JPS5836046Y2 - Transistor thermometer probe - Google Patents
Transistor thermometer probeInfo
- Publication number
- JPS5836046Y2 JPS5836046Y2 JP1943179U JP1943179U JPS5836046Y2 JP S5836046 Y2 JPS5836046 Y2 JP S5836046Y2 JP 1943179 U JP1943179 U JP 1943179U JP 1943179 U JP1943179 U JP 1943179U JP S5836046 Y2 JPS5836046 Y2 JP S5836046Y2
- Authority
- JP
- Japan
- Prior art keywords
- transistor
- case
- chip
- cable
- terminal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Measuring Temperature Or Quantity Of Heat (AREA)
Description
【考案の詳細な説明】
本考案は、トランジスタ温度計のプローブに関するもの
である。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a probe for a transistor thermometer.
トランジスタの■ｂｅに温度依存性があることを利用し
て、トランジスタを温度センサとした温度計が実用化さ
れている。Thermometers using transistors as temperature sensors have been put into practical use by taking advantage of the temperature dependence of the .beta. of transistors.
本考案はこのようにトランジスタを温度センサとする温
度計のプローブを測定器、或いは記録計の端子の温度を
計るのに適するようにその構造に改良をカロえたもので
ある。In this way, the present invention has improved the structure of a thermometer probe using a transistor as a temperature sensor to make it suitable for measuring the temperature of the terminal of a measuring device or a recorder.
第１図は本考案に係るプローブの上面図、第２図は第１
図の側面図、第３図は第１図の拡大断面図である。Fig. 1 is a top view of the probe according to the present invention, and Fig. 2 is a top view of the probe according to the present invention.
The side view in the figure, FIG. 3, is an enlarged sectional view of FIG. 1.
第１図及び第３図において、１０はセンサ用のトランジ
スタで、これには市販品（例えばＴ−１８形）が用いら
れている。In FIGS. 1 and 3, 10 is a transistor for a sensor, and a commercially available product (for example, T-18 type) is used for this.
２０は銅で作ったチップで、その頭部２１には被測定端
子が挿入される穴２２が形成されている。Reference numeral 20 denotes a chip made of copper, and its head 21 has a hole 22 formed therein into which a terminal to be measured is inserted.
このチップの展開図は第４図のＡに示す如くもので、そ
の脚部２３を同図Ｂの如く丸く形成したものである。The developed view of this chip is as shown in A of FIG. 4, and the leg portion 23 is rounded as shown in B of the same figure.
なお、頭部２１には第４図のＣに示す如く切欠き２４を
形成するようにしても良い。Note that a notch 24 may be formed in the head 21 as shown in FIG. 4C.
３０はベークのような熱絶縁材で作った円筒状のケース
で、端に段部３１を有する。Reference numeral 30 denotes a cylindrical case made of a heat insulating material such as baking powder, and has a stepped portion 31 at the end.
４０はケーブル、５０は金属で作った円筒状のケーブル
押え、６０はエポキシ、７０はカバーである。40 is a cable, 50 is a cylindrical cable holder made of metal, 60 is epoxy, and 70 is a cover.
このような各部材からなる本考案の装置において、その
製作順序は次の通りである。The manufacturing order of the device of the present invention, which is composed of such various members, is as follows.
先ずケーブル４０にカバー７０とケーブル押え５０を挿
通したのち、トランジスタ１０の端子１１〜１３にケー
ブル４０の一端をそれぞれ半田付けし、トランジスタ１
０とケーブル押え５０の間の長さを所定値に決めてから
ケーブル押え５０をかしめ、カバー７０を装着する。First, after inserting the cover 70 and the cable holder 50 into the cable 40, one end of the cable 40 is soldered to each of the terminals 11 to 13 of the transistor 10, and the transistor 1
0 and the cable holder 50 to a predetermined value, the cable holder 50 is caulked, and the cover 70 is attached.
次にチップ２０の脚部２３をケース３０の段部３１に嵌
合させたのち、ケース３０の内部にトランジスタ１０の
頭部がケース３０の段部３１を突抜け、そのベース１４
が段部３１に押し当てるように挿入すると共に、ケーブ
ル押え５０をケース３０に接着剤で固定する。Next, after fitting the legs 23 of the chip 20 into the step 31 of the case 30, the head of the transistor 10 penetrates through the step 31 of the case 30 inside the case 30, and the base 14 of the transistor 10 is inserted into the case 30.
is inserted so as to press it against the stepped portion 31, and the cable presser 50 is fixed to the case 30 with adhesive.
しかるのち、チップ２０の脚部２３で形成される穴２５
（第４図Ｂ）にエポキシ６０を充填し、チップ２０をケ
ース３０に固定する。Thereafter, the holes 25 formed by the legs 23 of the chip 20
(FIG. 4B) is filled with epoxy 60 and the chip 20 is fixed to the case 30.
このような構成の本考案のプローブにおいては、プロー
ブの先端にチップを用いたことにより、測定器或いは記
録計器等の端子の温度を測定する場合に、この端子に取
付けて測定することができるので好適である。In the probe of the present invention having such a configuration, by using a tip at the tip of the probe, when measuring the temperature of the terminal of a measuring instrument or recording instrument, etc., it can be attached to the terminal for measurement. suitable.
しかも、ケース３０はトランジスタ１０の端子接続部を
保護するものであるが、このケースをベークのような熱
絶縁材で構成したので、被測定端子にプローブを取付け
る際にそのプローブを手で持った時に受ける熱外乱がセ
ンサに影響を与えないものとすることができる。Moreover, the case 30 protects the terminal connection part of the transistor 10, and since this case is made of a heat insulating material such as baked goods, it is difficult to hold the probe by hand when attaching it to the terminal to be measured. Thermal disturbances that sometimes occur do not affect the sensor.
又、鋼材のチップも必要最小限の質量にして全体の熱容
量を小さくすることにより、被測定端子に取付けられた
ときの熱応答時定数を短かくすることができる。Furthermore, by reducing the overall heat capacity by reducing the mass of the steel chip to the minimum necessary, the thermal response time constant when attached to the terminal to be measured can be shortened.
更に、トランジスタ１０の金属カバーとチップ２０の間
は絶縁されている必要があると共に、この間のギャップ
は熱的に等化であることが望ましいが、本考案のプロー
ブにおいてはケース３０とチップ２０の間の位置決めは
一義的に定まるので、その間の接触は起こらず、又その
間のギャップを熱伝導の良いエポキシ６０を充填するよ
うにしたので、被測定の端子温度とセンサトランジスタ
１０間の温度等化が計られる等、実用に供して種々効果
のあるプローブが得られる。Furthermore, it is necessary to insulate the metal cover of the transistor 10 and the chip 20, and it is desirable that the gap between them is thermally equalized, but in the probe of the present invention, the gap between the case 30 and the chip 20 is Since the positioning between them is uniquely determined, no contact occurs between them, and since the gap between them is filled with epoxy 60 having good thermal conductivity, the temperature between the terminal temperature to be measured and the sensor transistor 10 is equalized. Probes with various practical effects can be obtained, such as being able to measure
第１図は本考案に係るプローグの上面図、第２図は第１
図の側面図、第３図は第１図の縦断面図、第４図は本考
案に用いられるチップの構成説明図である。
１０・・・トランジスタ、２０・・・チップ、３０・・
・ケース、４０・・・ケーブル、５０・・・ケーブル押
え、６０・・・エポキシ、７０・・・カバー。Figure 1 is a top view of the prologue according to the present invention, and Figure 2 is a top view of the prologue according to the present invention.
3 is a longitudinal sectional view of FIG. 1, and FIG. 4 is an explanatory diagram of the structure of the chip used in the present invention. 10...transistor, 20...chip, 30...
- Case, 40... Cable, 50... Cable holder, 60... Epoxy, 70... Cover.
Claims (1)
、前記段部に押し当てるように前記ケース内に挿入され
るトランジスタ、一端がトランジスタの端子に接続され
、他端が前記ケース内を通って外部に導出されるケーブ
ル、及び、その脚部が前記ケースの段部に結合されるチ
ップを具備し、このチップの脚部と前記トランジスタの
間にエポキシを充填するようにしたトランジスタ温度計
。A cylindrical case made of a thermally insulating material and having a stepped portion at one end, a transistor inserted into the case so as to press against the stepped portion, one end connected to a terminal of the transistor, and the other end connected to the inside of the case. A transistor thermometer, comprising: a cable extending through the cable to the outside; and a chip, the leg of which is coupled to the step of the case, and epoxy is filled between the leg of the chip and the transistor. .
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1943179U JPS5836046Y2 (en) | 1979-02-16 | 1979-02-16 | Transistor thermometer probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1943179U JPS5836046Y2 (en) | 1979-02-16 | 1979-02-16 | Transistor thermometer probe |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS55119944U JPS55119944U (en) | 1980-08-25 |
| JPS5836046Y2 true JPS5836046Y2 (en) | 1983-08-13 |
Family
ID=28848515
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1943179U Expired JPS5836046Y2 (en) | 1979-02-16 | 1979-02-16 | Transistor thermometer probe |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5836046Y2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59149036U (en) * | 1983-03-25 | 1984-10-05 | 横河電機株式会社 | Isothermal plate for terminal temperature measurement |
| JP6756342B2 (en) * | 2018-04-03 | 2020-09-16 | Tdk株式会社 | Temperature sensor device |
-
1979
- 1979-02-16 JP JP1943179U patent/JPS5836046Y2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS55119944U (en) | 1980-08-25 |
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