JPS5843509A - Mass-production type film fabricating device - Google Patents
Mass-production type film fabricating deviceInfo
- Publication number
- JPS5843509A JPS5843509A JP56141840A JP14184081A JPS5843509A JP S5843509 A JPS5843509 A JP S5843509A JP 56141840 A JP56141840 A JP 56141840A JP 14184081 A JP14184081 A JP 14184081A JP S5843509 A JPS5843509 A JP S5843509A
- Authority
- JP
- Japan
- Prior art keywords
- chamber
- reaction chamber
- susceptor
- substrate
- door
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/54—Apparatus specially adapted for continuous coating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02524—Group 14 semiconducting materials
- H01L21/02532—Silicon, silicon germanium, germanium
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
Abstract
Description
【発明の詳細な説明】
本発明は、例えばアモルファスシリコンン太陽電池の製
造におけるように反応室内に対向配置された電極間に電
圧を印加してグロー放電を発生せしめ、反応511内に
供給された反応ガスを公簿し【反ゐガス成分の少くとも
一つを電極に支持された。箒板上に薄膜として堆積させ
る1糧を流れ作業で行うことができる量重量薄膜生成装
置−に関する。DETAILED DESCRIPTION OF THE INVENTION According to the present invention, a glow discharge is generated by applying a voltage between electrodes placed opposite each other in a reaction chamber, such as in the production of an amorphous silicon solar cell, and a glow discharge is supplied into the reaction chamber 511. The reactant gas was collected and at least one of the reactant gas components was supported on the electrode. The present invention relates to an apparatus for producing a thin film by weight, which can deposit a thin film on a broom board in an assembly line.
プラズマCVD法により多数の基板の上に薄膜を形成す
る製置としては、通常のQVD法と同様に大きな反応室
内で同・時に、多数の基板を処理するバッチ式−のもの
が考えられる。しかしこの方式では、多数の基板の出し
入わ操作が複雑であり、また基板を龜出すためにその都
度反応室の真空を破らねばならず、高い運転効率を得る
ことは困難である。A possible method for forming thin films on a large number of substrates using the plasma CVD method is a batch method in which a large number of substrates are processed simultaneously in a large reaction chamber, similar to the normal QVD method. However, in this method, the operation of loading and unloading a large number of substrates is complicated, and the vacuum in the reaction chamber must be broken each time to pump out the substrates, making it difficult to obtain high operating efficiency.
本発明は、とtlK対し【反応室の真空を保持したまま
流わ作業により基板上への薄膜の生成を行うことのでき
る量m型薄膜生成装置を提供樗ることを目的とする。SUMMARY OF THE INVENTION An object of the present invention is to provide an m-type thin film forming apparatus that can form a thin film on a substrate by flowing operation while maintaining a vacuum in a reaction chamber.
この目的は反応憲の1偶に、七れぞわ開閉可能の気書扉
を介して隣接する画素および後室が設けられ、反応算、
曽電および後室の三重は七わぞハ独立して真空排気可能
であり、さらに二重にまたがりて可動のコンベヤと、三
重にまた2がつて敷設され反応室内に位置する部分が給
電導体をなす二本のレールとが設けられ、コンベヤ上に
支持さゎて等間隔の対をなす電極の七ゎぞれがレールの
上を摺動する接触子を介して給電導体のそれぞれと接続
されることによって達成される。The purpose of this is to provide an adjacent pixel and a rear chamber in the first part of the reaction chamber through a seven-cell door that can be opened and closed.
The seven walls of the soden and rear chamber can be evacuated independently, and there is also a movable conveyor that spans the two, and a second part of the three that is located inside the reaction chamber that carries the power supply conductor. Two rails are provided, supported on the conveyor, and each of the seven equally spaced pairs of electrodes is connected to each of the power supply conductors via a contact that slides on the rails. This is achieved by
以下、図を引用して本発明の実施例について説明する。Embodiments of the present invention will be described below with reference to the drawings.
図において、反応*xecll!Iして前室2および後
室3が設けられている。反応室1と前室2および後*3
との境界には開閉可能の扉4および5が存在し、また前
室2と後1に3には正WK、Il示しない開閉可能の扉
を有する。各層は気密に閉じられるものであり、各室l
〜3は各層を閉じた際に−そわそわ独立に排気口6,7
.8より図示しない真空系によって真空排気□できる。In the figure, the reaction *xecll! A front chamber 2 and a rear chamber 3 are provided. Reaction chamber 1, front chamber 2 and rear *3
There are doors 4 and 5 that can be opened and closed at the boundary between the two, and the front chamber 2 and the rear 1 and 3 have doors that can be opened and closed (not shown). Each layer is hermetically closed, and each chamber l
~3 is when each layer is closed - fidget independent exhaust ports 6, 7
.. From 8, evacuation can be performed by a vacuum system (not shown).
さらに各室1〜3の底面には各室kまたがりてベルトコ
ンベヤ9が存在し、天井には各−1シーまたがる二本の
レール10.11が敷設さhている。シール10,11
は反応室内では給電導体12.13として導電体からな
り、前、室、後室内では絶縁体からなるが、それぞれ同
断面で連続するレールとして形成さtI″Cいる。コン
ベア9の上に絶縁体14をはさんで等間隔で働直に立て
ら4たサセプタ15は、一つおきにレール1゜の上を摺
動する接触子16を備えた接続導体17、あるいはレー
ル11の上を摺動する接触子18を備えた接続導体19
にそわぞわ接続さゎている。Furthermore, there is a belt conveyor 9 on the bottom of each chamber 1 to 3, extending across each chamber, and two rails 10 and 11 extending across each chamber K are laid on the ceiling. Seal 10, 11
is made of a conductor as the power supply conductor 12, 13 in the reaction chamber, and is made of an insulator in the front, chamber, and rear chambers, each of which is formed as a continuous rail with the same cross section. The susceptors 15, which are arranged at equal intervals across the susceptors 14, are connected to connecting conductors 17 with contacts 16 that slide on the rail 1° every other time, or on the rail 11. A connecting conductor 19 with a contact 18 that
I'm fidgeting with the connection.
この装置により−て薄膜生成を行うには、先ず前室2の
正面扉を開いてベルトコンベヤ9の上の所定の位置に絶
縁体14をはさんで両画に基板前を堆付けたサセプタ1
5を垂直に立て1.!!続導体17.19の接触子16
.18をレール10および11に嵌める。次いで正面扉
を閉じて前12゛内を排気ロアより真空排気し、サセプ
タ15に内蔵したヒータに通電して基板前を所定の温度
まで加熱する。ヒータへの通電は・ンベヤ9人あるいは
別に設けた給電導体を介して行われる曇、次い!既KX
空になっている反:、:、:′。To produce a thin film using this device, first open the front door of the front chamber 2, place the susceptor 1 at a predetermined position on the belt conveyor 9 with the insulator 14 in between, and deposit the substrate front on both sides.
Stand 5 vertically 1. ! ! Contact 16 of connecting conductor 17.19
.. 18 onto the rails 10 and 11. Next, the front door is closed, the inside of the front 12' is evacuated from the exhaust lower, and the heater built in the susceptor 15 is energized to heat the front of the substrate to a predetermined temperature. The heater is energized via a conductor or a separate power supply conductor, and then! Already KX
Empty anti:,:,:′.
応皇1どの間の扉、1.4を開き、コンベヤ9を運転し
て前室2内にありたサセプタ15を反応室内に移動させ
る。この際、各サセプタ15 K @続さゎた接触子1
6あるいは18はレール10あるいは11上を摺動して
反応室内の給電導体稔あるいは”13 K達する。ここ
で反応室2内にガス導入口21より所定の真空度に達す
るまで反応ガス、例えばシランガスを導入し。Open the door 1.4 in the room of the Emperor 1, operate the conveyor 9, and move the susceptor 15 that was in the front chamber 2 into the reaction chamber. At this time, each susceptor 15 K @contact 1
6 or 18 slides on the rail 10 or 11 and reaches the power supply conductor in the reaction chamber 2 or 13 K. Here, a reaction gas such as silane gas is introduced into the reaction chamber 2 from the gas inlet 21 until a predetermined degree of vacuum is reached. Introduced.
給電導体12 、 ”’13によって**−するサセプ
タ15の間に無線周波数電圧を印加してグロー放電を発
生させて各基板前の上にアモルファスシリコンを堆積さ
せる。次いでs5を−き、コンベヤ9を運転してアモル
ファスシリコン薄膜で覆わわた基板を取付けたサセプタ
15を反応室1から後室3まで移動させる。この除、接
触子16および18も給電導体12゜13の上から摺動
して後室3内部のレール10.11の絶□縁体部分に違
する◎この後扉5を閉じ、後室a内の真空を破ってから
正面扉を開いてサセプタ15および処理済みの基板前を
堰り出1゜このような操作な繰返−tlIIには、反応
室IKおける膜生成工程の進行中に前室2におけるサセ
プタ15および基板前の挿入、°後室3におけるサセプ
タ15および基板前の販り出しを行えば、基板への薄膜
生成操作がタクト式流ね作業として連続的に行うことが
できる。A radio frequency voltage is applied between the feed conductor 12 and the susceptor 15 which is turned by 13 to generate a glow discharge to deposit amorphous silicon on the front of each substrate. The susceptor 15 with the substrate covered with the amorphous silicon thin film mounted thereon is moved from the reaction chamber 1 to the rear chamber 3. At the same time, the contacts 16 and 18 are also slid from above the power supply conductors 12 and 13. □ Insulator part of rail 10.11 inside chamber 3 ◎ After this, close the door 5, break the vacuum in the rear chamber a, open the front door, and dam the susceptor 15 and the front of the processed substrate. Repetition of such operations tlII includes insertion of the susceptor 15 and the front of the substrate in the front chamber 2 during the film production process in the reaction chamber IK, and insertion of the susceptor 15 and the front of the substrate in the rear chamber 3. If it goes on sale, thin film production operations on substrates can be performed continuously as a tact-type flow operation.
図の実施例ではサセプタ15のすべての両画に基板前を
取り付け、できるだ、け多数の基板の同時も壇を行うよ
5Kしているが、一方のサセプタbにのみ基板を取り付
け、隣接するサセプタはヒータを内蔵しない専用電極に
置き換えてもよい。この場合は給電導体12.13を介
して、、、専用電極側が正になる+5な直流電圧、を印
加してグルー放電を発生させることもできる。In the embodiment shown in the figure, the front of the board is attached to both sides of the susceptor 15, and as many boards as possible are used at the same time. The susceptor may be replaced with a dedicated electrode without a built-in heater. In this case, glue discharge can also be generated by applying a +5 DC voltage with the dedicated electrode side being positive via the power supply conductors 12, 13.
給電導体12.13間の間隔はサセプタ(電極)15−
相互間の間隔に比較して十分大きく、例えば1.5倍以
上にとっておき、給電導体間に放電が生じないよ5に−
する必要がある◎
また、図の実施例では反応室を一つとしたが、こねは必
要に応じて増加させることができる。例えばplmの3
層アモルファスシリコンを生成する場合、反応室を3意
殻け、その間を開閉可能の扉で区切り、、各室における
反応ガス成分および放電條件の制御により、必要な膜厚
のptt*n−3層を生成して、境界の扉を開いてフン
ベヤにより基板を移動させ、所望のp1m構造を積層す
る。この場合、放−電の制御のためレールは反応嵩各富
の間でも絶縁し、各反応室の給電導体を独立にしておく
ことが必要である。The distance between the feed conductors 12 and 13 is the susceptor (electrode) 15-
The distance between the two conductors should be sufficiently large, for example, 1.5 times or more, to prevent discharge from occurring between the power supply conductors.
◎ Also, in the example shown in the figure, there is one reaction chamber, but the number of kneading chambers can be increased as necessary. For example, plm 3
When producing layered amorphous silicon, the reaction chambers are divided into three shells, separated by doors that can be opened and closed, and the reaction gas components and discharge conditions in each chamber are controlled to form a PTT*n-3 layer of the required film thickness. The desired p1m structure is laminated by opening the boundary door and moving the substrate by a conveyor. In this case, in order to control the discharge, it is necessary to insulate the rail between each reaction bulk and to keep the power supply conductor of each reaction chamber independent.
本発明による装置ではフンベヤが真空にすることができ
る各室の壁を貫通して動かされる。従ってその際に貫通
部分で真空漏わが生ずる虞があるが、コンベヤの運転は
反応進行中には行わわないので、真空漏わが直接生成膜
質に影響を及ぼすことがない。In the device according to the invention, a vacuum conveyor is moved through the walls of each chamber that can be evacuated. Therefore, at that time, there is a possibility that vacuum leakage may occur at the penetrating portion, but since the conveyor is not operated during the progress of the reaction, the vacuum leakage will not directly affect the quality of the produced film.
以上説明したよう罠1本発明は反応室の前後に設けら4
た室を利用してサセプタあるいは電極と基板の挿入、薄
膜生成反石工穆、サセプタあるいは電極とでき上り基板
の取出しを反応室の真空を破ることなく順次行い、その
間をコンベヤによって移動させることにより薄膜生成の
タクト式流4作業を可能にしたもので、特に・太陽電池
用のアモルファスシリ・ン膜の量産K ill’′七て
高い運転効率によって適用することができるので、得ら
れる効果は極め【大きい。As explained above, the trap 1 of the present invention is provided before and after the reaction chamber.
The susceptor or electrode and the substrate are inserted into the reaction chamber, the susceptor or electrode and the substrate are removed one after another without breaking the vacuum of the reaction chamber, and the thin film is moved between them by a conveyor. It enables tact-type production work, and can be applied to mass production of amorphous silicon films for solar cells due to its high operating efficiency, so the effects obtained are extremely [ big.
図は本発明による薄膜生成装置の一実施例の断力1であ
る。
1・・・反応室、2・・・前室、3・・・後室、4.5
・・・扉、6.7.8・・・排気口、9・・・ベルトコ
ンベヤ、10.11・・・レール、12.13・・・給
電導体、15・・・サセプタ、16゜18・・・接触子
、加・・・基板、21・・・ガス導入口。The figure shows the shear force 1 of an embodiment of the thin film production device according to the present invention. 1... Reaction chamber, 2... Front chamber, 3... Back chamber, 4.5
... Door, 6.7.8 ... Exhaust port, 9 ... Belt conveyor, 10.11 ... Rail, 12.13 ... Power supply conductor, 15 ... Susceptor, 16°18. ...Contactor, adder...board, 21...gas inlet.
Claims (1)
グロー放電を発生さ艙、′友―意P1−に供給された反
応ガスを分解して反応ガス成分め少くとも一つ誉電極に
支持された基板上に薄膜として堆積させるものにおいて
、反応室め両側に、それぞわ開閉可能の気書扉を介して
隣−する前*軸Jび後室はそれぞれ独立して真空排気□
可能tあり、さらKi記三三重またがって可働のコシベ
ヤと、主室にまたがって敷設され前記反応室内に位置す
る部分が給電導体をなす二本のレニルとが設けられ、前
″記コンベヤ上に支持されて等間隔の銹をなす電極のそ
れぞれが前記レールの上を摺動する接触子を介して前記
給電導体のiI:# jehと接続され麺ととを特徴と
する量iaim薄膜生成装−01) Glow discharge is generated by applying a voltage between electrodes placed opposite each other in the reaction chamber, and the reaction gas supplied to P1- is decomposed and the reaction gas components are separated from at least one electrode. In cases where the film is deposited as a thin film on a substrate supported by
In addition, a conveyor movable across three layers and two wires laid across the main chamber, the portion of which is located inside the reaction chamber serves as a power supply conductor, are provided. A quantity iaim thin film production characterized in that each of the electrodes supported on and forming equally spaced electrodes is connected to the iI:#jeh of the feed conductor via a contactor sliding on the rail. Equipment-0
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56141840A JPS5843509A (en) | 1981-09-09 | 1981-09-09 | Mass-production type film fabricating device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56141840A JPS5843509A (en) | 1981-09-09 | 1981-09-09 | Mass-production type film fabricating device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5843509A true JPS5843509A (en) | 1983-03-14 |
JPS627686B2 JPS627686B2 (en) | 1987-02-18 |
Family
ID=15301368
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56141840A Granted JPS5843509A (en) | 1981-09-09 | 1981-09-09 | Mass-production type film fabricating device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5843509A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60240121A (en) * | 1984-05-15 | 1985-11-29 | Fujitsu Ltd | Horizontal-type oven |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02122459A (en) * | 1988-10-31 | 1990-05-10 | Matsushita Electric Ind Co Ltd | Cassette holder device |
-
1981
- 1981-09-09 JP JP56141840A patent/JPS5843509A/en active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60240121A (en) * | 1984-05-15 | 1985-11-29 | Fujitsu Ltd | Horizontal-type oven |
JPH0520895B2 (en) * | 1984-05-15 | 1993-03-22 | Fujitsu Ltd |
Also Published As
Publication number | Publication date |
---|---|
JPS627686B2 (en) | 1987-02-18 |
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