JPS583972A - Pattern working device - Google Patents
Pattern working deviceInfo
- Publication number
- JPS583972A JPS583972A JP56102901A JP10290181A JPS583972A JP S583972 A JPS583972 A JP S583972A JP 56102901 A JP56102901 A JP 56102901A JP 10290181 A JP10290181 A JP 10290181A JP S583972 A JPS583972 A JP S583972A
- Authority
- JP
- Japan
- Prior art keywords
- work
- shutter
- laser
- metal oxide
- metal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/04—Coating on selected surface areas, e.g. using masks
- C23C14/042—Coating on selected surface areas, e.g. using masks using masks
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
Abstract
Description
【発明の詳細な説明】
本発明はパターン加工装置に係)、特にガラス板等の基
板に加工された金属・リーン中の剥離部分を加工するた
めの・臂ターン加工装置に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a pattern processing apparatus, and more particularly to an arm turn processing apparatus for processing a peeled part in a metal lean processed on a substrate such as a glass plate.
従来からガラス板等の基板上に金属又は金属酸化物をノ
臂ターニングするフォトマスク或はレティクルパターン
を修正する方法として第1図に示すように基板1に所定
形状のノリーン2をパターニングした際に上記パターン
2外の不用のノfターン3が形成された場合には該不用
パターン3部分にレーザ等の熱線4f照射することによ
って不用ノJ?ターン3は簡単に除去することが出来る
。Conventionally, as a method for modifying a photomask or reticle pattern by turning a metal or metal oxide on a substrate such as a glass plate, as shown in FIG. If an unnecessary no-f turn 3 other than the above-mentioned pattern 2 is formed, the unnecessary no-J? Turn 3 can be easily removed.
然し第2図(4)(B)に示すように基板1上に金属等
の・量ターン2を形成した中に欠落部5を含むような場
合にはこの欠落部を修正するためには工程的にはかなシ
複雑な修正を必要とした。However, as shown in FIG. 2(4)(B), if a cutout part 5 is included in the metal turn 2 formed on the substrate 1, a process is required to correct the cutout part. However, it required some complex modifications.
即ち第3図(4)〜(D)に示すように欠落部5を有す
る金属パターン2上にレジスト材6を塗布したのち、欠
落部5部分のレジスト6を光線7で現像処理させて(第
2図(B))光線7を当てた部分のレジスト材を取シ去
って金属8をレジスト6の上面に蒸着させて(第3図(
C5)次にレジスト6を剥離すると欠落部5には金属8
aが残って基板1上の金属又は金属酸化物の欠落部が補
充されて修正が完了する。That is, as shown in FIGS. 3(4) to 3(D), a resist material 6 is applied onto the metal pattern 2 having the missing portions 5, and then the resist 6 in the missing portions 5 is developed with a light beam 7. Figure 2 (B)) The resist material in the area irradiated with the light beam 7 is removed, and the metal 8 is deposited on the upper surface of the resist 6 (Figure 3 (B)).
C5) Next, when the resist 6 is peeled off, there is a metal 8 in the missing part 5.
a remains, and the missing portion of the metal or metal oxide on the substrate 1 is replenished, completing the repair.
然し、このような工程での薔加工物の修正は多くの時間
と工数を要する欠点があった。However, the correction of the rose workpiece in such a process has the disadvantage that it requires a lot of time and man-hours.
本発明は叙上の如き欠点を除いたパターン加工装置を提
供するものであり、その特徴とするところは真空容器内
に上記級加工物を配しシャッタを介して金属等の蒸着物
をレーザによって熔融はせ、被加工物の欠落部に金属の
溶融物を蒸着させるようにした・2ターン加工装置にあ
る。The present invention provides a pattern processing apparatus that eliminates the above-mentioned drawbacks, and its feature is that the above-mentioned workpiece is placed in a vacuum container, and a vapor deposit of metal or the like is removed using a laser through a shutter. This is a two-turn processing device that deposits molten metal onto the missing parts of the workpiece.
以下本発明の1実施例を図面について詳記する。An embodiment of the present invention will be described in detail below with reference to the drawings.
第4図は本発明の・ぐターン加工装置の路線的側断面図
を示すものであシ、真空容器9内にフォトマスク又はレ
ティクル等の被加工物10が配され該被加工物はガラス
等の基板1に金属又は金属酸化物等により彦るパターン
2が形ル′されている。被加工物10には欠落部5のあ
るノ々ターンが・千ター;ングされている。被加工物l
Oは加工載置台12上に被加工物挿入口9bよシ挿入す
る。FIG. 4 shows a cross-sectional side view of the pattern processing apparatus of the present invention, in which a workpiece 10 such as a photomask or a reticle is arranged in a vacuum container 9, and the workpiece is a glass or the like. A pattern 2 made of metal, metal oxide, etc. is formed on a substrate 1. The workpiece 10 has thousands of turns with missing parts 5. Workpiece l
O is inserted onto the processing table 12 through the workpiece insertion opening 9b.
被加工物10と対向する位置に顕微鏡などよシなる観察
系11が容器9上部に固定され、上記被加工物10のパ
ターン2がガラス基板1を通じて観察される。An observation system 11 such as a microscope is fixed to the upper part of the container 9 at a position facing the workpiece 10, and the pattern 2 of the workpiece 10 is observed through the glass substrate 1.
9aは容器9内のエアを排気させるための排気口であシ
、9cけ排気弁である。9a is an exhaust port for exhausting the air inside the container 9, and 9c is an exhaust valve.
13けシャッタであシ真空容器9の外部に排出された調
整摘み】5によって該シャッタ13は操作レバー14を
通じて開口1.Xl整がなされる。The shutter 13 is opened through the operating lever 14 by the adjustment knob 5 which is discharged to the outside of the vacuum container 9. Xl adjustment is made.
16け金属酸化物等の蒸着物で蒸着物保持台17に蒸着
物が保持されている。蒸着物保持台は溝18に沿ってA
−A方向に摺動される。A vapor deposited material is held on a vapor deposited material holding table 17 using a vapor deposited material such as metal oxide. The deposit holding table is placed along the groove 18 at A
- It is slid in the A direction.
19けスプリングであシ、容器9の外側に排出した螺子
20が母螺の形成された螺子骨22と螺合され、容器外
に排出した螺子20に摘み21が固定されている。With the spring 19, the screw 20 discharged to the outside of the container 9 is screwed together with the screw bone 22 on which the host screw is formed, and the knob 21 is fixed to the screw 20 discharged to the outside of the container.
螺子20の先端は蒸着物保持台17にスプリング19に
抗して対接されている。The tip of the screw 20 is brought into contact with the deposit holding table 17 against the spring 19.
23は容器9の底部に固定したガラス等の透明板であり
、レーザ装置24げ容器9外にガラス等の透明板23と
対向して配されている。A transparent plate 23 made of glass or the like is fixed to the bottom of the container 9, and a laser device 24 is placed outside the container 9 facing the transparent plate 23 made of glass or the like.
シャッタ13は例えば第5図に示す如く4つのシャッタ
板13a、13b、13c、13dを組み合せて互にシ
ャッタ板13a、13dと13c。For example, the shutter 13 is made by combining four shutter plates 13a, 13b, 13c, and 13d as shown in FIG.
13dがB−B及びC−C方向に摘み15の回動によっ
て摺動するようにされシャツタ開口部25の大きさをμ
オーダで微調整出来る構成である。13d is slid in the B-B and C-C directions by rotating the knob 15, and the size of the shirt opening 25 is determined by μ.
It has a configuration that can be finely adjusted to order.
本発明のパターン加工装置は上述の如く構成されている
ので、炭酸ガス又はヤグレーザ装置24よシ放出された
レーザ24&は透明板23を通じて金属酸化物又は金属
等の蒸着物16を熔融して金属酸化物を飛散させる。Since the pattern processing apparatus of the present invention is configured as described above, the laser 24 & emitted from the carbon dioxide or YAG laser device 24 melts the metal oxide or metal vapor deposit 16 through the transparent plate 23 to oxidize the metal. scatter things.
飛散した金属酸化物はシャッタ13の開口25を通じて
被加工物10のパターン2の欠落部に充填されるように
蒸着される。The scattered metal oxide is deposited through the opening 25 of the shutter 13 so as to fill the missing part of the pattern 2 of the workpiece 10.
被加工物10は観察系によって載置台の所定位置に正し
く配置される。又摘み15.21によってシャッタ13
の開口部の大きさの制御衣らびに蒸着物16がレーザ光
によって正しく照射されるよう々制御がなされ、且つ容
器9内は排気口を通じてエアを抜き真空状態で欠落部へ
の蒸着がガされることは勿論である。The workpiece 10 is correctly placed at a predetermined position on the mounting table by the observation system. Also, the shutter 13 is set by the knob 15.21.
The size of the opening of the container 9 is controlled so that the vapor deposited material 16 is properly irradiated with the laser beam, and air is removed from the inside of the container 9 through the exhaust port, and the vapor deposition is carried out in the missing parts in a vacuum state. Of course.
本発明は上述の如く構成させ、且つ動作させたので、第
3図に示したような多くの工程を必要とする化学的な修
正方法に比べて極めて短時間に欠落部の修正を何回も行
うことが出来る特゛徴を有するものである。Since the present invention is constructed and operated as described above, it is possible to repair missing parts many times in an extremely short time compared to the chemical repair method that requires many steps as shown in FIG. It has the characteristic that it can be carried out.
(5)(5)
第1図は従来の不用パターン除去方法を説明するための
基板平面図、第2図(A) (B) H従来のパターン
中に欠落部を生じた場合の基板の平面図と側断面図、第
3図(N〜Φ)は従来の・Pターン中の欠落部全修正す
る工程を説明する基板側断面図、第4図は本発明のノ4
ターン加工装置の路線的側断面図、第5図は第4図に示
すシャッタの構造を示す路線的斜視図である。
1・・・基板、2・・・パターン、3・・・不用のパタ
ーン、4・・・熱線、5・・・欠落部、6・・・レゾス
ト材、8・・・金属、9・・・真空容器、10・・・被
加工物、11・・・観察系、13・・・シャッタ、16
・・・蒸着物、24・・・レーザ。
特許出願人 富士通株式会社
(6)FIG. 1 is a plan view of a substrate for explaining a conventional unnecessary pattern removal method, FIGS. Fig. 3 (N to Φ) is a sectional side view of the board illustrating the conventional process of repairing all the missing parts in the P-turn, and Fig. 4 is the No. 4 of the present invention.
FIG. 5 is a cross-sectional side view of the turning device, and FIG. 5 is a perspective view showing the structure of the shutter shown in FIG. 4. DESCRIPTION OF SYMBOLS 1... Substrate, 2... Pattern, 3... Unnecessary pattern, 4... Hot wire, 5... Missing part, 6... Resist material, 8... Metal, 9... Vacuum container, 10... Workpiece, 11... Observation system, 13... Shutter, 16
...Vapor deposit, 24...Laser. Patent applicant Fujitsu Limited (6)
Claims (1)
置台を設け、該真空容器内の加工載置台と対向して観察
系を、蒸着物載置台に対向して観察Xを、蒸着物載置台
に対向しガラス板等の透明板を設け、上記透明板を通じ
てレーザービーム等の熱線を照射するようにしてなるパ
ターン加工装置。A processing mounting table, a shutter device, and a deposited material mounting table are provided in the vacuum container, and an observation system is placed opposite the processing mounting table in the vacuum container, an observation system A pattern processing device in which a transparent plate such as a glass plate is provided opposite to a mounting table, and a heat ray such as a laser beam is irradiated through the transparent plate.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56102901A JPS6049896B2 (en) | 1981-06-30 | 1981-06-30 | Photomask pattern correction equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56102901A JPS6049896B2 (en) | 1981-06-30 | 1981-06-30 | Photomask pattern correction equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS583972A true JPS583972A (en) | 1983-01-10 |
JPS6049896B2 JPS6049896B2 (en) | 1985-11-05 |
Family
ID=14339758
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56102901A Expired JPS6049896B2 (en) | 1981-06-30 | 1981-06-30 | Photomask pattern correction equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6049896B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6648997B2 (en) | 2000-07-26 | 2003-11-18 | The Boc Group, Plc | Quenching method |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6242895U (en) * | 1985-09-03 | 1987-03-14 |
-
1981
- 1981-06-30 JP JP56102901A patent/JPS6049896B2/en not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6648997B2 (en) | 2000-07-26 | 2003-11-18 | The Boc Group, Plc | Quenching method |
Also Published As
Publication number | Publication date |
---|---|
JPS6049896B2 (en) | 1985-11-05 |
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