JPS5866870A - 抵抗測定回路 - Google Patents

抵抗測定回路

Info

Publication number
JPS5866870A
JPS5866870A JP16608481A JP16608481A JPS5866870A JP S5866870 A JPS5866870 A JP S5866870A JP 16608481 A JP16608481 A JP 16608481A JP 16608481 A JP16608481 A JP 16608481A JP S5866870 A JPS5866870 A JP S5866870A
Authority
JP
Japan
Prior art keywords
resistance
circuit
contact
measuring
electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16608481A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0330829B2 (enrdf_load_stackoverflow
Inventor
Takashi Noguchi
隆 野口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP16608481A priority Critical patent/JPS5866870A/ja
Publication of JPS5866870A publication Critical patent/JPS5866870A/ja
Publication of JPH0330829B2 publication Critical patent/JPH0330829B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/08—Measuring resistance by measuring both voltage and current

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
JP16608481A 1981-10-16 1981-10-16 抵抗測定回路 Granted JPS5866870A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16608481A JPS5866870A (ja) 1981-10-16 1981-10-16 抵抗測定回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16608481A JPS5866870A (ja) 1981-10-16 1981-10-16 抵抗測定回路

Publications (2)

Publication Number Publication Date
JPS5866870A true JPS5866870A (ja) 1983-04-21
JPH0330829B2 JPH0330829B2 (enrdf_load_stackoverflow) 1991-05-01

Family

ID=15824682

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16608481A Granted JPS5866870A (ja) 1981-10-16 1981-10-16 抵抗測定回路

Country Status (1)

Country Link
JP (1) JPS5866870A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1991019202A1 (en) * 1990-05-29 1991-12-12 Electro Scientific Industries, Inc. Method and system for concurrent electronic component testing and lead verification
CN104977469A (zh) * 2014-04-04 2015-10-14 中芯国际集成电路制造(上海)有限公司 用于集成电路设计的测量电路和方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1991019202A1 (en) * 1990-05-29 1991-12-12 Electro Scientific Industries, Inc. Method and system for concurrent electronic component testing and lead verification
CN104977469A (zh) * 2014-04-04 2015-10-14 中芯国际集成电路制造(上海)有限公司 用于集成电路设计的测量电路和方法
CN104977469B (zh) * 2014-04-04 2018-03-23 中芯国际集成电路制造(上海)有限公司 用于集成电路设计的测量电路和方法

Also Published As

Publication number Publication date
JPH0330829B2 (enrdf_load_stackoverflow) 1991-05-01

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