CA990798A - Apparatus and method for displaying the minimum thickness of a dielectric member measured by a radio frequency thickness gauge - Google Patents

Apparatus and method for displaying the minimum thickness of a dielectric member measured by a radio frequency thickness gauge

Info

Publication number
CA990798A
CA990798A CA191,630A CA191630A CA990798A CA 990798 A CA990798 A CA 990798A CA 191630 A CA191630 A CA 191630A CA 990798 A CA990798 A CA 990798A
Authority
CA
Canada
Prior art keywords
displaying
radio frequency
dielectric member
member measured
thickness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA191,630A
Other languages
English (en)
Inventor
Robert D. Kohler
Gerald F. Scherf
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
OI Glass Inc
Original Assignee
Owens Illinois Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Owens Illinois Inc filed Critical Owens Illinois Inc
Application granted granted Critical
Publication of CA990798A publication Critical patent/CA990798A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
CA191,630A 1973-02-08 1974-02-04 Apparatus and method for displaying the minimum thickness of a dielectric member measured by a radio frequency thickness gauge Expired CA990798A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US33051173A 1973-02-08 1973-02-08

Publications (1)

Publication Number Publication Date
CA990798A true CA990798A (en) 1976-06-08

Family

ID=23290089

Family Applications (1)

Application Number Title Priority Date Filing Date
CA191,630A Expired CA990798A (en) 1973-02-08 1974-02-04 Apparatus and method for displaying the minimum thickness of a dielectric member measured by a radio frequency thickness gauge

Country Status (7)

Country Link
US (1) US3780859A (enExample)
JP (1) JPS5856803B2 (enExample)
CA (1) CA990798A (enExample)
DE (1) DE2403243C3 (enExample)
FR (1) FR2217662B1 (enExample)
GB (1) GB1455341A (enExample)
IT (1) IT1008674B (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4046258A (en) * 1976-07-02 1977-09-06 Owens-Illinois, Inc. Method and apparatus for measuring the eccentricity of containers
EP0363113B1 (en) * 1988-10-05 1992-12-09 Emhart Glass Machinery Investments Inc. Glass container inspection apparatus
GB2495104A (en) 2011-09-28 2013-04-03 Oxford Rf Sensors Ltd Rotor blade sensor
GB2506424B (en) * 2012-09-28 2017-06-07 Salunda Ltd Target clearance measurement device
GB2601158B (en) * 2020-11-20 2025-05-21 Elcometer Ltd Coating thickness measurement instrument

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3393799A (en) * 1966-12-21 1968-07-23 Owens Illinois Inc Apparatus for measuring the thickness of dielectric members
US3593133A (en) * 1967-12-27 1971-07-13 Rca Corp Apparatus for comparing two dimensions
US3541435A (en) * 1968-04-22 1970-11-17 Reliance Electric & Eng Co Noncontact dimension comparator employing constant frequency and amplitude pickup vibration
US3665506A (en) * 1970-02-04 1972-05-23 Bendix Corp Electrical apparatus and gaging device using same
US3708064A (en) * 1971-03-16 1973-01-02 Owens Illinois Inc Method and apparatus for inspecting dielectric members

Also Published As

Publication number Publication date
GB1455341A (enExample) 1976-11-10
US3780859A (en) 1973-12-25
DE2403243C3 (de) 1979-06-13
DE2403243A1 (de) 1974-08-15
FR2217662B1 (enExample) 1977-06-10
IT1008674B (it) 1976-11-30
FR2217662A1 (enExample) 1974-09-06
DE2403243B2 (de) 1978-10-12
JPS49107757A (enExample) 1974-10-14
JPS5856803B2 (ja) 1983-12-16

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