JPS58705A - Inspecting device of spherical body distortion - Google Patents

Abstract

PURPOSE:To easily inspect whether distortion exists on a spherical surface or not, and also an extent of its distortion, by installing a circular index centering around an optical axis of an observation optical system of a spherical body, and providing a reflection optical member for superposing a transmission light beam and a reflected ray on the observation optical system. CONSTITUTION:A reflected light from an eyeball to be inspected, which has been irradiated by a light from an annular light source 5 is observed 4 through a microscope objective lens 2, an image converter 6 and a microscope eyelens 3. When an image light beam of an ellipse PQR is made incident to the image converter 6, image light beams of a point P and a point Q, which have transmitted a semitransparent reflection surface 11 at a point A and a point D are reflected by prisms 15, 14, and take routes of PABCDEF and QDCBAGH, respectively. Also, image light beams of a point P and a point Q, which have been reflected by a point A and a point B of a semitransparent mirror are reflected by prisms 16, 14, pass through routes of PAJKEF and QDKJGH, respectively, and an observation image PQR and P'Q'R' are doubly seen in the direction as indicated with an arrow 17. Accordingly, it is possible to easily inspect whether distortion exists on an eyeball surface 1 or not, and also an extent of its distortion.

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an apparatus for inspecting distortion of a spherical surface of an eyeball, contact lens, or the like.

Especially in the case of the eyeball, although it is difficult to measure the curvature by applying a measuring device to the surface of the eyeball, it is easy to detect distortion clinically for purposes such as visual acuity tests and surgical results tests. However, it is an object of the present invention to realize an inspection device suitable for such use.

The present invention will be explained below based on illustrated embodiments.

In FIG. 1, 1 is an eye to be examined, 2 is a microscope objective lens, 3 is a microscope eyepiece, and 4 is an observer. When an annular light source 5 centered on the optical axis is placed around the incident optical path of the objective lens 2, the light source 5 is reflected by the convex surface of the eyeball 1 and becomes a relatively small annular bright line for observation. be done. If the eyeball is not distorted, the observed five lines form a perfect circle, and if the eyeball is distorted, the observed bright line forms an ellipse. An image converting device 6 is inserted between the objective lens 2 and the eyepiece lens 3 in order to determine whether the object is a perfect circle or an ellipse, and to determine the extent of the ellipse.

FIG. 2 shows an example of the image conversion device 6, in which a translucent reflective surface 11
Right angle prism 12.13 for forming
Right angle prism 14.15 provided in contact with each of the two faces
．． 16 and Yoshi Naru. The image ray enters the prism 13 from the bottom surface and exits from the top surface of the prism 14.

Now, in FIG. 2(a), if the image ray of the ellipse PQR is incident, the image rays of the points P and Q that have passed through the semi-transparent reflective surface 11 at points A and D will both pass through the prism 15 and 14 and PABCDEF and QDC, respectively.
Take the BAGH route. Therefore, the observation image PQR can be seen from the direction of the arrow 17.

At the same time, the image rays at points P and Q reflected at points A and B of the translucent reflector 11 are reflected within the prisms 16 and 14, and take paths PAJKEF and QDKJGH, respectively. Therefore, from the direction of arrow 17, the observed image p/Q/R
/ can be seen. The observation image PQR and p/Q/R/ are
The exact same things appear to overlap.

Next, if the prism 16 is rotated 900 times as shown in FIG.
The point image rays take PALGH and QDMF paths, respectively. Therefore, the observed image P/Q/ seen from the direction of arrow l
R/ overlaps the observation image Pq-H, but the attitude is 180°
It's rotating.

Therefore, the prisms 16 are rotated and overlapped in the middle of FIGS. 2(a) and 2(b). Therefore, the two observed images PQR
By contrasting p/Q/R/, it is possible to intuitively know the presence or absence of eyeball distortion and the degree of distortion.

In this embodiment, prism 15 may be rotated without rotating prism 16. In this case, the observed image PQRO appears to be rotated. . By comparing the observed image PQR and p/qlR', it is possible to intuitively know whether or not the eyeball is distorted and the degree of distortion.

In FIG. 3, the prism 15 in FIG. 2 is replaced with the prism 12.
An embodiment in which the prism 14 is omitted is shown. The image ray at point P that has passed through the semi-transparent reflective surface 11 at point A is
The image ray at point P, which travels straight along the path of PAF and is reflected from the semitransparent reflective surface 11 at point A, takes the path of PAJKCBAF. In addition, the image ray at point Q that has passed through the semi-transparent reflective surface 11 is QDH
The image ray at point Q reflected by the semi-transparent reflective surface 11 takes a path QDKJBCDH. Therefore, from the direction of arrow 17, as shown in FIG. 2(a), the observed image PQR
and p/q/R/ appear to overlap correctly.

When the prism 16 in FIG. 3 is rotated by 45 degrees, the observation image PQR and P/
It appears to overlap Q/R/ with a 90° shift. In addition,
In this embodiment, since the optical path lengths of the transmitted light beam and the reflected light beam of the translucent reflector 11 are different, it is necessary to install it in a region parallel to the image beam within the microscope optical system.

FIG. 4 shows an embodiment in which a reflecting mirror 18 is used in place of the prism 15 in FIG. In FIG. 4(a), the image rays at points P and Q that have passed through the semi-transparent reflective surface 11 at points A and D take the paths PABAGH and QDCDEF, respectively, so the observation seen from the direction of arrow I Statue PQ
R is turned upside down. In addition, the reflected light at points P and Q that is reflected from the semitransparent reflective surface 11 at points A and D takes the paths PAJKEF and qDKJGH, respectively, so the observed image seen from the direction of arrow 17 is p/Q/R/ assumes the correct state and overlaps the reversed image PQR.

Next, when the prism 16 is rotated by 90 degrees as shown in FIG.
Since the path of DMEF is taken, the observed image p/q/Hl seen from the direction of arrow 17 is rotated by 180°. When the prism 16 is rotated by 45 degrees, the correct image P'Q'R' is seen from the direction of the arrow 17, as shown in FIG. 4(c).
and the reversed image PQR are observed in a state in which they are rotated by 90' and overlapped.

In FIG. 5, the prism 15 in FIG. 3 is replaced with a reflecting mirror 19. The image rays at points P and Q that have passed through the semi-transparent reflective surface 11 at points A and D are PAF and Q, respectively.
Taking the DH route, the correct observation image P is seen from the direction of arrow 17.
You can get QR. In addition, P reflected on the semi-transparent reflective surface 11
The image rays at point and Q point are PAJKCDH and Q, respectively.
Since the path of DKJBAF is taken, the observed image p/q/Hl from the direction of arrow 11 is as shown in Figure 5 (b).
The image becomes an inverted image with the left and right sides reversed. And prism 1
When rotating 6 by 45 degrees, as shown in the same figure (0),
Reflection image p/Q/R/ on semi-transparent reflective surface 11 is 900
It is rotated and observed overlapping the transmitted image PQR. In addition,
This embodiment also has a transmission image PQ similar to the embodiment shown in the third figure.
Since the optical path lengths of R and the reflected image P'Q'R' are different, consideration must be given to the optical system.

As is clear from the above embodiments, the present invention utilizes the fact that a circular image is reflected as a distorted circular image ray on a distorted spherical surface, and adds a rotated image ray to the image ray. By overlapping them, it is easy to inspect the presence or absence of distortion on the spherical surface and the degree of distortion. Since the test results can be obtained simply by observing a circular image through the device, it is particularly suitable for clinical eyeball tests, and is also suitable for testing easily deformable spherical objects such as soft contact lenses.

It should be noted that the prism 16 in each of the embodiments described above may be installed so as to be rotatably adjustable, but may also be fixed in a previously rotated state by 45 degrees for ease of handling.

[Brief explanation of drawings]

FIG. 1 is an optical path diagram of an eyeball testing device embodying the present invention, and FIGS. 2, 3, 4, and 5 are explanatory diagrams of various embodiments of the image conversion device 6 in FIG. 1, respectively. . 1...Eyeball (sphere), 2...Objective lens, 3...
・Eyepiece, 5... Annular light source (circular index), 6...
- Reflective optical member, 16...roof-shaped prism. Patent applicant: Konan Camera Institute Co., Ltd. Agent: Satoshi Shimizu and 28 others 1 Figure

Claims (1)

[Claims] (+) A circular index is installed surrounding the incident observation optical path in the spherical observation optical system and centered on the optical axis, and a semi-transparent reflective surface is provided in the observation optical system, and the transmission through the semi-transparent reflective surface is A reflective optical member that superimposes the light and the reflected light again is interposed, and the reflective optical member includes a roof-shaped prism whose attitude is rotated so that the attitude of the incident image is rotated and the incident image is emitted. A spherical strain inspection device characterized by: