JPS5875050A - 表面疵自動検査機構 - Google Patents

表面疵自動検査機構

Info

Publication number
JPS5875050A
JPS5875050A JP17293181A JP17293181A JPS5875050A JP S5875050 A JPS5875050 A JP S5875050A JP 17293181 A JP17293181 A JP 17293181A JP 17293181 A JP17293181 A JP 17293181A JP S5875050 A JPS5875050 A JP S5875050A
Authority
JP
Japan
Prior art keywords
light
scanning
output
photoelectric conversion
receive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP17293181A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0434099B2 (enrdf_load_stackoverflow
Inventor
Masakazu Fujita
正和 藤田
Hideo Kitsuka
木塚　秀雄
Yukio Furukawa
古川　幸夫
Yasuhiko Masuno
増野　豈彦
Shoji Akutsu
阿久津　昭司
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
TOEI DENSHI KOGYO KK
Original Assignee
Kawasaki Steel Corp
TOEI DENSHI KOGYO KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kawasaki Steel Corp, TOEI DENSHI KOGYO KK filed Critical Kawasaki Steel Corp
Priority to JP17293181A priority Critical patent/JPS5875050A/ja
Publication of JPS5875050A publication Critical patent/JPS5875050A/ja
Publication of JPH0434099B2 publication Critical patent/JPH0434099B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
JP17293181A 1981-10-30 1981-10-30 表面疵自動検査機構 Granted JPS5875050A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17293181A JPS5875050A (ja) 1981-10-30 1981-10-30 表面疵自動検査機構

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17293181A JPS5875050A (ja) 1981-10-30 1981-10-30 表面疵自動検査機構

Publications (2)

Publication Number Publication Date
JPS5875050A true JPS5875050A (ja) 1983-05-06
JPH0434099B2 JPH0434099B2 (enrdf_load_stackoverflow) 1992-06-04

Family

ID=15951000

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17293181A Granted JPS5875050A (ja) 1981-10-30 1981-10-30 表面疵自動検査機構

Country Status (1)

Country Link
JP (1) JPS5875050A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPH0434099B2 (enrdf_load_stackoverflow) 1992-06-04

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