JPS5833117A - Electronic measuring device provided with accuracy display - Google Patents
Electronic measuring device provided with accuracy displayInfo
- Publication number
- JPS5833117A JPS5833117A JP13109981A JP13109981A JPS5833117A JP S5833117 A JPS5833117 A JP S5833117A JP 13109981 A JP13109981 A JP 13109981A JP 13109981 A JP13109981 A JP 13109981A JP S5833117 A JPS5833117 A JP S5833117A
- Authority
- JP
- Japan
- Prior art keywords
- accuracy
- measured
- measurement
- measured value
- electronic measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D7/00—Indicating measured values
- G01D7/02—Indicating value of two or more variables simultaneously
Abstract
Description
【発明の詳細な説明】
本発明は、測定確度の表示機能を具えた電子測定器に関
する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an electronic measuring instrument equipped with a measurement accuracy display function.
一般に電子測定器の確度(accuracy)とは、規
定された状態において動作する機器の測定値に対し、製
造業者が明示した誤差の限界値である。この確度は上位
の標準器によって校正され、そして国家標準に対するト
レーサビリティ−によって確立されている。一方、電子
測定器においては、測定対象の多様化とともに被測定物
に与える測定パラメータ(例えば測定周波数、測定レベ
ル等)を連続的に変化せしめている。このような測定器
においては、測定パラメータの変化に応じてその測定値
に対する確度も変化する。In general, the accuracy of an electronic measuring instrument is the limit value of error specified by the manufacturer for the measured value of the instrument operating under specified conditions. This accuracy is calibrated by superior standards and established by traceability to national standards. On the other hand, in electronic measuring instruments, measurement parameters (eg, measurement frequency, measurement level, etc.) applied to the measurement object are continuously changed as the objects to be measured become more diverse. In such a measuring instrument, the accuracy of the measured value also changes as the measurement parameter changes.
実際に、被測定対象(例えばり、O,Rのような回路素
子)の測定量が変化したり、又は測定パラメータが変化
した場合に各測定点における確度は、測定回路の測定信
号レベル対ノイズ比や使用周線数帯域における回路の周
波数特性等を解析し、そして測定パラメータの変化によ
る測定回路の誤差の変化量を近似式で表わし、更にこれ
を基に測定パラメータ、又は測定量の変化による確度を
近似式で求めていた。したがって、すべての測定点にお
ける確度を求める場合、各点における測定値(測定量)
と被測定対象に与える測定パラメータDデータを近似式
に代入して計算して(へたが、上記の近似式が複雑にな
ればなるほどその計算工数が増加して確度を知ることは
困難である。In fact, when the measured quantity of the object under test (for example, circuit elements such as O and R) changes or the measurement parameters change, the accuracy at each measurement point is the measurement signal level of the measurement circuit versus the noise. Analyze the ratio and the frequency characteristics of the circuit in the used frequency band, express the amount of change in error of the measurement circuit due to changes in measurement parameters using an approximate formula, and based on this, calculate the amount of change in error of the measurement circuit due to changes in measurement parameters or measured quantities. Accuracy was determined using an approximate formula. Therefore, when determining the accuracy at all measurement points, the measured value (measured quantity) at each point
and the measurement parameter D data given to the object to be measured are substituted into an approximation formula and calculated. .
本発明は上記の欠点を除去するために電子測定器の制御
回路K例えばマイクロプロセッサを内蔵し、Q −r
イクロプロセッサにはすべての測定点における確度の近
似式を予めストアしておき、そしてすべての測定点に対
して一回の測定毎にその測定値を表示すると共に、#測
定値に対する確度を近似式で計算し表示するよ5Kした
電子測定器に関するものである。以下図面を用(Qで本
発明を説明する。In order to eliminate the above-mentioned drawbacks, the present invention incorporates a control circuit K of an electronic measuring instrument, for example, a microprocessor, and
The microprocessor stores approximation formulas for accuracy at all measurement points in advance, and displays the measured values for each measurement at all measurement points, and also displays the accuracy for each measurement value using the approximation formula. This is related to an electronic measuring device that calculates and displays 5K. The present invention will be explained below using the drawings.
第1図は本発明の一実施例による電子測定器のブロック
図、第2図は第1図における測定回路12の具体的回路
図である。両図において、10は測定信号発生器で、そ
の出力信号は標準抵抗器12を介して被測定対象14に
送りだされる。20は演算増幅器22とレンジ抵抗器2
4とを含む測定回路で、前記演算増幅器22の反転入力
端は前記被測定対象14に、そしてレンジ抵抗器24を
介してその出力端子にそれぞれ接続されている。ここで
、測定信号発生器10から送りだされる出力周波数fs
及び標準抵抗器12に印加される電圧レベルV、を含
む測定パラメータの可変制御信号、測定回路20におけ
るレンジ抵抗器24(その値をルとする)の可変制御信
号は、それぞれ演算機能(例工ばマイクロプロセッサ)
を具えた演算処理装置16から送りだされる。そして前
記演算処理装置16は測定回路20から電圧ψt、Vx
の測定値情報を導入する。なお、18は表示装置で
ある。FIG. 1 is a block diagram of an electronic measuring instrument according to an embodiment of the present invention, and FIG. 2 is a specific circuit diagram of the measuring circuit 12 in FIG. 1. In both figures, 10 is a measurement signal generator, the output signal of which is sent to the object to be measured 14 via a standard resistor 12. 20 is an operational amplifier 22 and a range resistor 2
4, the inverting input terminal of the operational amplifier 22 is connected to the object to be measured 14 and to its output terminal via a range resistor 24, respectively. Here, the output frequency fs sent out from the measurement signal generator 10
and the voltage level V applied to the standard resistor 12, and the variable control signal for the range resistor 24 in the measurement circuit 20 (the value of which is assumed to be Le) are each controlled by an arithmetic function (for example, microprocessor)
The data is sent out from an arithmetic processing unit 16 equipped with a. The arithmetic processing unit 16 receives the voltages ψt and Vx from the measurement circuit 20.
Introduce measurement value information. Note that 18 is a display device.
上記の如く、インピーダンスの測定例において、演算処
理装置16は先ず測定回路20から得られた測定値情報
(Vl 、 Vx 1:基づき次式(1)の演算処理に
より測定値ixを求めた後、この測定値が表示装置18
に表示される。As described above, in the impedance measurement example, the arithmetic processing unit 16 first calculates the measured value ix by the following equation (1) based on the measured value information (Vl, Vx 1: obtained from the measuring circuit 20), and then This measured value is displayed on the display device 18.
will be displayed.
又、演算処理装置16は上記の演算実行と同時又はこれ
と並行して次式(2)K示す近似式に基づいて前記測定
値ixに対する確度にの演算を実行し、9
(1+に7(1+Ksβ) −)−1−−=−0−1,
−+21ィ。6、r=v3.β=漁、 K+ 、 K2
6、−−1Ke。よ。Simultaneously or in parallel with the execution of the above calculation, the arithmetic processing unit 16 executes a calculation for the accuracy of the measured value ix based on the approximation formula shown in the following equation (2)K, and calculates 9 (1+ to 7( 1+Ksβ) −)−1−−=−0−1,
-+21. 6, r=v3. β=fishing, K+, K2
6,--1Ke. Yo.
測定レンジ、測定ファンクション(インダクタンス、キ
ャパシタンス、抵抗等)に異なる係数で、これら各係数
は予め計算され、そして処理装置におけるメモリにスト
アされている。With different coefficients for measurement range, measurement function (inductance, capacitance, resistance, etc.), each of these coefficients is pre-calculated and stored in memory in the processing unit.
上記の説明より明らかなように1本発明は各点における
測定値すなわち、測定パラメータの変化に対する測定値
と該測定値に対するそれぞれの確度を同時に表示させる
ことができるので、実用に供し至便である。なお、上記
確度の表示方法は、絶対値確度、又は百分率確度−Wx
” 00%)のいずれでもよい。又測定値に対する確度
が得られると、この測定器が保証し得る測定値の最小値
、最大値を求めることができるので、測定パラメータ例
えば測定周波数を連続的に掃引して測定を行い、そして
CRTの管面又は記碌計等K(測定周波数)対(測定値
)をプロットする場合、各測定値の最小値曲線と最大値
曲線を同時にプロットすることもできる。As is clear from the above description, the present invention is convenient for practical use because it can simultaneously display measured values at each point, that is, measured values for changes in measurement parameters, and the accuracy of each of the measured values. The above accuracy is displayed as absolute value accuracy or percentage accuracy -Wx
” 00%). Also, once the accuracy of the measured value is obtained, the minimum and maximum values of the measured value that can be guaranteed by this measuring device can be determined. When performing sweep measurements and plotting K (measurement frequency) versus (measurement value) such as a CRT screen or recording meter, it is also possible to plot the minimum and maximum value curves for each measurement value at the same time. .
第1図は本発明の一実施例による電子測定器のブロック
図、第2図は第1図における測定回路20の具体的回路
図である。
10:測定信号発生器、14:被測定対象、16:演算
処理装置、18:表示装置、20:測定回路、22:演
算増幅器、24:レンジ抵抗器。FIG. 1 is a block diagram of an electronic measuring instrument according to an embodiment of the present invention, and FIG. 2 is a specific circuit diagram of the measuring circuit 20 in FIG. 1. 10: measurement signal generator, 14: object to be measured, 16: arithmetic processing unit, 18: display device, 20: measurement circuit, 22: operational amplifier, 24: range resistor.
Claims (1)
数値を測定する電子測定器において、前記被測定対象に
供給される測定信号のパラメータ情報又は測定値情報に
基づいて各測定値に対する確度を逐次演算する演算処理
装置と、前記測定値及び確度を同時に表示せしめる表示
装置とを具備して成る電子測定装置。In an electronic measuring instrument that measures constant values of an object to be measured according to certain set measurement parameters, accuracy for each measurement value is sequentially determined based on parameter information or measurement value information of a measurement signal supplied to the object to be measured. An electronic measuring device comprising an arithmetic processing unit that performs calculations and a display device that simultaneously displays the measured value and accuracy.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13109981A JPS5833117A (en) | 1981-08-21 | 1981-08-21 | Electronic measuring device provided with accuracy display |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13109981A JPS5833117A (en) | 1981-08-21 | 1981-08-21 | Electronic measuring device provided with accuracy display |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5833117A true JPS5833117A (en) | 1983-02-26 |
JPH0145587B2 JPH0145587B2 (en) | 1989-10-04 |
Family
ID=15049949
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13109981A Granted JPS5833117A (en) | 1981-08-21 | 1981-08-21 | Electronic measuring device provided with accuracy display |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5833117A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6192890A (en) * | 1984-10-12 | 1986-05-10 | Mitsubishi Paper Mills Ltd | Thermal recording sheet |
US8201122B2 (en) | 2010-05-25 | 2012-06-12 | International Business Machines Corporation | Computing resistance sensitivities with respect to geometric parameters of conductors with arbitrary shapes |
-
1981
- 1981-08-21 JP JP13109981A patent/JPS5833117A/en active Granted
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6192890A (en) * | 1984-10-12 | 1986-05-10 | Mitsubishi Paper Mills Ltd | Thermal recording sheet |
JPH0444592B2 (en) * | 1984-10-12 | 1992-07-22 | Mitsubishi Paper Mills Ltd | |
US8201122B2 (en) | 2010-05-25 | 2012-06-12 | International Business Machines Corporation | Computing resistance sensitivities with respect to geometric parameters of conductors with arbitrary shapes |
Also Published As
Publication number | Publication date |
---|---|
JPH0145587B2 (en) | 1989-10-04 |
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