JPS5856803B2 - ユウデンタイブツピン オ ケンサスル ホウホウ オヨビ ソウチ - Google Patents

ユウデンタイブツピン オ ケンサスル ホウホウ オヨビ ソウチ

Info

Publication number
JPS5856803B2
JPS5856803B2 JP48143675A JP14367573A JPS5856803B2 JP S5856803 B2 JPS5856803 B2 JP S5856803B2 JP 48143675 A JP48143675 A JP 48143675A JP 14367573 A JP14367573 A JP 14367573A JP S5856803 B2 JPS5856803 B2 JP S5856803B2
Authority
JP
Japan
Prior art keywords
voltage
thickness
article
transistor
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP48143675A
Other languages
English (en)
Japanese (ja)
Other versions
JPS49107757A (enExample
Inventor
フレデリツク シヤーフ ジエラルド
デイーン コーラー ロバート
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
OI Glass Inc
Original Assignee
Owens Illinois Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Owens Illinois Inc filed Critical Owens Illinois Inc
Publication of JPS49107757A publication Critical patent/JPS49107757A/ja
Publication of JPS5856803B2 publication Critical patent/JPS5856803B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
JP48143675A 1973-02-08 1973-12-24 ユウデンタイブツピン オ ケンサスル ホウホウ オヨビ ソウチ Expired JPS5856803B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US33051173A 1973-02-08 1973-02-08

Publications (2)

Publication Number Publication Date
JPS49107757A JPS49107757A (enExample) 1974-10-14
JPS5856803B2 true JPS5856803B2 (ja) 1983-12-16

Family

ID=23290089

Family Applications (1)

Application Number Title Priority Date Filing Date
JP48143675A Expired JPS5856803B2 (ja) 1973-02-08 1973-12-24 ユウデンタイブツピン オ ケンサスル ホウホウ オヨビ ソウチ

Country Status (7)

Country Link
US (1) US3780859A (enExample)
JP (1) JPS5856803B2 (enExample)
CA (1) CA990798A (enExample)
DE (1) DE2403243C3 (enExample)
FR (1) FR2217662B1 (enExample)
GB (1) GB1455341A (enExample)
IT (1) IT1008674B (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4046258A (en) * 1976-07-02 1977-09-06 Owens-Illinois, Inc. Method and apparatus for measuring the eccentricity of containers
EP0363113B1 (en) * 1988-10-05 1992-12-09 Emhart Glass Machinery Investments Inc. Glass container inspection apparatus
GB2495104A (en) 2011-09-28 2013-04-03 Oxford Rf Sensors Ltd Rotor blade sensor
GB2506424B (en) * 2012-09-28 2017-06-07 Salunda Ltd Target clearance measurement device
GB2601158B (en) * 2020-11-20 2025-05-21 Elcometer Ltd Coating thickness measurement instrument

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3393799A (en) * 1966-12-21 1968-07-23 Owens Illinois Inc Apparatus for measuring the thickness of dielectric members
US3593133A (en) * 1967-12-27 1971-07-13 Rca Corp Apparatus for comparing two dimensions
US3541435A (en) * 1968-04-22 1970-11-17 Reliance Electric & Eng Co Noncontact dimension comparator employing constant frequency and amplitude pickup vibration
US3665506A (en) * 1970-02-04 1972-05-23 Bendix Corp Electrical apparatus and gaging device using same
US3708064A (en) * 1971-03-16 1973-01-02 Owens Illinois Inc Method and apparatus for inspecting dielectric members

Also Published As

Publication number Publication date
GB1455341A (enExample) 1976-11-10
US3780859A (en) 1973-12-25
CA990798A (en) 1976-06-08
DE2403243C3 (de) 1979-06-13
DE2403243A1 (de) 1974-08-15
FR2217662B1 (enExample) 1977-06-10
IT1008674B (it) 1976-11-30
FR2217662A1 (enExample) 1974-09-06
DE2403243B2 (de) 1978-10-12
JPS49107757A (enExample) 1974-10-14

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