JPS5854782Y2 - Sample tension device for electron microscopes, etc. - Google Patents

Sample tension device for electron microscopes, etc.

Info

Publication number
JPS5854782Y2
JPS5854782Y2 JP13356878U JP13356878U JPS5854782Y2 JP S5854782 Y2 JPS5854782 Y2 JP S5854782Y2 JP 13356878 U JP13356878 U JP 13356878U JP 13356878 U JP13356878 U JP 13356878U JP S5854782 Y2 JPS5854782 Y2 JP S5854782Y2
Authority
JP
Japan
Prior art keywords
sample
holder
applying
piezoelectric element
tension device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP13356878U
Other languages
Japanese (ja)
Other versions
JPS5549472U (en
Inventor
幹夫 成瀬
Original Assignee
日本電子株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本電子株式会社 filed Critical 日本電子株式会社
Priority to JP13356878U priority Critical patent/JPS5854782Y2/en
Publication of JPS5549472U publication Critical patent/JPS5549472U/ja
Application granted granted Critical
Publication of JPS5854782Y2 publication Critical patent/JPS5854782Y2/en
Expired legal-status Critical Current

Links

Description

【考案の詳細な説明】 本考案は電子顕微鏡等に使用される試料引張装置の改良
に関する。
[Detailed Description of the Invention] The present invention relates to an improvement of a sample tensioning device used in an electron microscope or the like.

斯かる試料引張装置における引張駆動手段としてはモー
タとネジ或いは油圧機構とテコとを組合せたものが従来
広く使用されている。
Conventionally, a combination of a motor and a screw or a hydraulic mechanism and a lever has been widely used as a tension driving means in such a sample tensioning device.

しかし乍ら斯様な引張駆動手段では試料の引張速度を微
小(例えば1×10−2μm/5ec)にコントロール
することが困難である。
However, with such a tension driving means, it is difficult to control the tension speed of the sample to a minute level (for example, 1×10 −2 μm/5 ec).

そのため金属試料等における転位移動の如き微小に変形
する状態を観察することができない。
Therefore, it is not possible to observe minute deformations such as dislocation movement in metal samples.

本考案は斯様な不都合を解決することを目的とするもの
で、以下図面に基づき詳説する。
The present invention aims to solve such inconveniences, and will be explained in detail below with reference to the drawings.

添付図面は本考案の一実施例を示す平面断面であり、1
は電子顕微鏡の鏡体である。
The attached drawing is a plan cross section showing one embodiment of the present invention.
is the mirror body of an electron microscope.

2は該鏡体1の側壁を貫通して取付けられた保持体で、
該保持体はその軸心(長手方向)が光軸と略直交するよ
うに配置されている。
2 is a holder attached through the side wall of the mirror body 1;
The holder is arranged so that its axis (longitudinal direction) is substantially perpendicular to the optical axis.

該保持体2の真空側の端部は対物レンズの上磁極(図示
せず)と下磁極3aとの間に挿入され、又光軸と交叉す
る部分には開口4が形成しである。
The end of the holder 2 on the vacuum side is inserted between the upper magnetic pole (not shown) and the lower magnetic pole 3a of the objective lens, and an opening 4 is formed in the portion intersecting the optical axis.

更に該保持体2の大気側には把持部5が設けである。Further, a grip portion 5 is provided on the atmosphere side of the holding body 2.

6は前記保持体2の開口4部分におかれた薄膜状試料で
、該試料は2つの試料保持部材7a及び7bにより保持
されている。
Reference numeral 6 denotes a thin film sample placed in the opening 4 of the holder 2, and the sample is held by two sample holding members 7a and 7b.

該両試料保持部材の内7aは前記保持体2に固定され、
他方の7bは後述する圧電素子8を介在して駆動棒9に
取付けられている。
The inner portions 7a of both sample holding members are fixed to the holder 2,
The other 7b is attached to the drive rod 9 via a piezoelectric element 8, which will be described later.

該駆動棒9の他端は保持体2の中央部を移動可能に貫通
して大気中に取り出され、その先端部に雄ネジ10が形
成されている。
The other end of the drive rod 9 movably passes through the center of the holder 2 and is taken out into the atmosphere, and has a male screw 10 formed at its tip.

又該駆動棒9はキー11 a及びキー溝11bにより回
転が阻止されており、更に該駆動棒に形成した雄ネジ体
13が螺合されている。
The drive rod 9 is prevented from rotating by a key 11a and a keyway 11b, and a male threaded body 13 formed on the drive rod is screwed into the drive rod.

従ってモーター用駆動電源14を操作することによりモ
ーター12を駆動すると、雌ネジと雄ネジの螺合により
駆動棒9が図中矢印A方向に移動し、圧電素子8及び試
料保持部材7bが同方向に移動するため、試料6に引張
が与えられる。
Therefore, when the motor 12 is driven by operating the motor drive power supply 14, the drive rod 9 moves in the direction of arrow A in the figure due to the screw engagement of the female screw and the male screw, and the piezoelectric element 8 and the sample holding member 7b move in the same direction. In order to move the sample 6, tension is applied to the sample 6.

尚モーター12は把持部5に設けた板体15に固定され
ている。
Note that the motor 12 is fixed to a plate 15 provided on the grip portion 5.

前述した圧電素子8は電圧を印加することにより機械的
歪を生ずる物質で形成され、又該圧電素子には2つの電
極板16a及び16bが貼着しており、その電極板に電
源17から電圧を印加することにより圧電素子8は駆動
棒9の軸方向に伸長又は収縮するように構成されている
The piezoelectric element 8 described above is made of a material that causes mechanical strain when a voltage is applied, and two electrode plates 16a and 16b are attached to the piezoelectric element, and a voltage is applied to the electrode plates from a power source 17. The piezoelectric element 8 is configured to expand or contract in the axial direction of the drive rod 9 by applying .

ここで圧電素子8の歪量は数μm以下であり、しかも歪
量は印加する電圧に比例している。
Here, the amount of strain in the piezoelectric element 8 is several μm or less, and moreover, the amount of strain is proportional to the applied voltage.

従って該圧電素子8の歪を利用して試料6に引張を与え
ることになせば、容易に例えばI X 10=μm/s
ec以下の遅い引張速度を得ることが可能となる。
Therefore, if the strain of the piezoelectric element 8 is used to apply tension to the sample 6, it is easy to obtain, for example, I x 10 = μm/s.
It becomes possible to obtain a slow tensile speed of less than ec.

そこで試料6に転位変化が生じる直前までモーター12
によって試料6を引張る。
Therefore, the motor 12 was operated until just before the dislocation change occurred in sample 6.
Sample 6 is pulled by.

しかる後モーター12の駆動を停止させ、電源17より
電極板16aと16b間に電圧を印加して圧電素子8を
収縮させれば、試料6に微小な引張量を与えることがで
きるため、試料の転位移動状態を正確に観察することが
できる。
After that, if the driving of the motor 12 is stopped and a voltage is applied between the electrode plates 16a and 16b from the power source 17 to contract the piezoelectric element 8, it is possible to apply a minute amount of tension to the sample 6. The state of dislocation movement can be observed accurately.

尚前述の説明は本考案の例示であり、実施にあたっては
幾多の変形が考えられる。
It should be noted that the above description is an illustration of the present invention, and many modifications may be made in its implementation.

例えば、圧電素子は試料保持部材7bと駆動棒9との間
に設けたが、他の例えば試料と各試料保持部材との接続
部分や保持体2と試料保持部材9aとの接続部分に設け
てもよい。
For example, the piezoelectric element is provided between the sample holding member 7b and the drive rod 9, but it may also be provided at other points, such as the connecting portion between the sample and each sample holding member or the connecting portion between the holder 2 and the sample holding member 9a. Good too.

又試料の引張駆動手段としてはモーターとネジの組合せ
を利用したが、これに限定されることなく、例えばテコ
と油圧機構との組合せによって試料に引張を与えてもよ
い。
Further, although a combination of a motor and a screw is used as the means for pulling the sample, the present invention is not limited to this, and tension may be applied to the sample by a combination of a lever and a hydraulic mechanism, for example.

更に試料の引張にあたっては試料の一端に引張力を加え
る場合を示したが、試料の両端に引張力を与えるように
構成してもよい。
Further, when pulling the sample, although the case where a tensile force is applied to one end of the sample has been shown, it may be configured so that a tensile force is applied to both ends of the sample.

【図面の簡単な説明】[Brief explanation of drawings]

添付図面は本考案の一実施例を示す平面断面図である。 図中 1は鏡体、2は保持体、3aは対物レンズの上磁
極、4は開口、5は把持部、6は試料、7a及び7bは
試料保持部材、8は圧電素子、9は駆動棒、10は雄ネ
ジ、12はモーター、13は雌ネジ体、1は駆動電源、
16a及び16 bは電極板、17は電源である。
The accompanying drawing is a sectional plan view showing an embodiment of the present invention. In the figure, 1 is a mirror body, 2 is a holder, 3a is an upper magnetic pole of an objective lens, 4 is an aperture, 5 is a gripping part, 6 is a sample, 7a and 7b are sample holding members, 8 is a piezoelectric element, and 9 is a drive rod , 10 is a male screw, 12 is a motor, 13 is a female screw body, 1 is a drive power source,
16a and 16b are electrode plates, and 17 is a power source.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 鏡体に取付けられた保持体と、該保持体に取付けられ且
つ試料を保持するための試料保持部材と、該試料保持部
材に引張力を加えて前記試料を引張るための駆動手段と
を備え、前記駆動手段とは独立して前記試料に引張を与
えるための電圧を印加することにより機械的歪を生ずる
物質を前記試料と保持体間或いは試料と駆動手段間の部
材に設け、該物質に電圧を印加するための手段を設けて
なる電子顕微等における試料引張装置。
comprising a holder attached to a mirror body, a sample holding member attached to the holder and for holding a sample, and a driving means for applying a tensile force to the sample holding member to pull the sample, A substance that causes mechanical strain by applying a voltage for applying tension to the sample independently of the drive means is provided between the sample and the holder or between the sample and the drive means, and a voltage is applied to the substance. A specimen tensioning device for an electron microscope, etc., which is provided with means for applying .
JP13356878U 1978-09-29 1978-09-29 Sample tension device for electron microscopes, etc. Expired JPS5854782Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13356878U JPS5854782Y2 (en) 1978-09-29 1978-09-29 Sample tension device for electron microscopes, etc.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13356878U JPS5854782Y2 (en) 1978-09-29 1978-09-29 Sample tension device for electron microscopes, etc.

Publications (2)

Publication Number Publication Date
JPS5549472U JPS5549472U (en) 1980-03-31
JPS5854782Y2 true JPS5854782Y2 (en) 1983-12-14

Family

ID=29102150

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13356878U Expired JPS5854782Y2 (en) 1978-09-29 1978-09-29 Sample tension device for electron microscopes, etc.

Country Status (1)

Country Link
JP (1) JPS5854782Y2 (en)

Also Published As

Publication number Publication date
JPS5549472U (en) 1980-03-31

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