JPS50122978A - - Google Patents

Info

Publication number
JPS50122978A
JPS50122978A JP2840774A JP2840774A JPS50122978A JP S50122978 A JPS50122978 A JP S50122978A JP 2840774 A JP2840774 A JP 2840774A JP 2840774 A JP2840774 A JP 2840774A JP S50122978 A JPS50122978 A JP S50122978A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2840774A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2840774A priority Critical patent/JPS50122978A/ja
Publication of JPS50122978A publication Critical patent/JPS50122978A/ja
Pending legal-status Critical Current

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Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2840774A 1974-03-11 1974-03-11 Pending JPS50122978A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2840774A JPS50122978A (en) 1974-03-11 1974-03-11

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2840774A JPS50122978A (en) 1974-03-11 1974-03-11

Publications (1)

Publication Number Publication Date
JPS50122978A true JPS50122978A (en) 1975-09-26

Family

ID=12247794

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2840774A Pending JPS50122978A (en) 1974-03-11 1974-03-11

Country Status (1)

Country Link
JP (1) JPS50122978A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5319090U (en) * 1976-07-24 1978-02-18
JPS5869269U (en) * 1981-11-05 1983-05-11 東英電子工業株式会社 Surface flaw inspection device
JPH01212339A (en) * 1987-02-17 1989-08-25 Orbot Syst Ltd Method and apparatus for inspecting work piece moving along production line

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5319090U (en) * 1976-07-24 1978-02-18
JPS5869269U (en) * 1981-11-05 1983-05-11 東英電子工業株式会社 Surface flaw inspection device
JPH01212339A (en) * 1987-02-17 1989-08-25 Orbot Syst Ltd Method and apparatus for inspecting work piece moving along production line

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