JPS5860390A - Selection of coin - Google Patents

Selection of coin

Info

Publication number
JPS5860390A
JPS5860390A JP15997981A JP15997981A JPS5860390A JP S5860390 A JPS5860390 A JP S5860390A JP 15997981 A JP15997981 A JP 15997981A JP 15997981 A JP15997981 A JP 15997981A JP S5860390 A JPS5860390 A JP S5860390A
Authority
JP
Japan
Prior art keywords
coin
information
coins
circuit
standby
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15997981A
Other languages
Japanese (ja)
Other versions
JPS6236592B2 (en
Inventor
效 荒井
松本 定男
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Vending Machine Co Ltd
Original Assignee
Sanyo Vending Machine Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanyo Vending Machine Co Ltd filed Critical Sanyo Vending Machine Co Ltd
Priority to JP15997981A priority Critical patent/JPS5860390A/en
Publication of JPS5860390A publication Critical patent/JPS5860390A/en
Publication of JPS6236592B2 publication Critical patent/JPS6236592B2/ja
Granted legal-status Critical Current

Links

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 本発明は交番磁界中に硬貨を置くことによって生ずる硬
貨内の渦電流損に起因するインダクタンス、損失抵抗を
周波数、位相変化、誘起電圧変化により捉えて硬貨の特
性を検出する磁気型の硬貨検査方法又は2つの電極間に
硬貨を置くことによって生ずる誘電率又は導電体の寸法
変化に起因する静電容量の変化を捉えて硬貨の特性を検
出する静電容量型等の硬貨検査方法にて硬貨を測定し、
硬貨の適正更には金種を判定する硬貨選別装置に関する
ものである。
[Detailed Description of the Invention] The present invention detects the characteristics of a coin by capturing inductance and loss resistance caused by eddy current loss within the coin caused by placing the coin in an alternating magnetic field by frequency, phase change, and induced voltage change. A magnetic type coin testing method that detects the characteristics of a coin, or a capacitance type that detects the characteristics of a coin by capturing changes in capacitance caused by changes in dielectric constant or dimensions of a conductor caused by placing a coin between two electrodes. Measure the coin using the coin testing method,
The present invention relates to a coin sorting device that determines the suitability and denomination of coins.

従来の硬貨選別装置は前記硬貨検査器を検査用と基準用
の2つを配置して基準用には予め真硬貨を置き検査用に
検査すべき硬貨が経過した時両者の測定結果を比較する
ことでこの硬貨の適正を判定するか若しくは基準用の条
件として可変抵抗又は可変キャパシターを用いて基準用
硬貨の電気的条件と同一とするような方法が多く用いら
れていた。しかし最近此種の基準用硬貨若しくは該当調
節部品の代替物として半導体集積回路を用いた半導体メ
モリーを用いることによって真硬貨の場合の受入範囲情
報や許容誤差範囲やその他の測定条件等の情報を記憶せ
しめ硬貨検査情報と前述の基準値情報とを比較し投入貨
の真偽を判定する方法がある。
A conventional coin sorting device has two coin testers, one for testing and one for reference, and a real coin is placed in advance for the reference, and when the number of coins to be tested has passed, the measurement results of both are compared. Many methods have been used to determine the suitability of this coin, or to use a variable resistor or variable capacitor as the reference condition to make the electrical conditions the same as the reference coin. Recently, however, semiconductor memories using semiconductor integrated circuits have been used as a substitute for these standard coins or corresponding adjustment parts, which can store information such as acceptance range information, tolerance range, and other measurement conditions for genuine coins. There is a method of comparing the coin inspection information and the above-mentioned reference value information to determine the authenticity of the inserted coin.

しかしながら前記基準値情報は大幅に異る情報の硬貨を
弁別する場合は受入許容誤差範囲を拡大せしめることが
可能であり実用上問題はないが、硬貨の種類によっては
硬貨検査情報が極めて酷似していたり、また精巧な偽貨
を投入された場合受大許容範囲を他の正貨又は偽貨と弁
別するため正貨の受入率をあまり大きく低下させない程
度に可能な限り狭い範囲とする必要がある。この場合交
番磁界の周波数、電圧、温度又これらの測定回路に於け
る各種電気的素子の外的変化による影響はもとより、硬
貨の安定した転勤による硬貨検査器からの検査情報を常
に安定した条件となるよ、う回路、素子、機構に工夫が
施され高価なものとなっていた。
However, if the standard value information is used to distinguish between coins with significantly different information, it is possible to expand the acceptance tolerance range and there is no practical problem, but depending on the type of coin, the coin inspection information may be extremely similar. In addition, in the case where sophisticated counterfeit coins are inserted, the acceptance range must be as narrow as possible without significantly reducing the acceptance rate of genuine coins in order to distinguish them from other genuine coins or counterfeit coins. . In this case, not only the frequency of the alternating magnetic field, the voltage, the temperature, and the influence of external changes in various electrical elements in the measurement circuit, but also the inspection information from the coin inspection machine due to the stable transfer of coins are always kept under stable conditions. You see, the detour circuits, elements, and mechanisms were devised, making it expensive.

斯かる点より本発明は硬貨検査器の測定条件と前記基準
値情報を設定した時の設定条件との間に変動が生じても
これに追随して適確な判定を行ない、更に該判定が複数
の硬貨の検査情報に対し精度よく判定出来る硬貨選別装
置を提供するものである。
From this point of view, the present invention is capable of making an accurate judgment by following the variation even if there is a variation between the measurement conditions of the coin inspection device and the setting conditions when setting the reference value information, and furthermore, it is possible to make an appropriate judgment by following the change. The present invention provides a coin sorting device that can accurately judge the inspection information of a plurality of coins.

以下、図面と共に一実施例を詳述する。Hereinafter, one embodiment will be described in detail with reference to the drawings.

第4図は硬貨選別装置(1)の概略図を示すが硬貨選別
装置の上部の受口(2)より投入された硬貨は硬貨通路
登eの一側を構成する角度的100の傾斜を持った基板
A(2)及び下方に位置するレール上を他側の基板B(
9)により構成される硬貨通路αeを転動し、順次配列
された材質センサー(4)、板厚センサー(5)直径セ
ンサー(6)の各部を通過しこれらの複数の検査器の情
報が予め定められた基準値情報と各々一致した場合制御
回路(図示せず)で正貨として判定され受入ゲート(7
)を吸引せしめ正貨通路(8)に導入するよう構成され
ているものである。
Figure 4 shows a schematic diagram of the coin sorting device (1). Coins inserted from the upper part of the coin sorting device (2) have an angular inclination of 100, which constitutes one side of the coin passageway e. Board A (2) on the other side and board B (2) on the other side on the rail located below.
9), the coin rolls through the coin passage αe, and passes through each part of the material sensor (4), plate thickness sensor (5), and diameter sensor (6) that are arranged in sequence, and the information of these multiple inspection devices is read in advance. If each item matches the predetermined reference value information, the control circuit (not shown) determines it as genuine currency, and the coin is sent to the acceptance gate (7).
) is configured to be sucked in and introduced into the specie passage (8).

第2図は本発明の最も効果的である板厚センサー(5)
の断面図である。板厚センサーは基板(3)と基板(9
)のそれぞれの壁に埋めこまれたポット型のフェライト
材で作られたコアa1とその内部に巻回されたコイルI
及びコアα擾とその内部に巻回されたコイル0より構成
さね、その通路寸法Aは使用される硬貨の最大厚みに若
干の余裕を持った寸法に設定されている。投入された硬
貨a呻の厚さは該構成に於いては硬貨のほぼ中央部の凹
部の厚さTO■が測定されることとなり、この寸法は基
板(9)側センサーからの寸法Bと基板(3)からの寸
法Cを測定することにより硬貨中央部の厚さTを間接的
に検出することKなる。
Figure 2 shows the most effective plate thickness sensor (5) of the present invention.
FIG. The board thickness sensor is connected to the board (3) and board (9).
) A pot-shaped core A1 made of ferrite material is embedded in each wall of the core A1, and a coil I is wound inside the core A1.
It is composed of a core α and a coil 0 wound inside the core α, and its passage dimension A is set to have a slight margin for the maximum thickness of the coin used. In this configuration, the thickness of the inserted coin a is measured by the thickness TO of the recessed part in the approximate center of the coin, and this dimension is determined by the dimension B from the sensor on the board (9) side and the board. By measuring the dimension C from (3), the thickness T of the central part of the coin can be indirectly detected.

第3図は第2図に示した各々のコイルa’aSa謙の接
続方法とその回路構成である。なお本回路は説明上板厚
検査回路のみを示しており他の検査回路は省略した図と
している。コイル(13)とコイルaυは相互インダク
タンスが負となるよう互に発生磁界を打ち消すように直
列逆相接続を行ない発振回路a優に入る。前記直列逆相
接続は通路寸法Aが変化した場合、例えば広くなった場
合にはコイルα3とコイルaυの合計のインダクタンス
が大きくなって発振周波数が下がり、通路寸法の増加に
よる低下分を補償するよう作用するものである。
FIG. 3 shows the connection method of each coil a'aSa shown in FIG. 2 and its circuit configuration. In this circuit, only the board thickness inspection circuit is shown for the sake of explanation, and other inspection circuits are omitted. The coil (13) and the coil aυ are connected in series with opposite phases so as to mutually cancel out the generated magnetic fields so that the mutual inductance becomes negative, and enter the oscillation circuit a. In the series anti-phase connection, when the passage dimension A changes, for example when it becomes wider, the total inductance of the coil α3 and the coil aυ increases and the oscillation frequency decreases to compensate for the decrease due to the increase in the passage size. It is something that works.

発振器11r(11は、内蔵されたキャパシターとコイ
ル(13とコイル0υにより得られるインダクタンスと
で決定される発振周波数で発振するよう構成され、更に
発振波形を正弦波から論理回路レベルになるよう波形整
形回路を内蔵している0発振回路α9の出力は判定演算
回路12Bに入力され、該回路で演算と後述する誤差の
補正演算を行ないその補正を終了した情報を基準値情報
記憶装置器の情報を照合し、前記情報が該情報範囲であ
れば正貨出力(2)として出力され該正貨出力は板厚セ
ンサー(5)の結果として複数の硬貨のいずれかに属す
るかを示す信号又は偽貨の信号として用いられることに
なる。
The oscillator 11r (11 is configured to oscillate at an oscillation frequency determined by the built-in capacitor and coil (13) and the inductance obtained by the coil 0υ, and further shapes the oscillation waveform from a sine wave to a logic circuit level. The output of the 0 oscillation circuit α9, which has a built-in circuit, is input to the judgment calculation circuit 12B, which performs calculation and error correction calculation to be described later, and uses the information after the correction as information in the reference value information storage device. If the information is within the information range, it is output as a genuine coin output (2), and the genuine coin output is a signal indicating whether the coin belongs to one of a plurality of coins or a counterfeit coin as a result of the plate thickness sensor (5). It will be used as a signal.

この様な構成より理解出来るように本実施例では硬貨が
センサ一部に無い場合の発振周波数とセ、ンサ一部に硬
貨が転勤通過時の発振周波数の変化を検出して正偽貨若
しくは硬貨の種類を判定するものである。第4図は第3
図で示したような発振周波数変化による硬貨検査方法に
於ける本発明の必要理由を更に明らかにするだめのもの
である。
As can be understood from such a configuration, in this embodiment, the oscillation frequency when there is no coin in one part of the sensor and the change in the oscillation frequency when a coin passes through the sensor part are detected, and the change in the oscillation frequency is detected to determine whether the coin is a genuine coin or a counterfeit coin. This is to determine the type of. Figure 4 is the third
This is intended to further clarify the reason why the present invention is necessary in a coin inspection method using oscillation frequency changes as shown in the figure.

横軸Tは各種投入硬貨又は相当する偽貨等の中央部の厚
さ寸法を表わし縦軸は第3図に於ける発振回路(2)の
山嶺である発振周波数を示しておシ、70点は硬貨の投
入が無い場合の発振周波数であり待機時周波数である。
The horizontal axis T represents the thickness of the central part of various inserted coins or equivalent counterfeit coins, etc., and the vertical axis represents the oscillation frequency, which is the peak of the oscillation circuit (2) in Figure 3. is the oscillation frequency when no coin is inserted, and is the standby frequency.

この待機時周波数は前述のようにコイ間飄αυと発振回
路員の内部のコンデンサー及び発振器の特性によって決
定される周波数である。T、線上のL 、  f、、 
 f、は待機時周波数でありf、は工場等での前述の基
準値情報記憶装置器に情報を設置した時の発振周波数で
あり、f、 、f、 はいずれも外的要因例えばボット
コアα1又はa2のフェライト等の透磁率や発振回路内
部のコンデンサーの容量変化や通路寸法AQ4)の温度
等による変化に伴う待機発振周波数の変化した状態を示
している。f、 、f、 、 f、 の関係は周波数で
f、)’f。〉fl でありf8ハ周波数の上昇f1は
周波数の下降を示している。本例では説明1晃!しやす
いように(f、−f、) = (f、 −f、)として
いる。このような条件に於いて硬貨厚みTを種々変えた
場合その発振周波数の変化はグラフのようになり、例え
ば2.0−の厚さの硬貨を投入した場合各々の待機周波
数に応じて待機周波数がfoの場合はfo−1゜+ f
lの場合はfr %−* −ftの場合は4T!、。と
なり、その各々の差(ft’rt、*)−(taTt、
。)は(fa Tt−0)  (flTt、@) より
大きくなる。
As described above, this standby frequency is determined by the coil-to-coil airflow αυ and the characteristics of the capacitor and oscillator inside the oscillation circuit member. T, L on the line, f,,
f is the standby frequency, f is the oscillation frequency when information is installed in the aforementioned reference value information storage device in a factory, etc., and f, , f, are all caused by external factors such as bot core α1 or It shows the state in which the standby oscillation frequency changes due to changes in the magnetic permeability of the ferrite etc. of a2, changes in the capacitance of the capacitor inside the oscillation circuit, changes in the passage dimension AQ4) due to temperature, etc. The relationship between f, , f, , f, is f, )'f in frequency. 〉fl, and f8c shows an increase in frequency f1 indicates a decrease in frequency. In this example, explanation 1 Akira! For ease of calculation, we set (f, -f,) = (f, -f,). Under these conditions, if the coin thickness T is varied, the change in the oscillation frequency will be as shown in the graph. For example, if a coin with a thickness of 2.0 - is inserted, the standby frequency will change according to each standby frequency. If is fo, then fo-1゜+f
For l, fr %-* -ft for 4T! ,. and the difference between each of them (ft'rt, *) - (taTt,
. ) becomes larger than (fa Tt-0) (flTt, @).

またそれぞれの差は待機周波数のそれぞれの差すなわち
(f、)−(f、)や(f。)−(f、)よりも大きく
なっていることが理解出来る。また、l、Qs鶴の硬貨
を投入した場合の同様の差も同じ傾向を示しているが(
c’rt、。)−(f、%、。)より同条件のT101
部の発振周波数の差は小さい。この理由は待機発振周波
−数に対し硬貨投入時の変化は等比変化をすることと、
厚い硬貨の方が特に基板(9)側のセンサーに近ずくた
めコイM0の変化が大きくなりまたインダクタンス変化
が指数函数的に増大する傾向にあることを示している。
It can also be seen that the respective differences are larger than the respective differences in standby frequencies, that is, (f,)-(f,) and (f.)-(f,). Also, the same difference when inserting l and Qs crane coins also shows the same tendency (
c'rt,. ) - (f, %, .) T101 under the same conditions
The difference in oscillation frequency between the two parts is small. The reason for this is that the change in the standby oscillation frequency when a coin is inserted is a geometric change.
This shows that the thicker coin is closer to the sensor on the substrate (9) side, so the change in the coin M0 becomes larger, and the inductance change tends to increase exponentially.

このようなことから、従来提案されていたように、硬貨
投入時の発振周波数より待機時の発振周波数の変動分で
そのままの加減する平行移動の補正の方法や待機時の発
振周波数の変動分に一率の補正係数を乗じて補正する方
法では不完全であり既述のような精度よく正貨のみを受
は入れようとし許容誤差範囲を狭く設定することは非常
に困難となる。
For this reason, as previously proposed, there is a method for correcting parallel movement in which the fluctuation of the oscillation frequency during standby is adjusted from the oscillation frequency when coins are inserted, and a method for correcting the parallel movement is adjusted by the fluctuation of the oscillation frequency during standby. The method of correcting by multiplying by a correction coefficient is incomplete, and it is extremely difficult to set a narrow allowable error range in order to accept only genuine coins with high accuracy as described above.

本発明はこの点を鑑み、工場での生産時の待機周波数と
使用時の待機周波数の他に使用時の投入硬貨により得ら
れる値(例えばL Tt、* )の大小によシはぼ全て
の補正を完全に演算により行なうものである。
In view of this point, the present invention has been designed to handle almost all of the values obtained from the input coins (for example, L Tt, *) in addition to the standby frequency during production at the factory and the standby frequency during use. Correction is performed entirely by calculation.

第5図はその構成図であるがセンサー(5)の待機周波
数(f、又はf。又はf、)を検出するため材質−セン
サー<4)の信号は硬貨投入検出回路(5)により硬貨
の投入を検出し該信号はセンサー(5)の待機周波数取
り込み回路罰に送られセンサー(5)のその時の値が一
時的に記憶される。この値は基準値情報を設定した装置
生産時の待機周波数の記憶部(ハ)の値と待機周波数変
動分演算回路(5)でそのずれ分が演算されその値は補
正回路(至)に送られる。次に投入された硬貨は板厚セ
ンサー(5)に達しその硬貨情報のピーク値がピーク値
検出回路(イ)によセ検出されると該情報も補正回路(
至)に送られる。補正回路(至)はすでに述べたように
待機値の変動分とピーク値変化に伴う一率分の補正用係
数でありβは硬貨の厚さ差等による不拘等分の補正であ
りとのα、βの値はセンサーの感度、通路寸法の大小、
複数の硬貨厚さによる差等で決定される定数である。こ
のようにして補正回路(7)で演算された値は基準値0 情報装置(イ)内部の受入許容範囲情報記憶部(31)
の値と比較され正貨又は金種出力として(ハ)に出力さ
れる。
Fig. 5 shows its configuration. In order to detect the standby frequency (f, or f. or f,) of the sensor (5), the signal of the material - sensor < 4) is detected by the coin insertion detection circuit (5). When the input is detected, the signal is sent to the standby frequency acquisition circuit of the sensor (5), and the current value of the sensor (5) is temporarily stored. This value is calculated by calculating the deviation between the value in the standby frequency storage section (c) at the time of device production with reference value information set and the standby frequency fluctuation calculation circuit (5), and the value is sent to the correction circuit (to). It will be done. Next, the inserted coin reaches the plate thickness sensor (5), and when the peak value of the coin information is detected by the peak value detection circuit (a), the information is also transferred to the correction circuit (a).
sent to ). As already mentioned, the correction circuit (to) is a correction coefficient for the fluctuation of the standby value and one percentage due to the change in the peak value, and β is the correction coefficient for the unconstrained portion due to the difference in the thickness of the coin, etc. , the value of β depends on the sensitivity of the sensor, the size of the passage size,
This is a constant determined by the difference in thickness of multiple coins. The value calculated by the correction circuit (7) in this way is the reference value 0. Acceptable range information storage section (31) inside the information device (a)
It is compared with the value of and output as a specie or denomination output in (c).

以上詳述してきた本発明はメモリーに基準情報の記憶の
他に基準情報記憶時の待機時情報及びその補正の係数を
記憶し、検査時の条件と記憶時の条件との差異と検査時
の情報の差異による2点から補正演算1基準情報(受入
範囲を幅を持つ)とを比較することで硬貨の適正を判定
する硬貨選別装置に係わり測定条件の変動に係わらず誤
差範囲をとり入れた適確な判定動作を行なうことが出来
るものである。
The present invention, which has been described in detail above, stores in the memory, in addition to storing reference information, standby information when storing the reference information and coefficients for its correction. Correcting calculations based on two points due to differences in information 1 This method is related to a coin sorting device that determines the suitability of a coin by comparing it with standard information (with a wide acceptance range). It is possible to perform accurate judgment operations.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は、硬貨選別装置の概略図、第2図は、板厚セン
サー断面図、第3図は制御回路、第4図は、硬貨に対す
る板厚特性、fa5図は、本発明に依る制御回路を示す
。 (5)−・・板厚センサー、a萄υ・・・コイル、翰・
・・ピーク値検出回路、(至)・・・補正回路。 系1図      錫2円 帖5目
Fig. 1 is a schematic diagram of the coin sorting device, Fig. 2 is a sectional view of the plate thickness sensor, Fig. 3 is the control circuit, Fig. 4 is the plate thickness characteristics for coins, and FA5 is the control according to the present invention. Shows the circuit. (5)--Plate thickness sensor, coil, wire...
...Peak value detection circuit, (to)...Correction circuit. System 1 diagram Tin 2 yen book 5 items

Claims (1)

【特許請求の範囲】[Claims] 1、投入された硬貨の真偽を信号変化を基に判定する装
置に於いて、生産時のセンサー信号の待機値を第2の信
号とし、使用時の硬貨投入時のピーク値を第3の信号と
し、硬貨受入時の演算に第1第2、第3の信号を基に演
算し、予め定められた受入設定範囲との判定を行ない真
偽を判定することを特徴とした硬貨選別方法
1. In a device that determines the authenticity of an inserted coin based on signal changes, the standby value of the sensor signal during production is used as the second signal, and the peak value at the time of coin insertion during use is used as the third signal. A coin sorting method characterized in that the coin is used as a signal, and the coin is calculated based on the first, second, and third signals when accepting the coin, and the authenticity is determined by determining whether it is within a predetermined acceptance setting range.
JP15997981A 1981-10-06 1981-10-06 Selection of coin Granted JPS5860390A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15997981A JPS5860390A (en) 1981-10-06 1981-10-06 Selection of coin

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15997981A JPS5860390A (en) 1981-10-06 1981-10-06 Selection of coin

Publications (2)

Publication Number Publication Date
JPS5860390A true JPS5860390A (en) 1983-04-09
JPS6236592B2 JPS6236592B2 (en) 1987-08-07

Family

ID=15705344

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15997981A Granted JPS5860390A (en) 1981-10-06 1981-10-06 Selection of coin

Country Status (1)

Country Link
JP (1) JPS5860390A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0727585B2 (en) * 1984-03-01 1995-03-29 マ−ス インコ−ポレ−テッド Self-tuning coin recognition device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50107997A (en) * 1974-01-31 1975-08-25
JPS56110194A (en) * 1980-02-05 1981-09-01 Sanyo Jido Hanbaiki Kk Compensation method of electronic coin selector

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50107997A (en) * 1974-01-31 1975-08-25
JPS56110194A (en) * 1980-02-05 1981-09-01 Sanyo Jido Hanbaiki Kk Compensation method of electronic coin selector

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0727585B2 (en) * 1984-03-01 1995-03-29 マ−ス インコ−ポレ−テッド Self-tuning coin recognition device

Also Published As

Publication number Publication date
JPS6236592B2 (en) 1987-08-07

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