) 1983-04-22
EP0077739A1 (fr) 1983-04-27

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