JPS5844845U - adsorption stage - Google Patents
adsorption stageInfo
- Publication number
- JPS5844845U JPS5844845U JP14028481U JP14028481U JPS5844845U JP S5844845 U JPS5844845 U JP S5844845U JP 14028481 U JP14028481 U JP 14028481U JP 14028481 U JP14028481 U JP 14028481U JP S5844845 U JPS5844845 U JP S5844845U
- Authority
- JP
- Japan
- Prior art keywords
- stage
- shaft
- outer periphery
- center
- suction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Gripping Jigs, Holding Jigs, And Positioning Jigs (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第1図は本考案の吸着ステージの断面図、第2図は第1
図のn−n断面図。
1・・・・・・ウェハー、2・・・・・・ステージ、3
・・・・・・外周突出部、4・・・・・・中央突出部、
6・・・・・・ヒータ板もしくは冷却板、7・・・・・
・円板、11・・・・・・垂直軸、14・・・・・・中
央孔、15・・・・・・溝、16.17・・・・・・エ
アーニップル。Figure 1 is a cross-sectional view of the suction stage of the present invention, and Figure 2 is a cross-sectional view of the suction stage of the present invention.
nn sectional view of the figure. 1... Wafer, 2... Stage, 3
......Outer peripheral protrusion, 4...Central protrusion,
6...Heater plate or cooling plate, 7...
- Disc, 11... Vertical shaft, 14... Center hole, 15... Groove, 16.17... Air nipple.
Claims (2)
の下方に突出部を設け、下部底円板を中央においてステ
ージのブロックに固定して、外周突出部との間を気密に
し、かつステージの下面にヒート板もしくは冷却板を取
付け、軸上部の中央孔と外周との間に複数条の溝を設け
、底円板と軸とを固定した吸着ステージ。(1) Protrusions are provided at the center and below the outer periphery of a stage that has suction holes on the upper surface, and the lower bottom disk is fixed to the block of the stage at the center to create an airtight space between the stage and the outer periphery protrusions, and the stage A suction stage with a heating plate or cooling plate attached to the bottom surface of the shaft, and multiple grooves between the center hole at the top of the shaft and the outer periphery to secure the bottom disc and shaft.
を導入し溝を通し、て流出させる吸着ステージ。(2) The suction stage according to claim 1, in which air is introduced into the central hole in the upper part of the shaft, passes through a groove, and then flows out.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14028481U JPS5844845U (en) | 1981-09-21 | 1981-09-21 | adsorption stage |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14028481U JPS5844845U (en) | 1981-09-21 | 1981-09-21 | adsorption stage |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5844845U true JPS5844845U (en) | 1983-03-25 |
JPS6138189Y2 JPS6138189Y2 (en) | 1986-11-05 |
Family
ID=29933448
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14028481U Granted JPS5844845U (en) | 1981-09-21 | 1981-09-21 | adsorption stage |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5844845U (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02116950U (en) * | 1989-03-07 | 1990-09-19 | ||
JPH08162508A (en) * | 1994-12-01 | 1996-06-21 | Nec Corp | Measuring device of silicon tester |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101408728B1 (en) * | 2007-12-18 | 2014-07-02 | 세메스 주식회사 | Unit for fixing a board and apparatus for bonding dies including the same |
KR101324711B1 (en) * | 2013-03-15 | 2013-11-05 | 쿠어스텍아시아 유한회사 | Wafer chuck having alternating suction hall |
-
1981
- 1981-09-21 JP JP14028481U patent/JPS5844845U/en active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02116950U (en) * | 1989-03-07 | 1990-09-19 | ||
JPH08162508A (en) * | 1994-12-01 | 1996-06-21 | Nec Corp | Measuring device of silicon tester |
Also Published As
Publication number | Publication date |
---|---|
JPS6138189Y2 (en) | 1986-11-05 |
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