JPS5824831A - Data processing method in frequency sweeping vibration test - Google Patents

Abstract

PURPOSE:To shorten the time required for data processing and to obtain accurate response magnification, by digitally processing a reference measuring point response waveform, other measuring point response waveforms, and a vibrating input in real time. CONSTITUTION:An A/D converter 4 receives the reference measuring point response waveform Eb and a plurality of the other measuring point response waveforms Ec. The converter 4 also receives sampling triggers, which are synchronized with the vibrating input Ea, from a trigger generator 5. The converter 4 simultaneously samples the waveforms Eb and Ec for one cycle of the input Ea and supplies the result to a digital operating device 6. The operating device 6 computes the maximum value, average value, and effective value of the sampled waveforms and the frequency values of the input Ea and send the results to a memory device 7. These operations are repeated until the frequency sweeping is finished. When the vibration test is finished, the computation results stored in the memory device is read by the operating device 6 and the response magnification of the other measuring points with respect to the reference measuring point is computed.

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a data processing method in a frequency sweep vibration test.

When performing multi-point measurements in this type of vibration test and finding the response magnification of multiple other measurement points with respect to the reference measurement point, conventionally, as shown in Figure 1, the sine wave excitation input Ea, the reference measurement point The measured reference measurement point response waveform Eb and the other side fixed point response waveform Er measured at a plurality of other measurement points are directly \,
- record on data recorder 1, and after the vibration test is completed,
The analog calculation device 2 is used to perform calculations while repeatedly reproducing the data, and the calculation results are input to the plotter 3 to draw a response curve C.

In this way, conventionally, the response waveform is recorded as is/once,
Since all arithmetic processing is performed after the test is completed, for example, the number of response curves is 20 to calculate the multi-point response magnification.
In some cases, it takes a long time, 3 hours or more, and in the low frequency range of several Hz, the response curve is distorted as shown in the figure, and analog arithmetic devices are very expensive.

This invention was made in view of the above-mentioned conventional problems, and by digitally processing the reference measurement point response waveform, the other side fixed point response waveform, and the excitation input in real time,
It is an object of the present invention to provide a data processing method in a frequency sweep test that can significantly shorten the time required for data processing, obtain an accurate response magnification, and reduce equipment costs compared to the conventional method.

An embodiment of the present invention will be described below with reference to the drawings.

(3) In FIG. 2, 4 is an A/D converter that receives a reference measuring point response waveform Eb and a plurality of other side fixed point response waveforms EC, which are analog signals, and receives an analog signal from the l trigger generator 5. Shake input W
When the sampling trigger 5a synchronized with a is received, the excitation input Eal cycle of the above two waveforms (1 in Fig. 3:
, time) are simultaneously sampled and converted into digital signals 1/ and supplied to the Diginor calculation device 6. The digital arithmetic unit 6 calculates the maximum value, average value, or effective value of each sampled waveform of the reference measurement point response waveform Eb and the plurality of multi-sided fixed point response waveforms Ec, and the frequency value of the sampled cycle as shown in FIG. The calculations are performed simultaneously and the calculation results are sent to the storage device 7 within a certain period indicated by . When this calculation is completed, the A/D converter 4 is controlled to again sample the reference measurement point response waveform Eb and the plurality of other side fixed point response waveforms Ec during one cycle of the excitation input Ea, and the sampled waveform , the same calculation as above is executed by the digital calculation device 6, and the calculation result is stored in the storage device 7. Thereafter, the same operation as described in (4) above is repeated until the frequency sweep is completed.

When the vibration test is completed, the digital calculation device 6 reads out the calculation results stored in the storage device 7, and calculates the response magnification of the fixed point on the other side with respect to the reference measurement point for each of the frequency values. The calculation results can be displayed on a plotter +t, <k display, etc.8
A response curve C is drawn.

For example, I J(z ~10 Hz (sweep time 10
For proportional sweep, the number of waves changes from 1 times/second to 10 times/second.
That's about 3,000 pieces. On the other hand, in order to draw the response curve C, 0.01. ) Tz resolution is sufficient.
000 points of data is sufficient. If the speed of the above calculation by the digital calculation device 6 is 0.01 seconds or less, sampling can be performed every two cycles. Since this embodiment uses digital processing, the above requirements can be easily met.If 20 response curves are required, it only takes a few minutes, and even when the frequency of the excitation input EIL is low, in the range of several Hz. Accurate response magnification can be obtained. Note that when the sweep frequency is in a high frequency range such as 5 Hz to 50 Hz, sampling may be performed every several cycles.

Furthermore, as shown in FIG. 3, if the time t3 until each sampled waveform reaches its maximum value is stored in the storage device 7, data regarding the phase can also be drawn.

As described above, according to the present invention, one cycle of excitation input of a reference measuring point response waveform and a plurality of other side fixed point response waveforms is simultaneously sampled and digitized, a required numerical value is calculated for the sampled waveform, and the sampling Since the calculations are repeated alternately, the numerical value for determining the response magnification can be obtained in real time, and the response magnification can be calculated from this value after the test is completed, so data processing for multiple measurement points is possible. The time required for data processing can be significantly shortened compared to conventional methods, and since it is digital processing, accurate response magnification can be obtained for the entire sweep frequency range, and the equipment cost required for data processing is also lower than conventional methods. Extremely cheap.

FIG. 4 shows another embodiment of the invention, in which a reference measurement response waveform Eb and a plurality of other side fixed point response waveforms Ec are input to a peak hold calculator 9. The peak hold calculator 9 calculates the peak value Ebmax of each input waveform,
Detect and hold Ecmax.

10 is a frequency-voltage converter, which sends out a voltage ea proportional to the frequency of the excitation input Ea. The hold output of the peak hold calculator 9 and the frequency proportional voltage e of the frequency-voltage converter 10 are sampled by the A/D converter 4 at predetermined intervals t2 and stored in the storage device 7, as shown in FIG. After the test is completed, as in the case of the embodiment shown in FIG.
get.

In addition, when calculating the effective value or the average value of the response waveform, the calculator 9 is used which calculates, holds, and outputs the effective value or the average value.

In the case of this invention, after the numerical value (7) required to find the response magnification from the reference measurement point response waveform and the other side fixed point response waveform is calculated by Real Tights while corresponding to the frequency of the excitation input. Since it is digitized and stored, and after the test is completed, the response magnification is calculated based on the above numerical values, the time required to process data for multiple measurement points is significantly reduced compared to the conventional method. In addition, accurate data can be obtained over the entire sweep frequency range, and equipment costs are lower than in the past.

[Brief explanation of drawings]

FIG. 1 is a block diagram of a conventional data processing device, FIG. 2 is a block diagram of a data processing device implementing a data processing method in a frequency sweep test according to the present invention, FIG. 3 is a waveform diagram, and FIG. The figure is a block diagram of a data processing device implementing another invention, and FIG. 5 is a waveform diagram. In the figure, 4... A/D converter, 5... trigger generator, 6...
...Digital arithmetic device, 7...Storage device, 8...Block, 9...Peak hold arithmetic unit, 10...Frequency-voltage converter. In addition, in the figures, the same reference numerals indicate the same or equivalent parts. Agent Makoto Kuzuno - (8) TI Tdo TI 72 Procedural amendment (voluntary) Commissioner of the Japan Patent Office 1, Indication of case Patent application No. 1982-123682 2, Title of invention Frequency sweep vibration test 1 jaw (data Relationship with the Office J±11 Method 3, Amendment Case Patent Applicant Address 112 Marunouchi 2-chome, Chiyo 111-ku, Tokyo
Number 3 Name (601) Mitsubishi Electric Co., Ltd. Representative Hitoshi Katayama Hachibe 4, Agent Address Tokyo, Chiyo+1'1-ku Kuunouchi-■-112-33 River, Mitsubishi Electric Co., Ltd. Name (6699) Patent attorney Shin Kuzuno
-5, Claims of the specification subject to amendment i15 6, Contents of the amendment Ell;! ``I amend the claim column of ``i'' as specified in the appendix. Claims (1) Determining the response magnification of the response measurement point with respect to the reference measurement point in a multi-point measurement vibration test by frequency sweep of the excitation input In this case, one cycle of the above-mentioned excitation input of the reference measurement point response waveform and other measurement point response waveforms is simultaneously sampled and digitized at a predetermined period, and then supplied to a digital arithmetic unit to obtain the maximum value or average of each sampled waveform. The value or effective value and the frequency of one cycle are calculated, and the calculation result is stored in a storage device, and after the frequency sweep is completed, the calculation result is called from the storage device to the digital calculation device, and the calculation result is calculated for the frequency value. A data processing method in a frequency sweep vibration test characterized by calculating a response magnification. The reference measurement point response waveform and other measurement point response waveforms are manually input to a computing device that calculates and holds the maximum value, average value, or effective value, and the hold output of the computing device is proportional to the frequency of the excitation input mentioned above. The frequency proportional voltage is simultaneously sampled at predetermined intervals and the sampled values are stored in a storage device, and after the frequency sweep is completed, the sampling values stored in the storage device are called to a digital arithmetic device to calculate the response to the frequency. A data processing method in a frequency sweep vibration test characterized by calculating a magnification. (2)

Claims (2)

[Claims] (1) Response to the reference measurement point in a multi-point measurement vibration test by frequency sweep of the excitation input When determining the response magnification of the measurement point, the reference measurement point response waveform and the other side fixed point response waveform are calculated for one cycle of the excitation input. are simultaneously sampled and digitized at predetermined intervals, and then supplied to a digital arithmetic unit, which calculates the maximum value, average value, or effective value of each sampled waveform and the frequency of one cycle, and stores the calculation results in a storage device. and, after the completion of the frequency sweep, the calculation result is called from the storage device to the digital calculation device to calculate the response magnification for the frequency value. (2) When determining the response magnification of the response measurement point relative to the reference measurement point in a multi-point measurement vibration test in which the frequency sweep j of the excitation input is applied, the reference measurement point response waveform and the other side fixed point response waveform are set to the maximum value or Input the average value or effective value to a computing unit that calculates and holds it, and the bold output of the computing unit,
A frequency proportional voltage proportional to the frequency of the excitation input is simultaneously sampled every predetermined period, and the sampling value is stored in a storage device, and after the frequency sweep is completed, the sampling value stored in the storage device is digitalized. 1. A data processing method in a frequency sweep vibration test, characterized by calling up a calculation device to calculate the response magnification with respect to frequency.