JPS5869269U - Surface flaw inspection device - Google Patents
Surface flaw inspection deviceInfo
- Publication number
- JPS5869269U JPS5869269U JP16433381U JP16433381U JPS5869269U JP S5869269 U JPS5869269 U JP S5869269U JP 16433381 U JP16433381 U JP 16433381U JP 16433381 U JP16433381 U JP 16433381U JP S5869269 U JPS5869269 U JP S5869269U
- Authority
- JP
- Japan
- Prior art keywords
- inspected
- inspection device
- surface flaw
- flaw inspection
- inspection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
図面は本考案の技術的内容を示すものであって、第１図
は本考案によるキズ検査装置の１例を示した説明図、第
２図は本考案による各検出器の配設 ′関係を示し
た斜面図、第３図はその回路構成関係の１例についての
説明図である。The drawings show the technical contents of the present invention, and Fig. 1 is an explanatory diagram showing an example of a flaw inspection device according to the present invention, and Fig. 2 shows the arrangement relationship of each detector according to the present invention. The illustrated perspective view, FIG. 3, is an explanatory diagram of an example of the circuit configuration relationship.
Claims (1)
けられた主検査機構と前記被検査面の一部を集中的に精
度高く検査するための補助検査機構を有し、該補助検査
機構には被検査面全般に亘って移動操作するための移動
操作機構を設け、該移動操作機構に上記主検査機構によ
る検出結果によって疵存在可能位置へ前記補助検査機構
を移動させる駆動機構を設けたことを特徴とする表面疵
検査装置。The main inspection mechanism is provided to cover the entire surface to be inspected, such as a cold-rolled steel plate, and the auxiliary inspection mechanism is provided to intensively and accurately inspect a part of the surface to be inspected. The mechanism is provided with a movement operation mechanism for moving over the entire surface to be inspected, and the movement operation mechanism is provided with a drive mechanism that moves the auxiliary inspection mechanism to a position where a flaw can be present based on the detection result by the main inspection mechanism. A surface flaw inspection device characterized by:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16433381U JPS5869269U (en) | 1981-11-05 | 1981-11-05 | Surface flaw inspection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16433381U JPS5869269U (en) | 1981-11-05 | 1981-11-05 | Surface flaw inspection device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5869269U true JPS5869269U (en) | 1983-05-11 |
Family
ID=29956586
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16433381U Pending JPS5869269U (en) | 1981-11-05 | 1981-11-05 | Surface flaw inspection device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5869269U (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS50122978A (en) * | 1974-03-11 | 1975-09-26 | ||
| JPS5334586A (en) * | 1976-09-10 | 1978-03-31 | Ishikawajima Harima Heavy Ind | Method of and apparatus for detecting surface flaw |
-
1981
- 1981-11-05 JP JP16433381U patent/JPS5869269U/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS50122978A (en) * | 1974-03-11 | 1975-09-26 | ||
| JPS5334586A (en) * | 1976-09-10 | 1978-03-31 | Ishikawajima Harima Heavy Ind | Method of and apparatus for detecting surface flaw |
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