JPS5876106U

JPS5876106U - thickness measuring device

Info

Publication number: JPS5876106U
Application number: JP17090781U
Authority: JP
Inventors: 正昭井上; 平野　時雄
Original assignee: 横河電機株式会社
Priority date: 1981-11-17
Filing date: 1981-11-17
Publication date: 1983-05-23

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

[Brief explanation of the drawing]

第１図は厚さ測定装置の構成説明図、第２図は　　゛従
来の厚さ測定装置の動作を説明するフロー図、第３図は
本考案実施例の要部説明図、第４図は本考案実施例の動
作を説明するフロー図である。１．２・・・スタンド、３．４・・・ビーム、５．６・
・・アーム、７・・・ソースヘッド、８・・・デテクタ
ヘッド、９・・・被測定体、１０・・・折返点設定器、
１１・・・比較器、１２・・・ヘッド走査機構、１３・
・・電気的スライド器、１４・・・デテクタヘッド表面
、１５・・・取付板、１６−・・検出中心、１７ａ、　
　１７ｂ−・・調節孔、１８ａ。１８ｂ、２１．２２・・・光スィッチ、１９・・・測定
中心設定器、２０・・・測定中心検出回路、２３・・・
被測定体幅検出回路。Fig. 1 is an explanatory diagram of the configuration of the thickness measuring device, Fig. 2 is a flow diagram explaining the operation of the conventional thickness measuring device, Fig. 3 is an explanatory diagram of the main parts of the embodiment of the present invention, and Fig. 4 is FIG. 3 is a flow diagram illustrating the operation of the embodiment of the present invention. 1.2...Stand, 3.4...Beam, 5.6.
... Arm, 7... Source head, 8... Detector head, 9... Measured object, 10... Turning point setter,
11... Comparator, 12... Head scanning mechanism, 13.
...Electric slide device, 14...Detector head surface, 15...Mounting plate, 16-...Detection center, 17a,
17b--adjustment hole, 18a. 18b, 21.22... Optical switch, 19... Measurement center setting device, 20... Measurement center detection circuit, 23...
Measured object width detection circuit.

Claims

[Scope of utility model registration request]

first and second arms that are scanned simultaneously along the first and second beams, a source head that is held by the second arms and emits a predetermined electromagnetic wave, and a source head that is held by the first arms. and a detector head for detecting the electromagnetic waves, and a sheet-shaped object to be measured running in a direction perpendicular to the scanning direction of the arm is interposed between the source head and the detector head. In a thickness measuring device that measures the thickness of the object to be measured from the amount of attenuation of the detected electromagnetic waves, two optical switches for detecting both ends of the object to be measured are fixed to a mounting plate having adjustment holes of a predetermined shape. and located at a symmetrical position with respect to the detection center of the detector head,
A thickness measuring device characterized in that scanning of the detector head is controlled by the both-end signals detected by the optical switch and the center signal of the object to be measured detected by the detector head.