JPS582757A - Detecting device for trouble of signal transmission line - Google Patents
Detecting device for trouble of signal transmission lineInfo
- Publication number
- JPS582757A JPS582757A JP56101520A JP10152081A JPS582757A JP S582757 A JPS582757 A JP S582757A JP 56101520 A JP56101520 A JP 56101520A JP 10152081 A JP10152081 A JP 10152081A JP S582757 A JPS582757 A JP S582757A
- Authority
- JP
- Japan
- Prior art keywords
- signal transmission
- circuit
- transmission line
- signal
- signals
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/58—Testing of lines, cables or conductors
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は、信号伝達線、4GK複数の盤間な接続する信
号伝達線の故障を検出する故障検出装置に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a failure detection device for detecting a failure in a signal transmission line or a signal transmission line connecting a plurality of 4GK panels.
第1図は、盤間に配線された信号伝達線の概略な示した
ものである。盤1と盤1′との間で、信号伝達線21.
2t 肖2Lv介して信号のやりと9が表されていると
き、信号伝達線2,2□・・・、2Lの故障があると、
盤の動作釦異常を来す@そとで、盤の動作の異常を検出
し、これに基いて信号伝達線2の故障を検出することと
していた。しかし、盤の誤動作が信号伝達線の故障に起
因することが分かってもどの信号伝達線の故障であるか
を見い出すことが容易ではなかった。また信号伝達線の
検査はプラントの稼動率の低下な防ぐため、短時間に行
なわなければならないが、信号伝達線が多い大規模なプ
ラントではこれが困癲であった。FIG. 1 schematically shows signal transmission lines wired between panels. A signal transmission line 21. between the board 1 and the board 1'.
2t When signal transmission line 9 is shown through 2Lv, if there is a failure in signal transmission line 2, 2□..., 2L,
An abnormality in the operation of the panel was detected when an operation button on the panel malfunctioned, and a failure in the signal transmission line 2 was detected based on this. However, even if it is known that the malfunction of the board is caused by a failure in a signal transmission line, it is not easy to find out which signal transmission line is at fault. In addition, inspection of signal transmission lines must be carried out in a short period of time to prevent a drop in the operating rate of the plant, but this is difficult in large-scale plants with many signal transmission lines.
本発明の目的は、簡単にしかも短時間で故障の検出を行
なうことができる故障検出装置を提供することにある。An object of the present invention is to provide a failure detection device that can easily detect failures in a short time.
第2図は本発明の一実施例を示したものである。FIG. 2 shows an embodiment of the present invention.
同図において1.1′は制御盤等の盤2+ −2m −
・・・、2Lは盤1.1′間で信号を伝送するためのL
本の信号伝達線である。3は一方の盤1内に設けられ、
複数のテスト用信号をパラレルに発生する信号発生回路
、4は盤1内に設けられ、信号発生回路3で発生された
パラレルなテスト用信号をシリアルな信号に変換する変
換回路、4′は@ 1’内に設けられ、信号発生回路3
で発生されたパラレルなテスト用信号を信号伝達線2を
介して供給され、該テスト用信号をシリアルな信号に変
換する変換回路である口変換回路4および4の出力は互
いに対応するようI/cfkつている。即ち、例えば信
号伝達線21〜2Lに与えられたパラレル信号は、2つ
の変換回路4.4′の双方において信号伝達線2.〜2
Lの順に並んだシリアル信号に変換される。変換回路4
の出力は直接、変換回路4′の出力はエコー信号伝達線
5を介してともに判定回路6に与えられる。In the same figure, 1.1' is a panel such as a control panel 2+ -2m -
..., 2L is L for transmitting signals between panels 1 and 1'
This is the signal transmission line of the book. 3 is provided in one panel 1,
A signal generation circuit 4 that generates a plurality of test signals in parallel is provided in the board 1, a conversion circuit that converts the parallel test signals generated by the signal generation circuit 3 into serial signals, and 4' is @ 1', and the signal generation circuit 3
A parallel test signal generated by the I/F converter circuit 4 is supplied via the signal transmission line 2, and the outputs of the converter circuits 4 and 4, which are conversion circuits that convert the test signal into a serial signal, are connected to the I/R so that they correspond to each other. cfk is on. That is, for example, the parallel signals applied to the signal transmission lines 21 to 2L are transmitted to the signal transmission lines 2.4 in both of the two conversion circuits 4.4'. ~2
It is converted into serial signals arranged in the order of L. Conversion circuit 4
The output of the conversion circuit 4' is directly applied to the determination circuit 6, and the output of the conversion circuit 4' is applied to the determination circuit 6 via the echo signal transmission line 5.
判定回路6は、例えば第3図−示す工うに構成されてい
る。変換回路4.4′の出力は一致回路7により順次比
較される0これにより、信号発生回路3から発生された
テスト用信号の各々につき、信号伝達線(21〜2L)
を介して伝達されたものとそうでないものとが比較され
る0比較の結果両者が不一致であると、不一致を示す信
号「1」が一致回路7から出力される。The determination circuit 6 is configured, for example, as shown in FIG. The outputs of the conversion circuits 4 and 4' are sequentially compared by the matching circuit 7. As a result, for each of the test signals generated from the signal generation circuit 3, the signal transmission lines (21 to 2L)
If the result of a 0 comparison in which what is transmitted via the 0 and what is not transmitted is a mismatch, a signal "1" indicating a mismatch is output from the matching circuit 7.
メモリ回路10および10’は、信号伝達線21〜2L
の各々に対応したアドレスA1〜ALを含む0これらの
アドレスAH−’−ALの内容は、判定動作の開始に先
立って「0」Kセットされる0
最初、選択信号11にエリメモリ回路10が選択される
0力ウンタ回路12はテスト用信号の各々についての、
一致回路7による順次の比較に同期して、メ峰り回路1
0のアドレス(Al〜AL)を順次指定するO
表示器13は指定されているアドレス、従って一致回路
7により比較されているテスト用信号に対応する信号伝
達線V*示する0
カウンタ回路12により指定されているアドレス(Al
〜AL)の内容はレジスタ回路14に移される0加算回
路8はVジスタ回路I4の内#%’ lk回路7の出
力[lJまたはI”OJとを加算する0加算結果はメモ
リ10の指定されているアドレスに書込まれる。Memory circuits 10 and 10' are connected to signal transmission lines 21 to 2L.
The contents of these addresses AH-'-AL, including addresses A1 to AL corresponding to each of the addresses AH-'-AL, are set to "0" K prior to the start of the determination operation.At first, the selection signal 11 is selected by the memory circuit 10. The zero-power counter circuit 12 to be used for each of the test signals,
In synchronization with the sequential comparison by the matching circuit 7, the Memine circuit 1
0 address (Al to AL) is sequentially specified. The display 13 indicates the specified address, and therefore the signal transmission line V* corresponding to the test signal being compared by the coincidence circuit 7. The counter circuit 12 The specified address (Al
The contents of ~AL) are transferred to the register circuit 14. The 0 addition circuit 8 adds #%' of the V register circuit I4 to the output [lJ or I"OJ of the lk circuit 7. The 0 addition result is transferred to the specified memory 10. is written to the specified address.
上記の15″&動作が、すべての信号伝達線について所
定の回数(M回)繰返される。しかる後、選択信号11
’によりメモリ回路1σが選択される。The above 15''& operation is repeated a predetermined number of times (M times) for all signal transmission lines. After that, the selection signal 11
'The memory circuit 1σ is selected.
弁別回路9は、加算回路8での加算結果が所定の回a
(N回)以上であるときK ro」そうでないときに「
1」を出力する0弁別回路9の出力はメモリ回路10′
の指定されているアドレスに書込まれる。この動作はす
べての信号伝達線について1回ずつ行なわれる。メモリ
回路10′に書込まれた内容はフリップフロップ回路1
5にセットされるとともに、表示器13’により表示さ
れる。表示器13’17)表示から、故障した信号伝達
線が分かる。The discrimination circuit 9 determines that the addition result in the addition circuit 8 is a predetermined number a.
(N times) or more, K ro” otherwise, “
The output of the 0 discrimination circuit 9 which outputs ``1'' is sent to the memory circuit 10'.
is written to the specified address. This operation is performed once for all signal transmission lines. The contents written in the memory circuit 10' are stored in the flip-flop circuit 1.
5 and is displayed on the display 13'. Indicator 13'17) The faulty signal transmission line can be identified from the display.
上記の実施例では、信号伝達線を介してパラレルに伝送
された複数のテスト用信号なシリアルに変換して返信す
ることとしているので、返信用の線(エコー信号伝達線
)は1本でよく、パラレル信号なそのまま返信する場合
に比べて返信用の線の数を減らすことができる。また返
信された信号の比較に用いられる一致回路も1個でよい
。従ってプラントが大規模で、信号伝達線が多い場合に
も、簡単な構成の装置で確実に故障検出を行なうことが
できる◇また、各信号伝達線についてテスト用信号な複
数・回(M回)伝送し、比較を行ない、不一致の回数が
8回以上であるときに限り真に故障であると判断するこ
ととしているので、ノイズや一過性の故障による誤判定
を回避することができる0第4図は判定回路6の他の例
を示したものである。この例では、第3図のメモリ回路
1σが省略され、メモリ回路10の出力が切換装置16
によりレジスタ回路14または弁別回路9選択的に入力
されるようになっている。この例の判定回路6では、一
致回路7による比較を行ない不一致の回数を累算してい
る間は切換装置16はレジスタ回路14を選択している
。一致回路71Cよる比較が各信号伝達線についてM回
ずつ行なわれた後、切換装置16により弁別回路9が選
択され、メモリ回路10に記憶された不一致の回数の累
算値が弁別回路9で所定の回数N以上であるかどうかの
判定が行なわれる。In the above embodiment, multiple test signals transmitted in parallel via the signal transmission line are converted into serial signals and sent back, so only one return line (echo signal transmission line) is required. , the number of return lines can be reduced compared to the case where parallel signals are returned as is. Further, only one matching circuit is required for comparing the returned signals. Therefore, even if the plant is large-scale and has many signal transmission lines, it is possible to reliably detect failures with a device with a simple configuration.In addition, each signal transmission line can be sent a test signal multiple times (M times). It is determined that there is a true failure only when the number of mismatches is 8 or more times. FIG. 4 shows another example of the determination circuit 6. In this example, the memory circuit 1σ of FIG. 3 is omitted, and the output of the memory circuit 10 is transferred to the switching device 16.
The signal is selectively input to the register circuit 14 or the discriminator circuit 9. In the determination circuit 6 of this example, the switching device 16 selects the register circuit 14 while the matching circuit 7 performs the comparison and accumulates the number of mismatches. After the matching circuit 71C performs the comparison M times for each signal transmission line, the switching device 16 selects the discrimination circuit 9, and the accumulated value of the number of mismatches stored in the memory circuit 10 is determined by the discrimination circuit 9 to a predetermined value. A determination is made as to whether or not the number of times N is greater than or equal to N.
その他の点では第3図の判定回路と同様である。In other respects, it is similar to the determination circuit shown in FIG.
第5図は、第4図のメモリ回路10として、二重化した
ものを用いた所定回路を示している。即ち、←の入力信
号について、同一条件で、同一の処理を行なう2つのメ
モリ回路10A、IOHの出力が比較回路17で比較さ
れ、一致した場合にはその出力が切換装置16を介して
レジスタ回路14または弁別回路9に送られる。一致し
ない場合には、比較回路17により7リツプ7胃ツブ回
路15がセットされる0これを基にして、判定回路6
(4IKそのメモリ回路10ム、10B等)の故障を表
示させること:ができる@
以上の工うに本発明によれば、簡単な構成でしかも迅速
にかつ確笑に信号伝達線の故障を検出することができる
〇FIG. 5 shows a predetermined circuit using a duplex memory circuit 10 of FIG. 4. In FIG. That is, regarding the input signal ←, the outputs of the two memory circuits 10A and IOH, which perform the same processing under the same conditions, are compared in the comparator circuit 17, and if they match, the outputs are sent to the register circuit via the switching device 16. 14 or the discrimination circuit 9. If they do not match, the comparison circuit 17 sets the 7-lip 7 stomach-tub circuit 15.Based on this, the judgment circuit 6
(4IK's memory circuit 10M, 10B, etc.): It is possible to display a failure in a signal transmission line with a simple configuration, quickly and reliably. I can do it〇
第1図は2つの盤とこれら!結ぶ信号伝達線とを示″f
概略図、第2図は本発明の一実施例を示す概略配線図、
第3図乃至第5図は、第2図の判定回路の例を示すブロ
ック図である。Figure 1 shows the two boards and these! "f" indicates the signal transmission line connecting
Schematic diagram, FIG. 2 is a schematic wiring diagram showing one embodiment of the present invention,
3 to 5 are block diagrams showing examples of the determination circuit of FIG. 2.
Claims (1)
と、前記テスト用信号ケ、検査される複数の信号伝達線
を介して伝送され、該テスト用信号をシリアル信号に変
換でる第1の変換回路と、前記テスト用信号を、前記信
号伝達線を介さす忙与えられ、該テスト用信号を、前記
第1の変換回これに対応する前記第2の変換回路の出力
の信号とを、第1の所定の回数繰返して比較し、前記信
号伝達線の各々につき、比較される2つの信号が一致し
ないことが第2の所定の回数以上繰返して起こったとき
に該信号伝達線に故障があるものと判定する判定回路と
を備えた信号伝達線故障検出装置。a signal generation circuit that generates a plurality of test signals in parallel; and a first conversion circuit that transmits the test signals through a plurality of signal transmission lines to be tested and converts the test signals into serial signals. The test signal is transmitted through the signal transmission line, and the test signal is transmitted to the first conversion circuit and the corresponding output signal of the second conversion circuit is transmitted to the first conversion circuit. The signal transmission line is repeatedly compared a predetermined number of times, and when the two signals being compared do not match for each of the signal transmission lines repeatedly for a second predetermined number of times or more, there is a failure in the signal transmission line. A signal transmission line failure detection device comprising a determination circuit for determining.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56101520A JPS582757A (en) | 1981-06-30 | 1981-06-30 | Detecting device for trouble of signal transmission line |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56101520A JPS582757A (en) | 1981-06-30 | 1981-06-30 | Detecting device for trouble of signal transmission line |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS582757A true JPS582757A (en) | 1983-01-08 |
Family
ID=14302778
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56101520A Pending JPS582757A (en) | 1981-06-30 | 1981-06-30 | Detecting device for trouble of signal transmission line |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS582757A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010194260A (en) * | 2009-02-27 | 2010-09-09 | Toshiba Corp | Medical diagnostic apparatus and method for controlling medical diagnostic apparatus |
-
1981
- 1981-06-30 JP JP56101520A patent/JPS582757A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010194260A (en) * | 2009-02-27 | 2010-09-09 | Toshiba Corp | Medical diagnostic apparatus and method for controlling medical diagnostic apparatus |
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