JPS5848854A - Analysis for rhodium phase of planted film of rhodium- ruthenium alloy - Google Patents

Analysis for rhodium phase of planted film of rhodium- ruthenium alloy

Info

Publication number
JPS5848854A
JPS5848854A JP56147260A JP14726081A JPS5848854A JP S5848854 A JPS5848854 A JP S5848854A JP 56147260 A JP56147260 A JP 56147260A JP 14726081 A JP14726081 A JP 14726081A JP S5848854 A JPS5848854 A JP S5848854A
Authority
JP
Japan
Prior art keywords
rhodium
ruthenium alloy
phase
alloy plating
plated film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56147260A
Other languages
Japanese (ja)
Inventor
Kazuhisa Yasuda
安田 和久
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Priority to JP56147260A priority Critical patent/JPS5848854A/en
Publication of JPS5848854A publication Critical patent/JPS5848854A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20Metals
    • G01N33/205Metals in liquid state, e.g. molten metals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20Metals
    • G01N33/202Constituents thereof
    • G01N33/2028Metallic constituents

Abstract

PURPOSE:To melt perfectly by heating and to analyze concisely a rhodium phase in good accuracy, by melting a plated film of a rhodium-ruthenium alloy together with sodium peroxide or potassium peroxide by heating. CONSTITUTION:A plated film of a rhodium-ruthenium alloy is heated and is melted together with sodium peroxide or potassium peroxide in a nickel crucible. Quantity of the rhodium in the plated film of the rhodium-ruthenium alloy after fusion is found by an atomic absorption spectroscopy. By using said method, the plated film of the rhodium-ruthenium alloy is melted perfectly by heating and also an accurate measurement of rhodium concentration is performed because influences of sodium and potassium brought about an interference at the time of the atomic absorption spectroscopy, are eliminated by carrying out the simultaneous background correction.

Description

【発明の詳細な説明】 この発明は、ロジウム−ルテニウム合金めっき皮膜のロ
ジウム相分析方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for analyzing the rhodium phase of a rhodium-ruthenium alloy plating film.

ロジウム−ルテニウム合金めっき皮膜は、光沢のある白
色の優雅な色調と汚nにくい表面が得らするため、工業
用にも装飾用にも用いら牡ているが、王水にはもちろん
、逆圧水にも溶解しにくいため、従来、ロジウム相の分
析は困難であシ、わずかに、硫酸水素カリウム“または
、硫酸水素ナトリウムとともに、約700℃で加熱溶融
後、水溶液として、原子吸光分析法によシ、ロジウム濃
度を求める方法が知らtていた。
Rhodium-ruthenium alloy plating has an elegant glossy white color and a stain-resistant surface, so it is used for both industrial and decorative purposes. Conventionally, it has been difficult to analyze the rhodium phase because it is difficult to dissolve in water, and after heating and melting it at about 700°C with potassium hydrogen sulfate or sodium hydrogen sulfate, it is analyzed as an aqueous solution by atomic absorption spectrometry. Yes, I knew how to determine the rhodium concentration.

しかしながら、この方法は、ロジウム−ルテニウム合金
めっき皮膜を細粉状にしなけnばならず、また、細粉状
にしても、完全にカロ熱溶融することは難かしく、加え
て、加熱溶融後の水溶液に多量の硫酸イオンが存在する
ため、原子吸光分析時の干渉が大きくなり、正確なロジ
ウム相の分析ができにくいという欠点を有していた。
However, in this method, the rhodium-ruthenium alloy plating film must be made into a fine powder, and even if it is made into a fine powder, it is difficult to completely melt the rhodium-ruthenium alloy plating film. The presence of a large amount of sulfate ions in the aqueous solution increases interference during atomic absorption spectrometry, making it difficult to accurately analyze the rhodium phase.

この発明は、上記の欠点を改良するためになされたもの
であシ、ロジウム−ルテニウム合金メっき皮膜の正確な
ロジウム相分析方法の提供を目的としtものである。
This invention was made to improve the above-mentioned drawbacks, and its purpose is to provide an accurate method for analyzing the rhodium phase of a rhodium-ruthenium alloy plating film.

この発明の特徴は、ロジウム−ルテニウム合金めっき皮
膜を、ニッケルるつぼ中で過酸化ナトリウムまたは、過
酸化カリウムとともに、加熱溶融することにある。この
方法を用いると、ロジウム−ルテニウム合金めっき皮膜
を、細粉状にすることなく完全に加熱溶融することがで
き、しかも、原子吸光分析時の干渉となるナトリウム、
カリウ ムの影響は、同時バックグラウンド補正をする
ことにより増り除かれるため正確なロジウム濃度の測定
が可能である。
The feature of this invention is that a rhodium-ruthenium alloy plating film is heated and melted together with sodium peroxide or potassium peroxide in a nickel crucible. Using this method, it is possible to completely heat and melt the rhodium-ruthenium alloy plating film without turning it into fine powder, and it is possible to completely heat and melt the rhodium-ruthenium alloy plating film without turning it into fine powder.
Accurate rhodium concentration measurements are possible because the effect of potassium is increased or eliminated by simultaneous background correction.

以下、この発明の実施例について述べる。Examples of the present invention will be described below.

実施例1 0ジウム(硫酸ロジウムとして)5y/l、、スルファ
ミンH20y / t % IA eマグネシウム20
.9 /′t1ルテニウム〔塩化ルテニウムとして〕0
゜511/lのロジウム−ルテニウム合金めっき液を建
浴した後、浴温f、50℃とし、電流密度1゜3A/ 
tlm” テ90 分間、ステンレス板(50mm X
 25濶1日)にめっきを施した。このロジウム−ルテ
ニウム合金めっき皮膜を剥離し、その0゜211程度を
天秤で正確にはかり取り、ニッケルるつほに入n1過酸
化ナトリウム3gとともに、約800℃で加分間、加熱
溶融した。室温まで冷却後、溶融物k 200 mAの
メスフラスコに移し変え、さらに)ニッケルるつは中の
残留物ヲ、10%の塩酸で洗浄g、200 mlのメス
フラスコにカlえ、10%ノ塩酸でメスフラスコを定容
とした。この水溶液中のロジウム症度f 343 n 
rnの波長で、同時バックグラウンド補正を行いながら
、標章添加法を用いた原子吸光法で測定し、測定結果を
得た。この測定結果と、最初にはかシ取つ;′?:、ロ
ジウムールテニウム合金めっき皮膜の重量からロジウム
相は、59.2%と算出さ詐た。一方、めっき浴中のロ
ジウム濃度の減少量を、同様に原子吸光法で測定したと
ころ、ロジウムの減少量と、上記析出量は、一致した。
Example 1 0dium (as rhodium sulfate) 5y/l, Sulfamine H20y/t% IA e Magnesium 20
.. 9 /'t1 Ruthenium [as Ruthenium chloride] 0
After preparing a rhodium-ruthenium alloy plating solution of ゜511/l, the bath temperature was set to f and 50°C, and the current density was set to 1゜3A/l.
tlm" for 90 minutes on a stainless steel plate (50mm
Plating was applied after 25 hours and 1 day). This rhodium-ruthenium alloy plating film was peeled off, and approximately 0°211 of it was accurately weighed with a balance, and heated and melted at about 800° C. with 3 g of n1 sodium peroxide in a nickel melting box. After cooling to room temperature, the melt was transferred to a 200 mA volumetric flask, and the residue inside the nickel melt was washed with 10% hydrochloric acid. The volumetric flask was brought to volume with hydrochloric acid. Rhodium disease degree f 343 n in this aqueous solution
The measurement results were obtained by measuring by atomic absorption spectrometry using the mark addition method at a wavelength of rn while performing simultaneous background correction. With this measurement result, first take a candle ;'? : The rhodium phase was calculated to be 59.2% from the weight of the rhodium ruthenium alloy plating film. On the other hand, when the amount of decrease in rhodium concentration in the plating bath was similarly measured by atomic absorption spectrometry, the amount of decrease in rhodium and the amount of precipitation coincided with each other.

実施例2 0ジウム(硫酸ロジウムとして)511/l、ス/I/
 7 アミンft 201 / 1% (iitt酸マ
グネシウム201//11ルテニウム(塩化ルテニウム
として)2y/lのロジウム−ルテニウム合金めっき液
を建浴した後、浴温を50℃とし、電流密度1.3A/
dm”で120分間、ステンレス板(50m X 25
 mX1mm)にめっきを施した。このロジウム−ルテ
ニウム合金めつき皮膜を剥離し、その0.2#程度を天
秤で正確にはかり取シ、ニッケルるつぼに入れ、過酸化
ナトリウム311とともに、約800℃で(資)分間、
加熱溶融した。室温まで冷却後、溶融物を200 ml
のメスフラスコに移し変え、さらに、ニッケルるつぼ中
の残留物’t、io%の塩酸で洗浄後、200tnLの
メスフラスコに力1え、10%の塩酸でメスフラスコ會
定容とした。この水溶液中のロジウム濃度’1343z
trLの波長で、同時バックグラウンド補正を行いなが
ら、標準添加法を用いた原子吸光法で測定し、測定結果
を得た。この測定結果と、最初にはかシ取ったロジウム
−ルテニウム合金めっき皮膜の重量からロジウム相は、
49゜0%と算出され友。一方、めっき浴中のロジウム
濃度の減少量を、同様に原子吸光法で測定したところ、
ロジウムの減少量と、上記析出量は、一致した。
Example 2 0dium (as rhodium sulfate) 511/l, Su/I/
After preparing a rhodium-ruthenium alloy plating solution containing 7 amine ft 201/1% (magnesium iitt acid 201//11 ruthenium (as ruthenium chloride) 2y/l, the bath temperature was set to 50°C, and the current density was set to 1.3 A/l.
dm" for 120 minutes on a stainless steel plate (50m x 25
m x 1 mm) was plated. This rhodium-ruthenium alloy plating film was peeled off, about 0.2# of it was accurately weighed out using a balance, placed in a nickel crucible, and heated at about 800°C for minutes with 311 sodium peroxide.
Melted by heating. After cooling to room temperature, 200 ml of the melt
The residue in the nickel crucible was then washed with io% hydrochloric acid, and then poured into a 200 tnL volumetric flask, and the volume of the volumetric flask was brought to a constant volume with 10% hydrochloric acid. Rhodium concentration in this aqueous solution '1343z
The measurement results were obtained by measuring at the wavelength of trL by atomic absorption spectrometry using the standard addition method while simultaneously performing background correction. From this measurement result and the weight of the rhodium-ruthenium alloy plating film that was initially scraped off, the rhodium phase was determined to be
It was calculated to be 49.0%. On the other hand, when the decrease in the rhodium concentration in the plating bath was similarly measured using atomic absorption spectrometry, it was found that
The amount of rhodium decreased and the amount of precipitation were consistent.

以上述べたように、この発明によ牡は、従来の方法ト異
なり、ロジウム−ルテニウム合金めっき皮膜を、過酸化
ナトリウムま几は、過酸化カリウ5− ムとともに加熱溶融するという簡単な操作で、完全に加
熱溶融することができ、しかも、原子吸光分析時の干渉
が小さいため、ロジウム−ルテニウム合金めっき皮膜の
ロジウム相を簡潔に精度よく分析できるという効果を有
する。
As described above, the present invention differs from the conventional method in that a rhodium-ruthenium alloy plating film can be melted by heating with sodium peroxide or potassium peroxide. Since it can be completely heated and melted and has little interference during atomic absorption analysis, it has the effect of allowing the rhodium phase of a rhodium-ruthenium alloy plating film to be analyzed simply and accurately.

以上 出願人 株式会社第二精工舎 6−that's all Applicant: Daini Seikosha Co., Ltd. 6-

Claims (1)

【特許請求の範囲】[Claims] ニッケルるつぼ中で、ロジウム−ルテニウム合金めっき
皮膜を過酸化ナトリウムまたは、過酸化カリウムととも
に加熱溶融し、溶融後のロジウム−ルテニウム合金めっ
き皮膜中のロジウム量を、原子吸光分析法により求める
ことを特徴とするロジウム−ルテニウム合金めっき皮膜
のロジウム相分析方法。
A rhodium-ruthenium alloy plating film is heated and melted together with sodium peroxide or potassium peroxide in a nickel crucible, and the amount of rhodium in the rhodium-ruthenium alloy plating film after melting is determined by atomic absorption spectrometry. A method for analyzing the rhodium phase of a rhodium-ruthenium alloy plating film.
JP56147260A 1981-09-18 1981-09-18 Analysis for rhodium phase of planted film of rhodium- ruthenium alloy Pending JPS5848854A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56147260A JPS5848854A (en) 1981-09-18 1981-09-18 Analysis for rhodium phase of planted film of rhodium- ruthenium alloy

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56147260A JPS5848854A (en) 1981-09-18 1981-09-18 Analysis for rhodium phase of planted film of rhodium- ruthenium alloy

Publications (1)

Publication Number Publication Date
JPS5848854A true JPS5848854A (en) 1983-03-22

Family

ID=15426203

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56147260A Pending JPS5848854A (en) 1981-09-18 1981-09-18 Analysis for rhodium phase of planted film of rhodium- ruthenium alloy

Country Status (1)

Country Link
JP (1) JPS5848854A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007138768A1 (en) 2006-05-26 2007-12-06 Nippon Mining & Metals Co., Ltd. Zirconium crucible for analytical sample melting, method of preparing analytical sample and method of analysis
JP2009041947A (en) * 2007-08-06 2009-02-26 Nikko Kinzoku Kk Nickel crucible
WO2010110064A1 (en) 2009-03-23 2010-09-30 日鉱金属株式会社 Zirconium crucible

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007138768A1 (en) 2006-05-26 2007-12-06 Nippon Mining & Metals Co., Ltd. Zirconium crucible for analytical sample melting, method of preparing analytical sample and method of analysis
JP2009041947A (en) * 2007-08-06 2009-02-26 Nikko Kinzoku Kk Nickel crucible
WO2010110064A1 (en) 2009-03-23 2010-09-30 日鉱金属株式会社 Zirconium crucible

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