JPS5840800A - X-ray apparatus - Google Patents

X-ray apparatus

Info

Publication number
JPS5840800A
JPS5840800A JP13770581A JP13770581A JPS5840800A JP S5840800 A JPS5840800 A JP S5840800A JP 13770581 A JP13770581 A JP 13770581A JP 13770581 A JP13770581 A JP 13770581A JP S5840800 A JPS5840800 A JP S5840800A
Authority
JP
Japan
Prior art keywords
heating
circuit
ray
tube
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13770581A
Other languages
Japanese (ja)
Inventor
Kaoru Kurosaki
黒崎 馨
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP13770581A priority Critical patent/JPS5840800A/en
Publication of JPS5840800A publication Critical patent/JPS5840800A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05GX-RAY TECHNIQUE
    • H05G1/00X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08Electrical details
    • H05G1/26Measuring, controlling or protecting
    • H05G1/30Controlling
    • H05G1/34Anode current, heater current or heater voltage of X-ray tube

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • X-Ray Techniques (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To averte light-exposure of an X-ray film due to the unnecessary residual X-ray by shortening to the most the strating-up time of the high-voltage wave form applied onto an X-ray tube by reducing the internal impedance of the X-ray tube immediately after X-ray scanning as far as possible. CONSTITUTION:The heating voltage stabilized by a stabilizer 20 is corrected in the tube voltage by a space-charge compensating transformer 21 and applied onto the heating resistor 22 for selecting the tube current. The standard heating voltage Vf equal to the heating voltage Ve corresponding to the set tube voltage is applied onto a switching device 23, similarly in the concrete example described in the above, and Ve is applied onto the primary side of a filament heating transformer 11 by the timing signal of a timing circuit 24 during heating. The timing circuit 24 consists of a monostable multifilament vibrator circuit and the circuit which is driven so that the switching device 23 applies Vf, switched from Ve, onto the primary side of the filament heating circuit 11 only during the time when the pulse is transmitted from the monostable vibrator circuit.

Description

【発明の詳細な説明】 本発明はX線曝射時にX線管に印加される高電圧波形の
立下り特性の改善を図ったX1m装置に関するものであ
る。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an X1m device that improves the fall characteristics of a high voltage waveform applied to an X-ray tube during X-ray exposure.

従来、この神の装置、殊に大容普の診断用三相X線装置
においては、同一管電圧の条件下であうて4設定管電流
、即ちフィラメント加熱電流の大小如何によって、高電
圧波形の立下り波形が大きく異なる。即ちtXim管に
印加される管電圧が同じであうても、X@開閉器の開成
後。
Conventionally, in this divine device, especially in large-sized, ordinary diagnostic three-phase The downstream waveforms are significantly different. That is, even if the tube voltage applied to the tXim tube is the same, X @ after the switch is opened.

その高電圧波形が実質的な零電位に達するまでの立下砂
時間は、設定管電流が小さい軽負荷になるに連れ長くな
る。従うて、軽負荷ではXg開閉器の開成した以後、継
続して曝射される不必要なX1sの曝射時間が長くなる
The falling time for the high voltage waveform to reach substantially zero potential becomes longer as the set tube current becomes smaller and the load becomes lighter. Therefore, under light loads, the unnecessary exposure time of X1s, which is continuously emitted after the Xg switch is opened, becomes longer.

この高電圧波形の立下に特性の悪さは9周知のように高
圧ケーブルの浮遊容量(Cつ及びX線管球の浮遊容量(
C”;C1>>CI) K蓄積され九電荷Qが、高圧回
路の開成−6cX線管を通して放電することに起因する
。その放電カーブ、即ち高電圧波形の立下に特性は、前
記浮遊容量(C。
As is well known, the poor falling characteristics of this high voltage waveform are due to the stray capacitance of the high voltage cable (C) and the stray capacitance of the X-ray tube (C).
C";C1>>CI) K is caused by the accumulated nine charges Q discharging through the open-6C X-ray tube of the high voltage circuit. The characteristics of the discharge curve, that is, the falling edge of the high voltage waveform, are the stray capacitance. (C.

C・十〇”)及び放電時の負荷抵抗(R) Kようて決
まる。この場合、前記浮遊容量(C)は装置固有の一定
値であるが、その負荷抵抗(勅はX線管)内部インピー
ダンスに依存する丸め、設定管電流(フィラメント加熱
電流)の大小の如何にようて大きく変化する。従うて、
高圧波形の立ける最大許容管電流時に最も、短くなる。
The load resistance (R) during discharge is determined as K. Rounding depends on impedance, and changes greatly depending on the magnitude of the set tube current (filament heating current).Therefore,
It is shortest when the maximum allowable tube current is generated by the high voltage waveform.

一般に診断用X線装置においては、X線テレビジ曹ン系
を有し、X線透視にて診断部位を観察して適正撮影タイ
ンングを得、すかさずX線フィルムを待機位置から撮影
位置に高速に移動して撮影を行なう1.所謂狙撃撮影方
式を採用している。この場合、前述したよりなXll1
!撮影操作は、X線透視とX@フィルム撮影とが交互に
繰撤されることが多い、仁の場合、X線撮影指令(撮影
スイッチ閉成)が出ると同時にX線透視が停止し、直ち
にXlsフィルムが待機位置から撮影位置に向けて高速
移動を開始するようになっている。
Diagnostic X-ray equipment generally has an X-ray television system, which observes the diagnosis area using X-ray fluoroscopy to obtain the appropriate imaging angle, and quickly moves the X-ray film from the standby position to the imaging position at high speed. 1. It uses a so-called sniper shooting method. In this case, the above-mentioned
! During the imaging operation, X-ray fluoroscopy and X@film imaging are often repeated alternately. The Xls film starts moving at high speed from the standby position toward the photographing position.

従うて、この種の撮影方式においては、殆どがX線フィ
ルム撮影の直前まで、Xm管が最も軽負荷となるX線透
視が行なわれているため。
Therefore, in this type of imaging method, X-ray fluoroscopy is performed until just before X-ray film imaging, in which the Xm tube has the lightest load.

移動中のX線フィルムが撮影領域に侵入し始めると、X
線透視停止指令後に継続して曝射されているXIm、即
ち前記浮遊容量による残留X線により、少なくてもX線
フィルムの撮影領域に侵入し始めた部分が不要な感光を
受けることになる。この移動中のX線フィルムの感光は
、その後の撮影用のX1llKより形成されるXIm像
に対し、ボケ的な画質低下の要因となる。
When the moving X-ray film begins to enter the imaging area,
Due to the XIm that is continuously irradiated after the fluoroscopy stop command, that is, the residual X-rays due to the stray capacitance, at least the portion of the X-ray film that has begun to invade the imaging area will be exposed to unnecessary light. The exposure of the X-ray film during this movement causes a deterioration in image quality such as blur in the XIm image formed by X1llK for subsequent photographing.

本発明は、上記の事情を踏まえてなされたもので少なく
ともX線透視直後のx!I管の内部インビーダン−を可
及的に低下させ、X線管に印加される高電圧波形の立下
り時間を最大限に短縮し、不要な残留X1mによるX1
mフィルムの感光を1避し得るX線装置を提供すること
を目的とする。
The present invention was made based on the above circumstances, and at least x! immediately after X-ray fluoroscopy! By reducing the internal impedance of the I-tube as much as possible and maximally shortening the fall time of the high voltage waveform applied to the X-ray tube,
An object of the present invention is to provide an X-ray apparatus that can avoid exposure to m-film.

以下図面を参照して本発明の一実施例について説明する
An embodiment of the present invention will be described below with reference to the drawings.

第1図は9本発明における三相X線装置の一実施例を示
す回路図で、1GはX線管球、11は前記X線管球10
のフィラメント加熱変圧器。
FIG. 1 is a circuit diagram showing an embodiment of a three-phase X-ray apparatus according to the present invention, in which 1G is an X-ray tube, and 11 is the X-ray tube 10.
filament heating transformer.

12は半導体加熱回路である。この加熱回路12におい
て、商用交流電源13からの入力は、入力端子Psに印
加される設定された管電流に対応する加熱レベル信号に
よりて制御・変換されフィラメント加熱制御電力として
前記フィラメント加熱変圧器11に印加される0図中1
゜〜几、は抵抗、VR紘可変抵抗、Cはコ弐ンサ、Dは
ダイオード、14Fi比較器、N1 。
12 is a semiconductor heating circuit. In this heating circuit 12, input from a commercial AC power source 13 is controlled and converted by a heating level signal corresponding to a set tube current applied to an input terminal Ps, and is converted into filament heating control power to the filament heating transformer 11. 1 in 0 applied to
゜~几 is a resistor, VR variable resistor, C is a capacitor, D is a diode, 14Fi comparator, N1.

はNORゲート、l鍬インバータ、16はアナログスイ
ッチ、17は加算増幅器である。
16 is an analog switch, and 17 is a summing amplifier.

前記設定された管電流に対応し九レベルの加熱信号が入
力端子P、に印加されると、その信号は抵抗R1を通う
て抵抗R,,R4,可変抵抗VBによりて作られた基準
の加熱レベルと比較器14にようて比較され、そのレベ
ルの差の分だけが反転増幅されて、アナログスイッチ1
6の入力として印加される。
When a nine-level heating signal corresponding to the set tube current is applied to the input terminal P, the signal passes through the resistor R1 to the reference heating created by the resistors R, , R4 and the variable resistor VB. The level is compared with the comparator 14, and only the difference in level is inverted and amplified, and the analog switch 1
6 is applied as an input.

ま九、NORゲー)N11N!#抵抗R5t Rs t
コンデンサーCにて構成される回路は単安定マルチバイ
ブレータ−であり、入力信号の立ち上9のエツジをとら
えて凡、とCの時定数で決定される幅のパルス出力を取
り出す回路である。
Maku, NOR game) N11N! #Resistance R5t Rs t
The circuit constituted by the capacitor C is a monostable multivibrator, which captures the rising edge of the input signal and extracts a pulse output having a width determined by the time constant of C.

次に第2図のタイ建ングチャートを参照に加えて本発明
の動作について説明する。
Next, the operation of the present invention will be explained with reference to the tie-setting chart of FIG.

まず、入力端子P、に、第2図Vp、で示されるよりな
X@曝射信号が印加されると、この立ち上多のエツジ、
すなわちxIII曝射終了のタイ建ングで単安定マルチ
バイブレータ−回路が駆動され、第2図Vp4に示され
る様な出力パルスを発生する。この信号はアナログスイ
ッチ16のコントロール入力に印加され、アナログスイ
ッチ16はこのパルス幅(1,−14)間だけ“ON@
状態となり前述の比較器14の出力信号を加算増幅器1
7に印加する。
First, when a higher X@ exposure signal shown in FIG. 2 Vp is applied to the input terminal P, the edge of this rising edge,
That is, the monostable multivibrator circuit is driven at the tie-setting at the end of the xIII exposure, and generates an output pulse as shown in FIG. 2 Vp4. This signal is applied to the control input of the analog switch 16, and the analog switch 16 is "ON@" only during this pulse width (1, -14).
state, and the output signal of the comparator 14 mentioned above is added to the summing amplifier 1.
7.

壕九、P、は半導体加熱回路の設定加熱レベル入力端子
であり、この入力信号によって加熱回路12からフィラ
メント加熱変圧器11に印加されるフィラメント加熱制
御電力が制御される。し九がうてP、に社通常は選択さ
れた管電流に対応し九レベルの加熱信号が印加され(第
2図Vp 1 oVa ) s X ill@射終了後
、アナpグスイッチ16が@ON”状態の期間(T、−
T4間)だけは、Vaに比較器14からの出力信号(Δ
V)を加算増幅器17で加算増幅した信号が印加される
ことになる。つまりこの期間だけは軽負荷時(透視時)
では9選択された管電流には無関係に比較器14でのR
,、R4,VRにて設定された基準レベルの加熱信号が
tPsに印加されることになる。
Trench 9, P, is a set heating level input terminal of the semiconductor heating circuit, and the filament heating control power applied from the heating circuit 12 to the filament heating transformer 11 is controlled by this input signal. Normally, a heating signal of 9 levels corresponding to the selected tube current is applied (Fig. 2 Vp 1 oVa) After the irradiation is completed, the analog pg switch 16 is turned ON. ``Duration of state (T, -
T4) is the output signal from the comparator 14 (Δ
A signal obtained by adding and amplifying V) by the summing amplifier 17 is applied. In other words, only during this period is light load (during fluoroscopy)
Then, R at the comparator 14 is independent of the selected tube current.
, R4, and the reference level heating signal set at VR is applied to tPs.

また、入力端子P0には半導体加熱回路12を駆動させ
る信号、すなわち実際に撮影のためのフィラメントの本
加熱の開始、終了を制御する信号が印加される0通常X
ll制御器には9本加熱のボタンを押しつづける限り本
加熱が実施される術式と、X線曝射終了と同時に自動的
に本加熱が切れる術式がある。したがって第2図のVp
sに示されるようにX線曝射終了と同時に加熱回路駆動
信号が切れる場合には、インバータ15とNORゲート
N3によりて構成される回路によりてt X II 曝
射終了後単安定マルチバイブレータの出力パルス信号の
幅だけ本加熱が持続される。(第2図*Vp@) また、フィラメント加熱変圧器110入力端子P、には
、加熱回路12からの管球フィラメント加熱の制御出力
信号、すなわち管電流制御信号が印加される。第2図の
Vp  で示される通り、最初vb−の値にようてX線
管球10のフィラメントコイルが予備加熱されており1
時刻音、すなわち本加熱開始のタインングで選択された
管電流に対応する加熱レベルVCまで増大する。X@曝
射が終了した時点(時刻1.)で加熱レベルは選択され
た管電流に無関係に基準レベルVdまで持ち上に1時刻
t、にて再び予備加熱レベルに戻や9次回の曝射を待つ
Further, a signal for driving the semiconductor heating circuit 12, that is, a signal for controlling the start and end of main heating of the filament for actual imaging, is applied to the input terminal P0.
There are two types of controllers: one in which main heating is performed as long as the nine heating buttons are held down, and the other in which main heating is automatically turned off as soon as X-ray exposure ends. Therefore, Vp in Figure 2
When the heating circuit drive signal is cut off at the same time as the end of X-ray exposure as shown in s, the output of the monostable multivibrator after the end of t The main heating is continued for the width of the pulse signal. (Fig. 2 *Vp@) Further, a control output signal for heating the tube filament from the heating circuit 12, that is, a tube current control signal, is applied to the input terminal P of the filament heating transformer 110. As shown by Vp in FIG. 2, the filament coil of the X-ray tube 10 is initially preheated according to the value of vb-.
The heating level increases to the heating level VC corresponding to the tube current selected at the time tone, that is, the tinging of the main heating start. At the end of X@ exposure (time 1.), the heating level is raised to the reference level Vd regardless of the selected tube current, and at time t, it is returned to the preheating level again for the 9th exposure. wait.

本発明は、前記一実施例に限定されるものではなく1例
えば、加熱回路が抵抗加熱の場合でも曝射終了のタイミ
ングでフィラメント加熱変圧器の一次側の電流を基準レ
ベルに変化させるととにようて、適用可能である。その
具体例を第3図に示す。
The present invention is not limited to the above-mentioned embodiment.1 For example, even if the heating circuit is resistance heating, the current on the primary side of the filament heating transformer can be changed to the reference level at the timing of the end of exposure. Therefore, it is applicable. A specific example is shown in FIG.

20はスタビライず−、21は空間電荷補償は切換器、
24は切換器23の切換のタイミングの信号を発生させ
るタイミング回路である。
20 is a stabilizer, 21 is a space charge compensation switch,
A timing circuit 24 generates a switching timing signal for the switching device 23.

前記スタビライザー20によりて安定化された加熱電圧
は、空間電荷補償変圧器21によりて管電圧補正され、
管電流選定用の加熱抵抗器22に印加される。切換器2
3には、設定された管電流に対応した加熱電圧Veと前
述の具体例と同様の基準加熱電圧Vfが印加され、タイ
ミング回路24のタイミング信号によって9本加熱中は
Veがフィラメント加熱変圧器11の1次側に印加され
、陽射終了のタイミングで■が印加される。
The heating voltage stabilized by the stabilizer 20 is corrected for tube voltage by a space charge compensation transformer 21,
It is applied to the heating resistor 22 for tube current selection. Switcher 2
A heating voltage Ve corresponding to the set tube current and a reference heating voltage Vf similar to the above-mentioned example are applied to the filament heating transformer 11 . is applied to the primary side of , and ■ is applied at the timing of the end of sunlight.

タイミング回路24は、前述の具体例の単安定マルチバ
イブレータ−回路と、そのパ羨ス間だけ切換器23がV
eからVfをフィラメント加熱変圧器11の1次側に印
加するように駆動させる回路から成うている。
The timing circuit 24 includes the monostable multivibrator circuit of the above-mentioned specific example, and the switching circuit 23 which is set to V only between its paths.
It consists of a circuit that drives so as to apply Vf from e to the primary side of the filament heating transformer 11.

以上詳述した如く本発明によれば、管電流の違いによる
X線管球の放電特性を改善し、精度の高い撮影時間の制
御を行ない得るX線装置を擾供することができるもので
ある。
As described in detail above, according to the present invention, it is possible to provide an X-ray apparatus that can improve the discharge characteristics of the X-ray tube due to differences in tube current and can control the imaging time with high precision.

尚9本発明は、上記した一実施例に限定される4のでは
なく9本発明の要旨を変更しない範囲で、適宜変形して
実施得ることは勿論である。
It should be noted that the present invention is not limited to the one embodiment described above, but can of course be implemented with appropriate modifications within the scope of the present invention without changing the gist of the present invention.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例を示すブロック図第2図は第
11のタイ建ングチャート、第3図は本発明の他の実施
例を示すブロック図である。 i o −−−−−X線管球、 11−・・−フィラメ
ント加熱変圧器、12−・・−半導体加熱回路、 13
−−−−−−・・・商用交流電源、14−−−比較器、
15・・・−インバータ、16−・−・アナログスイッ
チ、 17−・・加算増幅器、20−−−スタビライザ
ー、 21−・・空間電荷補償変圧器、22−−一管電
流選定用加熱抵抗器、23−・−切換器、24−・・−
タイミング回路、R4〜R,−−−抵抗、 V R−−
−−−可変抵抗、N□〜N 5−−−−No几ゲート代
理人弁理士 則近憲佑 ほか1名
FIG. 1 is a block diagram showing one embodiment of the present invention. FIG. 2 is a block diagram showing an eleventh tie-setting chart, and FIG. 3 is a block diagram showing another embodiment of the present invention. i o ----X-ray tube, 11-...-filament heating transformer, 12-...-semiconductor heating circuit, 13
------ Commercial AC power supply, 14--- Comparator,
15--inverter, 16--analog switch, 17--summing amplifier, 20--stabilizer, 21--space charge compensation transformer, 22--heating resistor for tube current selection, 23-...-switcher, 24-...-
Timing circuit, R4~R, ---resistance, V R--
---Variable resistance, N□~N 5-----No.Gate representative patent attorney Norichika Kensuke and one other person

Claims (1)

【特許請求の範囲】 X線管球と、このX線管球のフィラメントを加熱する加
熱回路と、この加熱回路に切換器を介して接続された透
視用加熱信号を印加する回路ならびに撮影用加熱信号を
印加する回路と。 前記切換器がX線曝射信号により透視から撮影に切換え
られたときフィラメントをある一定レベルまで予備加熱
する回路と、この予備加熱期間と撮影加熱期間のタイミ
ングを制御する回路とからなるX線装置。
[Claims] An X-ray tube, a heating circuit that heats the filament of the X-ray tube, a circuit that applies a heating signal for fluoroscopy connected to this heating circuit via a switch, and heating for imaging. and the circuit that applies the signal. An X-ray device comprising: a circuit that preheats the filament to a certain level when the switch is switched from fluoroscopy to radiography in response to an X-ray exposure signal; and a circuit that controls the timing of the preheating period and the radiography heating period. .
JP13770581A 1981-09-03 1981-09-03 X-ray apparatus Pending JPS5840800A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13770581A JPS5840800A (en) 1981-09-03 1981-09-03 X-ray apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13770581A JPS5840800A (en) 1981-09-03 1981-09-03 X-ray apparatus

Publications (1)

Publication Number Publication Date
JPS5840800A true JPS5840800A (en) 1983-03-09

Family

ID=15204887

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13770581A Pending JPS5840800A (en) 1981-09-03 1981-09-03 X-ray apparatus

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111063471A (en) * 2019-12-13 2020-04-24 北方夜视技术股份有限公司 Angel type lobster eye X-ray focusing optical device and preparation and detection method thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111063471A (en) * 2019-12-13 2020-04-24 北方夜视技术股份有限公司 Angel type lobster eye X-ray focusing optical device and preparation and detection method thereof

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