JPS5848659A - Method and apparatus for measuring electroless plating speed - Google Patents

Method and apparatus for measuring electroless plating speed

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Publication number
JPS5848659A
JPS5848659A JP14621781A JP14621781A JPS5848659A JP S5848659 A JPS5848659 A JP S5848659A JP 14621781 A JP14621781 A JP 14621781A JP 14621781 A JP14621781 A JP 14621781A JP S5848659 A JPS5848659 A JP S5848659A
Authority
JP
Japan
Prior art keywords
plating
speed
electroless plating
electrolytic
specimen
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14621781A
Other languages
Japanese (ja)
Inventor
Hiroshi Kikuchi
廣 菊池
Hitoshi Oka
岡 齊
Osamu Miyazawa
修 宮沢
Chiaki Nakatsuka
中塚 千晶
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP14621781A priority Critical patent/JPS5848659A/en
Publication of JPS5848659A publication Critical patent/JPS5848659A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To measure the plating speed by immersing a sample strip of a metal with catalytic activity to electroless plating in a plating soln. at a constant speed for a fixed time to subject the strip to electroless plating and by carrying out anodic stripping while immersing the strip in an electrolytic soln. at the constant speed. CONSTITUTION:A sample strip 2 of a metal with catalytic activity to electroless plating is driven at a constant speed with a rubber roller 6 through auxiliary rollers 7, 8 and a guide roller 5 and immersed in a plating soln. 4 in a plating tank 1 through a guide roller 3 to subject the strip 2 to electroless plating. The strip 2 plated in the tank 1 for a fixed time is immersed in an electrolytic cell 9 by a fixed area and electrolyzed as an anode at a constant voltage applied between the anode and a cathode 11. In the cell 9 the metal deposited in the tank 1 is electrolyzed. The electrolytic current is measured with an ammeter 13, and by utilizing the face that the current corresponds to the plating speed, the plating speed is measured. The surface of the sample strip is a metal belonging to the 5 or 6 period of theIB or VIII group or an alloy thereof.

Description

【発明の詳細な説明】 本発明は、無電解めっきのめっき速度の測定方法と装置
に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method and apparatus for measuring the plating rate of electroless plating.

S[解めっきは、めっき液に金属塩と還元剤を含有し、
還元剤の自己触媒反応を利用して、触媒活性な金属膜を
形成するものである。工業的には次亜リン酸塩を還元剤
とする無電解ニッケル、ホルムラルデヒドを還元剤とす
る無電解銅めっき等が実用化され、プリント回路板の回
路形成等に広く利用されてbる。
S [Deplating involves containing metal salts and reducing agents in the plating solution,
A catalytically active metal film is formed by utilizing the autocatalytic reaction of a reducing agent. Industrially, electroless nickel plating using hypophosphite as a reducing agent and electroless copper plating using formaldehyde as a reducing agent have been put into practical use and are widely used for forming circuits on printed circuit boards. .

無電解めっきでは、めっき速度すなわちめりき金属皮膜
の形成速度がめつき液のpH9還元剤。
In electroless plating, the plating rate, that is, the formation rate of the plated metal film, is determined by the pH 9 reducing agent of the plating solution.

全滅塩、微量の添加剤等や反応生成物の1lli度に1
って変動するので、めっき液管理が電気めっきにくらべ
て非常に困難であシ、製品の護摩9品質を一定に保つこ
とを困難にしてbた。
1 per 1 liter of annihilated salts, trace amounts of additives, etc. and reaction products.
Since the plating temperature fluctuates, managing the plating solution is much more difficult than with electroplating, making it difficult to maintain a constant quality of the product.

このLうな間Mは、無電解めっきの速度を簡易かつ迅速
に精度良く連続的に測定する方法がないことから生じて
おり、めっき速[を簡易、かつ迅速にN度良く測定する
ことが望まれていた。
This L length M arises from the fact that there is no way to easily and quickly measure the electroless plating speed continuously with high precision. It was rare.

しかるに、従来無電解めっきの速度を測定するには、次
のような方法をとるのが通常であった。
However, in the past, the following method was usually used to measure the rate of electroless plating.

すなわち、一定面積の試片に一足時間無電解めっきな鳳
し、析出し交会−の1i童から換算して速度を知るもの
、あるいは試片上の析出金塊の岸さを一定時間毎に電解
膜厚計等の膜厚測定計で測定してい穴、このような方法
では、常時変化するめっき速度を平均化して測定するこ
とになるので、速度の測定を連続的に行なうのが極めて
困難であった。
In other words, electroless plating is carried out on a specimen of a certain area for one hour, and the speed is calculated from the 1i child of the precipitation exchange rate, or the thickness of the electrolytic film is calculated by measuring the thickness of the deposited gold nugget on the specimen at regular intervals. With this method, the constantly changing plating speed is averaged and measured, making it extremely difficult to measure the speed continuously. .

本発明の目的は、上記しt従来技術では困難であった無
電解めっき速度を連続的に測定する方法と装置を提供す
るにある。
An object of the present invention is to provide a method and apparatus for continuously measuring the electroless plating rate, which has been difficult with the prior art.

本発明で#:t、無電解めっき速度を目動的に測定する
定めに、無電解めっきに触媒活性な金属からなるめっき
試片を一足速度で一定時間めっき液に浸漬して無電解め
っきを施し、次にめつ龜しt試片を電解液中に一足速度
で浸漬しながらアノーFストリヴビングを行ない、試片
に析出した金属と電解電流が比例することを利用して、
めっき速度を知るものである。
In the present invention, #:t, in order to visually measure the electroless plating rate, a plating specimen made of a metal that is catalytically active for electroless plating is immersed in a plating solution for a certain period of time at a speed of one foot to perform electroless plating. After that, the test specimen was immersed in the electrolytic solution at a speed of 1 foot and subjected to Anor F strobbing. Taking advantage of the fact that the metal deposited on the specimen is proportional to the electrolytic current,
This is to know the plating speed.

次に本発明の詳細な説明する。第1図は本発明の基本構
成を示すもので、1はめ−)き槽であり。
Next, the present invention will be explained in detail. FIG. 1 shows the basic configuration of the present invention, which is a plating tank.

めっき電極2は無電解めっきに触媒活性な金属よりなる
もので、 P、、P、、A、等のワイヤもしくはこれら
金属の箔、もしくはこれら金属をめっきしたワイヤおよ
び箔、もしくはこれら金属薄膜を不導体上に蒸着等にニ
ジ形成したもののいずれを使用することも可能である。
The plating electrode 2 is made of a metal that is catalytically active for electroless plating, and is made of wires such as P, , P, , A, foils of these metals, wires and foils plated with these metals, or thin films of these metals. It is also possible to use any material formed by vapor deposition or the like on a conductor.

環状に形成しためつき電極2は、ガイドa−ラ3をブr
して一定面積をめっき液4に浸漬しながらガイドローラ
5.お工びモータにて定速で回転する工うにし友ゴムロ
ーラ6で一定速度で駆動する。7.8はめつきt極2の
移動をなめらかにする補助ガイドである。
The clamping electrode 2 formed in an annular shape grips the guide a-ra 3.
guide roller 5 while immersing a certain area in plating solution 4. It is driven at a constant speed by a rotary rubber roller 6 which is rotated at a constant speed by a rotary motor. 7.8 is an auxiliary guide that smoothes the movement of the mating t-pole 2.

めっき槽1で一足時間のめっきを施されtめつき1jL
極2Ia、’電解槽9において電解液10に一足面積を
浸漬してめっき電極2を陽極として、陰極11に対し、
一定電圧で電解する。12は陽、陰極間に一足電圧を印
加する電源、13は電解電流を側足する電流計、14は
記録針である。
After being plated for one hour in plating tank 1, the plating was 1JL.
Electrode 2Ia, 'In the electrolytic tank 9, one foot area is immersed in the electrolyte 10, the plating electrode 2 is used as the anode, and the cathode 11 is
Electrolyzes at a constant voltage. 12 is a power source that applies a voltage between the positive and negative electrodes, 13 is an ammeter that measures the electrolytic current, and 14 is a recording needle.

かかる装置において、めつき槽1で析出し几全滅は電解
槽9で電解溶出し、このときの電解電流がめつき速度に
対応することを利用してめっき速度を#1定するもので
ある。
In this apparatus, the plating rate is determined by utilizing the fact that the deposited in the plating bath 1 is electrolytically eluted in the electrolytic bath 9, and the electrolytic current at this time corresponds to the plating rate.

めっき電極としては、無電解7めつきに触媒活性で、か
つ陽極として不溶な金属が望ましく、これは1B族、8
族の5および6局期の金属の女かから選ばれたものが適
している0%にP t e P d # A%Iが適し
ている。
As the plating electrode, it is desirable to use a metal that is catalytically active for electroless plating and is insoluble as an anode.
P t e P d # A% I is suitable for 0% selected from the 5th and 6th phase metal females of the group.

ま7t、めっき電極を環状にすることは必ずしも必要で
なく、常に一方向に定速で移動できれば本発明の効果が
そこなわれることはない。しかし。
Also, it is not necessary that the plating electrode be annular, and the effects of the present invention will not be impaired as long as it can always move in one direction at a constant speed. but.

長時間にわたシめつき速度を連続的に測定するには、短
込めつき電極を周期的に利用するのが有利である。
To continuously measure the sew rate over a long period of time, it is advantageous to periodically utilize short embedding electrodes.

しかしながら本発明は、めっき電極を環状にすることに
その本質があるのではなく1例えば1g2図に示すよう
に、テープま一7’Cは線状の電極を用いることはなん
らさしつかえない。
However, the essence of the present invention is not to form the plating electrode into an annular shape; for example, as shown in Figure 1g2, a linear electrode may be used as the tape plate 7'C.

すなわちテープまfcはめつき電極15を巻きつけたり
−ル16から一定速度で回転するり−ル17に電極を巻
きとりながら、めりき檜18で無電解めっきを施し、次
いで゛電解槽19でこれを電解してもふい。電解槽19
で鵬陰極20に一足電圧な竜@21!り印加し、成解電
fiを電流計22で測定し、記録計25で記録すること
に工すめっき速度の自動−1足ができる。
That is, by winding the fc-plated electrode 15 around the tape, or winding the electrode from the wheel 16 onto the wheel 17 that rotates at a constant speed, electroless plating is applied in the metal plate 18, and then in the electrolytic bath 19. No need to electrolyze. Electrolytic cell 19
And Peng cathode 20 has one voltage dragon @21! The electrolytic electrolyte fi is measured by the ammeter 22 and recorded by the recorder 25, thereby automatically controlling the plating speed.

さらに本発明は、めつき櫂で直接めっき電極へめっきし
ないことも可能である。すなわち第5図に示すごとく、
めっき速度の側足#eit内に小さなめっき呈24を設
けここに外部のめつき槽からボンプ等でめっき液を導入
し、めっき電極25にめっきを施した後、電解室26で
陰極27に対し電源28ニジ−足電圧を印加し電解電流
を11E流計汐で測定し、記録計30で記録するもので
ある。31は駆動装置を示してbる。
Furthermore, the present invention allows not to directly plate the plating electrode with the plating paddle. In other words, as shown in Figure 5,
A small plating chamber 24 is provided in the side leg #eit of the plating speed, and a plating solution is introduced into the plating tank from an external plating tank using a pump or the like, and after plating the plating electrode 25, the plating solution is applied to the cathode 27 in the electrolytic chamber 26. A voltage is applied to the power source 28, and the electrolytic current is measured with a current meter 11E and recorded with a recorder 30. 31 indicates a driving device.

実施例1゜ 本発明を実施し7t1例として、第4図に示す装置に工
って無電解銅めっきの速度を自動的に測定し友0図2の
装置は、めっき電極、めっき電極の駆動部分、めっき室
、′@解呈、測定系からなり、めっき電極32は、l1
51mφの白金ワイヤの両趨を溶接して環状に形成した
ものがある。このめっき電極32を一方向に定速で移動
する駆動機構はD−Cサーボモータの回転軸に取付は比
ゴムローラ33と真ちゅう製の補助ローラ34でめっき
電極15t’圧層し、補助ゴムローラー55を弁してめ
っき電極32を回転する。本笑施例ではサーボモータの
電圧を調整することに工り、めっき電極32の送シ速度
を毎分5IIEIと一足とし友。
Example 1 The present invention was implemented and as an example, the speed of electroless copper plating was automatically measured by constructing the apparatus shown in Fig. 4. The plating electrode 32 consists of a plating chamber, a plating chamber, a measurement system, and a plating electrode 32.
There is one in which both ends of a 51 mφ platinum wire are welded to form an annular shape. The drive mechanism for moving the plating electrode 32 in one direction at a constant speed is attached to the rotating shaft of a D-C servo motor, and the plating electrode 15t' is pressed by a rubber roller 33 and an auxiliary roller 34 made of brass, and the auxiliary rubber roller 55 valve to rotate the plating electrode 32. In this embodiment, the voltage of the servo motor is adjusted, and the feeding speed of the plating electrode 32 is set to 5IIEI per minute.

このめっき電極32に銅めっきするめっき呈36は、め
っき製品にめっきを行なう大型のめっき槽37よりポン
プ58にて常にめっき液を循環し。
In the plating 36 for copper plating the plating electrode 32, a pump 58 constantly circulates a plating solution from a large plating tank 37 for plating the plating products.

オーバーフローでめっき液の高さを常に一定とした。め
っき電極32はめっき室36で銅めっきを施されながら
移動するが、めっき電極32がめつき室36に入る部分
は、α511mφの穴を有するシリコンゴム39を用い
てめっき液の漏れるのを防いだ。
The height of the plating solution was always kept constant by overflow. The plating electrode 32 moves while being copper-plated in the plating chamber 36, and the part where the plating electrode 32 enters the plating chamber 36 is made of silicone rubber 39 having a hole of α511 mφ to prevent the plating solution from leaking.

次に、めっき電極上の析出銅を溶解する電解室40は、
電解液をタンク41Lシボンプ42により循環し、めっ
き室と同様オーバーフローにニジ液面の高さを一足とし
、めっき電極32の出口にII!ifじ(a5Mφの穴
を有すシリコンゴム43にLす液漏れを防止した。この
電解室40では、めっき電極を5m浸漬し、1Qas”
 を有する銅陰極44に対してめっき電極に析出した銅
を溶解する几めに電源45にLすα1vの電圧を印加し
、電流Iを電流計46で測定、記録計47に記録した。
Next, the electrolytic chamber 40 dissolves the copper deposited on the plating electrode.
The electrolytic solution is circulated through the tank 41L and the pump 42, and the liquid level is raised to a certain level above the overflow, as in the plating chamber, and placed at the outlet of the plating electrode 32. If the silicone rubber 43 has a hole of 5Mφ, liquid leakage was prevented. In this electrolytic chamber 40, the plating electrode was immersed for 5m, and
In order to dissolve the copper deposited on the plating electrode, a voltage of L α1v was applied to the power supply 45 to the copper cathode 44 having a plating electrode, and the current I was measured with the ammeter 46 and recorded on the recorder 47.

この実施例における測定対象の無電解鋼めっき液は1次
の以下に記すピ)の組成′Ik有するもので。
The electroless steel plating solution to be measured in this example had a primary composition 'Ik' as shown below.

電解液は以下に記f伸1の液を用いた。もちろん本発明
はげl 、 (olのような%足の液組成のものに対し
のみ有効なのではなく、これらは−例にすぎない。
As the electrolytic solution, the solution described in Section 1 below was used. Of course, the present invention is not only effective for those with a % foot fluid composition such as baldness and baldness, but these are only examples.

また、めっき電極32の送り速度や形状、電解電圧等も
本例に限定されるものではない。
Further, the feeding speed, shape, electrolytic voltage, etc. of the plating electrode 32 are not limited to this example.

(イ夏 無電解鋼めっき液 / (ロ) 電解液 上記無電解銅めっき液は、主成分濃度によってめっき測
定は1〜4μm / nの範囲で変化するが。
(Inatsu Electroless Steel Plating Solution/(B) Electrolyte Solution The electroless copper plating solution described above varies in plating measurement in the range of 1 to 4 μm/n depending on the concentration of the main component.

本例の装置によれば、めっき速度と゛題ps毫流の関に
は比例関係が成立し、電流値として1〜4mAの変化と
してめっき速度を測定できることがわかった1本例にお
けるめっき速度と電流の関係は第5図に示すようなもの
で、電流を記録することによりめっき速度の経時変化な
直接記録できることもわかっ穴。
According to the apparatus of this example, there is a proportional relationship between the plating speed and the ps current, and the plating speed can be measured as a change in current value of 1 to 4 mA. The relationship is as shown in Figure 5, and it is also clear that by recording the current, it is possible to directly record changes in plating speed over time.

実施例2 実施例1と同じ構成の装置を用いて、無電解ニッケルめ
っきの速度を測定した。無電解ニッケルめ)きFi、無
電解銅めっきLシ速度が大なため、(151111φの
日金線からなるめっき電極を5(至)7分の速度で5t
smめっき液に浸漬して二!ケルめっきを施しπ後、゛
電解液に151m浸漬して2gaJの面積のニダケル板
を陰極としてα4vで電解した。
Example 2 Using an apparatus having the same configuration as in Example 1, the speed of electroless nickel plating was measured. Since the speed of electroless nickel plating (Fi) and electroless copper plating (L) is high, the plating electrode made of (151111φ Japanese gold wire) was 5 tons at a speed of 5 (to) 7 minutes.
Immerse it in the SM plating solution! After applying KEL plating to π, it was immersed in an electrolytic solution for 151 m and electrolyzed at α4V using a KEL plate with an area of 2 gaJ as a cathode.

この実施例に用いた無電解ニッケルめっき液し惨。Electroless nickel plating solution used in this example.

電解液に)は次の1うなものである。The electrolyte solution is as follows.

(ハ)無電解ニッケルめっき液 に)電解液 かかる装置および液で本発明の効果を調べt結果、第6
図に示すようなめっき速度と電解電流の間の良い直線関
係が得られ、無電解ニッケルめっきの速度を電流値とし
て自動的に測定できることがわかった。
(c) The effect of the present invention was investigated using an apparatus and solution that splashes electrolyte (on electroless nickel plating solution).
As shown in the figure, a good linear relationship between plating speed and electrolytic current was obtained, and it was found that the speed of electroless nickel plating can be automatically measured as a current value.

実施例& 実施例1と同じ装置、液を用い、めっき電極の送り速[
を1.2,5.10m/分と変え、銅メッキを施し、電
解室での電解電圧をα05.α1.α5゜1.0,1.
5,2.OVを変えて、めっき速度を測定したが、実施
例1と全く同様にめっき速度と電解電流の間に良い直線
関係が成立し、めっき速度が自動測定できることがわか
り几。
Example & Using the same equipment and solution as Example 1, the plating electrode feeding speed [
was changed to 1.2 and 5.10 m/min, copper plating was applied, and the electrolysis voltage in the electrolytic chamber was set to α05. α1. α5゜1.0,1.
5,2. The plating speed was measured by changing the OV, and a good linear relationship was established between the plating speed and the electrolytic current, just as in Example 1, indicating that the plating speed could be measured automatically.

以上、詳細に実施例を示して説明したが、要するに本発
明の特徴とするところは、一定条件で無電解めっきした
金属試片を一定条件で陽極電解するときの電解電流から
めつき速度が求まることにあシ簡易な方法でめっき速度
の自動測定を可能とできるので、めっき液やめつき製品
の管理を容易にするその効果はすこぶる大である。
Although the embodiments have been explained in detail above, the present invention is characterized in that the plating speed can be determined from the electrolytic current when a metal specimen electrolessly plated under certain conditions is subjected to anodic electrolysis under certain conditions. Since the plating speed can be automatically measured using a simple method, the effect of facilitating the management of plating solutions and plating products is extremely large.

【図面の簡単な説明】[Brief explanation of drawings]

第1図〜第4図は本発明の装置を示す図であシ第5図、
第6図は実験データである。 1・・・めっき槽 2・・・めっき電極 4・・・めっき液 6・・・ゴムローラ 9・・・電解槽 11、・・・陰極 12・・・電源 13・・・電流針 0ゞA11“80.翫\ ′−¥ / 凹 寸 2 ワ1 −73図 f 4 図 才 5 図 ヤ l 図
Figures 1 to 4 are diagrams showing the apparatus of the present invention; Figure 5;
Figure 6 shows experimental data. 1... Plating tank 2... Plating electrode 4... Plating solution 6... Rubber roller 9... Electrolytic bath 11,... Cathode 12... Power supply 13... Current needle 0゜A11" 80. →\ ′-¥ / concave size 2 wa 1 -73 figure f 4 figure 5 figure ya l figure

Claims (1)

【特許請求の範囲】 1、 無電解めっきに触媒活性なめっき試片を無電解め
っき液中を一定速度で移動しながら無電解めっきを施し
、ついでこのめっきされた試片を電解液中を一足速度で
移動しながらアノードストリッピングを行ない、この際
の電解電流からめっき速度を連続的に側足することを特
徴とする無電解めっき速度の測定方法。 z s電解めっきに触媒活性表めっき試片は、その表面
が1B族、81にの5.6のいずれかの金属、もしくは
これら金属の合金の員ずれかであることを特徴とする特
許請求の範囲第1.!J記載の無電めっき速度の測定方
法。 五 無電解めっきに触媒活性なめっき試片、このめりき
試片に無電解めっきを施すめっき槽、このめつき試片に
析出し九めりき金属をアノードストリッピングする電解
槽、前記めっき試片をめりき檜、[解槽の顯に移動する
駆動装置、およびアノ−トストリ・yピング電流測定部
からなることを特徴とする無電解めっ龜速度の測定装置
。 4、無電解めっきに触媒活性なめっき試片は、その表面
が1B族、8族の5,6のいずれかの金属もしくはこれ
ら金属の合金のいずれかであることを特徴とする特許請
求の範囲第3項記載の無電解めっき速度の測定装置。
[Claims] 1. Electroless plating is applied to a catalytically active plating specimen while moving it at a constant speed in an electroless plating solution, and then the plated specimen is immersed in the electrolytic solution for a moment. A method for measuring electroless plating speed, characterized by performing anode stripping while moving at a high speed, and continuously calculating the plating speed from the electrolytic current at this time. The surface of the catalytically active surface plating sample for zs electroplating is characterized in that its surface is made of any metal of Group 1B, 5.6 of 81, or an alloy of these metals. Range 1. ! The method for measuring electroless plating speed described in J. (5) A catalytically active plating specimen for electroless plating, a plating bath for applying electroless plating to this plated specimen, an electrolytic bath for anodically stripping the plated metal deposited on this plating specimen, and the aforementioned plating specimen. An electroless plating speed measuring device comprising: a drive device that moves to the top of a plating tank; and an anoto stripping/yping current measuring section. 4. The claim that the surface of the plated specimen that is catalytically active for electroless plating is one of metals 5 and 6 of Group 1B and Group 8, or an alloy of these metals. 3. The electroless plating rate measuring device according to item 3.
JP14621781A 1981-09-18 1981-09-18 Method and apparatus for measuring electroless plating speed Pending JPS5848659A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14621781A JPS5848659A (en) 1981-09-18 1981-09-18 Method and apparatus for measuring electroless plating speed

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14621781A JPS5848659A (en) 1981-09-18 1981-09-18 Method and apparatus for measuring electroless plating speed

Publications (1)

Publication Number Publication Date
JPS5848659A true JPS5848659A (en) 1983-03-22

Family

ID=15402751

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14621781A Pending JPS5848659A (en) 1981-09-18 1981-09-18 Method and apparatus for measuring electroless plating speed

Country Status (1)

Country Link
JP (1) JPS5848659A (en)

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