JPS5824949A - Test system for operation device - Google Patents

Test system for operation device

Info

Publication number
JPS5824949A
JPS5824949A JP56123378A JP12337881A JPS5824949A JP S5824949 A JPS5824949 A JP S5824949A JP 56123378 A JP56123378 A JP 56123378A JP 12337881 A JP12337881 A JP 12337881A JP S5824949 A JPS5824949 A JP S5824949A
Authority
JP
Japan
Prior art keywords
unit
arithmetic
central processing
control unit
calculation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56123378A
Other languages
Japanese (ja)
Inventor
Mamoru Ishibashi
石橋 守
Kenji Takahashi
賢二 高橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP56123378A priority Critical patent/JPS5824949A/en
Publication of JPS5824949A publication Critical patent/JPS5824949A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE:To decrease time required for the test for a plurality of operation device, by executing the operation of the test mode at the same time at all the operation device connected to a common controller, through the provision of a circuit which simultaneously selects the operation devices in the common controller. CONSTITUTION:A common controller 2 is connected to a CPU1 with a bus cable and operation devices 3 and 4 are connected to the device 2 with interface lines 106-109. The device 2 is provided with a priority selection section 22 controlled with a common control section 21, an operation device determining section 23 and an operation device control section 24, the test mode is set to the section 23 from the control section 21 via an interface line 113 and the output of the selection section 22 accesses the operation devices 3 and 4 set to the test mode at the same time. The operation of the test mode is executed at the operation devices 3 and 4 at the same time and the result is returned to the CPU1 via the control section 24, allowing to decrease the time required for the test of the operation devices 3 and 4 of a plurality of sets.

Description

【発明の詳細な説明】 この発面は並列処理システムにおける複数台の演算装置
の試験方式に関する。
DETAILED DESCRIPTION OF THE INVENTION This invention relates to a method for testing a plurality of arithmetic units in a parallel processing system.

従来、並列処理システムにおける複数台の演算装置の試
験は1台ずつ順番に実行していた。したがって演算装置
の台数が増えれば増える程、試験のための所要時間が増
加するという欠点があった。
Conventionally, testing of a plurality of arithmetic units in a parallel processing system has been performed one by one in sequence. Therefore, as the number of arithmetic devices increases, the time required for testing increases.

この発明の目的は演算装置の試験時に、共通制御装置に
接続される全ての演算装置を同時に選択する回路を共通
制御装置内に設けることKより、演算装置台数に比例し
て試験奥行時間が長くなるという従来の欠点を解決し、
複数の演算装置の試験実行時間を大幅に短縮させる並列
処理システムの試験方式を提供するととにある。
The purpose of this invention is to provide a circuit in the common control device that simultaneously selects all the arithmetic devices connected to the common control device when testing the arithmetic devices. Solving the conventional drawback of becoming
It is an object of the present invention to provide a test method for a parallel processing system that significantly reduces the test execution time of a plurality of arithmetic units.

この発明によれば、中央処理装置と、共通制御装置と、
複数の演算装置とから構成される並列処理システムにお
いて、前記共通制御装置に1前記中央処理装置からの演
算すべきデータを受取った後前記複数の演算装置にデー
タを送出する演算装置制御部と、前記中央処理装置から
の試験実行指示により前記複数の演算装置への同時実行
指示を行う演算装置選択部とを設けることにより、前記
中央処理装置からの同一データを用いて前記複数の演算
装置の試験が同時に実行されることを可能とする。
According to this invention, the central processing unit, the common control unit,
In a parallel processing system comprising a plurality of arithmetic units, an arithmetic unit control unit that sends data to the plurality of arithmetic units after receiving data to be operated on from one of the central processing units to the common control unit; By providing an arithmetic device selection unit that instructs the plurality of arithmetic devices to perform simultaneous execution based on a test execution instruction from the central processing unit, the plurality of arithmetic devices can be tested using the same data from the central processing device. can be executed simultaneously.

次にこの発明について図面を参照して詳細に説明する。Next, the present invention will be explained in detail with reference to the drawings.

この発明の実施例を示す第1図において、並列処理シス
テム蝶中央処理装置1と、共通制御装置2と、2つの演
算装置3,4とKよや構成されており、このうち共通制
御装置2FJ共通制御部21.演算装置3,4への処m
I!求の優先度を選択する優先度選択部22、演算装置
3,4の起動を決定する演算装置決定部23、共通制御
部21と演算装!i13 、4との間のデータ転送制御
を主として行う演算装置制御部24とを含んでいる。
In FIG. 1 showing an embodiment of the present invention, the parallel processing system is composed of a central processing unit 1, a common control unit 2, two arithmetic units 3 and 4, and a common control unit 2FJ. Common control unit 21. Processing to arithmetic units 3 and 4
I! A priority selection unit 22 that selects the priority of a request, an arithmetic unit determination unit 23 that determines activation of the arithmetic units 3 and 4, a common control unit 21, and an arithmetic unit! i13, i14, and an arithmetic unit control section 24 which mainly controls data transfer between i13 and i4.

中央処理装置lからバスケーブル101を介して初期設
定が要求されると共通制御部21は演算装置決定部23
内の試験モード7リツプフロツプ233t”論理@Om
に設定する。よって演算装置決定部23内の決定回路2
31 、232の各ゲート231m 、 232mが閉
じ、グー) 231b 、 232bが開けられる。中
央処理装置1から業務用データの演算要求がバスケーブ
ル101を介して行なわれると共通制御部21は処!要
求線103 K論!@1’ t−出力する。優先度選択
部22はビジー表示線106をチェックし、演算装置1
3のビジー状態を、表示+H106上の信号が論!@l
”にょシ、ビジーでないことを論理@0#によりv繊す
る。
When initial settings are requested from the central processing unit l via the bus cable 101, the common control unit 21
Test mode 7 lip-flop 233t” logic @Om
Set to . Therefore, the determination circuit 2 in the arithmetic device determination unit 23
The respective gates 231m and 232m of 31 and 232 are closed, and the gates 231b and 232b are opened. When a calculation request for business data is made from the central processing unit 1 via the bus cable 101, the common control unit 21 performs a process! Demand line 103 K theory! @1' t-output. The priority selection unit 22 checks the busy display line 106 and selects the
The signal on display +H106 indicates the busy state of 3! @l
``Nyoshi, use logic @0# to indicate that you are not busy.

ビジー表示線106がm理@O”ならば演算装置選択1
104KI]lil理11”を出力することにより決定
同層11#とじて出力され、演算装置13に処理要求を
行う。ビジー表示線106から論理11mが入力される
と、優先度選択部22はビジー表示#! 107をチェ
ックする0ビジ一表示# 106 、107がともに論
理11”ならば優先度選択部22はバスケーブル102
を介して共通制御部21に優先度選択部22が処理要求
受付中であることを伝え、共通制御部21は処理要求受
付中が屏除されるまで待たされる。
If the busy display line 106 is "m operation@O", arithmetic unit selection 1
104KI]lil logic 11'' is output as the determined same layer 11#, and a processing request is made to the arithmetic unit 13. When logic 11m is input from the busy display line 106, the priority selection unit 22 indicates that it is busy. Display #! Check 107 0 Busy Display # If both 106 and 107 are logical 11", the priority selection unit 22 selects the bus cable 102.
The priority selector 22 notifies the common control unit 21 via the process request that the priority selection unit 22 is accepting a processing request, and the common control unit 21 is made to wait until the status of accepting a process request is removed.

今、決定回路231の出力がインタフェース線108上
で論理″″l”となシ、かつ決定回路232の出力がイ
ンタフェース線109上で論理@O’に′lkシ、演算
装置3での演算実行が決定されたとすると、共通制御部
21は中央処理装置lから演算すべきデータ會読出し、
演算装置制御部24を介してバスケーブル110 、1
11上に送出する。演算装置3はインタフェース線10
8から論!111”を入力しバスケーブル110からの
データを引取)、演算装置4はインタフェースill 
101から論m”o”を入力しバスケーブル111から
のデータは引取らない。
Now, the output of the decision circuit 231 becomes logic ""l" on the interface line 108, and the output of the decision circuit 232 becomes logic @O' on the interface line 109, and the arithmetic unit 3 executes the operation. is determined, the common control unit 21 reads out the data to be calculated from the central processing unit l,
The bus cables 110 and 1 are connected via the arithmetic device control section 24.
11. Arithmetic device 3 has interface line 10
Discussion from 8! 111" and receives data from the bus cable 110), the arithmetic unit 4 interfaces ill
Logic m"o" is input from bus cable 101, and data from bus cable 111 is not received.

演算装置3での演算結果は演算装置3内のバッファ(図
示していない)K格納され、演算装置!lt3はバスケ
ーブル1101e介して演算装置制御部24に演算終了
を伝える。演算装置制御部24は共通制御部21を介し
て中央処理装置lに演算装fllt3における演算終了
を伝える。中央処理装置1ltl上の業務プログラムが
共通制御部21に演算装置3からの演算結果読出しを要
求した後、共通制御部21はバスケーブル112 を介
して演算装置制御部24に演算装置3からの演算結果読
出しを要求する。演算装置制御部24はバスケーブル1
10を介して演算装置3から演算結果を絖み出し、共通
制御部21を介して中央処理装置IK演算結果を送出す
る。
The calculation results in the calculation device 3 are stored in a buffer (not shown) K within the calculation device 3, and the calculation results are stored in the calculation device 3. lt3 notifies the arithmetic unit control unit 24 of the completion of the computation via the bus cable 1101e. The arithmetic unit control unit 24 notifies the central processing unit 1 via the common control unit 21 of the completion of the calculation in the arithmetic unit fllt3. After the business program on the central processing unit 1ltl requests the common control unit 21 to read the calculation results from the calculation unit 3, the common control unit 21 requests the calculation unit control unit 24 to read the calculation results from the calculation unit 3 via the bus cable 112. Request reading of results. The arithmetic device control unit 24 connects the bus cable 1
The calculation result is outputted from the calculation unit 3 via the CPU 10, and the calculation result is sent to the central processing unit IK via the common control unit 21.

次に試験時における動作について説明する。中央処理装
置1内の試験プログラムがバスケーブル101を介して
共通制御部21に試験モード設定を要求すると、共通制
御部21はインタフェース線113を介して試験モード
クリップ70ツブ233を論理″11”に設定する。よ
ってグー) 231m 、 232aがl+4き、グー
) 231b 、 232bが閉じる。中央処理装置1
から試験用の演算すべきデータの送出要求が共通制御部
21に送出されると、共通制御部21は処理☆零線10
3上に論理@1”を出力する。この1rl”がゲート2
31m 、 232mをそれぞれ通過し、決定回路23
1と232の出力はそれぞれインタフェース[108゜
109上で論理@1#となシ、演算装置3と4の両方は
演算データ待ちの状態になる。
Next, the operation during the test will be explained. When the test program in the central processing unit 1 requests the common control section 21 to set the test mode via the bus cable 101, the common control section 21 sets the test mode clip 70 knob 233 to logic "11" via the interface line 113. Set. Therefore, Goo) 231m and 232a are l+4, and Goo) 231b and 232b are closed. Central processing unit 1
When a request for sending data to be calculated for testing is sent to the common control unit 21, the common control unit 21 performs processing☆zero line 10.
Outputs logic @1” on gate 3. This 1rl” is the gate 2
31m and 232m, respectively, and the decision circuit 23
The outputs of 1 and 232 are logic @1# on the interfaces 108 and 109, respectively, and both arithmetic units 3 and 4 are in a state of waiting for arithmetic data.

この後、共通制御部21は中央処理装置11から試験用
データを読み出し、演算装置制御部24を介してバスケ
ーブル110 、111 K送出する。演算装置3はイ
ンタフェースM 108からの論理″″1”を入力トシ
てバスケーブル110からのデータを受付可能にしてい
るので、バスケーブル110からの試験用データを胱堰
シ演算を行なう。同様に演算装置4も演算装置3が読取
ったデータと同一のデータをバスケーブル111から読
取シ演算を行う。
Thereafter, the common control unit 21 reads the test data from the central processing unit 11 and sends it to the bus cables 110 and 111K via the arithmetic unit control unit 24. Since the arithmetic device 3 inputs the logic ""1" from the interface M 108 and is enabled to accept data from the bus cable 110, it performs the bladder dam calculation on the test data from the bus cable 110.Similarly, The arithmetic device 4 also reads the same data as the data read by the arithmetic device 3 from the bus cable 111 and performs arithmetic operations.

演算装置3における演算結果は演算装置3内のバッファ
(図示していない)K格納され、演算装置3は演算装置
制御部24と共通制御部21とを介して演算終了を中央
処理蔵置IK報告する。中央処埋装置1内の試験プログ
ラムは共通制御部21に演II#装置3からの演算結果
読出しを要求すると、共通制#部21は演算装置制御部
24を介して演算装置3から演算結果を読出し、中央処
理装置1に送出する。この後、試験プログラムは演算結
果の妥当性を調べる。
The calculation results in the calculation device 3 are stored in a buffer (not shown) K in the calculation device 3, and the calculation device 3 reports the completion of the calculation to the central processing unit IK via the calculation device control unit 24 and the common control unit 21. . When the test program in the central processing unit 1 requests the common control unit 21 to read the calculation results from the performance II# device 3, the common control unit 21 reads the calculation results from the calculation device 3 via the calculation device control unit 24. It is read out and sent to the central processing unit 1. After this, the test program checks the validity of the calculation results.

演算装置3の場合と同様にして演算装置4での演J#終
了は中央処理装置lに報告され、この後中央処理装置1
内の試験プログラムは演算装[4から演算結果を読出し
て演算結果の妥当性を調べる。
In the same manner as in the case of the arithmetic unit 3, the end of the operation J# in the arithmetic unit 4 is reported to the central processing unit l, and then the central processing unit 1
The test program in the test program reads the calculation results from the calculation unit [4] and checks the validity of the calculation results.

なお、演算装置3と4との演算終了が同時に演算装置制
@524FC報告されると演算装置制御部24は共通制
御部21を介して演算装置3.4での演算終了を中央処
理装#IK同時に@告し、中央処理装[1内の試験プロ
グラムは順釜に演算結果を読み出す。
Note that when the completion of the computations in the computation units 3 and 4 is simultaneously reported to the computation unit system @524FC, the computation unit control unit 24 informs the central processing unit #IK of the completion of computation in the computation units 3 and 4 via the common control unit 21. At the same time, the test program in the central processing unit 1 reads out the calculation results in order.

こOよりにして、中央処Jll装置1からの試験データ
は1回の演算要求により演算装置3と4の両方に同時に
送出され、演算装置3と4上の演算は同時に実行される
ので、演算装置3と4の試験の所要時間が大幅に!Mi
縮される。
In this way, the test data from the central processing Jll device 1 is simultaneously sent to both arithmetic units 3 and 4 with a single arithmetic request, and the arithmetic operations on the arithmetic units 3 and 4 are executed simultaneously. The time required for testing devices 3 and 4 has been significantly reduced! Mi
Shrunk.

この発明は以上説明し九ように、試験モード設定時に複
数の演算装置が一時に選択されるように構成されてbる
ため、試験の所要時間を大幅に短縮できるという効果が
らるっ
As described above, this invention is configured such that a plurality of arithmetic units are selected at once when setting the test mode, and therefore has the effect of significantly shortening the time required for testing.

【図面の簡単な説明】[Brief explanation of drawings]

図はこの発明の実施例を示す構成図である。 1・・・中央処理装置、2−・共通制御装置、3.4・
・・演算装置、21・・・共通制御部、22・・・優先
度運択部、23・・・演算袈置決定部、24・・・演算
装置制御部、231 、232−・・決定回路、233
・・・試験モード7リツプフロツプ、103 、104
 、105 、106 、107゜108 、109 
、113・・・インタフェース線、101 、102 
、110 、111 、112・・・バスケーブル。 特許出願人  日本電気株式会社 代理人 軍野 卑
The figure is a configuration diagram showing an embodiment of the present invention. 1...Central processing unit, 2-.Common control device, 3.4.
...Arithmetic device, 21...Common control section, 22...Priority operation section, 23...Arithmetic operation decision section, 24...Arithmetic device control section, 231, 232-...Decision circuit , 233
...Test mode 7 lip flop, 103, 104
, 105 , 106 , 107° 108 , 109
, 113...interface line, 101, 102
, 110, 111, 112...bus cable. Patent Applicant: NEC Co., Ltd. Agent Hiroshi Gunno

Claims (1)

【特許請求の範囲】[Claims] 中央処m装置と、複数の演算装置と、前記中央処理装置
からの演算すべきデータを受取り前記複数の演算装置に
前記データを送出する演算装置制御部と、前記中央処理
装置からの試験実行指示により前記被数の演算装置への
同時実行指示を行う演算装置選択部とからなる並列処理
システムにおける演算装置の試練方式。
a central processing unit, a plurality of calculation units, a calculation unit control unit that receives data to be calculated from the central processing unit and sends the data to the plurality of calculation units, and a test execution instruction from the central processing unit; A method for testing arithmetic units in a parallel processing system, comprising an arithmetic unit selection unit that instructs the arithmetic units of the augend to perform simultaneous execution.
JP56123378A 1981-08-05 1981-08-05 Test system for operation device Pending JPS5824949A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56123378A JPS5824949A (en) 1981-08-05 1981-08-05 Test system for operation device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56123378A JPS5824949A (en) 1981-08-05 1981-08-05 Test system for operation device

Publications (1)

Publication Number Publication Date
JPS5824949A true JPS5824949A (en) 1983-02-15

Family

ID=14859091

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56123378A Pending JPS5824949A (en) 1981-08-05 1981-08-05 Test system for operation device

Country Status (1)

Country Link
JP (1) JPS5824949A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60755A (en) * 1983-06-16 1985-01-05 Pioneer Electronic Corp Formation of through hole

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4932020A (en) * 1972-07-28 1974-03-23
JPS52122446A (en) * 1976-04-07 1977-10-14 Fujitsu Ltd Circuit tester
JPS5384651A (en) * 1976-12-30 1978-07-26 Fujitsu Ltd Automatic test control system

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4932020A (en) * 1972-07-28 1974-03-23
JPS52122446A (en) * 1976-04-07 1977-10-14 Fujitsu Ltd Circuit tester
JPS5384651A (en) * 1976-12-30 1978-07-26 Fujitsu Ltd Automatic test control system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60755A (en) * 1983-06-16 1985-01-05 Pioneer Electronic Corp Formation of through hole

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