JPS5853303B2 - Standard sample for light absorption analyzer - Google Patents

Standard sample for light absorption analyzer

Info

Publication number
JPS5853303B2
JPS5853303B2 JP54006433A JP643379A JPS5853303B2 JP S5853303 B2 JPS5853303 B2 JP S5853303B2 JP 54006433 A JP54006433 A JP 54006433A JP 643379 A JP643379 A JP 643379A JP S5853303 B2 JPS5853303 B2 JP S5853303B2
Authority
JP
Japan
Prior art keywords
standard sample
wavelength
light absorption
measurement
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54006433A
Other languages
Japanese (ja)
Other versions
JPS5598335A (en
Inventor
正昭 井上
久雄 梶原
憲久 桜井
均 山田
政一郎 清部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Hokushin Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Hokushin Electric Corp filed Critical Yokogawa Hokushin Electric Corp
Priority to JP54006433A priority Critical patent/JPS5853303B2/en
Publication of JPS5598335A publication Critical patent/JPS5598335A/en
Publication of JPS5853303B2 publication Critical patent/JPS5853303B2/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/255Details, e.g. use of specially adapted sources, lighting or optical systems

Description

【発明の詳細な説明】 本発明は、光吸収形分析計用標準サンプルに関するもの
であって、比較的容易に安定した所望の光学特性が得ら
れ、かつ取り扱いも簡単な標準サンプルを提供するもの
である。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a standard sample for a light absorption analyzer, and provides a standard sample that can relatively easily obtain stable desired optical characteristics and is easy to handle. It is.

測定物質の吸収スペクトルに基づいて測定物質の物理量
を測定するように構成された光吸収形分析計の一種に、
赤外線吸収スペクトルを利用した赤外線水分計がある。
A type of light absorption analyzer that is configured to measure the physical quantity of a substance to be measured based on its absorption spectrum.
There are infrared moisture meters that use infrared absorption spectra.

この水分計は、たとえば抄紙工程において、抄紙機の制
御信号として、あるいは品質管理用データとして、紙の
水分量や水分率を測定するために用いられている。
This moisture meter is used, for example, in a papermaking process to measure the moisture content and moisture content of paper as a control signal for a papermaking machine or as data for quality control.

第1図は、前述の紙における水分量と吸収スペクトルと
の関係の一例を示す特性図であって、縦軸には透過率T
(@をとり、横軸には波長λ(μm)をとっている。
FIG. 1 is a characteristic diagram showing an example of the relationship between moisture content and absorption spectrum in the paper described above, and the vertical axis is the transmittance T.
(@ is shown, and the horizontal axis shows the wavelength λ (μm).

第1図において、Aは水分が零の状態での吸収スペクト
ルを表わし、B−Dはそれぞれ水分量が増加した状態で
の吸収スペクトルの変化を表わしている。
In FIG. 1, A represents the absorption spectrum in a state where the water content is zero, and B-D represent changes in the absorption spectrum when the water content increases, respectively.

これらから明らかなように、水分は波長がほぼ1.95
μmの光に対してその濃度に応じた吸収特性を有してい
る。
As is clear from these, the wavelength of water is approximately 1.95.
It has absorption characteristics for μm light depending on its concentration.

水分計は、このような吸収スペクトルに基づいて水分量
あるいは水分率を測定するように構成されている。
A moisture meter is configured to measure moisture content or moisture content based on such an absorption spectrum.

ところで、このような水分計では、信頼性の高い測定信
号を得るために、自動または手動により校正・チェック
動作が行なわれる。
By the way, in such a moisture meter, in order to obtain a highly reliable measurement signal, calibration and checking operations are performed automatically or manually.

この校正・チェック動作にあたっては、測定物質に対応
した所定の光学的特性を有する標準サンプルが用いられ
る。
In this calibration/checking operation, a standard sample having predetermined optical characteristics corresponding to the substance to be measured is used.

第2図は、従来の標準サンプルの一例を示す構成説明図
であって、aはその断面図、bは斜視図である。
FIG. 2 is a configuration explanatory diagram showing an example of a conventional standard sample, in which a is a cross-sectional view and b is a perspective view.

図面において、1は環状の金属枠、2は測定しようとす
る紙そのものに所定の水分量を含ませた標準の紙、3,
4はたとえばガラスで構成された赤外線透過体、5はガ
ス抜きあるいはガス注入のためのパイプである。
In the drawing, 1 is a circular metal frame, 2 is a standard paper containing a predetermined amount of moisture in the paper itself to be measured, 3,
4 is an infrared transmitting body made of glass, for example, and 5 is a pipe for gas venting or gas injection.

紙2は金属枠1の内周に固着さぁ赤外線透過体3,4は
金属枠1の両面の縁に紙1を挾むようにして非吸湿性の
接着剤等で固着され、パイプ5は金属枠1に設けた連通
孔11を通じて金属枠1と赤外線透過体3,4で構成さ
れた容器内に通じるように配置されている。
The paper 2 is fixed to the inner circumference of the metal frame 1.The infrared transmitting bodies 3 and 4 are fixed to the edges of both sides of the metal frame 1 with a non-hygroscopic adhesive, etc., with the paper 1 sandwiched between them.The pipe 5 is fixed to the inner circumference of the metal frame 1. It is arranged so as to communicate through a communication hole 11 into a container made up of a metal frame 1 and infrared transmitting bodies 3 and 4.

しかし、このように構成された標準サンプルには、次の
ような欠点がある。
However, the standard sample configured in this manner has the following drawbacks.

(:)紙の水分が容器内で蒸発するので、温度特性が悪
くなる。
(:) The water in the paper evaporates inside the container, resulting in poor temperature characteristics.

(11)容器を気密的にシールできないので、長期安定
性に欠ける。
(11) Long-term stability is lacking because the container cannot be sealed airtight.

(11D 水分量の異なる種々の標準サンプルを作成
するのにあたっては、水分量の異なる標準の紙を用いて
第2図のように構成しなければならず、相当の工数を要
する。
(11D) To prepare various standard samples with different moisture contents, standard papers with different moisture contents must be constructed as shown in Figure 2, which requires a considerable number of man-hours.

OX/)標準の紙の地合いむらが、校正・チェック動作
時の標準サンプル設置位置による誤差要因となる。
OX/) The uneven texture of the standard paper causes errors due to the position of the standard sample during calibration and checking operations.

本発明者等は、これら従来の標準サンプルの欠点を解決
するために、測定物質の吸収スペクトルに着目し、単層
蒸着膜を含み測定物質で吸収される測定波長近傍で透過
率が極小となり測定波長よりも短波長の基準波長近傍で
透過率が極大となる分光透過特性を有する光学フィルタ
を用いて、第2図の標準サンプルを用いた場合と同様な
模擬光信号を得るようにした。
In order to solve the shortcomings of these conventional standard samples, the present inventors focused on the absorption spectrum of the measurement substance, and found that the transmittance is minimal near the measurement wavelength that contains a single layer deposited film and is absorbed by the measurement substance. A simulated optical signal similar to that obtained using the standard sample shown in FIG. 2 was obtained by using an optical filter having spectral transmission characteristics such that the transmittance is maximum near the reference wavelength, which is shorter than the wavelength.

以下、図面を用いて、詳細に説明する。Hereinafter, it will be explained in detail using the drawings.

第3図は、本発明に係る標準サンプルを用いる水分計の
構成例を示す構成説明図であって、LPは光源、FPは
フィルタ板、SPLはサンプル、DTは検出器、Ll、
L2はレンズである。
FIG. 3 is a configuration explanatory diagram showing an example of the configuration of a moisture meter using a standard sample according to the present invention, in which LP is a light source, FP is a filter plate, SPL is a sample, DT is a detector, Ll,
L2 is a lens.

光源LPの出力光はレンズL1を通してフィルタ板FP
に入射される。
The output light from the light source LP passes through the lens L1 to the filter plate FP.
is incident on the

フィルタ板FPには、基準光を透過させるための所定の
透過波長域(中心波長1.8μm)を有する干渉フィル
タRFと測定光を透過させるための所定の透過波長域(
中心波長1.95μm)を有する干渉フィルタMFとが
配置されている。
The filter plate FP includes an interference filter RF having a predetermined transmission wavelength range (center wavelength 1.8 μm) for transmitting the reference light and a predetermined transmission wavelength range (center wavelength 1.8 μm) for transmitting the measurement light.
An interference filter MF having a center wavelength of 1.95 μm) is arranged.

このフィルタ板FPは、一定速度で回転されている。This filter plate FP is rotated at a constant speed.

したがって、このフィルタ板FPからは、波長の異なる
光が交互に送出されることになる。
Therefore, light having different wavelengths is alternately sent out from this filter plate FP.

このようにしてフィルタ板FPを透過した光は、サンプ
ルSPLに入射される。
The light transmitted through the filter plate FP in this manner is incident on the sample SPL.

このサンプルSPLとしては、校正・チェック時には本
発明に係る標準サンプルが挿入され、測定時には測定サ
ンプルが挿入される。
As this sample SPL, a standard sample according to the present invention is inserted during calibration and checking, and a measurement sample is inserted during measurement.

このサンプルSPLを透過した光は、レンズL2を介し
て検出器DTに入射され、電気信号に変換される。
The light that has passed through the sample SPL is incident on the detector DT via the lens L2, and is converted into an electrical signal.

そして、これら検出器DTから送出される電気信号に基
づいて所定の演算処理が施さ力、校正・チェック動作あ
るいは水分率、水分量の測定が行なわれる。
Then, predetermined arithmetic processing is performed based on the electrical signals sent from these detectors DT, and force, calibration/checking operations, or moisture content and moisture content are measured.

第4図は、本発明の一実施例を示す構成説明図であって
、その断面図を示したものであり、第2図と同等部分に
は同一符号を付している。
FIG. 4 is a structural explanatory diagram showing one embodiment of the present invention, and is a cross-sectional view thereof, and parts equivalent to those in FIG. 2 are given the same reference numerals.

第4図において、6は単層蒸着膜よりなる光学フィルタ
要素を含む光学干渉フィルタ素子である。
In FIG. 4, reference numeral 6 denotes an optical interference filter element including an optical filter element made of a single-layer deposited film.

この光学干渉フィルタ素子6は、基板としてシリコン(
Si )、ゲルマニウム(Ge)、石英、ガラス等を用
い、単層膜材料として酸化シリコン(Sin)、ゲルマ
ニウム(Ge)、硫化亜鉛(ZnS)等を用いて構成さ
れるものである。
This optical interference filter element 6 uses silicon (
It is constructed using silicon oxide (Sin), germanium (Ge), zinc sulfide (ZnS), etc. as a single layer film material.

なお、8,9はスペーサである。Note that 8 and 9 are spacers.

第5図は、第4図の標準サンプルの分光透過特性側図で
あって、単層蒸着膜の膜厚によって長波長領域における
分光透過波長域が変化し、温度変化によって透過率の極
大値および極小値が変化する状態を示したものである。
FIG. 5 is a side view of the spectral transmission characteristics of the standard sample shown in FIG. This shows the state in which the minimum value changes.

特性図a、1)において、単層膜の膜厚はa < bの
関係にある。
In the characteristic diagram a, 1), the thickness of the single layer film has a relationship of a < b.

また、これら特性図において、実線で示した特性E、E
’は温度t。
In addition, in these characteristic diagrams, the characteristics E and E indicated by solid lines are
' is the temperature t.

におけるものであり、破線で示した特性F、Fは温度t
1におけるものであって、これら温度t。
The characteristics F and F shown by broken lines are at temperature t
1, and these temperatures t.

、tlはt。<tlの関係にある。これらの特性から明
らかなように、単層膜の膜厚が厚くなると、透過率の極
小値を示す波長が長くなることが認められる。
, tl is t. The relationship is <tl. As is clear from these characteristics, it is recognized that as the thickness of the single layer film increases, the wavelength at which the minimum value of transmittance occurs becomes longer.

また、特性図aにおいて透過率の極小値を示す波長1.
95μmにおける温度変化による透過率の変化量と、特
性図すにおける波長1.95μmでの温度変化による透
過率の変化量を比較すると、後者の変化量の小さいこと
が認められる。
In addition, in the characteristic diagram a, wavelength 1.0 exhibits the minimum value of transmittance.
Comparing the amount of change in transmittance due to temperature change at 95 μm and the amount of change in transmittance due to temperature change at wavelength 1.95 μm in the characteristic diagram, it is recognized that the latter amount of change is smaller.

すなわち、単層膜の膜厚を調整することにより、第4図
に示すような構成の標準サンプルの光学特性を所望の特
性にすることができ、第3図のような装置における測定
波長での温度変化による透過率の変化量の少ない光学特
性の安定した標準サンプルが実現できる。
In other words, by adjusting the thickness of the single layer film, the optical properties of the standard sample with the configuration shown in Figure 4 can be made into the desired characteristics, and the optical characteristics at the measurement wavelength in the apparatus shown in Figure 3 can be adjusted to the desired characteristics. It is possible to create a standard sample with stable optical properties, with little change in transmittance due to temperature changes.

なお、これら実施例では、いわゆる1光路2波長・透過
光測定形の水分計に用いる標準サンプルの例について説
明したが、これに限るものではなく、2光路2波長形、
反射光測定形等各種の光吸収形分析計の標準サンプルに
ついても同様の効果を得ることができる。
In addition, in these examples, examples of standard samples used in so-called one-light path, two-wavelength, transmitted-light measurement type moisture meters have been described, but the present invention is not limited to this, and the two-light path, two-wavelength type,
Similar effects can be obtained with standard samples of various light absorption type analyzers such as reflected light measurement type.

以上説明したように、本発明によれば、比較的容易に安
定した所望の光学特性が得られ、かつ取扱いも簡単な標
準サンプルが実現でき、各種の光吸収形分析計の標準サ
ンプルとして好適である。
As explained above, according to the present invention, a standard sample that can relatively easily obtain stable desired optical characteristics and is easy to handle can be realized, and is suitable as a standard sample for various light absorption analyzers. be.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は紙における水分量と吸収スペクトルとの関係の
一例を示す特性図、第2図は従来の標準サンプルの一例
を示す構成説明図、第3図は本発明に係る標準サンプル
を用いる水分計の構成例を示す構成説明図、第4図は本
発明の一実施例を示す構成説明図、第5図は本発明の他
の実施例を示す構成説明図、第5図は第4図の標準サン
プルの分光特性側図である。 1・・・・・・金属枠、3,4・・・・・・赤外線透過
体、6・・・・・・光学干渉フィルタ素子、7,8・・
・・・・スペーサ。
Fig. 1 is a characteristic diagram showing an example of the relationship between moisture content and absorption spectrum in paper, Fig. 2 is a configuration explanatory diagram showing an example of a conventional standard sample, and Fig. 3 is a characteristic diagram showing an example of the relationship between moisture content and absorption spectrum in paper. FIG. 4 is a configuration explanatory diagram showing one embodiment of the present invention, FIG. 5 is a configuration explanatory diagram showing another embodiment of the present invention, and FIG. FIG. 2 is a side view of the spectral characteristics of a standard sample. 1... Metal frame, 3, 4... Infrared transmitting body, 6... Optical interference filter element, 7, 8...
····Spacer.

Claims (1)

【特許請求の範囲】[Claims] 1 測定物質の吸収スペクトルに基づいて測定物質の物
理量を測定する光吸収形分析計の標準サンプルとして、
単層蒸着膜を含み測定物質で吸収される測定波長近傍で
透過率が極小となり測定波長よりも短波長の基準波長近
傍で透過率が極大となる分光透過特性を有する光学フィ
ルタを含むものを用いることを特徴とする光吸収形分析
計用標準サンプル。
1. As a standard sample for a light absorption analyzer that measures the physical quantity of a substance to be measured based on its absorption spectrum,
Use an optical filter that includes a single-layer deposited film and has spectral transmission characteristics such that the transmittance is minimum near the measurement wavelength that is absorbed by the measurement substance, and the transmittance is maximum near the reference wavelength that is shorter than the measurement wavelength. A standard sample for a light absorption analyzer.
JP54006433A 1979-01-19 1979-01-19 Standard sample for light absorption analyzer Expired JPS5853303B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP54006433A JPS5853303B2 (en) 1979-01-19 1979-01-19 Standard sample for light absorption analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP54006433A JPS5853303B2 (en) 1979-01-19 1979-01-19 Standard sample for light absorption analyzer

Publications (2)

Publication Number Publication Date
JPS5598335A JPS5598335A (en) 1980-07-26
JPS5853303B2 true JPS5853303B2 (en) 1983-11-28

Family

ID=11638254

Family Applications (1)

Application Number Title Priority Date Filing Date
JP54006433A Expired JPS5853303B2 (en) 1979-01-19 1979-01-19 Standard sample for light absorption analyzer

Country Status (1)

Country Link
JP (1) JPS5853303B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH089632Y2 (en) * 1991-06-06 1996-03-21 日本たばこ産業株式会社 Measuring container for infrared moisture analyzer
JPH0540088A (en) * 1991-08-06 1993-02-19 Japan Steel Works Ltd:The Method and device for calibrating ozone concentration measuring device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4006358A (en) * 1975-06-12 1977-02-01 Measurex Corporation Method and apparatus for measuring the amount of moisture that is associated with a web of moving material

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50130987U (en) * 1974-04-13 1975-10-28

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4006358A (en) * 1975-06-12 1977-02-01 Measurex Corporation Method and apparatus for measuring the amount of moisture that is associated with a web of moving material

Also Published As

Publication number Publication date
JPS5598335A (en) 1980-07-26

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