JPS5844378Y2 - Connector for circuit board testing - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a test connector used for testing circuit boards, and particularly to a test connector useful for testing high-density, high-speed circuit boards.

Circuit tests of logic circuits usually use an IJ device such as a voltmeter or oscilloscope to indicate the level of pulses and logic signals in the circuit under test.

However, when using these instruments, the operator usually selects a test location in the circuit under test, then directs attention to the instrument to be started or adjusted, and finally performs the test on the instrument. This is done by looking at the specified measurement values.

By the way, the above-mentioned test of the conventional circuit board was conducted as shown in FIG.

In Figure 1, 1 is a circuit board, 2 is a back panel, 3 is a connector, 4 is a test dummy circuit board, and 5 is a connector.
/ indicates the circuit board under test, and when connecting publication 1 only in one direction as shown in Figure 1, that is, at the connector 3 on the second side of the back panel, when testing the circuit board, By inserting the test board □ into the connector 3 in place of the circuit board 1 and connecting the circuit board under test 1' to this test dummy circuit board 4, it was possible to pull it out of the device housing and test it. .

In this method, the circuit board 1' under test is simply inserted into the connector 5 of the test dummy circuit board 4, so the circuit board 1' becomes a cantilever beam and a large bending stress is applied to the connector 3.
There are some drawbacks.

New electronic computers are becoming faster and faster, and if the speed is higher than the current speed, the printed wiring conductors on the test dummy circuit board 4 will cause signal delays, making it impossible to perform tests.

Furthermore, in high-density circuit boards, the problem of heat generation in elements cannot be ignored, and in conventional dummy circuit boards for testing, heat generation can lead to destruction of elements.

The purpose of the present invention is to provide a test connector that eliminates the above-mentioned problems.

The configuration for this purpose includes the support of the printed board shelf on which multiple circuit boards under test are mounted and/! A pedestal that is mechanically fixed to a pillar of the housing or a pedestal and on which any one circuit board under test is mounted; A test circuit board having approximately the same size as the circuit board under test, and an appropriate position on the pedestal that can cool the electronic components on any one circuit board under test mounted on the pedestal. A connector having a fan is provided for electrically connecting the circuit board under test and the test dummy circuit board, and the wiring material connecting the connectors is made of a coaxial structure. It is characterized by

To explain the present invention with reference to the drawings, FIGS. 2 and 3 schematically show a plan view and a side view of an embodiment of the present invention.

In FIGS. 2 and 3, 13 is a circuit board with a button having connection parts in two directions, and the housing a is taken over by four pillars 9, and has circuit board insertion connectors 10 on both sides. , circuit board 13
It is possible to implement from a few to more than 20 sheets.

The test connector is provided with a strong pedestal 14, and the pedestal 14 is mechanically fixed to a structural component on the housing a.

A connector for connecting the circuit board under test is provided on the pedestal.

Reference numeral 12 denotes a connector mounting base, on which an L-shaped support 11 is attached, a connector 6 is attached to a fixture (not shown) with a link mechanism attached to this L-shaped support, and the connector 6 is attached to the O-mounting fixture. By turning the screw, the circuit board under test 13' placed on the pedestal is inserted into the connector 6VC.

Note that the connector 6 is connected to the dummy board 1, which is connected instead of the board to be tested inside the casing a.

Further, the hinge 8 connects the connector mounting base 12 and the dummy plate 7, and allows the connector mounting base 12 to be opened and closed.

Numeral 15 is a cooling fan, 16 is a cover, and 17 is a cover opening window.

Testing can be performed as follows using the test connector with the above structure.

l Pull out the circuit board under test 13' from the casing a of the device, position the pedestal 14 at a predetermined position on the post where the circuit board under test 13' was mounted, and mechanically fix it to the casing a. do.

2. Next, insert the dummy board 7 into the position where the circuit board under test 13' was located.

This dummy board 7 is wired to resemble the circuit board 13,
It is for exchanging electrical signals.

In addition, if the pedestal 14 becomes an obstacle when inserting the dummy plate I and tightening it to the connector 10, the hinge 8 at the boundary between the pedestal 14 and the dummy plate
2 upward to create a gap, insert a screwdriver through the gap, and turn the screw to connect the dummy plate 7 to the connector 10.
Attach to.

3. The circuit board under test 13' is inserted and connected to the connector 6 on the pedestal of a test connector having two-way connections.

The connector 6 and the dummy board 7 inside the housing a are connected by a wiring material with low signal delay (for example, a coaxial line, coaxial flat cable, etc. using an insulator with a low dielectric constant) to reduce signal delay. I'm doing less.

4. The elements on the circuit board to be tested 13' on the pedestal 14 generate heat, so they are cooled by the fan 15 to prevent damage to the heat generating parts during the test.

In addition, the cover 16 has a hole as shown by the dashed line in the upper part of the circuit board under test 13' to form an open window 17.
This makes it possible to check the parts installed in the machine.

By the above method, even if the circuit board under test is pulled out of the device housing, a test can be performed without any negative effects, and the test work is made easy.

Note that the test connector of the present invention is effective for testing circuit boards stored in a shelf shape within the device, regardless of the type of equipment.

The present invention has been described above with reference to embodiments. According to the present invention, a dummy board of the same size as the circuit board under test is coupled with a connector, and the circuit board under test is mounted on a pedestal located outside the mounting position. By combining them with , it is possible to perform tests that cannot be tested structurally, and the test work becomes easier.

In addition, by using wiring materials such as coaxial cables with low capacitance to connect the dummy board and the connector on the connector mounting base on the pedestal, there will be no delay in signal lines, allowing for faster device testing. It can also be dealt with.

Furthermore, since it is made of a strong base and fixed to the equipment housing, the circuit board under test does not bend during probing during test work.Furthermore, since the mounted components of the circuit board under test are on the top surface,
Easy to do test work.

Furthermore, by providing a cooling fan on the pedestal to cool the circuit board, it is possible to prevent heat-generating components from being damaged by heat.

[Brief explanation of the drawing]

Figure 1: An explanatory diagram of a conventional test connector. Figure 2: Front view of the test connector according to the present invention. Figure 3: Side view of the test connector according to the present invention. 1 is the circuit board, 1' is the circuit board under test, 2 is the back panel,
3 is a connector, 4 is a dummy circuit board for testing, 5 is a connector, 6 is a connector, I is a dummy board, 8 is a hinge, 9 is a support,
10 is a connector, 11 is an L frame support, 12 is a connector mounting base, 13 is a circuit board, 14 is a pedestal, 15 is a cooling fan,
16 is a cover, 17 is an open window of the cover, a is a housing, and b is a test connector.

Claims (1)

[Scope of utility model registration request] A pedestal that is mechanically fixed to the support of the casing in which a plurality of circuit boards under test are mounted, and a pedestal on which any one circuit board to be tested is mounted, horizontally adjacent to the pedestal and fixed so as to be rotatable. A dummy circuit board for testing having approximately the same size as the arbitrary one circuit board under test, a button, and an electronic component on the arbitrary one circuit board under test mounted on the pedestal can be cooled. The pedestal is configured with a cooling fan at an appropriate position, and each is provided with a connector for electrically connecting the circuit board under test and the test dummy circuit board, and a wiring material is provided to connect the connectors. A connector for circuit board testing characterized by its coaxial structure.