JPS5871547A - Ion source - Google Patents

Ion source

Info

Publication number
JPS5871547A
JPS5871547A JP56169555A JP16955581A JPS5871547A JP S5871547 A JPS5871547 A JP S5871547A JP 56169555 A JP56169555 A JP 56169555A JP 16955581 A JP16955581 A JP 16955581A JP S5871547 A JPS5871547 A JP S5871547A
Authority
JP
Japan
Prior art keywords
ion
ions
collision chamber
ion gun
collision
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56169555A
Other languages
Japanese (ja)
Other versions
JPS5838908B2 (en
Inventor
Norihiro Naito
内藤統広
Yoshihiro Naito
内藤善博
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK filed Critical Jeol Ltd
Priority to JP56169555A priority Critical patent/JPS5838908B2/en
Publication of JPS5871547A publication Critical patent/JPS5871547A/en
Publication of JPS5838908B2 publication Critical patent/JPS5838908B2/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/14Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/142Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using a solid target which is not previously vapourised

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

PURPOSE:To accelerate ions in two steps together with an ion gun part and obtain an ion source capable of feeding out neutral particles having extremely high velocity by impressing ion accelerating voltage on a collision chamber while insulating said collision chamber from surroundings in a mass spectrograph. CONSTITUTION:Ar required for an ion gun (10<-2>-10<-4>Torr in pressure) is supplied from a collision chamber (equally 10<-2>-10<-3>Torr). Ar ion formed in a formation chamber 6 inside of the ion gun is accelerated by annular lens electrodes 9, 10 and 11 and then incided into the collision chamber 19, while in this invention said collision chamber 19 is held insulatedly to impress acceleration voltage upon said collision chamber so as to further accelerate Ar ions also between the ion gun and the collision chamber 19 so that energy of ions inciding into the collision chamber 19 is extremely increased as compared with the past wherein ions ucould not be except by the ion gun.

Description

【発明の詳細な説明】 本発明は質量分析装置に用いて好適なイオン源に関し、
特に試料に高速中性粒子を衝突させてイオン化する方式
のイオン源に関する0 質量分析装置に用いられるイオン源のイオン化方式とし
ては、電子衝撃型、化学電離型、電界電IwI型あるい
は電界脱離型等が次々と開発され実用化されてめる。と
ころで近時試料に高いエネルギーを持った高速中性粒子
(例えばムr@子)を衝突さ鷺、そのエネルギーにより
試料をイオン化するイオン化方式が注目されており、こ
の方式はU)イオン化のエネルギーが小さくソフトなイ
オン化である。(2)正イオンばかりでなく負イオンの
生成率も高い、(8)加熱気化が不要なため試料の熱分
解が少ない、(4)中性粒子なのでチャージアップがな
く絶縁物でも容易性イオン化できる等多ぐの優れた点を
持った方式として今後の発達が期待されている。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an ion source suitable for use in a mass spectrometer,
In particular, it relates to ion sources that ionize samples by colliding high-speed neutral particles with them.The ionization methods of ion sources used in mass spectrometers include electron impact type, chemical ionization type, electric field IwI type, and field desorption type. etc. are being developed and put into practical use one after another. By the way, recently, an ionization method that collides high-energy high-speed neutral particles (such as particles) with a sample and ionizes the sample with that energy has been attracting attention. It is a small and soft ionization. (2) The generation rate of not only positive ions but also negative ions is high. (8) There is little thermal decomposition of the sample because heating vaporization is not required. (4) Since it is a neutral particle, there is no charge-up and even insulating materials can be easily ionized. This method has many excellent features and is expected to be developed in the future.

本発明はこの方式に基づくイオン源の改良に関するもの
で、イオン銃から発生したイオンを衝突箱へ導入して中
性粒子に変換する際、該衝突箱を周囲と絶縁して該衝突
箱にイオン加速電圧を印加することによりイオンをイオ
ン銃部と併せて2段階で加速し、極めて高速度を持った
中性粒子を取出すことのできるイオン源を提供すること
全目的としている。以下図面を用^て本発明を詳説する
The present invention relates to an improvement of an ion source based on this method. When introducing ions generated from an ion gun into a collision box and converting them into neutral particles, the collision box is insulated from the surroundings and ions are transferred to the collision box. The overall purpose of this invention is to provide an ion source that can accelerate ions together with the ion gun section in two stages by applying an accelerating voltage and extract neutral particles with extremely high velocity. The present invention will be explained in detail below with reference to the drawings.

d#Jは本発明の一実施例の構成を示す断面図であり、
図中1は試料に照射する中性粒子例えば紅原子を−Hイ
オン化するためのイオン銃であるO該イオン銃1は質量
分析装置のイオン源側壁2に取付けられてお秒、その内
部は排気管6及び/くルブ4を介して真空ポンプ(図示
せず)によって排される了ノード7及びフィラメント8
と、上記円筒状電極5の下端に取付けられた3段構成の
環状レンズ電ff19,10.11から構成される。#
電極9.11には接電電位、又電極10には電源12に
より数Kvの正電位が与えられており、上記生成室6で
生成された正電荷を持つArイオン(ムr )はこれら
の電極間に形成される電界による加速作用及び収束作用
を受け、高速のArイオンビーム16としてイオン銃外
へ取出される。
d#J is a sectional view showing the configuration of an embodiment of the present invention,
In the figure, 1 is an ion gun for ionizing neutral particles such as red atoms to -H to irradiate the sample.The ion gun 1 is attached to the side wall 2 of the ion source of the mass spectrometer, and its interior is exhausted. A node 7 and a filament 8 are evacuated by a vacuum pump (not shown) via a tube 6 and a tube 4.
and a three-stage annular lens electrode ff19, 10.11 attached to the lower end of the cylindrical electrode 5. #
The electrodes 9 and 11 are given a grounding potential, and the electrode 10 is given a positive potential of several Kv by the power source 12, and the positively charged Ar ions (Mu r ) generated in the generation chamber 6 are The ion beam is accelerated and focused by the electric field formed between the electrodes, and is taken out of the ion gun as a high-speed Ar ion beam 16.

ここで上記環状電極11は第1図におけるエーエ断面図
である第2図に示すように3分割されて間に絶縁スペー
サ14を介して一体に成形してあり、分割電@i11°
に正又は負の数百Vまでの可変電位を与えることにより
Arイオンビーム16を!方向ヘー向でき、又分割側1
1”に同様の可変電位を与えることによりY方向へ偏向
できる構造となっている。
Here, the annular electrode 11 is divided into three parts as shown in FIG. 2, which is a cross-sectional view of FIG.
Ar ion beam 16 by applying a positive or negative variable potential of up to several hundred volts to! The direction can be oriented, and the split side 1
1'' can be deflected in the Y direction by applying a similar variable potential.

尚S5はフィラメント加熱用の電源、16はフィラメン
トアノード間に数百Vの電圧を印加するための電源、1
7はフィラメントから電極5の方向へ向けて発生した電
子をアノードの方向へ反転させるためζこg〜#与える
ための電源、そして67は加速電圧を印加するための電
源である。
Note that S5 is a power supply for heating the filament, 16 is a power supply for applying a voltage of several hundred V between the filament anodes, and 1
Reference numeral 7 designates a power source for applying ζg~# to reverse electrons generated from the filament toward the electrode 5 toward the anode, and 67 represents a power source for applying an accelerating voltage.

この様にしてイオン銃1から取出された高速紅イオンビ
ーム13はイオン源側壁2に絶縁体18を介して固着さ
れた衝突箱19を通過してイオン源内部へ導入されるが
該衝突箱19には電源20から負の高電圧が印加されて
おl)、Arイオンビーム13は鱈高電圧により更に高
速度に加速されて衝突箱19内へ入射してゆく。該衝突
箱19の内部には導入管21を介してArガス(中性A
r原子)が満たさnており、衝突箱の内部を通過するイ
オンのかなりの部分は該ムr原子と衝突して運動方向及
び速度は殆んど変わらずに電荷のみを奪 4われで高速
中性ムr原子に変換されるため、該衝突箱19t−通過
したビーム中にはArイオンと中性Ar原子が混在する
こと1ζなる0このうちArイオンは後続して設けられ
たl向a22による偏向を受けて除去され、中性ムr原
子のみが該偏向器221″通過して高速ムr原子ビーム
26として取出される。尚本実施例ではこの時偏向62
2の一対の電極のうち偏向を受けたArイオンが衝突す
る方の電極を電流計24を介して接地することによりA
rイオン電流をモニタするようにしている。又Arイオ
ン電流と中性ムr原子の量とは比例関係があるので中性
ムr原子の量も間接的にモニタできることになる。
The high-speed red ion beam 13 taken out from the ion gun 1 in this manner passes through a collision box 19 fixed to the ion source side wall 2 via an insulator 18 and is introduced into the ion source. A negative high voltage is applied from a power source 20 to (1), and the Ar ion beam 13 is accelerated to a higher speed by the high voltage and enters the collision box 19. Ar gas (neutral A) is introduced into the collision box 19 through an introduction pipe 21.
A large portion of the ions passing through the collision chamber collide with these atoms, taking away only their charge without changing their direction or velocity. Because the beam is converted into a neutral Ar atom, Ar ions and neutral Ar atoms coexist in the beam that passes through the collision box 19t. After being deflected and removed, only the neutral Mur atoms pass through the deflector 221'' and are extracted as a high-speed Mur atomic beam 26. In this embodiment, the deflection 62
By grounding the electrode of the pair of electrodes 2 with which the deflected Ar ions collide through the ammeter 24, the
The r-ion current is monitored. Furthermore, since there is a proportional relationship between the Ar ion current and the amount of neutral Mur atoms, the amount of neutral Mur atoms can also be monitored indirectly.

上配備向器22から取出された高速Ar[子ビーム23
は切欠き部25を介してイオン化箱26内へ導入され、
該イオン化箱26内へ後方から挿入されたターゲット2
7の原子ビーム25に対して傾斜が与えられたターゲツ
ト面に衝突し、該衝突面に塗布されて−るグリセリンと
被検物質とを混合調製した試料をイオン化させる。該タ
ーゲット27は例えば鋼製で絶縁体28を介して導入プ
ローブ29の先端に取付けられると共に電源30から例
えば3KV程度の加速電圧が印加されており、その表面
から飛び出した試料イオンは加速電圧を分圧器31で分
圧して得た適宜な電圧が夫々印加されているスリット電
極群52〜65によって引出されて加速され1図示しな
い質量分析部へ導かれる。尚36はターゲット27とイ
オン化箱26との間にバイアス電圧(正、負可f)を印
加するための電源である。
The high-speed Ar [child beam 23
is introduced into the ionization box 26 through the notch 25,
Target 2 inserted into the ionization box 26 from the rear
The atomic beam 25 of No. 7 collides with an inclined target surface, and ionizes a sample prepared by mixing glycerin and a test substance coated on the collision surface. The target 27 is made of steel, for example, and is attached to the tip of the introduction probe 29 via an insulator 28, and an accelerating voltage of, for example, about 3 KV is applied from a power source 30, and the sample ions ejected from the surface are separated by the accelerating voltage. Appropriate voltages obtained by dividing the voltage with the voltage generator 31 are drawn out by the slit electrode groups 52 to 65 to which they are respectively applied, accelerated, and guided to a mass spectrometer (not shown). Note that 36 is a power source for applying a bias voltage (positive or negative f) between the target 27 and the ionization box 26.

斯かる構成において、イオン銃1に必要なAr(圧力に
して10−” 〜10−’τorr)は衝突箱〔同じ<
 10−” 〜10  ”Torr )から供給されて
おり、両者を結ぶビーム通過口の大きさとバルブ4のt
A節によって夫々の圧力が保たれる様に設定されている
。そしてイオン銃1内の生成室6で生成されたArイオ
ンは環状レンズ電極9,10.11によって加速された
後衝突箱嘔9へ入射するのであるが、本発明では該衝突
箱19を絶縁的に保持し鱈衝突箱に加速電圧を印加して
いるので、ムrイオンはイオン銃と衝突箱19の間でも
更に加速されることになり、イオン銃でしか加速しなか
った従姿番べ衝突箱19に入射するイオンのエネルギー
を飛躍的lこ高めることができる。従って該衝突箱19
から取出される中性ムr原子の持つエネルギーもそれに
応じて高められ、大きなエネルギーを持つ高速ムr原子
を試料に衝突させることができる。
In such a configuration, the Ar required for the ion gun 1 (10-" to 10-'τorr in terms of pressure) is
10-” to 10” Torr), and the size of the beam passage port connecting the two and the t of valve 4
The settings are such that each pressure is maintained by section A. The Ar ions generated in the generation chamber 6 in the ion gun 1 are accelerated by the annular lens electrodes 9, 10, 11 and then enter the collision box 9. In the present invention, the collision box 19 is Since an accelerating voltage is applied to the cod collision box while holding the ion gun at The energy of ions incident on the box 19 can be dramatically increased. Therefore, the collision box 19
The energy of the neutral Mur atoms extracted from the sample is increased accordingly, allowing high-speed Mur atoms with large energy to collide with the sample.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例の構成を示す図であ0111
112図はそのエーエ断面図である。 1:イオン銃、6:イオン生成室、9,10゜11:環
状レンズ電極、20:電源、13:ムrイオンビーム、
18:絶縁体、19:衝突箱、25:嵩速z−r原子ビ
ーム、26:イオン化箱、27:ター・ゲット。 特許出願人 日本電子株式会社 代表者加勢忠雄
FIG. 1 is a diagram showing the configuration of an embodiment of the present invention.
FIG. 112 is a cross-sectional view of the same. 1: Ion gun, 6: Ion generation chamber, 9, 10° 11: Annular lens electrode, 20: Power supply, 13: Mur ion beam,
18: Insulator, 19: Collision box, 25: Bulk zr atomic beam, 26: Ionization box, 27: Target. Patent applicant JEOL Ltd. Representative Tadao Kase

Claims (1)

【特許請求の範囲】[Claims] イオン銃と、鱈イオン銃から取出されtイオンが通る通
路を有し内部に収容した衝突ガスによりイオンから電荷
を奪って中性粒子に弯撲するための衝突箱とを備え、該
中性粒子を試料に照射して試料をイオン化するイオン源
において、前記イオン銃から取出されたイオンを更に加
速するための加速電圧を前記衝突箱に印加することを特
徴とするイオン源。
It is equipped with an ion gun and a collision box which has a passage through which the t-ions taken out from the cod ion gun pass and uses a collision gas contained therein to remove electric charges from the ions and deform them into neutral particles. An ion source that ionizes a sample by irradiating it onto the sample, characterized in that an accelerating voltage is applied to the collision box to further accelerate the ions taken out from the ion gun.
JP56169555A 1981-10-23 1981-10-23 ion source Expired JPS5838908B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56169555A JPS5838908B2 (en) 1981-10-23 1981-10-23 ion source

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56169555A JPS5838908B2 (en) 1981-10-23 1981-10-23 ion source

Publications (2)

Publication Number Publication Date
JPS5871547A true JPS5871547A (en) 1983-04-28
JPS5838908B2 JPS5838908B2 (en) 1983-08-26

Family

ID=15888630

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56169555A Expired JPS5838908B2 (en) 1981-10-23 1981-10-23 ion source

Country Status (1)

Country Link
JP (1) JPS5838908B2 (en)

Also Published As

Publication number Publication date
JPS5838908B2 (en) 1983-08-26

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